• 제목/요약/키워드: electron temperature measurement

검색결과 371건 처리시간 0.035초

Effects of Substrate Temperature on Properties of Sb-doped SnO2 Thin Film

  • Do Kyung, Lee;Young-Soo, Sohn
    • 센서학회지
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    • 제31권6호
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    • pp.371-375
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    • 2022
  • Antimony-doped tin oxide (ATO) thin films, one type of transparent conductive oxide (TCO) films, were prepared on a SiO2-coated glass substrate with different substrate temperatures by a radio-frequency magnetron sputtering system. Structural, optical, and electrical characteristics of the deposited ATO films were analyzed using X-ray diffraction, scanning electron microscopy, alpha-step, ultraviolet-visible spectrometer, and Hall effect measurement. The substrate temperature during deposition did not affect the basic crystal structure of the films but changed the grain size and film thickness. The optical transmittance of the ATO films deposited at different substrate temperatures was over 70%. The lowest sheet resistance and resistivity were 8.43 × 102 Ω/sq, and 0.3991 × 10-2 Ω·cm, respectively, and the highest carrier concentration and mobility were 2.36 × 1021 cm-3 and 6.627 × 10-2 cm2V-1s-1, respectively, at a substrate temperature of 400 ℃.

천연해수 용액에서 STS 304와 용융 알루미늄 도금된 STS 304의 캐비테이션-침식 환경 하에서의 전기화학적 특성 (Electrochemical Characteristics under Cavitation-Erosion Environment of STS 304 and Hot-Dip Aluminized STS 304 in Sea Water Solution)

  • 정상옥;김성종
    • 한국표면공학회지
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    • 제49권1호
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    • pp.26-31
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    • 2016
  • In this paper, the characteristics of a cavitation-erosion damage behavior on the STS 304 and hot-dip aluminized STS 304 under cavitation environment in sea water solution was investigated. The electrochemical experiments were carried out by potential measurement, anodic/cathodic polarization test, Tafel analysis, and also galvanostatic experiment in current density variables for the samples. The apparatus of cavitation-electrochemical experiment was manufactured in compliance with modified ASTM G-32 standard, with the conditions of sea water temperature of $25^{\circ}C$ and the measurement, amplitude of $30{\mu}m$. The damage behavior was analyzed by an observation of surface mophologies and a measurement of damage depth by a scanning electron microscope(SEM) and a 3D microscope, respectively, after electrochemical test. After polarization experiment under cavitation environment, much higher damage depths for the hot-dip aluminized STS 304 were observed comparing to the untreated STS 304. In addition, higher corrosion current density in hot-dip aluminized STS 304 presented than that of untreated STS 304 as a result of Tafel analysis.

TOWARD A NEXT GENERATION SOLAR CORONAGRAPH: DIAGNOSTIC CORONAGRAPH EXPERIMENT

  • Cho, Kyung-Suk;Yang, Heesu;Lee, Jae-Ok;Bong, Su-Chan;Kim, Jihun;Choi, Seonghwan;Park, Jongyeob;Cho, Kyuhyoun;Baek, Ji-Hye;Kim, Yeon-Han;Park, Young-Deuk
    • 천문학회지
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    • 제53권4호
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    • pp.87-98
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    • 2020
  • The Korea Astronomy and Space Science Institute (KASI) has been developing a next-generation coronagraph (NGC) in cooperation with NASA to measure the coronal electron density, temperature, and speed simultaneously, using four different optical filters around 400 nm. KASI organized an expedition to demonstrate the coronagraph measurement scheme and the instrumental technology during the 2017 total solar eclipse (TSE) across the USA. The observation site was in Jackson Hole, Wyoming, USA. We built an eclipse observation system, the Diagnostic Coronal Experiment (DICE), composed of two identical telescopes to improve the signal-to-noise ratio. The observation was conducted at four wavelengths and three linear polarization directions in the limited total eclipse time of about 140 seconds. We successfully obtained polarization data for the corona but we were not able to obtain information on the coronal electron temperature and speed due to the low signal-to-noise ratio of the optical system and strong emission from prominences located at the western limb. In this study, we report the development of DICE and the observation results from the eclipse expedition. TSE observation and analysis with our self-developed instrument showed that a coronagraph needs to be designed carefully to achieve its scientific purpose. We gained valuable experience for future follow-up NASA-KASI joint missions: the Balloon-borne Investigation of the Temperature and Speed of Electrons in the Corona (BITSE) and the COronal Diagnostic EXperiment (CODEX).

다양한 온도에서 열처리한 씨앗 층 위에 열수화법을 이용한 ZnO 나노 막대의 성장

  • 배영숙;김영이;김동찬;공보현;안철현;최미경;우창호;한원석;조형균
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2009년도 하계학술대회 논문집
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    • pp.433-433
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    • 2009
  • ZnO-based materials have been extensively studied for optoelectronic applications due to their superiors physical properties such as wide direct bandgap (~3.37 eV), large exciton binding energy (~60 meV), high transparency in the visible region, and low cost. Especially, one-dimensional (1D) ZnO nanostructures have attracted considerable attention owing to quantum confinement effect and high crystalline quality. Additionally, various nanostructures of ZnO such as nanorods, nanowires, nanoflower, and nanotubes have stimulated the interests because of their semiconducting. and piezoelectric properties. Among them, vertically aligned ZnO nanorods can bring the improved performance in various promising photoelectric fields including piezo-nanogenerators, UV lasers, dye sensitized solar cells, and photo-catalysis. In this work, we studied the effect of the annealing temperature of homo seed layers on the formation of ZnO nanorods grown by hydrothermal method. The effect of annealing temperature of seed layer on the length and orientation of the nanorods was investigated scanning electron microscopy investigation. Transmission electron microscopy and X-ray diffraction measurement were performed to understand the effect of annealing temperatures of seed layers on the formation of nanorods. Moreover, the optical properties of the seed layers and the nanorods were studied by room temperature photoluminescence.

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Deep Submicron SOI n-채널 MOSFET에서 열전자 효과들의 온도 의존성 (Dependence of Hot Electron Effects on Temperature in The Deep Submicron SOI n-Channel MOSFETs)

  • 박근형;차호일
    • 한국정보전자통신기술학회논문지
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    • 제11권2호
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    • pp.189-194
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    • 2018
  • 현재 대부분의 집적회로는 bulk CMOS 기술을 사용해서 제작되고 있으나 전력 소모를 낮추고 die 크기를 줄이기에는 한계점에 도달해있다. 이러한 어려움을 획기적으로 극복할 수 있는 초저전력 기술로서 SOI CMOS 기술이 최근에 크게 각광을 받고 있다. 본 논문에서는 100 nm Thin SOI 기판 위에 제작된 n-채널 MOSFET 소자들의 열전자 효과들의 온도 의존성에 관한 연구 결과들이 논의되었다. 소자들이 LDD 구조를 갖고 있음에도 불구하고 열전자 효과들이 예상보다 더 심각한 것으로 나타났는데, 이는 채널과 기판 접지 사이의 직렬 저항이 크기 때문인 것으로 믿어졌다. 온도가 높을수록 채널에서의 phonon scattering의 증가와 함께 열전자 효과는 감소하였는데, 이는 phonon scattering의 증가는 결과적으로 열전자의 생성을 감소시켰기 때문인 것으로 판단된다.

Measurement of Plasma Parameters (Te and Ne) and Reactive Oxygen Species in Nonthermal Bioplasma Operating at Atmospheric Pressure

  • Choi, Eun Ha;Kim, Yong Hee;Kwon, Gi Chung;Choi, Jin Joo;Cho, Guang Sup;Uhm, Han Sup;Kim, Doyoung;Han, Yong Gyu;Suanpoot, Pradoong
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
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    • pp.141-141
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    • 2013
  • We have generated the needle-typed nonthermal plasma jet by using an Ar gas flow at atmospheric pressure. Diagnostics of electron temperature anddensity is critical factors in optimization of the atmospheric plasma jet source in accordance with the gas flow rate. We have investigated the electron temperature and density of plasma jet by selecting the four metastable Ar emission lines based on the atmospheric collisional radiative model and radial profile characteristics of current density, respectively. The averaged electron temperature and electron density for this plasma jet are found to be ~1.6 eV and ~$3.2{\times}10^{12}cm^{-3}$, respectively, in this experiment. The densities of OH radical species inside the various bio-solutions are found to be higher by about 4~9 times than those on the surface when the argon bioplasma jet has been bombarded onto the bio-solution surface. The densities of the OH radicalspecies inside the DI water, DMEM, and PBS are measured to be about $4.3{\times}10^{16}cm^{-3}$, $2.2{\times}10^{16}cm^{-3}$, and $2.1{\times}10^{16}cm^{-3}$, respectively, at 2 mm downstream from the surface under optimized Ar gas flow 250 sccm.

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DC 전류 측정을 위한 탄소나노튜브와 합금으로 구성된 칩 타입 션트저항체의 전기적 특성 (Electrical Properties of Chip Typed Shunt Resistor Composed of Carbon Nanotube and Metal Alloy for the Use of DC Current Measurement)

  • 이선우
    • 한국전기전자재료학회논문지
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    • 제34권2호
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    • pp.126-129
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    • 2021
  • We fabricated plate typed shunt resistors composed of carbon nanotube (CNT) and metal alloy for measuring DC current. CNT plates were prepared from dispersed CNT/Urethane solution by squeezing method. Cu/Ni alloys were prepared from composition-designed alloy wires for adjusting the temperature coefficient of resistance (TCR) by pressing them. As well, we fabricated a hybrid resistor by squeezing the CNT/Urethane solution on the metal alloy plate directly. In order to confirm the composition ratio of the Cu/Ni alloy, we used an energy-dispersed X-ray spectroscopy (EDX). Cross-section and surface morphology were analyzed by using a scanning electron microscopy (SEM). Finally, we measured the initial resistance of 2.35 Ω at 25℃ for the CNT paper resistor, 7.56 mΩ for the alloy resistor, and 7.38 mΩ for the hybrid resistor. The TCR was also measured to be -778.72 ppm/℃ at the temperature range between 25℃ to 125℃ for the CNT paper resistor, 824.06 ppm/℃ for the alloy resistor, and 17.61 ppm/℃ for the hybrid resistor. Some of the hybrid resistors showed a near-zero TCR of 1.38, -2.77, 2.66, and 5.49 ppm/℃, which might be the world best-value ever reported. Consequently, we could expect an error-free measurement of the DC current using this resistor.

전자빔 증착법에 의한 CdSe/GaAs epilayer의 성장과 그 전기-광학적 특성 (Growth and electro-optical characteristics of CdSe/GaAs epilayers prepared by electron beam epitaxy)

  • 양동익;신영진;이춘호;최용대;유평렬
    • 한국결정성장학회지
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    • 제7권1호
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    • pp.70-75
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    • 1997
  • Electron beam 증착법을 보완하여 GaAs(100)기판위에 cubic(zinc blende) CdSe 에피충을 성장시켜 그의 특성을 조사하였다 .. CdSe 에피충의 격자 상수는 6.077 A였으며, 배향 성은 ECP 패번에 의하여 확인되고 결정성은 DCXR curve로 관찰하였다. 상온에서 측정된 H Hall data로는 에피충의 운반자 농도와 이통도는 각각 1018cm-3, 102cm2N' see 정도임을 알았 고 30 K에서 측정한 PC spectra peak는 cubic CdSe의 free exciton에 기인된 것으로 1.746 e eV에서 예리하게 나타냐고 있음을 보여주고 있다.

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퇴적 온도와 열처리에 따른 SiC에 퇴적된 Ga 도핑된 ZnO의 구조 및 전기적 특성 (Deposition Temperature and Annealing Temperature Dependent Structural and Electrical Properties of Ga-doped ZnO on SiC)

  • 이정호;구상모
    • 한국전기전자재료학회논문지
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    • 제25권2호
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    • pp.121-124
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    • 2012
  • The characteristics of Ga-doped zinc oxide (GZO) thin films deposited at different deposition temperatures (TS~250 to $550^{\circ}C$) on 4H-SiC have been investigated. Structural and electrical properties of GZO thin film on n-type 4H-SiC(0001) were investigated by using x-ray diffraction(XRD), atomic force microscopy(AFM), Hall effect measurement, barrier height from I-V curve and Auger electron spectroscopy(AES). XRD $2\theta$ scan shows GZO thin film has preferential orientation with c-axis perpendicular to SiC substrate surface. The lowest resistivity ($\sim1.9{\times}10^{-4}{\Omega}cm$) was observed for the GZO thin film deposited at $400^{\circ}C$. As deposition temperature increases, barrier height between GZO and SiC was increased. Whereas, resistivity of GZO thin films as well as barrier height between GZO and SiC were increased after annealing process in air atmosphere. It has been found that the c-axis oriented crystalline quality as well as the relative amount of activated Ga3+ ions and oxygen vacancy may affect the electrical properties of GZO films on SiC.

열처리 온도에 따른 AZO 박막의 구조적, 전기적, 광학적 특성 분석 (Charaterization of structural, electrical, and optical properties of AZO thin film as a function of annealing temperature)

  • 고기한;서재근;이상준;황채영;배은경;임무길;최원석
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2009년도 제40회 하계학술대회
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    • pp.1343_1344
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    • 2009
  • In this work, transparent conducting Al-doped zinc oxide (AZO) films were prepared on Corning glass substrate by RF magnetron sputtering using an Al-doped ZnO target (Al: 2 wt.%) at room temperature and all films were deposited with athickness of 150 nm. We investigated the effects of the post-annealing temperature and the annealing ambient on structural, electrical and optical properties of AZO films. The films were annealed at temperatures ranging from 300 to $500^{\circ}C$ in steps of $100^{\circ}C$ using rapid thermal annealing equipment in oxygen. The thickness of the film was observed by field emission scanning electron microscopy (FE-SEM) and grain size was calculated from the XRD spectra using the Scherrer equation and their electrical properties were investigated using a hole measurement and the reflectance of AZO films was investigated by UV-VIS spectrometry.

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