• 제목/요약/키워드: device degradation

검색결과 474건 처리시간 0.031초

Dynamic Self-Heating Effects of Bulk and SOI FinFET with Realistic Device Structure (실제적 구조를 가진 벌크 및 SOI FinFET에서 발생하는 동적 self-heating 효과)

  • Ryu, Heesang;Chung, Hayun Cecillia;Yang, Ji-Woon
    • Journal of the Institute of Electronics and Information Engineers
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    • 제52권10호
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    • pp.64-69
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    • 2015
  • Self-heating effects of bulk and SOI FinFETs on device structure are examined with TCAD simulation. The degradation of drive current in SOI FinFET is severer than that of bulk one in steady-state condition as expected. However, it is shown that the dynamic self-heating effects of SOI FinFETs are comparable to those of bulk FinFETs for high speed logic operation, especially in realistic device structure.

Passivation Layers for Organic Thin-film-transistors

  • Lee, Ho-Nyeon;Lee, Young-Gu;Ko, Ik-Hwan;Kang, Sung-Kee;Lee, Seong-Eui;Oh, Tae-Sik
    • Transactions on Electrical and Electronic Materials
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    • 제8권1호
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    • pp.36-40
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    • 2007
  • Inorganic layers, such as SiOxNy and SiOx deposited using plasma sublimation method, were tested as passivation layer for organic thin-film-transistors (OTFTs). OTFTs with bottom-gate and bottom-contact structure were fabricated using pentacene as organic semiconductor and an organic gate insulator. SiOxNy layer gave little change in characteristics of OTFTs, but SiOx layer degraded the performance of OTFTs severely. Inferior barrier properties related to its lower film density, higher water vapor transmission rate (WVTR) and damage due to process environment of oxygen of SiOx film could explain these results. Polyurea and polyvinyl acetates (PVA) were tested as organic passivation layers also. PVA showed good properties as a buffer layer to reduce the damage come from the vacuum deposition process of upper passivation layers. From these results, a multilayer structure with upper SiOxNy film and lower PVA film is expected to be a superior passivation layer for OTFTs.

Reliability Analysis for Deuterium Incorporated Gate Oxide Film through Negative-bias Temperature Instability and Hot-carrier Injection (Negative-bias Temperature Instability 및 Hot-carrier Injection을 통한 중수소 주입된 게이트 산화막의 신뢰성 분석)

  • Lee, Jae-Sung
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • 제21권8호
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    • pp.687-694
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    • 2008
  • This paper is focused on the improvement of MOS device reliability related to deuterium process. The injection of deuterium into the gate oxide film was achieved through two kind of method, high-pressure annealing and low-energy implantation at the back-end of line, for the purpose of the passivation of dangling bonds at $SiO_2/Si$ interface. Experimental results are presented for the degradation of 3-nm-thick gate oxide ($SiO_2$) under both negative-bias temperature instability (NBTI) and hot-carrier injection (HCI) stresses using P and NMOSFETs. Annealing process was rather difficult to control the concentration of deuterium. Because when the concentration of deuterium is redundant in gate oxide excess traps are generated and degrades the performance, we found annealing process did not show the improved characteristics in device reliability, compared to conventional process. However, deuterium ion implantation at the back-end process was effective method for the fabrication of the deuterated gate oxide. Device parameter variations under the electrical stresses depend on the deuterium concentration and are improved by low-energy deuterium implantation, compared to conventional process. Our result suggests the novel method to incorporate deuterium in the MOS structure for the reliability.

Wireless Power Receiving System Implemented on a Flexible Substrate for Wearable Device Applications (웨어러블 기기 응용을 위한 플렉서블 무선 전력 수신 시스템)

  • Lee, Yongwan;Lim, Jongsik;Han, Sang-Min
    • The Transactions of The Korean Institute of Electrical Engineers
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    • 제64권5호
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    • pp.739-745
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    • 2015
  • In this paper, a flexible wireless power receiving system is proposed for wearable device applications. The proposed system is designed with printable component configuration to be integrable to textile material. While the defected ground structures(DGSs) are utilized for planar printable filter designs, direct impedance matching technique is considered for flexible circuit performance. The proposed system has been implemented on a flexible substrate with a thickness of 5 mils, and experimented for power conversion efficiencies and converted voltages. In order to evaluate the hardware flexibility, the system performance are measured a bended circuit board at a radius of curvature of 5 cm. The system performance is analyzed for the degradation due to the curvature. The proposed system has shown the excellent capability of far-field wireless power transfer systems in flexible device environments.

Real-time Distributed Control in Virtual Device Network with Uncertain Time Delay for Predictive Maintenance (PM) (가상 디바이스 네트워크상에서 불확실한 시간지연을 갖는 실시간 분산제어를 이용한 예지보전에 관한 연구)

  • Kiwon Song;Gi-Heung Choi
    • Journal of the Korean Society of Safety
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    • 제18권3호
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    • pp.154-160
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    • 2003
  • Uncertain time delay happens when the process reads the sensor data and sends the control input to the plant located at a remote site in distributed control system. As in the case of data network using TCP/IP, VDN that integrates both device network and data network has uncertain time delay. Uncertain time delay can cause degradation in performance and stability of distributed control system based on VDN. This paper first investigates the transmission characteristic of VDN and suggests a control scheme based on the Smith's predictor to minimize the effect of uncertain varying time delay. The validity of the proposed control scheme is demonstrated with real-time velocity control of DC servo motor located in remote site.

A SiGe HBT of Current Gain Modulation By using Passivation Ledge (Passivation Ledge를 이용한 SiGe HBT의 Current Gain Modulation)

  • You, Byoung-Sung;Cho, Hee-Yup;Ku, Youn-Seo;Ahn, Chul
    • Proceedings of the IEEK Conference
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    • 대한전자공학회 2003년도 하계종합학술대회 논문집 II
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    • pp.771-774
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    • 2003
  • Passivation Ledge's device is taken possession on one-side to the Emitter in this Paper. contact used in this paper Pt as Passivation Ledge of device to use Schottky Diode which has leitmotif, It is accomplished Current Modulation that we wish to do purpose using this device. Space Charge acts as single device which is becoming Passivation to know this phenomenon. This device becomes floating as well as Punched-through. V$_{L}$ (Voltage for Ledge) = - 0.5V ~ 0.5V variable values , PD(Partially Depleted ; Λ>0), as seeing FD(Fully Depleted ; A = 0) maximum electric current gains and Gummel Plot of I-V characteristics (V$_{L}$ = 0.1/ V$_{L}$ = -0.1 ). Becomming Degradation under more than V$_{L}$ = 0.1 , less than V$_{L}$ =-0.05 and Maximum Gain(=98.617076 A/A) value in the condition V$_{L}$ = 0.1. A Change of Modulation is electric current gains by using Schottky Diode and Extrinsic Base PN Diode of Passivation Ledge to Emitter Depletion Layer in HBT of Gummel-Poon I-V characteristics and the RF wide-band electric current gains change the Modulation of CE(Common-Emitter) amplifier description, and it had accomplished Current Gain Modulation by Ledge Bias that change in high frequency and wide bands. wide bands.s.

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A Camera Image Authentication Using Image Information Copyright Signature for Mobile Device without Distortion (무왜곡 휴대용 단말기 영상정보 권한서명을 이용한 카메라 영상 인증)

  • Han, Chan-Ho;Moon, Kwang-Seok
    • Journal of the Institute of Convergence Signal Processing
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    • 제15권2호
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    • pp.30-36
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    • 2014
  • Quality and resolution of camera in mobile device is improved significantly. In this paper, we propose block-based information hide techniques without image distortion for mobile device to solve image degradation in conventional watermarking methods. Information of image is composed with text such as camera maker, model, date, time, etc. Each text is converted to $8{\times}8$ pixel blocks and is added to the bottom of image. Generally image including block based information for image authentication are compressed using JPEG in mobile device. The vertical line value in JPEG header is modified by original size of image sensor. This technique can hide the block based authentication information using general decoder. In the experimental results, JPEG file size is slightly increased within 0.1% for the proposed block based authentication information encoding. Finally proposed methods can be adopted for various embedded systems using medical image, smart phone and DSLR camera.

Characterization of Acetylene Plasma-Polymer Films: Recovery of Surface Hydrophobicity by Aging

  • Kim, Jeong-Ho;Kim, Tae-Hyung;Oh, Jung-Geun;Noh, Seok-Hwan;Lee, Jeong-Soo;Park, Kyu-Ho;Ha, Sam-Chul;Kang, Heon
    • Bulletin of the Korean Chemical Society
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    • 제30권11호
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    • pp.2589-2594
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    • 2009
  • Aging phenomena of plasma polymer films were studied by using the surface analysis techniques of contact angle measurement, X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (TOFSIMS), and atomic force microscopy (AFM). The polymer films were grown on an aluminum substrate by using a plasma polymerization method from a gas mixture of acetylene and helium, and the films were subsequently modified to have a hydrophilic surface by oxygen plasma treatment. Aging of the polymer films was examined by exposing the samples to water and air environments. The aging process increased the hydrophobicity of the surface, as revealed by an increase in the advancing contact angle of water. XPS analysis showed that the population of oxygen-containing polar groups increased due to the uptake of oxygen during the aging, whereas TOF-SIMS analysis revealed a decrease in the polar group population in the uppermost surface layer. The results suggest that the change in surface property from hydrophilic to hydrophobic nature results from the restructuring of polymer chains near the surface, rather than compositional change of the surface. Oxidative degradation may enhance the mobility and the restructuring process of polymer chains.

A Study on Degradation Phenomenon Based on Test Device for Aging Diagnosis in PV Modules (태양광모듈의 열화진단 시험장치 구현 및 열화특성에 관한 연구)

  • Shen, Jian;Lee, Hu-Dong;Tae, Dong-Hyun;Rho, Dae-Seok
    • Journal of the Korea Academia-Industrial cooperation Society
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    • 제22권6호
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    • pp.27-35
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    • 2021
  • Generally, a proper evaluation method of the aging phenomenon of PV modules is required as the electrical performance and lifespan of PV modules can degrade significantly due to several environmental factors, while they are generally known as devices that are used semi-permanently for more than 20 years. On the other hand, there is a lack of objectivity in the existing evaluation method of the aging phenomenon, which compares the adjusted PV output based on STC with the initial PV module specifications due to the data distortion while adjusting the measured data. Therefore, this study implemented a test device for an aging diagnosis to measure and collect actual data from a PV module section and modeled the data for aging using MATLAB S/W to minimize the variability of the PV output, communication error, and delay. Furthermore, this study confirmed the usefulness of the presented test device for aging diagnosis of the PV modules by diagnosing the total period and yearly-basis degradation rate of aging PV modules as 25.73% and 1.55%, respectively, according to the on-site output characteristics of the PV modules by season.

Corrosion mitigation of photovoltaic ribbon using a sacrificial anode (희생양극을 이용한 태양광 리본의 부식 저감)

  • Oh, Wonwook;Chan, Sung-Il
    • Journal of the Korea Academia-Industrial cooperation Society
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    • 제18권3호
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    • pp.681-686
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    • 2017
  • Degradation is commonly observed in field-aged PV modules due to corrosion of the photovoltaic ribbon. The reduced performance is caused by a loss of fill factor due to the high series resistance in the PV ribbon. This study aimed to mitigate the degradation by corrosion using five sacrificial anodes - Al, Zn and their alloys - to identify the most effective material to mitigate the corrosion of the PV ribbon. The corrosion behavior of the five sacrificial anode materials were examined by open circuit potential measurements, potentiodynamic polarization tests, and galvanic current density and potential measurements using a zero resistance ammeter. Immersion tests for 120 hours were also conducted using materials and damp heat test tests were performed for 1500 hours using 4 cell mini modules. The Al-3Mg and Al-3Zn-1Mg sacrificial anodes had a low corrosion rate and reduced drop in power, making then suitable for long-term use.