Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 2000.07a
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- Pages.367-370
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- 2000
A Test Input Sequence for Test Time Reduction of $I_{DDQ}$ Testing
- Ohnishi, Takahiro (Department of Electrical and Electronic Engineering Faculty of Engineering, The Univ. of Tokushima) ;
- Yotsuyanagi, Hiroyuki (Department of Electrical and Electronic Engineering Faculty of Engineering, The Univ. of Tokushima) ;
- Hashizume, Masaki (Department of Electrical and Electronic Engineering Faculty of Engineering, The Univ. of Tokushima) ;
- Tamesada, Takeomi (Department of Electrical and Electronic Engineering Faculty of Engineering, The Univ. of Tokushima)
- Published : 2000.07.01
Abstract
It is shown that
Keywords