• Proceedings of the Optical Society of Korea Conference
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• 2007.02a
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• pp.163-164
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• 2007

We have described a polarization selective diffraction grating using liquid crystal polymer and experimentally demonstrated. From the experimental results, intensity ratios of 1.171 for p-polarization and of 0.0072 for s-polarization are achieved by 650nm wavelength, respectively.

• Proceedings of the KIEE Conference
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• 1987.07a
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• pp.47-50
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• 1987

There are various holographic recording materials, such as Dichromated Gelatin, Silver Halide, Thermoplastic, Photoresist. In this paper especially, we used Photoresist to make the phase holographic grating. Deep-groove diffractive grating formed in relatively thin holographic recording material is to express high diffraction efficiency. Phase holographic grating recorded In photoresist can be used very practical because it has the high diffraction efficiency, and it is possible to make a replication easily. So, it has the merit in recording the optical holographic grating than any other materials.

• Korean Journal of Optics and Photonics
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• v.15 no.1
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• pp.56-62
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• 2004

We present a diffraction grating interferometer of large equivalent wavelength specially designed for flatness testing of rough surfaces. Two transmission diffraction gratings are illuminated on the object under test by use of two measurement beams with different angles of incidence, which yields a large equivalent wavelength. This interferometer design minimizes unnecessary diffraction rays and the systematic error caused by the diffraction gratings, and provides a large working distance and easy alignment. To improve the measurement accuracy, phase shifting technique is applied and the equivalent wavelength error caused by defocus is calibrated. Test results obtained from mirror surfaces and machined rough surfaces are discussed.

• Journal of the Optical Society of Korea
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• v.1 no.1
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• pp.36-40
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• 1997

Bragg diffraction of a strong reference beam from a steady-state photorefractive grating is measured experimentally and an analytic prediction is derived from the coupled wave equations of two-beam energy coupling. The relation between Bragg diffraction and two-beam coupling is used to check the mechanism of photorefractive grating formation.

• Journal of the Korean Society for Precision Engineering
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• v.9 no.1
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• pp.82-95
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• 1992

There is the high interest for sensing of tool wear with the aim of controlling machine tools productivity from the point of view of qualitity. Difficulties in this measurement are also known. This study is on the development of measurement setup for crater wear by CCD image inturning. In this study, the crater wear measurement system consists of the He-Ne gas laser, diffraction grating. CCD camera, noise filter, slit, microcomputer, diverging lens, converging lens and so on. He-Ne laser beam passes through a diverging lens and a diffraction grating is positioned properly. A converging lens focuses so that the interference fringes can be obtained on the crater wear. Performance test revealed that the developed image technique provides precise, absolute tool-wear quantification and reduces human measurement errors. The results obtained are as follows 1. The digitizing of one image requires less than 2ses. 2. It can give detailed information on crater wear with limited times and errors 3. All parameters required by specification are easily obtained for several points of the cutting edge.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1988.05a
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• pp.20-23
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• 1988

Effect of light irradiation on evaporated chalcogenide glass films of an As-Se-S-Ge system has been studied. Utiling this characteristics diffraction grating of the amorphous film was obtained. Parameters such as film thickness, composition, and exporsure time influencing the diffraction efficiency were also studied. The maximum value of the diffraction efficiency achieved was 4.6% in an $As_{75}Se_{15}S_{35}-Ge_{10}$ film.

• Proceedings of the Optical Society of Korea Conference
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• 2003.07a
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• pp.166-167
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• 2003

아조벤젠 그룹의 trans-cis-trans photo isomerization 특성에 의한 광배향 (photoinduced orientation) 성질을 이용하여 아조벤젠이 함유된 폴리머박막에 표면 부조 격자 (surface relief grating)를 만드는 것은 널리 알려져 있다. 특히 최근 들어, 비선형 물질의 주기적인 배열 구조를 만들기 위해서 surface relief grating을 corona poling 하는 방법들이 연구되어 지고 있다. poling된 surface relief grating은 poling 방향으로의 azo분자의 극질서가 유도되기 때문에, $C_{{\infty}v}$점대칭을 가지는 비등방 회절 격자(anisotropic grating)가 되며 2차 비선형 특성 중의 하나인 선형 전기 광학 효과를 나타낼 수 있다. (중략)

• Transactions on Electrical and Electronic Materials
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• v.5 no.6
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• pp.219-222
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• 2004

This paper discovers that there are some peculiar properties that can remove holography grating, which was made in chacogenide thin film by impressed voltage. The thin films were used are $As_{40}Ge_{10}Se_{15}S_{35}$, and we use He-Ne laser in order to form thin films. I-V curved line in a thin film before a lattice was made has the critical point, about 3.7 V. Moreover, the I-V curved line increased current intensity at over 4 V after it made thin film. In addition, while holography grating is being made, and when it has the highest diffraction efficiency, a lattice can be deleted if put more voltage into it.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.16 no.8
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• pp.736-739
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• 2003

We prepared the chalcogenide As$\_$40/Ge$\_$10/Se$\_$15/S$\_$35/, Se$\_$75/Ge$\_$25/ thin film. Holographic grating was formed by the He-Ne laser( λ =633 nm). Annealing at 100$^{\circ}C$ and 200$^{\circ}C$ has been used to change the optical property of chalcogenide thin films for holographic grating formation. As the results, large variation of the optical property was generated at the As$\_$40/Ge$\_$10/Se$\_$15/S$\_$35/ chalcogenide film. Diffraction efficiency of the As$\_$40/Ge$\_$10/Se$\_$15/S$\_$35/ film has been enhanced about three times

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.25 no.3
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• pp.213-217
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• 2012

In this study, we have investigated the holographic grating formation on Ag-doped amorphous As-Ge-Se-S thin films. The dependence of diffraction efficiency as afunction of Ag layer thickness has been investigated in this amorphous chalcogenide films. Holographic gratings was formed using [P:P] polarized Diode Pumped Solid State laser (DPSS, 532.0 nm). The diffraction efficiency was obtained by +1st order intensity. The results were shown that the diffraction efficiency of Ag/AsGeSeS double layer thin films for the Ag thickness, the maximum grating diffraction efficiency using 60 nm Ag layer is 0.96%.