• 한국전자파학회논문지
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• 제27권2호
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• pp.208-211
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• 2016

단말 간 직접통신(D2D: Device-to-Device) 기술은 지리적으로 근접한 단말들이 네트워크 인프라를 거치지 않고 직접적으로 통신하는 기술이다. 특히 셀룰러 네트워크에서는 D2D 통신이 셀룰러 자원을 공간적으로 재사용함으로써 주파수 이용 효율을 향상시킬 수 있다. 하지만 셀룰러 단말의 채널 시변성 및 그에 따른 자원 할당 변화로 인해 셀룰러 자원을 재사용하는 D2D 단말의 채널 품질을 지속적으로 유지할 수 없고, 셀룰러 단말 또한 간섭에 의해 성능이 열화될 수 있다. 따라서 본 논문에서는 D2D 링크가 셀룰러 네트워크의 상향링크 자원을 재사용하는 상황에서 셀룰러 단말의 채널 변화로 인한 D2D 통신 링크의 성능 열화를 완화하는 방안으로 비면허 대역 주파수 자원을 D2D 통신에 보조적으로 활용하는 기술을 제안한다. 모의실험을 통해 제안한 기술의 효용성을 검증한다.

• 한국통신학회논문지
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• 제38A권4호
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• pp.371-380
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• 2013

셀룰러 인프라 구조에 기반하여 셀룰러 스펙트럼을 공유하여 사용하는 D2D (Device-to-Device) 통신은 몇 가지 장점이 있지만, 셀룰러 네트워크 사용자와 동일한 자원을 사용하므로 간섭이 생기는 큰 문제점이 있다. 특히, 다중 셀에서 셀 경계 D2D 사용자와 셀룰러 사용자 간의 간섭 문제는 셀의 중심부에서보다 훨씬 강도가 높게 발생한다. 따라서, 본 논문에서는 인접한 셀들의 중심에 위치한 SRN (Shared Relay Node)이 셀룰러 링크와 D2D 링크 사이에 발생하는 간섭을 효율적으로 관리하는 새로운 방식을 제안한다. 제안하는 SRN은 기존 Type II 릴레이와 같이 데이터 재전송 역할을 수행할 뿐만 아니라, 추가적으로 간섭 관리를 위한 기능을 수행하기 때문에 몇 가지 기능이 새롭게 정의된다. 셀룰러 링크와 D2D 링크 사이에 간섭 관리를 위한 구체적인 방법으로 본 논문에서는 셀 경계영역 사용자들의 간섭 회피를 위한 SRN 기반 자원할당 방법을 제안하고 이들의 성능을 모의실험을 통해 검증하였다.

• 한국안전학회지
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• 제30권4호
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• pp.39-45
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• 2015

This paper deals with development of integrity evaluation instrument for the power line surge protective device. A reliable power supply is an essential element in the developed information and communication society by highly advances in IT technology. However, the lightning incidence also increased with the recent extreme weather events. In Korea, in order to protect the electrical system from lightning surge, SPD(Surge Protective Device) has been used for these past 30 years. However, the method of diagnosing the safety of the SPD in the industry is insufficient. In this paper, SPD integrity evaluation system was composed of a variable DC power source unit, voltage-current sensor and the embedded controller. In order to measure V-I characteristics of MOV, 3 type samples were degraded by impulse current generator. After impulse tests, the varistor voltage of all samples and nonlinearity coefficient were decreased. It confirmed the utility of the developed equipment by this experimental test and the reliability of SPD is expected for surge accident prevention when applied to industrial plant.

• 전자공학회논문지A
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• 제33A권10호
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• pp.130-138
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• 1996

The size of a device needs to scale down to increase its integrity and speed. As the size of the device is reduced, the hot-carrier degradation that severely effects on device reliabilty is concerned. In this paper, sub-micron buried-channel P-MOSFETs were fabircated, and the hot-carrier effects were invetigated. Also the hot-carrier effect in the buired-channel P-MOSFETs and the surface-channel P-MOSFETs were compared with simulation programs using SUPREM-4 and MINIMOS-4. This paper showed that the electric characteristics of sub-micron P-MOSFET are different from those of N-MOSFET. Also it showed that the punchthrough voltage ( $V_{pt}$ ) was abruptly drop after applying the stress and became almost 0V when the channel lengths were shorter than 0.6.mu.m. The lower punchthrough voltage causes the device to operte poorly by the deterioration of cut-off characteries in the switching mode. We can conclude that the buried channel P-MOSFET for CMOS circuits has a limit of the channel length to be around 0.6.mu.m.

• 한국안전학회지
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• 제32권2호
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• pp.21-26
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• 2017

According to the data of Korea Occupational Safety and Health Agency, electric shock accidents during recent 11 years exceeded more than 60% in architecture/other and construction work, the countermeasures for safety are required in the harsh environment of a construction site where moving electric machines and equipments are widely used. The establishment of countermeasure for insulation degradation and defect is required, in consideration of increasing trend for accidents caused by defective insulation among low voltage electrical installation each year. The aim of this study is to propose the policy about portable electrical tool standards and/or worker's safety standards for preventing electric shock accidents on safety workings, and is to develop the technology and the safety device to prevent electric shock for accident prevention reduction through experiments. It obtained the followings through this study; statistical data analysis of late about 10 years of electric shock-related industrial accidents analysis and portable electric tools; safety device development of 'device for testing continuous grounding and power shut-down' to prevent electric shock from portable electric tools. Furthermore, developed results and proposal in this study will help to prevent the electric shock accidents from portable electric tools and will be expected the utilization of policy formulation, educational data and field supplement of the safety device, and etc.

• KIEAE Journal
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• 제14권3호
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• pp.97-103
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• 2014

This study aimed at developing integrated logic for controlling heating device and openings of the double skin facade buildings. Two major logics were developed-rule-based control logic and artificial neural network based control logic. The rule based logic represented the widely applied conventional method while the artificial neural network based logic meant the optimal method. Applying the optimal method, the predictive and adaptive controls were feasible for supplying the advanced thermal indoor environment. Comparative performance tests were conducted using the numerical computer simulation tools such as MATLAB (Matrix Laboratory) and TRNSYS (Transient Systems Simulation). Analysis on the test results in the test module revealed that the artificial neural network-based control logics provided more comfortable and stable temperature conditions based on the optimal control of the heating device and opening conditions of the double skin facades. However, the amount of heat supply to the indoor space by the optimal method was increased for the better thermal conditioning. The number of on/off moments of the heating device, on the other hand, was significantly reduced. Therefore, the optimal logic is expected to beneficial to create more comfortable thermal environment and to potentially prevent system degradation.

• 한국전기전자재료학회논문지
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• 제24권8호
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• pp.669-673
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• 2011

The charged particle type display is a kind of the reflectivity type display and shows an image by absorption and reflection of external light source, which has keep an image without additional electric power because of bistability. In this paper, we made a device whose cell gap is $56\;{\mu}m$ and also analyzed driving and memory characteristics by applied driving voltages. As a result, we found that the driving voltage and memory effect depend on q/m(charge to mass ratio) of charged particle. In this case of breakdown voltage, the devices showed degradation of reflectivity and memory effect due to irregular movement of overcharged particles. In addition, contrast ratio of the device varies with memory effect. Thus, we consider that device needs uniform q/m for improvement of electric and optical properties and memory effect.

• Nuclear Engineering and Technology
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• 제54권12호
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• pp.4422-4430
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• 2022

Studying the effects of gamma radiation on the instrumentation and control (I&C) system of a nuclear power plant is critical to the successful and reliable operation of the plant. In the accidental scenario, the adverse environment of ionizing radiation affects the performance of the I&C system and it leads to inaccurate and incomprehensible results. This paper reports the effects of gamma radiation on the AT89C51RD2, a commercial-off-the-shelf 8-bit high-performance flash microcontroller. The microcontroller, selected for the device under test for this study is used in the remote terminal unit for a nuclear power plant. The custom circuits were made to test the microcontroller under different gamma doses using a ⁶⁰Co gamma source in both ex-situ and in-situ modes. The device was exposed to a maximum dose of 1.5 kGy. Under this hostile environment, the performance of the microcontroller was studied in terms of device current and voltage changes. It was observed that the microcontroller device can operate up to a total absorbed dose of approximately 0.6 kGy without any failure or degradation in its performance.

• 대한전자공학회논문지
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• 제24권3호
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• pp.400-407
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• 1987

Thin film filter type 4-channel wavelength division multiplexing(WDM) device was designed and fabricated for the application in optical subscriber loop system. It has multi-mode fiber pigtails and four wavelength division consisting of 0.81, 0.89, 1.2 and 1.3 um. The evaluated performances are 1-2d B of insertion loss(connector loss excluded)and 30-35d B of crosstalk attenuation for all channels. The performance of the fabricated device was tested in the wideband optical transmission experiment, where the SNR degradation due to the crosstalk of the device was found to be within a measurement error.

• 마이크로전자및패키징학회지
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• 제17권4호
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• pp.19-26
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• 2010

포화 수증기압이 고출력 형광체 변환 백색 LED 패키지의 열화현상에 미치는 주요 스트레스 인자임을 확인하였다. 또한 LED 패키지의 가속 수명시험을 통하여 포화 수증기압이 효과적인 가속 스트레스 인자임을 확인하였다. 실험조건은 350 mA 전류를 인가한 것과 인가하지 않은 2가지 조건에 대해 $121^{\circ}C$, 100% R.H. 환경에서 최대 168 시간동안 진행하였다. 실험결과 두 실험 모두 광 출력 감소, 스펙트럼 세기의 감소, 누설전류 및 열 저항이 증가하였다. 고장분석 결과 광 특성의 열화는 봉지재의 변색과 기포에 의해 발생한 것으로 나타났다. LED 패키지의 변색과 흡습에 의해 유발되는 기계적 (hygro-mechanical) 스트레스에 의한 기포 발생은 패키지 열화의 중요한 인자로써, 포화 수증기압이 고출력 LED의 수명시험 시간을 단축하기 위한 스트레스 인자로 적합함을 알 수 있었다.