• 품질경영학회지
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• 제34권4호
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• pp.133-138
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• 2006

In this paper, we propose a software reliability growth model (SRGM) based on the testing domain, which is isolated by the executed test cases. This model assumes an imperfect debugging environment in which new faults are introduced in the fault-correction process. We consider that the fault detection rate of NHPP model is changed in the proposed SRGM. We obtain the maximum likelihood estimate, and compare goodness-of-fit with another existing software reliability growth model.

• Journal of Information Technology Applications and Management
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• 제13권4호
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• pp.1-12
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• 2006

Many software reliability growth models(SRGM) have been proposed since the software reliability issue was raised in 1972. The technology to estimate and grow the reliability of developing S/W to target value during testing phase were developed using them. Most of these propositions assumed the S/W debugging testing efforts be constant or even did not consider them. A few papers were presented as the software reliability evaluation considering the testing effort was important afterwards. The testing effort forms which have been presented by this kind of papers were exponential, Rayleigh, Weibull, or logistic functions, and one of these 4 types was used as a testing effort function depending on the S/W developing circumstances. I propose the methology to evaluate the SRGM using least square estimator and maximum likelihood estimator for those 4 functions, and then examine parameters applying actual data adopted from real field test of developing S/W.

• KSII Transactions on Internet and Information Systems (TIIS)
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• 제15권5호
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• pp.1829-1846
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• 2021

Transient faults occur in computation units of a processor, which can cause control flow errors (CFEs) and compromise system reliability. The software-based methods perform illegal control flow detection by inserting redundant instructions and monitoring signature. However, the existing methods not only have drawbacks in terms of performance overhead, but also lack of configurability. We propose a configurable approach CCFCA for detecting CFEs. The configurability of CCFCA is implemented by analyzing the criticality of each region and tuning the detecting granularity. For critical regions, program blocks are divided according to space-time overhead and reliability constraints, so that protection intensity can be configured flexibly. For other regions, signature detection algorithms are only used in the first basic block and last basic block. This helps to improve the fault-tolerant efficiency of the CCFCA. At the same time, CCFCA also has the function of solving confusion and instruction self-detection. Our experimental results show that CCFCA incurs only 10.61% performance overhead on average for several C benchmark program and the average undetected error rate is only 9.29%. CCFCA has high error coverage and low overhead compared with similar algorithms. This helps to meet different cost requirements and reliability requirements.

• 한국통신학회논문지
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• 제27권1C호
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• pp.103-111
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• 2002

IMT-2000에서 RNC의 Main Control Processor는 호 처리를 담당하는 부분으로, 고신뢰도와 실시간성이 요구되므로 결함 허용 시스템의 연구가 중요하다. 이를 위하여 본 연구에서는 태스크 기반 이중화 방안을 제안한다. 이 방안은 Active side의 태스크들이 메시지 단위로 동작하고, 동작 후 변경된 메모리 영역의 데이터를 Standby side에 전달하는 방식을 기본으로 하며, 절체 시 recovery를 위해 메시지를 logging하는 방식이다. 제안한 방식은 dual down 및 동기화 과정의 복잡성을 제거 할 뿐만 아니라, 태스크가 동기를 제어하므로 좀 더 정확한 동기화가 가능하다. 또한 효과적으로 태스크 기반 이중화를 수행하기 위한 결함 탐지 및 처리 방안을 제시한다. 이 방안은 결함 탐지 확률을 높이고 결함에 의하여 발생한 오류 데이터가 Standby side로 전송되는 것을 원천적으로 차단하는 것에 중점을 둔다.

• 한국정보통신학회:학술대회논문집
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• 한국정보통신학회 2021년도 추계학술대회
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• pp.572-573
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• 2021

지능형 경로 이동 기능을 갖춘 드론을 이용하여, IoT형 열화상 기반 태양광 고장 검출 장비의 개발 및 드론과의 연동을 최적화하여 취득된 이미지 데이터의 실시간 분석을 통해 태양광 발전소의 고장 판독을 용이하게 함으로써, 태양광발전소의 발전율 향상과 효율적인 유지관리 모델을 만들 수 있는 기반 기술의 제시와 이미지 차감 분석기법을 이용하여 태양광 패널의 고장을 판독할 수 있는 시스템을 설계한다.

• 한국물환경학회지
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• 제24권1호
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• pp.91-98
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• 2008

This work was performed to develop a model possible to predict the influent flow and influent components, which are one of main disturbances causing process problems at the operation of municipal wastewater treatment plant. In this study, artificial neural network (ANN) was used in order to develop a model that was able to predict the influent flow, $COD_{Mn}$, SS, TN 1 day-ahead, 2day-ahead and 3 day ahead. Multi-layer feed-forward back-propagation network was chosen as neural network type, and tanh-sigmoid function was used as activation function to transport signal at the neural network. And Levenberg-Marquart (LM) algorithm was used as learning algorithm to train neural network. Among 420 data sets except missing data, which were collected between 2005 and 2006 at field plant, 210 data sets were used for training, and other 210 data sets were used for validation. As result of it, ANN model for predicting the influent flow and components 1-3day ahead could be developed successfully. It is expected that this developed model can be practically used as follows: Detecting the fault related to effluent concentration that can be happened in the future by combining with other models to predict process performance in advance, and minimization of the process fault through the establishment of various control strategies based on the detection result.

• 한국산업정보학회논문지
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• 제14권5호
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• pp.61-73
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• 2009

1972년에 소프트웨어의 신뢰도 문제가 제기되면서부터 개발 중인 소프트웨어의 신뢰도를 평가하고 목표치까지 신뢰도를 성장시키는 방법이 연구되었으며, 테스트 기간 동안에 소요되는 비용 문제까지를 포함하여 적정 인도시기를 결정하는 여러 방법이 제안되었다. 이러한 모델들 중 많은 연구에서 소프트웨어 테스트 전 단계를 거쳐서 테스트 노력이 상수인 것으로 가정하거나 또는 아예 고려하지도 않았으나, 그 후 몇몇 논문을 통하여 테스트 노력을 고려한 소프트웨어의 신뢰도 평가가 중요한 인자인 것으로 발포되었다. 여러 산업 현장의 경험 데이터에 의하면 그 형태가 지수함수형, 레일레이형, 웨이불형, 로지스틱형 테스트 노력 함수 중 하나인 것으로 보고되었다. 따라서 본 논문에서는 이 네 가지 형태의 테스트 노력을 가진 소프트웨어의 신뢰도 성장에 필요한 각종 파라미터를 구하는 방법에 대하여 제안한다. 개발 현장에서 관찰된 테스트 노력 데이터와 결함검출을 비교하여 어느 형태의 테스트 노력 곡선이 그 경우에 적합한가를 연구하는 한편, 목표 신뢰도에 맞는 발행 시기를 결정하는 문제를 연구한다.

• 반도체디스플레이기술학회지
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• 제18권4호
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• pp.30-34
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• 2019

We analyzed how the features in plasma information based virtual metrology (PI-VM) for SiO₂ etching depth with variation of 5% contribute to the prediction accuracy, which is previously developed by Jang. As a single feature, the explanatory power to the process results is in the order of plasma information about electron energy distribution function (PI_EEDF), equipment, and optical emission spectroscopy (OES) features. In the procedure of stepwise variable selection (SVS), OES features are selected after PI_EEDF. Informative vector for developed PI-VM also shows relatively high correlation between OES features and etching depth. This is because the reaction rate of each chemical species that governs the etching depth can be sensitively monitored when OES features are used with PI_EEDF. Securing PI_EEDF is important for the development of virtual metrology (VM) for prediction of process results. The role of PI_EEDF as an independent feature and the ability to monitor variation of plasma thermal state can make other features in the procedure of SVS more sensitive to the process results. It is expected that fault detection and classification (FDC) can be effectively developed by using the PI-VM.