• Journal of IKEEE
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• v.22 no.4
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• pp.896-900
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• 2018

Traditionally, Linear Shift Feedback Register (LFSR) has been widely employed to implement Cyclic Redundant Check (CRC) codes for a serial input. Since many applications including network and storage systems demand as high throughput as ever, various efforts have been made to implement CRC hardware to support parallel inputs. Among various parallel schemes, the look-ahead scheme is one of the most widely used schemes due to its short critical path. However, it is very cumbersome to design HDL codes for parallel CRC codes since the look-ahead scheme is inevitable to consider how register and input values move in the next cycles. Thus, this paper proposes a novel CRC hardware generator, which automatically produces HDL codes given a CRC polynomial and parallel factor. The experimental results verify the applicability to use the proposed generator by analyzing the synthesis results from the generated HDL code.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.4
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• pp.34-41
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• 2003

A new technique for detecting parametric faults in mixed signal circuits is proposed Pseudo-random sequence from linear feedback shift register(LFSR) is fed to circuit-under-test (CUT) as stimulus and wavelets are used to compact the transient response under this stimulus into a small number of signature. Wavelet based scheme decomposes the transient response into a number of signal in different frequency bands. Each decomposed signal is compacted into a signature using digital integrator. The digital pulses from LFSR, owing to its pseudo-randomness property, are almost uniform in frequency domain, which generates multi-frequency response when passed through CUT. The effectiveness of this technique is demonstrated in our experimental results.

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.54 no.4
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• pp.243-250
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• 2005

Test methodology is diversity by devices and the number of test pattern is tremendous because the digital circuit includes TTL and CMOS family ICs as well as high density devices such as ROM and RAM. Accordingly, the quick and effective test strategy is required to enhance the test productivity. This paper proposes the test strategy which is able to be applied efficiently to the diversity devices on the digital circuit board by analyzing the structure and characteristic of the digital device. Especially, this test strategy detects the faulted digital device or the faulted digital circuit on the digital board using SSA(Serial Signature Analysis) technique based on the polynomial division theory The SSA technique identifies the faults by comparing the reminder from good device with reminder from the tested device. At this time, the reminder is obtained by enforcing the data stream obtained from output pins of the tested device on the LFSR(Linear Feedback Shift Register) representing the characteristic equation. Also, the method to obtain the optimal signature analysis circuit is explained by furnishing the short bit input streams to the long bit input streams to the LFSR having 8, 12, 16, 20bit input/output pins and by analyzing the occurring probability of error which is impossible to detect. Finally, the effectiveness of the proposed test strategy is verified by simulating the stuck at 1 errors or stuck at 0 errors for several devices on typical 8051 digital board.

• Proceedings of the Korea Institute of Convergence Signal Processing
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• 2003.06a
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• pp.276-279
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• 2003

본 논문에서는 블루투스 장비 간 암호화를 위해 사용되는 암호화 모듈의 설계 및 구현에 관한 내용을 다룬다. 암호화 모듈은 기저 대역내에 암호화 키 생성 모듈과 암호화 엔진 모듈로 구성된다. 암호화 키 생성 모듈은 Cylink사에서 제안한 공개 도메인인 SAFER+(Secure And Fast Encryption Routine) 알고리즘을 사용하여 128bit 키를 생성한다. 그 구성은 키 치환을 위한 치환 함수(key-controlled substitution)와 선형 변환을 위한 PHT(Pseudo-Hadamard Transform)와 Armenian Shuffle 변환기로 구성된다. 암호화 엔진 모듈은 전송 패킷내의 페이로드 데이터와 생성된 사이퍼 키 스트림 데이터와 XOR연산을 통하려 암호화를 행하며 그 구성은 LFSR (Linear Feedback Shift Register)와 합 결합기로 구성된다. 이 중 암호화 키 생성 모듈은 LM(Link Manager)의 PDU(Protocol Data Unit) 패킷을 통해 상호 정보가 교환되므로 암호화키를 생성하는데 있어 시간적 제약이 덜 하다. 따라서 본 논문에서는 변형된 SAFER+ 알고리즘 구현하는데 있어 치환 함수의 덧셈과 XOR, 로그, 지수연산을 바이트 단위의 순차 계산을 수행함으로써 소요되는 하드웨어 용량을 줄이도록 설계하였다. 본 논문에서 제시한 모듈은 블루투스 표준안 버전 1.1에 근거하여 구현하였으며 시뮬레이션 및 테스트는 Xilinx FPGA를 이용하여 검증하였다.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.35 no.6B
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• pp.954-961
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• 2010

Stream cipher was worse than block cipher in terms of security, but faster in execution speed as an advantage. However, since so far there have been many algorithm researches about the execution speed of block cipher, these days, there is almost no difference between them in the execution speed of AES. Therefore an secure and fast stream cipher development is urgently needed. In this paper, we propose a 32bit output fast stream cipher, AA32, which is composed of ASR(Arithmetic Shifter Register) and simple logical operation. Proposed algorithm is a cipher algorithm which has been designed to be implemented by software easily. AA32 supports 128bit key and executes operations by word and byte unit. As Linear Feedback Sequencer, ASR 151bit is applied to AA32 and the reduction function is a very simple structure stream cipher, which consists of two major parts, using simple logical operations, instead of S-Box for a non-linear operation. The proposed stream cipher AA32 shows the result that it is faster than SSC2 and Salsa20 and satisfied with the security required for these days. Proposed cipher algorithm is a fast stream cipher algorithm which can be used in the field which requires wireless internet environment such as mobile phone system and real-time processing such as DRM(Digital Right Management) and limited computational environments such as WSN(Wireless Sensor Network).

• Journal of the Korea Institute of Information Security & Cryptology
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• v.24 no.1
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• pp.51-58
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• 2014

A LFSR is commonly used for various stream cryptography applications to generate random numbers. A Leap-ahead LFSR was presented to generate a multi-bits random number per cycle. It only requires a single LFSR and it has an advantages in hardware complexity. However, it suffers from the significant reduction of maximum period of the generated random numbers. This paper presents the new segmented Leap-ahead LFSR to solve this problem. It consists of two segmented LFSRs. We prove the efficiency of the proposed segmented architecture using the precise mathematical analysis. We also demonstrate the proposed comparison results with other counterparts using Xinilx Vertex5 FPGA. The proposed architecture can increase 2.5 times of the maximum period of generated random numbers compared to the typical Leap-ahead architecture.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.14 no.10
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• pp.2283-2291
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• 2010

The shrinking generator which is one of clock-controlled generator is a very simple generator with good cryptographic properties. A nonlinear sequence generator based on two 90/150 maximum length cellular automata can generate pseudorandom sequences at each cell of cellular automata whose characteristic polynomials are same. The nonlinear sequence generated by cellular automata has a larger period and a higher linear complexity than shrunken sequence generated by LFSRs. In this paper we analyze shrunken-interleaved sequence based on 90/150 maximum length cellular automata. We show that the sequence generated by nonlinear sequence generator based on cellular automata belongs to the class of interleaved sequence. And we give an effective algorithm for reconstructing unknown bits of output sequence based on intercepted keystream bits.

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.49 no.6
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• pp.322-329
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• 2000

BIST(Built-in Self Test) has been considered as the most promising DFT(design-for-test) scheme for the present and future test strategy. The most serious problem in applying BIST(Built-in Self Test) into a large circuit is the excessive increase in test time. This paper is focused on this problem. We proposed a new BIST construction scheme which uses a parallel divide-and-conquer method. The circuit division is performed with respect to some internal nodes called test points. The test points are selected by considering the nodal connectivity of the circuit rather than the testability of each node. The test patterns are generated by only one linear feedback shift register(LFSR) and they are shared by all the divided circuits. Thus, the test for each divided circuit is performed in parallel. Test responses are collected from the test point as well as the primary outputs. Even though the divide-and-conquer scheme is used and test patterns are generated in one LFSR, the proposed scheme does not lose its pseudo-exhaustive property. We proposed a selection procedure to find the test points and it was implemented with C/C++ language. Several example circuits were applied to this procedure and the results showed that test time was reduced upto 1/2151 but the increase in the hardware overhead or the delay increase was not much high. Because the proposed scheme showed a tendency that the increasing rates in hardware overhead and delay overhead were less than that in test time reduction as the size of circuit increases, it is expected to be used efficiently for large circuits as VLSI and ULSI.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.8 s.338
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• pp.7-14
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• 2005

This paper presents a new low power BIST TPG scheme. It uses a transition monitoring window (TMW) that is comprised of a transition monitoring window block and a MUX. When random test patterns are generated by an LFSR, transitions of those patterns satisfy pseudo-random gaussian distribution. The Proposed technique represses transitions of patterns using a k-value which is a standard that is obtained from the distribution of U to observe over transitive patterns causing high power dissipation in a scan chain. Experimental results show that the Proposed BIST TPG schemes can reduce scan transition by about $60\%$ without performance loss in ISCAS'89 benchmark circuits that have large number scan inputs.

• Journal of the Institute of Convergence Signal Processing
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• v.11 no.3
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• pp.244-249
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• 2010

The design of error correction code with low complexity has a good attraction for next generation multi-level cell flash memory. Sharing sub-expressions is effective method to reduce complexity and chip size. This paper proposes a new design method of m-bit parallel BCH encoder based on serial linear feedback shift register structure with low complexity using sub-expression. In addition, general algorithm for obtaining the sub-expression is introduced. The sub-expression can be expressed by matrix operation between sub-matrix of generator matrix and sum of two different variables. The number of the sub-expression is restricted by. The obtained sub-expressions can be shared for implementation of different m-parallel BCH encoder. This paper is not focused on solving a problem (delay) induced by numerous fan-out, but complexity reduction, expecially the number of gates.