• Proceedings of the Korean Society of Agricultural Engineers Conference
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• 2000.10a
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• pp.340-345
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• 2000

This study was carried out to analyze the light and thermal environment in model greenhouse using infrared absorption film as shading screen and to compare with the case of no shading and using general shading screen such as aluminum foil-backed film, black polyethylene film and thermal blanket. PPFD(photosynthetic photon flux density) of inside the model greenhouse under infrared absorption film was increased by 22% than under general shading screen on the average. And temperature of inside air under infrared absorption film was 2$^{\circ}C$ lower than under general shading screen on the average. So, it is expected that infrared absorption film is useful as shading screen.

• Korean Journal of Materials Research
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• v.13 no.10
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• pp.697-702
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• 2003

FT-IR and thermograph were used to investigate the infrared radiation characteristics of $SiO_2$film made by the sol-gel method. FT-IR spectrum of the $SiO_2$film showed high infrared absorption by Si-O-Si vibration at 1220, 1080, 800 and cm$460^{-1}$ The infrared absorption and radiation wavelength ranges of the $SiO_2$film measured by the integration method coincided with the reflection method, and the infrared emissivity was 0.65, equally. Depending on the bonding of elements, the infrared emissivity was high in the wavelength range where the infrared absorption rate was high, that follows the Kirchhoff's law. The emissivity showed the highest value in the wavelength range between $8∼10\mu\textrm{m}$. $SiO_2$film was considered as an efficient materials for infrared radiator at temperature below 10$0^{\circ}C$. The heat radiation temperature was $117^{\circ}C$ for the aluminum plate, but $146^{\circ}C$ for the $SiO_2$film after 7 minutes heat absorption, consiquently, $29^{\circ}C$ higher than the former.

• Journal of Surface Science and Engineering
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• v.36 no.5
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• pp.406-412
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• 2003

FT-IR and thermography were used to investigate the infrared radiation characteristic of SiO$_2$ film and SiO$_2$/Fe$_2$O$_3$film coated on aluminum. Through FT-TR spectrum, SiO$_2$film showed high infrared absorption in accordance with the stretching vibration of Si-O-Si, and as$ Fe_2$$O_3$was mixed additional absorption band appeared resulting from the stretching vibration of Fe-O at $590cm^{-1}$ and the bond of Si-O-Fe at $900 cm^{-1}$ The two kinds of film measured by the integration method and the reflective method coincided with each other in the wavelength area of infrared absorption and radiation, and corresponded well with Kirchhoff's law as the infrared emissivity is high in wavelength where infrared absorption rate is high. The emissivity of $SiO_2$ film was 0.65 and that of $SiO_2$/Fe$_2$$O_3$film was 0.77, so the addition of$ Fe_2$$O_3$ raised the infrared emissivity by approximately 13%.$ SiO_2$$Fe_2$$O_3$ film is efficient as an infrared radiator at below $100^{\circ}C$. The temperature of heat radiation after 7 minutes was 117$^{\circ}C$ in aluminum plate and $155^{\circ}C$ in $SiO_2$$Fe_2$$O_3$ film, $38^{\circ}C$ higher than the former.

• Journal of the Korean Ceramic Society
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• v.14 no.4
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• pp.226-229
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• 1977

The infrared absorption spectrum of Synthesized magnesite is shown in the wve number region 2510 and 745cm-1. By using Wilson's GF matrices the force constants' of the Urey-Bradley force field were deterined from the infrared absorption frequencies. For magnesite the stretching force constant K=5.41, the bending force constant H=0.46, the repulsive force constant F=1.97, and the force constant for the out-of-plane vibration fθ=0.65md/Å. For calcite they are K=5.51, H=0.38, F=1.88 and fθ=0.64md/Å.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.62 no.12
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• pp.1725-1729
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• 2013

In this paper, the modeling and simulation of infrared absorption in an infrared absorbing structure with the cascaded transmission line model were carried out. Each layer in the infrared absorbing structure can be modeled as a characteristic impedance of the cascaded transmission line model. The simulation results show that the cavity thickness to get a maximum absorption should be less than a quarter wavelength, which is somewhat different from prevalent thickness. It can be assured that the sheet resistance of an absorbing layer to get a maximum absorption is $377{\Omega}/{\square}$, that the thickness of the absorbing layer dose not affect the spectral characteristics of absorption. It is also shown that the thickness of the active layer is not critical to the IR absorption. It can also be assured that the validation of this modeling is proved in comparison with the previous results from similar absorbing structures.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.28 no.11
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• pp.1727-1732
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• 2004

A nickel layer was deposited onto the PZT thin films, serving both as a selective radiation absorption layer and as a top electrode. The absorption properties of such nickel coated multi-layered infrared detectors were studied in the visible and infrared wavelength ranges. The optimal thickness of the nickel layer on our substrate was 10nm. The maximum absorption coefficient of the deposited 10nm thick nickel layer was 0.7 at a 632nm wavelength. However, a striking asymmetric polarization hysteresis loop was observed in these PZT thin films with nickel as the top electrode. This asymmetric polarization was attributed to the difference between the dynamic pyroelectric responses in these Ni/PZT/Pt films poled either positively or negatively before the measurement. A positively poled film showed a 40% higher voltage response than a negatively poled detector.

• Journal of Surface Science and Engineering
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• v.32 no.3
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• pp.297-302
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• 1999

In situ measurement of infrared absorption spectra has been performed during low-temperature plasma-enhanced chemical vapor depositiion of silicon-oxide films using tetramethoxysilane as a silicon source. Several absorption bands due to the reactant molecules are clearly observed before deposition. In the plasma, these bands completely disappear at any oxygen mixing ratio. This result shows that most of the tetramethoxysilane molecules are dissociated in the rf plasma, even C-H bonds. Existence of Si-H bonds in vapor phase and/or on the film surface during deposition has been found by infrared diagnostics. We observed both a decrease in Si-OH absorption and an increase in Si-O-Si after plasma off, which means the dehydration condensation reaction continues after deposition. The rate of this reaction is much slower than the deposition ratio of the films.

• Journal of Sensor Science and Technology
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• v.32 no.1
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• pp.55-61
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• 2023

The objective of this study is to determine the concentrations of mixed gases by establishing a diagnosis method of a transformer using tunable-wavelength optical infrared sensors. Absorption of infrared light by methane, acetylene, and ethylene gases injected is measured from the outputs of the infrared sensors. Regression analysis equations of the gas concentrations are acquired from their respective measured absorption. The obtained concentrations are as follows: -3-9 % errors above 600 ppm(methane), 3 % errors above 1200 ppm(acetylene), and 10 % errors above 500 ppm(ethylene). The concentration inference equations obtained using the individual gases are applicable when the absorption wavelength bands do not overlap. The results of the fault analysis of a transformer using the Duval triangle method and the tunable infrared gas sensors are as follows: temperature faults with -1-1% errors and energy faults with -7-7 % errors.

• Bulletin of the Korean Chemical Society
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• v.17 no.9
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• pp.826-830
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• 1996

Fourier transform infrared (FTIR) temperature studies were performed to examine the microstructural changes that occur in annealing process of the thin films of 1,2-polybutadiene (1,2-PBu)/palladium chloride (PdCl2) complex. The disappearance of the infrared absorption intensities at 1640, 1418, 994 and 910 cm-1 signifies the consumption of 1,2-vinyl groups of 1,2-PBu. The progressive loss of unsaturation and production of methyl groups as a function of temperature were identified by the enhanced infrared absorption intensities at 1447 and 1375 cm-1. The loss of pendent carbon-carbon double bond is considered to involve both palladium-catalyzed addition reaction and thermally induced cyclization.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.20 no.11
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• pp.2085-2092
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• 2016

One of the most important properties of the IC substrate is that it should be uniform over large areas. Among the various physical approaches of wafer defect characterization, special attention is to be payed to the infrared techniques of inspection. In particular, a high spatial resolution, near infrared absorption method has been adopted to directly observe defects in semi-insulating GaAs. This technique, which relies on the mapping of infrared transmission, is both rapid and non-destructive. This method demonstrates in a direct way that the infrared images of GaAs crystals arise from defect absorption process. A new interpretation is presented for the observed reversal of contrast in the infrared absorption of nonuniformly distributed deep centers, related to EL2, in semi-insulating GaAs. The low temperature photoquenching experiment has demonstrated in a direct way that the contrast inverse images of GaAs wafers arise from both absorption and scattering mechanisms rather than charge re-distribution or local variation of bandgap.