• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 춘계학술대회 논문집 반도체 재료 센서 박막재료 전자세라믹스
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• pp.42-45
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• 2004

High quality CdTe single crystal for the solar cell fabrication was grown by vertical Bridgman method. The etch pits patterns of {111}surfaces of CdTe etched by Nakagawa solution was observed the {111} A composed of Cd atoms with typical triangle etch pits of pyramid mode. From the photoluminescence measurement on {111}A, we observed free exciton($E_x$) existing only higy quality crystal and neytral acceptor bound exciton($A^0$,X) having very strong peak intensity. Then, the full width at half maximum and binding energy of neutral acceptor bound exciton were 7 meV and 5.9 meV, respectively. By Haynes rule, an actibation energy of impurity was 59 meV. Therefore, the origins on impurity level acting as a neutral acceptor were associated Ag or Cu elements.

• Electronic Materials Letters
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• 제14권6호
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• pp.766-773
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• 2018

In this paper, temperature dependence of the excitonic bands in a mechanically exfoliated tungsten diselenide ($WSe_2$) monolayer is studied using photoluminescence and circular dichroic photoluminescence (PL) in the temperature range between 8 and 300 K. The peak energies associated with the neutral exciton (A), charged exciton (trion) and localized excitons are extracted from the PL spectra revealing a trion binding energy of around 30 meV. The circular dichroic PL measured at 8 K shows about 45% valley polarisation that sharply reduces with increasing temperature to 5% at 300 K with photoexcitation energy of 1.96 eV. A detailed analysis of the emission line-width suggests that the rapid decrease of valley polarisation with the increase of temperature is caused by the strong exciton-phonon interactions which efficiently scatter the excitons into different excitonic states that are easily accessible due to the supply of excess photoexcitation energy. The emission line-width broadening with the increase of temperature indicate residual exciton dephasing lifetime < 100 fs, that correlates with the observed rapid valley depolarisation.

• 한국진공학회지
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• 제16권4호
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• pp.286-290
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• 2007

실리콘 기판위에 성장된 ZnO 나노막대에 NiO를 코팅하여 core-shell 형태의 나노막대를 제작하였다. 이렇게 제작된 나노막대를 수소 분위기에서 열처리한 결과 ZnO 나노막대 표면에 Ni 나노점들이 형성됨을 확인하였다. 이러한 여러 종류의 나노막대의 저온(5K)에서 광발광 (photoluminescence) 특성을 연구하였는데 $ZnO{\rightarrow}NiO-ZnO{\rightarrow}Ni$ 나노점-ZnO 순서로 시료가 변화함에 따라 속박된 exciton들의 전이 에너지와 진폭이 변화함을 확인하였다. ZnO에 비하여 NiO-ZnO 시료의 경우 받개에 속박된 exciton ($A^0X$) 전이가 크게 감소함을 보이나 Ni 나노점-ZnO 시료의 경우 $A^0X$ 전이가 가장 우세함을 보인다. 이러한 현상은 수소화 과정에서 침투한 Ni과 수소 이온이 주개로 작용하였기 때문이다.

• 한국결정성장학회지
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• 제9권1호
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• pp.107-112
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• 1999

고주파 반응성 스퍼터링에 의하여 ZnSe/GaAs 박막을 성장하였다. 박막성장을 위한 본 시스템에서의 최적조건을 찾기 위하여 Ar 압력, sputter 입력전력, 기판온도, 기판과 target 간격의 변화 등을 시도하였다. 성장된 결정의 표면과 격면을 전자현미경으로 관찰했을 때 표면이 균일하게 성장되었으며 기판과 박막의 계면이 평활함을 알 수 있었다. DCRC 측정에 의해 격자 부정합에 의한 변형과 부정합률을 구했다. Photoluminescence 측정으로부터 질소를 주입하지않고 성장한 ZnSe/GaAs 시료는 bound exciton $I_2$세기가 $I_1$보다 우세하게 나타났고 bound exciton $I_2$은 깊은 받개준위인 $I_1\;^d$를 나타냄을 확인할 수 있었다. 성장 중에 질소를 주입한 ZnSe/GaAs 시료에서는 $I_1$ 봉우리가 $I_2$봉우리보다 세기가 매우 컸으며 반폭치값도 작게 나타났다. 이때 bound exciton $I_1$의 근원은 질소의 doping으로 인하여 방출되는 봉우리이며 p형 ZnSe/GaAs 박막으로 성장되었음을 확인하였다.

• 한국진공학회지
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• 제8권3B호
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• pp.297-301
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• 1999

High quality CdTe single crystal for the solar cell fabrication was grown by vertical Bridgman method. The etch pits patterns of {111} surfaces of CdTe etched by Nakagawa solution was observed the {11} A composed of Cd atoms with typical triangle etch pits of pyramid mode. From the photoluminescence measurement of {111} A, we observed free exciton $(E_x)$ existing only high quality crystal and neutral acceptor bound exciton ($A^{\circ}$, X) having very strong peak intensity. Then, the full width at half maximum and binding energy of neutral acceptor bound exciton were 7 meV and 5.9 meV, respectively. By Haynes rule, and activation energy of impurity was 59meV. Therefore, the origins on impurity level acting as a neutral acceptor were associated Ag or Cu elements.

• Journal of Information Display
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• 제10권2호
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• pp.92-95
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• 2009

Highly efficient blue and white phosphorescent organic light-emitting diodes (PHOLEDs) with an exciton-confining structure were investigated in this study. Effective charge confinement was achieved by stacking two emitting layers with different charge-transporting properties, and blue PHOLEDs with a maximum luminance efficiency of 47.9 lm/W were developed by using iridium(III) bis(4,6-(difluorophenyl) pyridinato-N,C2')picolinate (FIrpic) as an electrophosphorescent dopant. Moreover, when the optimized green and red emitting layers were sandwiched between the two stacked blue emitting layers, white PHOLEDs (WOLEDs) with peak external and luminance efficiencies of 19.0% coupling technique.and 54.0 lm/W, respectively, were obtained without the use of any out-coupling technique.

• Journal of Information Display
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• 제8권2호
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• pp.15-19
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• 2007

We have studied the effect of host materials on the electrophosphorescence properties by comparing three different host materials such as tris(8-hydroxyquinoline)-aluminum (III) $(Alq_3)$, bis(8-hydroxyquinoline)-zinc (II) $(Znq_2)$, and 4,4'-N,N' dicarbazole-biphenyl (CBP) doped with a red-emissive phosphorescent dye, 2,3,7,8,12,13,17,18-octaethyl-21H,23H-porphyrin platinum (II) (PtOEP). The EL spectra show a strong red emission (peak at 650 nm) from the triplet excited state of PtOEP and a very weak emission from an electron transport layer of $Alq_3$ and a hole transport layer of N,N'-diphenyl-N,N'-bis(3-methylphenyl)-1,1-biphenyl-4,4'-diamine (TPD). We find that the triplet exciton lifetime and the quantum efficiency decrease in the order of CBP, $Alq_3$, and $Znq_2$ host materials. The results are interpreted as a poor exciton confinement in $Alq_3$, and $Znq_2$ host compared with in CBP. Therefore, it is very important for the triplet-exciton confinement in the emissive layer for obtaining a high efficiency.

• 한국전기전자재료학회논문지
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• 제32권3호
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• pp.196-200
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• 2019

In this study, photoluminescence (PL) analysis was performed to evaluate the optical properties of commercial ZnO substrates. Particular attention was paid to the bound exciton (BX) luminescence, which is usually the strongest emission intensity of commercial substrates. At 15 K, PL analysis revealed that the BX peak due to donor-type impurities (donor-bound-exciton; DX) dominated, while two-electron satellite (TES) emission, donor-accepter pair (DAP) emission, and LO-phonon replica emission were also observed. The impurity concentration of the ZnO substrate was determined to be $10^{15}$ to $10^{16}/cm^3$ by examination of the temperature variation of DAP, while the half width and intensity change of the luminescence revealed that the temperature change of BX can be interpreted almost the same as the analysis of free-exciton emission.

• Transactions on Electrical and Electronic Materials
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• 제15권5호
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• pp.262-264
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• 2014

Pristine ZnO, 3 wt.% Ga-doped (3GZO) and 3 wt.% Ag-doped (3SZO) ZnO nanowires (NWs) were grown using the hot-walled pulse laser deposition (HW-PLD) technique. The doping of Ga and Ag in ZnO NWs was observed by analyzing the optical and chemical properties. We optimized the synthesis conditions, including processing temperature, time, gas flow, and distance between target and substrate for the growth of pristine and doped ZnO NWs. The diameter and length of pristine and doped ZnO NWs were controlled under 200 nm and several ${\mu}m$, respectively. Low temperature photoluminescence (PL) was performed to observe the optical property of doped NWs. We clearly observed the shift of the near band edge (NBE) emission by using low temperature PL. In the case of 3GZO and 3SZO NWs, the center photon energy of the NBE emissions shifted to low energy direction using the Burstein Moss effect. A strong donor-bound exciton peak was found in 3 GZO NWs, while an acceptor-bound exciton peak was found in 3SZO NWs. X-ray photoelectron spectroscopy (XPS) also indicated that the shift of binding energy was mainly attributed to the interaction between the metal ion and ZnO NWs.

• 한국결정성장학회지
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• 제9권2호
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• pp.197-206
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• 1999

수평 전기로에서 $AgInSe_2$다결정을 합성하여 HWE(Hot Wall Epitaxy) 방법으로 $AgInSe_2$ 단결정 박막을 반절연성 GaAs(100) 위에 성장하였다. $AgInSe_2$단결정 박막은 증발원과 기판의 온도를 각각 $610^{\circ}C$, $450^{\circ}C$로 성장하였다. 이때 성장된 단결정 박막의 두께는 3.8$\mu\textrm{m}$였다. 단결정 박막의 결정성의 조사에서 20 K에서 측정한 광발광 스펙트럼은 884.1nm(1.4024eV) 근처에서 excition emission 스펙트럼이 가장 강하게 나타났으며, 또한 이중결정 X-선 회절곡선(DCXD)의 반폭치(FWHM)도 125arcsec로 매우 작은 값으로 측정되어 최적 성장 조건임을 알 수 있었다. Hall 효과는 van der Pauw 방법에 의해 측정되었으며, 온도에 의존하는 운반자 농도와 이동도는 293K에서 각각 $9.58{\times}10^{22} electron/m^3,\; 3.42{\times}10^{-2}m^2/V{\cdot}s$였다. $AgInSe_2$단결정 박막의 광전류 단파장대 봉우리들로부터 20K에서 측정된 $\Delta$Cr(Crystal field splitting)은 0.12eV, $\Delta$So(spin orbit coupling)는 0.29 eV였다. 20K에서 얻어진 광발광 봉우리들 중에서 881.1nm(1.4071 eV)와 882.4nm(1.4051 eV)는 free exciton$E_x$의 upper polariton과 lower polariton인$E_x^U$와 $E_x^L$를 의미하며, 884.1nm(1.4024 eV)는 donor-bound exciton emission에 의한 $I_2$봉우리를, 885.9nm(1.3995 eV)는 acceptor-bound exciton emission에 의한 $I_1$ 봉우리를 각각 나타내었다. 또한 887.5nm(1.3970 eV)에서 관측된 봉우리는 DAP(donor-acceptor pair)에 기인하는 광발광 봉우리로 해석되었다.