• Proceedings of the KIEE Conference
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• 1995.11a
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• pp.36-38
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• 1995

A Single-phase condensor motor is analyzed by FEM coupled with external circuit. The finite element analysis is based on the solution of combined equation both the magnetic field equation from the Maxwell's and the circuit equations of the stator and rotor circuit. The external circuit of the single-phase condensor motor to be analyzed is described using FLUX2D and linked to multiple FEM regions. The simulated results show that the condensor motor analysis with external circuit has good agreement with those of test results.

• The Transactions of the Korean Institute of Electrical Engineers B
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• v.49 no.2
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• pp.85-92
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• 2000

30 kVA rotating-field type Super-Conducting Generator is built and tested with intensive FE(Finite Element) analysis. The generator is driven by VVVF inverter-fed induction motor. Open Circuit Characteristic(OCC) and Short Circuit Characteristic(SCC) are presented in this paper. Also, the test result under the light load(up to 3.6 kW) are given. From the design stage, 2-D FE analysis coupled with the external circuit has been performed. The external circuit includes the end winding resistance and reactance as well as two dampers. When compared with the test data, the FE analysis results show a very good agreement.

• Proceedings of the KIEE Conference
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• 1995.07a
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• pp.36-38
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• 1995

AC servo motors are widely used for various mechatronic devices such as FA, OA and robot machines. To obtain more accurate simulation results, a method of analysis for AC servo motor is described using transient magnetic formulation coupled with external circuit equation of the motor. The external circuit of the motor to be analyzed is described using FLUX2D program and linked to multiple finite element regions. The simulation results show that transient magnetic analysis coupled with extenal circuit has more accurate than those results from magnetostatic.

• Journal of the Korean Institute of Telematics and Electronics S
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• v.34S no.5
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• pp.94-103
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• 1997

It is necesary that analog buffer circuit should drive an external load in the VLSI design such as switched capacitor efilter (SCF), D/A converter, A/d converter, telecommunicatin circuit, etc. The conventional CMOS buffer circuit have many probvlems according as CMOS technique. Firstly, Capacity of large load ar enot able to opeate well. The problem can be solve to use class AB stages. But large load are operated a difficult, because an element of existing CMOS has a quadratic functional relation with inptu and outut voltage versus output current. Secondly, whole circuit of dynamic rang edecrease, because a range of inpt and output voltages go down according as increasing of intergration rate drop supply voltage. In this paper suggests that new differential CMOS line driver make out of operating an external of large load. In telecommunication's chip case transmission line could be a load. It is necessary that a load operate line driver. The proposal circuit is planned to hav ea high generation power rnage of voltage with preservin linearity. And circuit of capability is inspected through simulation program (HSPICE).

• Proceedings of the IEEK Conference
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• 1998.06a
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• pp.847-850
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• 1998

One of the most difficult problem of designing VLSI is a mixed-circuit design, that is to design circuit containing both analog parts and digital parts. Digital to analog converter and analog to digital converter is a typical case. Especially it can be a serious problem when mixed circuit are put into a large digital circuit like microcontroller. However nowadays this problem is settled by separating analog circuit parts outside the IC. This technique is based on converting a digital signal into a pulse sequence. Then an analog signal is obtained by averaging this pulse sequence at the external low-pass filter. An anlog to digital converter is designed using a stochastic logic instead of a traditional PWM (pulse-width modulation) signal and ins implemente dusing FPGa. Stochastic pulse sequence can be made as a simple circuits and moreover can be mathematically processed by simple circuits -AND gates. The spectral property of stochastic pulse sequence method is better than that of PWM method. So it make easy to design a external low-pass filter. This technique has important advantages, especially the reduction of the ADC cost.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.59 no.11
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• pp.2089-2092
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• 2010

There are many cases that interrupt the production process because of malfunctions caused by electronic circuit boards which control equipment, but it is difficult to distinctly identify the causes in many cases. Especially, CMOS devices with the control logic circuit return automatically to normal state after their own faults. Therefore it is not easy to analyze the problems with electronic circuit boards. Recently, nuclear power plant experienced a failure due to the malfunction of electronic circuit boards and it was identified that the reason of the malfunction was because of latch-up phenomenon caused by external surge in electronic devices. This paper presents the causes and the phenomenon of latch-up by experiment and also a way using counter EMF diodes, noise filters and surge protective devices to prevent latch-up phenomenon from electronic circuit boards, finally confirms the effectiveness of the result by experiment.

• Journal of the Korean Society of Industry Convergence
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• v.25 no.3
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• pp.333-340
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• 2022

Recently, the use of large-capacity secondary batteries for electric vehicles is rapidly increasing, and accordingly, the demand for technologies and equipment for battery reliability evaluation is increasing significantly. The existing short circuit test equipment for evaluating the stability of the existing secondary battery consists of relays, MCs, and switches, so when a large current is energized during a short circuit, contact fusion failures occur frequently, resulting in high equipment maintenance and repair costs. There was a disadvantage that repeated testing was impossible. In this paper, we developed an electronic short circuit test device that realizes stable switching operation when a large-capacity power semiconductor switch is energized with a large current, and applied smart ICT technology to this electronic short circuit stability test system to achieve high speed and high precision through communication with the master. It is expected that the inspection history management system based on data measurement, database format and user interface will be utilized as essential inspection process equipment.

• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.1
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• pp.28-33
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• 2013

Spin-torque oscillators (STO) is a new device that can be used as a tunable microwave source in various wireless devices. Spin-transfer torque effect in magnetic multilayered nanostructure can induce precession of magnetization when bias current and external magnetic field are properly applied, and a microwave signal is generated from that precession. We proposed a semi-empirical circuit-level model of an STO in previous work. In this paper, we present a refined STO model which gives more accuracy by considering physical phenomena in the calculation of effective field. Characteristics of the STO are expressed as functions of external magnetic field and bias current in Verilog-A HDL such that they can be simulated with circuit-level simulators such as Hspice. The simulation results are in good agreement with the experimental data.

• The Proceeding of the Korean Institute of Electromagnetic Engineering and Science
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• v.3 no.2
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• pp.3-9
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• 1992

The reponse of the angled two-strip transmission lines illuminated by an external electromagnetic field is estimated by using the circuit concept approach. Calculated terminal voltages reveal convergence to a fixed value as the number of discretization increases. The amplitude patterns of two terminal voltages to all the direction and polarization of the incident field are also calculated.

• Fire Science and Engineering
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• v.22 no.1
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• pp.24-28
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• 2008

This paper studied on the causal analysis of electrical fire by using fuse that it is used with safety device in electrical products. The experimental samples used are glass tube fuse(15 A, $5{\times}20mm$) and temperature fuse(10 A, $72^{\circ}C$). The experiment analyzed on the characteristics of damaged fuse by main causes(short circuit, overload, external flame) of electrical fire. The results showed, in case of glass tube fuse identified different characteristics in external form and element surface and element texture of damaged fuse by main causes of electrical fire. In case of temperature fuse identified different characteristics in external form and sliding contact surface and sliding contact texture of damaged fuse only by external flame.