Contact Resistance and Leakage Current of GaN Devices with Annealed Ti/Al/Mo/Au Ohmic Contacts |
Ha, Min-Woo
(Department of Electrical Engineering, Myongji University)
Choi, Kangmin (Department of Electrical Engineering, Myongji University) Jo, Yoo Jin (Department of Advanced Materials Engineering, Hanyang University) Jin, Hyun Soo (Department of Materials Science & Chemical Engineering, Hanyang University) Park, Tae Joo (Department of Advanced Materials Engineering, Hanyang University) |
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