• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 춘계학술대회 논문집 유기절연재료 전자세라믹 방전플라즈마 연구회
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• pp.212-216
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• 2001

The conventional tracking testing as IEC-60587 is widely used in surface aging measurement of outdoor insulator because those testing can carry out very short time in Lab-testing. Also IEC-60587 testing is able to offer the standard judgement of relative degradation level of outdoor HV machine/system. Therefore it is very useful method compare to previous conventional tracking testing method and effective Lab-testing method. But surface discharges(SD) have very complex characteristics of discharge pattern so it is required estimation research to development of precise analysis method. In recent, the study of IRR-camera is carrying out discover of temperature of power equipment through condition diagnosis and system development of degradation diagnosis. In this study, SD occurred from procelain insulator, used 22.9[KV] distribution, is measured with partial temperature distribution in real time, the degradation grade of SD is analyzed through produced patterns in SD concentration according to applied time.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 춘계학술대회 논문집 유기절연재료 전자세라믹 방전플라즈마 연구회
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• pp.33-37
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• 2001

Recently, the HFPD measurement testing is widely used in partial discharge measurement of HV machines because HFPD measurement testing receives less influence of external noise and has a merit of good sensitivity. Also HFPD testing is able to offer the judgement standard of degradation level of HV machine and can detect discharge signals in live-line. Therefore it is very useful method compare to previous conventional PD testing method and effective diagnosis method in power transformer that requires live-line diagnosis. But partial discharges have very complex characteristics of discharge pattern so it is required continuous research to development of precise analysis method. In recent, the study of partial discharge is carrying out discover of initial defect of power equipment through condition diagnosis and system development of degradation diagnosis using HFPD(High Frequency Partial Discharge) detection. In this study, simulated transformer is manufactured and HFPD occurred from transformer is measured with broad band antenna in real time, the degradation grade of transformer is analyzed through produced patterns in simulated transformer according to applied voltages.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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• pp.57-61
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• 1999

Electrical stress makes insulating materials aged finally resulting in the dielectric failure. It becomes more and more important to recognize the degree of aging and the life time of the insulating materials since it is directly concerned with the reliability of the insulation system. In this paper, the life time of the Cross-linked Polyethylene(XLPE), the insulation layer in the 154kV-grade power cable, is expected and calculated using statistical and mathematical methods. The simulated results are compared with experimental ones and the life exponent of the material is obtained.

• 한국전기전자재료학회논문지
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• 제13권10호
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• pp.805-811
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• 2000

Reliability of PBGA(plastic ball grid array) package is weak compared with normal plastic packages. The low reliability is caused by low resistance to the popcorn cracking, which is generated by moisture absorption in PCB(prited circuit board). In this paper, plasma treatment process was used and we analyzed its effects to interface adhesion. The contents of C and Cl decrease after plasma treatment but those of O, Ca, N relatively increase. The plasma treatment improves the adhesion between EMC(epoxy molding compound) and PCB(solder mask). The grade of improvement was over 100% Max, which depends on the properties of EMC. The RMS(root mean square) roughness value of the solder mask surface increases to plasma treatment. There is little difference of adhesion in RF power and treatment time.

• 한국전기전자재료학회논문지
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• 제11권5호
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• pp.400-406
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• 1998

We investigated the preparation and guided-mode properties of $Ti:LiNbO_3$ waveguides which were fabricated by Ti in-diffusion. The diffusion method to reduce the Li out-diffusion was proposed. The optical guided-mode and propagation loss based on butt-coupling pigtailed with PMF-input were measured. How to improve the polishing grade of waveguide endfaces is newly proposed in this paper. To show the mode propagations, the BPM simulations of channel waveguide are described.

• 한국전기전자재료학회논문지
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• 제13권2호
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• pp.106-113
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• 2000

This study describes how a properly calibrated simulation method could be used to investigate the latchup immunity characteristics among the various high energy ion implanted CMOS twin well (retro-grade/BILLI/BL) structures. To obtain the accurate quantitative simulation analysis of retrograde well, a global tuning procedure and a set of grid specifications for simulation accuracy and computational efficiency are carried out. The latchup characteristics of BILLI and BL structures are well predicted by applying a calibrated simulation method for retrograde well. By exploring the potential contour, current flow lines, and electron/hole current densities at the holding condition, we have observed that the holding voltage of BL structure is more sensitive to the well design rule (p+to well edge space /n +to well edge space) than to the retrograde well itself.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 춘계학술대회 논문집 유기절연재료 방전 플라즈마
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• pp.18-22
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• 2000

The partial discharge testing is widely used in insulation property measurement because it gives low stress to high voltage equipment which is undertaken tests. Therefore it is very useful method compare to previous destructive methods and effective diagnosis method in power transformer that requires live-line diagnosis. But partial discharges have very complex characteristics of discharge pattern so it is required continuous research to development of precise analysis method. In recent, the study of partial discharge is carrying out discover of initial defect of power equipment through condition diagnosis and system development of degradation diagnosis using HFPD(High Frequency Partial Discharge) detection. In this study, simulated transformer is manufactured and HFPD occurred from transformer is measured with broad band antenna in real time, the degradation grade of transformer is analyzed through produced patterns in simulated transformer according to applied voltages.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 춘계학술대회 논문집 유기절연재료 방전 플라즈마
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• pp.29-32
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• 2000

The partial discharge testing is widely used in insulation property measurement because it gives low stress to high voltage equipment which is undertaken tests. Therefore it is very useful method compare to previous destructive methods and effective diagnosis method in power transformer that requires on-line & on-site diagnosis. But partial discharges have very complex characteristics of discharge pattern so it is required continuous research to development of precise analysis method. In recent, the study of partial discharge is carrying out discover of initial defect of power equipment through condition diagnosis and system development of degradation diagnosis using HFPD(High Frequency Partial Discharge) detection. In this study, simulated transformer is manufactured and PD/HFPD occurred from transformer is measured with broad band antenna in real time, the degradation grade of transformer is analyzed through produced patterns in simulated transformer according to applied voltages.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 춘계학술대회 논문집 유기절연재료 방전 플라즈마
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• pp.59-63
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• 2000

The conventional tracking testing as IEC-60587 is widely used in surface aging measurement of outside insulator because those testing can carry out very short time in Lab testing. Also IEC-60587 testing is able to offer the standard judgement of relative degradation level of outside HV machine. Therefore it is very useful method compare to previous conventional tracking testing method and effective Lab testing method. But surface discharges(SD) have very complex characteristics of discharge pattern so it is required estimation research to development of precise analysis method. In recent, the study of IIR-camera is carrying out discover of temperature of power equipment through condition diagnosis and system development of degradation diagnosis. In this study, SD occurred from IEC-60587 is measured with partial temperature distribution in real time, the degradation grade of SD is analyzed through produced patterns in IEC-60587 according to applied time.

• 한국전기전자재료학회논문지
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• 제26권3호
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• pp.190-193
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• 2013

Power MOSFET and Power IGBT is develop in power savings, high efficiency, small size, high reliability, fast switching, low noise. Power MOSFET can be used high-speed switching transistors devices. Power MOSFET is devices the voltage-driven approach switching devices are design to handle on large power, power supplies, converters. In this paper, design the 80V MOSFET Planar Gate type, and design the Trench Gate type for realization of low on-resistance. For both structures, by comparing and analyzing the results of the simulation and characterization.