• 대한원격탐사학회:학술대회논문집
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• 대한원격탐사학회 1999년도 Proceedings of International Symposium on Remote Sensing
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• pp.425-428
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• 1999

The radar interferogram represents phase differences between the two synthetic aperture radar observations acquired in slightly different angle. The success of the radar interferometric application largely depends on the quality of the interferogram generated from two or more synthetic aperture radar data sets. We propose here to apply the wavenumber correlation analysis to the in-phase and quadrature phase of the radar interferogram. The wavenumber correlation analysis is to resolve the highly correlated components from the low correlation components by estimating correlation coefficients for each wavenumber component. Through this approach, one can easily distinguish the signal components from the noise components in the wavenumber domain. Therefore, the wavenumber correlation analysis of the radar interferogram can be utilized to design post filter and to estimate the quality of interferogram. We have tested the wavenumber correlation analysis using a Radarsat SAR data pair to demonstrated the effectiveness of

• 한국통신학회논문지
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• 제27권4B호
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• pp.397-402
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• 2002

SAR 데이터를 이용하는 IFSAR 기법은 응용분야가 다양하며, 레이더의 위상정보를 이용하여 고 정밀 고도정보를 추출할 수 있는 유일한 첨단기술이다. 본 논문에서는 IFSAR 기법을 구현하는 전체 알고리즘을 고찰하였다. 그리고 SAR 데이터의 방위방향 aliasing 제거 및 인터페로그램을 생성하는 알고리즘을 제안하였으며, 실험을 통하여 이를 검증하였다. 실험결과 방위방향 aliasing이 제거되고 적합한 인터페로그램이 생성되었다. 따라서 본 논문에서는 정밀한 고도정보를 추출하는데 필수적인 인터페로그램 생성방안 및 IFSAR 알고리즘 주요 모듈에 대한 개발방안을 제시하였다.

• 한국광학회지
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• 제8권3호
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• pp.199-203
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• 1997

안구표면과 같은 미세구면의 변위를 알아내기 위하여 Twyman-Green 간섭계를 이용하였으며 반송무늬(carrier fringe)를 형성시켜 푸리에 변환법으로 미세구면의 변위분포를 측정하였다. 기준위치에서 일정한 반송무늬가 형성되도록 한 후 구면이 변화할 때 반송무늬의 변화방향을 관측하였으며, 반송무늬의 변화방향에 의해 구면의 변화방향을 알아내었다. 푸리에 변환법(Fourier transform method)을 이용하여 CCD카메라에서 받아들여진 한 장의 간섭무늬로부터 위상분포를 얻어내고 구면의 변위 분포를 계산하였다. 공간주파수 영역에서 변위에 대한 정보를 분리함으로써 간섭무늬의 배경분포 및 잡음을 제거하였으며, 구면의 변위에 대한 3차원 분포를 이론적인 계산값의 측정오차가 .lambda./10 이내에서 얻어내었다.

• 대한원격탐사학회지
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• 제27권2호
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• pp.171-180
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• 2011

최근 비행방향으로의 지표변위 관측정밀도를 향상시키는 MAI(multiple aperture SAR interferometry)기법이 개발되었다. 이 MAI기법은 split-beam InSAR 처리를 통하여 forward-looking 간섭도와 backward-looking 간섭도를 제작하고, 이 두 개의 다른 두 간섭도로부터 MAI 간섭도를 생성하여 비행방향 지표변위를 관측하는 것으로 비행방향 지표변위를 0.6의 긴밀도(coherence)에서 약 8 cm의 정밀도로 관측을 가능하게 한다. 현재까지 이러한 MAI 간섭도에서 지형위상은 무시 가능한 것으로 알려져 있었다. 그러나 본 연구에서 2010년 아이티에서 발생한 지진 발생 전과 후의 ALOS PALSAR 간섭쌍을 이용하여 MAl 간섭도를 제작하였고, 이 MAI 간섭도에서 지형위상이 $3.45{\times}10^{-4}$ rad./m로 왜곡되고 있는 것을 보였다. 이러한 지형위상왜곡은 약 98 cm의 비행방향 지표변위에 해당된다. 또한 MAI 간섭도의 지형위상왜곡을효과적으로 보정하는 방법을 제안하였으며, 지형위상왜곡을 약 $7.82{\times}10^{-6}$ rad./m까지 저감시켰다. 이는 제안한 방법이 지형위상왜곡을 효과적으로 제거함을 보인다.

• 한국정밀공학회지
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• 제34권4호
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• pp.259-264
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• 2017

Spectrally resolved interferometry (SRI) is an attractive technique to measure absolute distances without any moving components. In the spectral interferogram obtained by a spectrometer, the optical path difference (OPD) can simply be extracted from the linear slope of the spectral phase. However, SRI has a fundamental measuring range limitation due to maximum and minimum measurable distances. In addition, SRI cannot distinguish the OPD direction because the spectral interferogram is in the form of a natural sinusoidal function. In this investigation, we describe a direction determining SRI and propose the optimal conditions for determining OPD direction. Spectral phase nonlinearity, caused by a dispersive material, effects OPD direction but deteriorates spectral interferogram visibility. In the experiment, various phase nonlinearities were measured by adjusting the dispersive material (BK7) thickness. We observed the interferogram visibility and the possibility of direction determination. Based on the experimental results, the optimal dispersion conditions are provided to distinguish OPD directions of SRI.

• Journal of the Optical Society of Korea
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• 제20권6호
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• pp.784-793
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• 2016

We present a single shot low coherence white light Hilbert phase microscopy (WL-HPM) for quantitative phase imaging of Si optoelectronic devices, i.e., Si integrated circuits (Si-ICs) and Si solar cells. White light interferograms were recorded by a color CCD camera and the interferogram is decomposed into the three colors red, green and blue. Spatial carrier frequency of the WL interferogram was increased sufficiently by means of introducing a tilt in the interferometer. Hilbert transform fringe analysis was used to reconstruct the phase map for red, green and blue colors from the single interferogram. 3D step height map of Si-ICs and Si solar cells was reconstructed at multiple wavelengths from a single interferogram. Experimental results were compared with Atomic Force Microscopy and they were found to be close to each other. The present technique is non-contact, full-field and fast for the determination of surface roughness variation and morphological features of the objects at multiple wavelengths.

• 대한원격탐사학회:학술대회논문집
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• 대한원격탐사학회 2002년도 Proceedings of International Symposium on Remote Sensing
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• pp.308-311
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• 2002

Radar interferometric phase is sensitive to both ground topography and coherent surface displacement. The basic tactics of differential interferometric synthetic aperture radar (DInSAR) technique are to separate the two effects. Applications of DInSAR to Duk-Po area in Busan were studied. In the study area, an abrupt subsidence, possibly caused by sub-way construction, was observed by JERS-1 SAR interferometry. Differential interferograms were generated using twenty-three JERS-1 SAR data acquired between April 24, 1992, and August 7, 1998. Because the area is relatively flat with little topographic relief the topographic effects were not removed. A phase filtering and interferogram techniques were applied to increase fringe clarity as well as to decrease decorrelation error. The stacking improves the quality of interferograms especially when the displacement is discontinuous. The interferograms clearly show the evidence of subsidence along Duk-Po subway railroad. These results demonstrate that the interferogram stacking technique can improve the detectability of radar interferometry to an abrupt displacement and DInSAR is useful to geological engineering applications.

• 대한전자공학회논문지SD
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• 제44권4호
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• pp.10-17
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• 2007

FTIR 분광계는 간섭계를 사용하여 표적 물질에 대한 간섭무늬를 획득하고, 이를 푸리에 변환함으로써 기체상태 물질의 적외선 영역 스펙트럼을 획득하기 위한 유용한 기법이다. 본 논문에서는 불규칙적 위치에서 간섭무늬 샘플링에 관하여 고속 스캔 간섭계의 신호처리에서의 샘플링 노이즈 영향에 대한 연구와 이에 대하여 실험적으로 검증 하였다.

• Current Optics and Photonics
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• 제1권5호
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• pp.505-513
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• 2017

Measuring the thickness of thin films is strongly required in the display industry. In recent years, as the size of a pattern has become smaller, the substrate has become larger. Consequently, measuring the thickness of the thin film over a wide area with low spatial sampling size has become a key technique of manufacturing-yield management. Interferometry is a well-known metrology technique that offers low spatial sampling size and the ability to measure a wide area; however, there are some limitations in measuring the thickness of the thin film. This paper proposes a method to calculate the thickness of the thin film in the following two steps: first, pre-estimation of the thickness with the phase at the peak position of the interferogram at the bottom surface of the thin film, using white-light phase-shift interferometry; second, accurate correction of the measurement by fitting the interferogram with the theoretical pattern through the estimated thickness. Feasibility and accuracy of the method has been verified by comparing measured values of photoresist pattern samples, manufactured with the halftone display process, to those measured by AFM. As a result, an area of $880{\times}640$ pixels could be measured in 3 seconds, with a measurement error of less than 12%.

• Current Optics and Photonics
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• 제6권3호
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• pp.244-251
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• 2022

We introduce a spectral reconstruction method to enhance the spectral resolution in a static modulated Fourier-transform spectrometer. The optical-path difference and the interferogram in the focal plane, as well as the relationship of the interferogram and the spectrum, are discussed. Additionally, for better spectral reconstruction, applications of phase-error correction and apodization are considered. As a result, the transfer function of the spectrometer is calculated, and then the spectrum is reconstructed based on the relationship between the transfer function and the interferogram. The spectrometer comprises a modified Sagnac interferometer. The spectral reconstruction is conducted with a source with central wave number of 6,451 cm^-1 and spectral width of 337 cm^-1. In a conventional Fourier-transform method the best spectral resolution is 27 cm^-1, but by means of the spectral reconstruction method the spectral resolution improved to 8.7 cm^-1, without changing the interferometric structure. Compared to a conventional Fourier-transform method, the spectral width in the reconstructed spectrum is narrower by 20 cm^-1, and closer to the reference spectrum. The proposed method allows high performance for static modulated Fourier-transform spectrometers.