• Journal of the Korean Institute of Telematics and Electronics A
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• v.30A no.5
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• pp.52-62
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• 1993

This paper describes the implementation of a layout generation system for the gate matrix style to implement multi-level logic. To achieve improved layouts from general net lists, the proposed system performs flexible net binding for series nets. Also the system reassings gates by the heuristic information that shorter net lengths are better for the track minimization. By track minimizing with subdividing layout column information, the system decreases the number of necessary layout tracks. Experimental results show that the system generates more area-reduced (approximately 7.46%) layouts than those by previous gate matrix generation systems using net list inputs.

• The Transactions of the Korean Institute of Electrical Engineers
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• v.32 no.11
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• pp.404-416
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• 1983

This paper is concerned with the design automation of the sequential machines. The operations of sequential machine can be diveded into two types such as synchronous and asynchronous sequential machine and their realization is treated in separate mode. But, in order to integrate logic circuits in high volume, mixed mode sequential machine uses common circuitry that consists of gates and flip-flops. Proposed sequential machine can be designed by several method, which are hard-wired implementation, firmware realization by PLA and ROM. And then onr example shows the differnces among three design mothods. Finally, computer algorithm(called MINIPLA) is discussed for various application of mixed-mode sequential machine.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2014.05a
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• pp.790-791
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• 2014

본 논문에서는 처음 레이아웃을 접하는 학생들이 쉽게 레이아웃을 할 수 있도록 논리게이트의 입력 수에 따른 소스/드레인 접합면의 개수 및 출력 단자에 연결되는 드레인 접합면의 개수를 간단한 수식으로 설명하고자 한다. 일반적으로 디지털 회로에서는 직렬로 연결되는 트랜지스터의 경우 하나의 접합면으로 트랜지스터의 소스와 또 다른 트랜지스터의 드레인으로 동작하도록 레이아웃 된다. 그리고 출력 단자에 연결되는 드레인 접합면의 개수를 줄어야만 논리게이트의 동작속도를 향상시킬 수 있다. 그러므로 출력단자를 구성하는 드레인 접합의 개수를 수식으로 제시하고 설명함으로서 초보자도 쉽게 레이아웃을 할 수 있도록 하고자 한다.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.11
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• pp.1-10
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• 1998

The advent of deep submicron technologies in the age of portable electronic systems creates a moving target for CAB algorithms, which now need to reduce power as well as delay and area in the existing design methodology. This paper presents a resynthesis algorithm for logic decomposition on mapped circuits. The existing algorithm uses a Huffman encoding, but does not consider glitches and effects on logic depth. The proposed algorithm is to generalize the Huffman encoding algorithm to minimize the switching activity of non-critical subcircuits and to preserve a given logic depth. We show how to obtain a transition-optimum binary tree decomposition for AND tree with zero gate delay. The algorithm is tested using SIS (logic synthesizer) and Level-Map (LUT-based FPGA lower power technology mapper) and shows 58%, 8% reductions on power consumptions, respectively.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.27 no.10
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• pp.917-925
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• 2016

Schmitt Trigger logic is a gate level design method to have hysteresis characteristics to improve noise immunity in digital circuits. Dynamic Threshold voltage MOS(DTMOS) Schmitt trigger circuits can improve noise immunity without adding additional transistors but by controlling substrate bias. The performance of DTMOS Schmitt trigger logic has not been verified yet in standard CMOS process through measurement. In this paper, DTMOS Schmitt trigger logic was implemented and verified using Magna $0.18{\mu}m$ MPW process. DTMOS Schmitt trigger buffer, inverter, NAND, NOR and simple digital logic circuits were made for our verification. Hysteresis characteristics, power consumption, and delay were measured and compared with common CMOS logic gates. EM Immunity enhancement was verified through Direct Power Injection(DPI) noise immunity test method. DTMOS Schmitt trigger logics fabricated using CMOS process showed a significantly improved EM Immunity in 10 M~1 GHz frequency range.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.28A no.12
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• pp.65-72
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• 1991

A cost model of test generation is presented in this paper. The cost of flat gate-level and hierarchical modular level test generation for combinational logic circuits are modeled. The model shows that the cost of hierarchical test generation grows as GlogGunder some assuptions, while the cost of gate-level test generation grows $G^2<$/TEX>, where G is the number of gates in a circuit under test. The cost model derived in this paper is used to explain why some test generation techniques are faster and why hierarchical test generators should be faster than flat test generators on large circuits.

• Proceedings of the IEEK Conference
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• 1998.06a
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• pp.847-850
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• 1998

One of the most difficult problem of designing VLSI is a mixed-circuit design, that is to design circuit containing both analog parts and digital parts. Digital to analog converter and analog to digital converter is a typical case. Especially it can be a serious problem when mixed circuit are put into a large digital circuit like microcontroller. However nowadays this problem is settled by separating analog circuit parts outside the IC. This technique is based on converting a digital signal into a pulse sequence. Then an analog signal is obtained by averaging this pulse sequence at the external low-pass filter. An anlog to digital converter is designed using a stochastic logic instead of a traditional PWM (pulse-width modulation) signal and ins implemente dusing FPGa. Stochastic pulse sequence can be made as a simple circuits and moreover can be mathematically processed by simple circuits -AND gates. The spectral property of stochastic pulse sequence method is better than that of PWM method. So it make easy to design a external low-pass filter. This technique has important advantages, especially the reduction of the ADC cost.

• Journal of the Korean Institute of Telematics and Electronics
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• v.25 no.7
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• pp.734-745
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• 1988

In this paper, it is tried to improve efficiency of the D-algorithm by assigning the logic values effectively on the nodes related to the critical path for back tracing to reduce the number of search nodes when acyclic combinational logic circuits are composed of NAND gates only. For that purpose, LASAR algorithm which is suitable for determining a critical path for back tracing is applied to the D-algorithm and it is implemented by IBM-PC with APL language. The test results on a number of NAND circuits which have multi-fanout, reconvergent and symetric characteristics show that the modified D-algorihtm reduces the number of search nodes in forward and backward tracing and decreases the run time of CPU about 10 percents.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.2
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• pp.125-134
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• 1994

This paper proposes a new top-down technology mapping algorithm for minimizing the chip area and the path delay time of lookup table-based field programmable gate array(FPGA). First, we present the decomposition and factoring algorithm using common subexpre ssion which minimizes the number of basic logic blocks and levels instead of the number of literals. Secondly, we propose a cube packing algorithm considering the decomposition of gates which exceed m-input lookup table. Previous approaches perform the cube packing and the gate decomposition independently, and it causes to increase the number of basic logic blocks. Lastly, the efficiency.

• Proceedings of the IEEK Conference
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• 2000.07a
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• pp.367-370
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• 2000

It is shown that $I_{DDQ}$ testing is very useful for shipping fault-free CMOS ICs. However, test time of $I_{DDQ}$ testing is extremely larger than one of logic testing. In this paper, a new test input sequence generation methodology is proposed to reduce the test time of $I_{DDQ}$ testing. At first, it is Shown that $I_{DDQ}$ test time Will be denominated by charge supply current for load capacitance of gates whose output logic values are changed by test input vector application and the charge current depends on input sequence of test vectors. After that, a test input sequence generation methodology is proposed. The feasibility is checked by some experiments.riments.