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Analysis of sampling noise effect of Interferometer on FTIR Spectrometer  

Bae, Hyo-Wook (Institute for Advanced Engineering)
Park, Do-Hyun (Institute for Advanced Engineering)
Ra, Sung-Woong (Department of Electrical Information and Communication Eng.)
Choi, Seung-Ki (Agency for Defense Development)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.44, no.4, 2007 , pp. 10-17 More about this Journal
Abstract
FTIR(Fourier Transform Infrared) spectrometry is a useful method to obtain infrared spectra of materials in gas phase by registering the interferogram of a target material using an interferometer, and then performing a Fourier transform on the interferogram to obtain the spectrum. In this paper, sampling noise effect on signal processing of the rapid scan interferometer was studied with relation to sampling the interferogram points at the improper location and empirically verified.
Keywords
FTIR; rotary scan interferometer; sampling noise;
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  • Reference
1 P. R. Griffiths, J.A. de Haseth, 'Fourier Transform Infrared Spectrometry,' John Wiley & Sons, New York 1986
2 T. Hirschfeld, 'Fourier Transform Infrared Spectroscopy: Application to chemical systems,' vol.2, New York 1979