• 전기전자학회논문지
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• 제5권1호
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• pp.43-51
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• 2001

메모리의 집적도가 올라갈수록 원치 않는 셀간의 간섭과 동시에 bit-line간의 상호 노이즈도 증가하게 된다. 그리고 높은 고장 검출율을 요구하는 고집적 메모리의 테스트는 많은 테스트 백터를 요구하게 되거나 비교적 큰 추가 테스트 회로를 요구하게 된다. 지금까지 기존의 테스트 알고리즘은 이웃 bit-line의 간섭이 아니라 이웃 셀에 중점을 두었다. 본 논문에서는 NPSFs(Neighborhood Pattern Sensitive Faults)를 기본으로 한 NBLSFs(Neighborhood Bit-Line Sensitive Faults)를 위한 새로운 테스터 알고리즘을 제안한다. 그리고 제안된 알고리즘은 부가 회로를 요구하지 않는다. 메모리 테스트를 위해 기존의 5개의 셀 레이아웃이나 9개의 셀 레이아웃을 사용하지 않고 NBLSF 검출에 최소한 크기인 3개의 셀 레이아웃을 이용하였다. 더구나 이웃 bit-line에 의한 최대의 상호잡음을 고려하기 위해 테스트 동작에 refresh 동작을 추가하였다(예 $write{\rightarrow}\;refresh{\rightarrow}\;read$). 또한 고착고장, 천이고장, 결합고장, 기존의 pattern sensitive 고장, 그리고 이웃 bit-line sensitive 고장 등도 검출될 수 있음을 보여준다.

• 전자공학회논문지A
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• 제32A권12호
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• pp.198-208
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• 1995

BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. Test to detect stuck-open faults in BiCMOS circuit is important, since these faults do sequential behavior and are represented as transition faults. In this paper, proposes a method for efficiently detecting transistor stuck-open faults in BiCMOS circuit by transforming them into slow-to=rise transition and slow-to-fall transition. In proposed method, BiCMOS circuit is transformed into equivalent gate-level circuit by dividing it into pull-up part which make output 1, and pull-down part which make output 0. Stuck-open faults in transistor are modelled as transition fault in input line of gate level circuit which is transformed from given circuit. Faults are detceted by using pull-up part gate level circuit when expected value is '01', or using pull-down part gate level circuit when expected value is '10'. By this method, transistor stuck-open faults in BiCMOS circuit are easily detected using conventional gate level test generation algorithm for transition fault.

• ETRI Journal
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• 제36권6호
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• pp.1066-1069
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• 2014

We propose a lane adaptive recovery scheme for multiple lane faults in a multi-lane-based Ethernet link. In our scheme, when lane faults occur in a link, they are processed not as full link faults but as partial link faults. Our scheme provides a higher link utilization and lower packet loss rate by reusing the available lanes of the link and providing a low recovery time of under a microsecond.

• 전자공학회논문지A
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• 제29A권8호
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• pp.99-109
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• 1992

First, the coupling faults of semiconductor memory are classified in detail. The chained coupling fault is introduced and defined, which results from sequential influencing of the coupling effects among memory cells, and its mapping relation is described. The linked coupling fault and its order are defined. Second, the deterministic “Algorithm GA” is proposed, which detects stuack-at faults, transition faults, address decoder faults, unlinked 2-coupling faults, and unlinked chained coupling faults. The time complexity and the fault coverage are improved in this algorithm. Third, it is proved that the march test of an address sequence can detect 97.796% of the linked 2-coupling faults with order 2. The deterministic “Algorithm NA” proposed can detect to the limit. The time complexity and the fault coverage are improved in this algorithm.

• 전기학회논문지
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• 제58권12호
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• pp.2453-2461
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• 2009

Faults caused by medium-voltage customers have been increased and enlarged their portion in total distribution faults even though we have done many efforts. In the previous paper, we suggested the fault prediction model and fault prevention method for these distribution line faults. However we can't directly apply this prediction model in the field. Because we don't have an useful program to predict those customers causing distribution line faults. This paper presents the construction method of data warehouse in ERP system and the program to find customers who cause distribution line faults in medium-voltage customer's electric facility management applying data mining techniques. We expect that this data warehouse and prediction program can effectively reduce faults resulted from medium-voltage customer facility.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2003년도 하계학술대회 논문집 B
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• pp.801-803
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• 2003

Faults in induction motors can be categorized into mechanical faults and electrical faults, and most mechanical faults result from inferiority or damage of the bearing, while most electrical faults derive from insulation faults of stator windings and rotor bar cracks. When a crack appears on the rotor bar, its efficiency decreases, which increases energy consumption and temperature, reducing the life span of the motor. This kind of fault can only be sensed by the protection relay after the condition has worsened to a certain degree, bringing massive economic loss. This paper will deal with the diagnosis method of rotor bar faults through the load current analysis method of the motor used during operation.

• 대한전자공학회논문지SD
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• 제40권4호
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• pp.74-84
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• 2003

기존의 테스트 알고리즘은 대부분 셀간의 고장에 중심이 맞추어져 있어 메모리의 집적도의 증가와 더불어 일어나는 word-line 과 bit-line 결합 잡음에 의한 고장을 효과적으로 테스트 할 수 없다 본 논문에서는 word-line 결합 capacitance에 의한 고장의 가능성을 제시하고 새로운 고장 모델인 WLSFs(Word-Line Sensitive Faults)을 제안하였다. 또한 word-line 과 bit-line 결합 잡음을 동시에 고려한 알고리즘을 제시하여 고장의 확률을 높였고 고장의 원인을 기존의 고장 모델로는 되지 않음을 보여준다. 제안된 알고리즘은 기존의 기본적인 고장인 고착고장, 천이고장, 그리고 결합고장을 5개의 이웃셀 내에서 모두 검출할 수 있음을 보여준다.

• 대한전기학회논문지:전력기술부문A
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• 제49권8호
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• pp.405-411
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• 2000

When faults occur in transmission lines, the classification of faults is very important. If the fault is HIF(High Impedance Fault), it cannot be detected or removed by conventional overcurrent relays (OCRs), and results in fire hazards and causes damages in electrical equipment or personal threat. The fast discrimination of fault needs to effective protection and treatment and is important problem for power system protection. This paper propolsed the fault detection and discrimination algorithm for LIFs(Low Impedance Faults) and HIFs(High Impedance Faults). This algorithm uses artificial neural networks and variation of 3-phase maximum currents per period while faults. A double lines-to-ground and line-to-line faults can be detected using Neural Network. Also, the other faults can be detected using the value of variation of maximum current. Test results show that the proposed algorithms discriminate LIFs and HIFs accurately within a half cycle.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2000년도 추계종합학술대회 논문집(2)
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• pp.59-62
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• 2000

As the density of memories increases, unwanted interference between cells and coupling noise between bit-lines are increased and testing high density memories for a high degree of fault coverage can require either a relatively large number of test vectors or a significant amount of additional test circuitry. From now on, conventional test algorithms have focused on faults between neighborhood cells, not neighborhood bit-lines. In this paper, a new algorithm for NPSFs, and neighborhood bit-line sensitive faults (NBLSFs) based on the NPSFs are proposed. Instead of the conventional five-cell and nine-cell physical neighborhood layouts to test memory cells, a three-cell layout which is minimum size for NBLSFs detection is used. To consider faults by maximum coupling noise by neighborhood bit-lines, we added refresh operation after write operation in the test procedure(i.e., write \longrightarrow refresh \longrightarrow read). Also, we present properties of the algorithm, such as its capability to detect stuck-at faults, transition faults, conventional pattern sensitive faults, and neighborhood bit-line sensitive faults.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2005년도 추계 학술대회논문집(수송기계편)
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• pp.200-203
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• 2005

Ball bearings not only sustain the system, but permit the rotational component to rotate. Excessive radial or axial load and many other reasons can cause faults to be created and grown rapidly in each component. The grown faults make noise and vibration, which can make the system unstable. Therefore, it is important to detect faults as early as possible. For this reason, there have been many researches on fault detection method of early faults in a ball bearing. The fault defection methods can be categorized to several groups by signal processing methods. Not all the methods are efficient for finding early faults. We select representative methods known as efficient for detecting early faults and compare the results for inspecting which method is effective.