• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.27 no.2
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• pp.208-211
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• 2016

Device-to-Device communication(D2D) enables devices in proximity to communicate directly without going through the network infrastructure. In particular, D2D communications in a cellular network can improve the spectral efficiency by allowing the reuse of cellular resources. However, it is not easy to maintain the channel quality of the D2D links and to protect the cellular links from the D2D interferences, since the resource allocations for the cellular users will change with time due to the time-varying nature of the cellular channels. To mitigate the performance degradation of D2D links, we propose to exploit unlicensed bands as auxiliary resources when the D2D links share the uplink cellular resources. The effectiveness of the proposed scheme is verified through simulations.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.38A no.4
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• pp.371-380
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• 2013

D2D (Device-to-Device) communication on an underlying cellular infrastructure which exploits the same spectrum has several advantages such as increased resource utilization and improved cellular coverage. However, D2D communication system needs to cope with ICI (Inter-Cell Interference) and interference between cellular and D2D links. As a result, macro UEs (User Equipments), especially those located near cell edge, will suffer from serious link performance degradation. We propose a novel interference avoidance mechanism assisted by SRN (Shared Relay Node) in this paper. SRN not only performs data re-transmission as a usual Type II relay but also has several features newly defined to avoid interference between cellular and D2D links. In particular, we suggest resource allocation methods based on the SRN for effective interference avoidance, and evaluate their performance through computer simulations.

• Journal of the Korean Society of Safety
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• v.30 no.4
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• pp.39-45
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• 2015

This paper deals with development of integrity evaluation instrument for the power line surge protective device. A reliable power supply is an essential element in the developed information and communication society by highly advances in IT technology. However, the lightning incidence also increased with the recent extreme weather events. In Korea, in order to protect the electrical system from lightning surge, SPD(Surge Protective Device) has been used for these past 30 years. However, the method of diagnosing the safety of the SPD in the industry is insufficient. In this paper, SPD integrity evaluation system was composed of a variable DC power source unit, voltage-current sensor and the embedded controller. In order to measure V-I characteristics of MOV, 3 type samples were degraded by impulse current generator. After impulse tests, the varistor voltage of all samples and nonlinearity coefficient were decreased. It confirmed the utility of the developed equipment by this experimental test and the reliability of SPD is expected for surge accident prevention when applied to industrial plant.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.10
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• pp.130-138
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• 1996

The size of a device needs to scale down to increase its integrity and speed. As the size of the device is reduced, the hot-carrier degradation that severely effects on device reliabilty is concerned. In this paper, sub-micron buried-channel P-MOSFETs were fabircated, and the hot-carrier effects were invetigated. Also the hot-carrier effect in the buired-channel P-MOSFETs and the surface-channel P-MOSFETs were compared with simulation programs using SUPREM-4 and MINIMOS-4. This paper showed that the electric characteristics of sub-micron P-MOSFET are different from those of N-MOSFET. Also it showed that the punchthrough voltage ( $V_{pt}$ ) was abruptly drop after applying the stress and became almost 0V when the channel lengths were shorter than 0.6.mu.m. The lower punchthrough voltage causes the device to operte poorly by the deterioration of cut-off characteries in the switching mode. We can conclude that the buried channel P-MOSFET for CMOS circuits has a limit of the channel length to be around 0.6.mu.m.

• Journal of the Korean Society of Safety
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• v.32 no.2
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• pp.21-26
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• 2017

According to the data of Korea Occupational Safety and Health Agency, electric shock accidents during recent 11 years exceeded more than 60% in architecture/other and construction work, the countermeasures for safety are required in the harsh environment of a construction site where moving electric machines and equipments are widely used. The establishment of countermeasure for insulation degradation and defect is required, in consideration of increasing trend for accidents caused by defective insulation among low voltage electrical installation each year. The aim of this study is to propose the policy about portable electrical tool standards and/or worker's safety standards for preventing electric shock accidents on safety workings, and is to develop the technology and the safety device to prevent electric shock for accident prevention reduction through experiments. It obtained the followings through this study; statistical data analysis of late about 10 years of electric shock-related industrial accidents analysis and portable electric tools; safety device development of 'device for testing continuous grounding and power shut-down' to prevent electric shock from portable electric tools. Furthermore, developed results and proposal in this study will help to prevent the electric shock accidents from portable electric tools and will be expected the utilization of policy formulation, educational data and field supplement of the safety device, and etc.

• KIEAE Journal
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• v.14 no.3
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• pp.97-103
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• 2014

This study aimed at developing integrated logic for controlling heating device and openings of the double skin facade buildings. Two major logics were developed-rule-based control logic and artificial neural network based control logic. The rule based logic represented the widely applied conventional method while the artificial neural network based logic meant the optimal method. Applying the optimal method, the predictive and adaptive controls were feasible for supplying the advanced thermal indoor environment. Comparative performance tests were conducted using the numerical computer simulation tools such as MATLAB (Matrix Laboratory) and TRNSYS (Transient Systems Simulation). Analysis on the test results in the test module revealed that the artificial neural network-based control logics provided more comfortable and stable temperature conditions based on the optimal control of the heating device and opening conditions of the double skin facades. However, the amount of heat supply to the indoor space by the optimal method was increased for the better thermal conditioning. The number of on/off moments of the heating device, on the other hand, was significantly reduced. Therefore, the optimal logic is expected to beneficial to create more comfortable thermal environment and to potentially prevent system degradation.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.24 no.8
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• pp.669-673
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• 2011

The charged particle type display is a kind of the reflectivity type display and shows an image by absorption and reflection of external light source, which has keep an image without additional electric power because of bistability. In this paper, we made a device whose cell gap is $56\;{\mu}m$ and also analyzed driving and memory characteristics by applied driving voltages. As a result, we found that the driving voltage and memory effect depend on q/m(charge to mass ratio) of charged particle. In this case of breakdown voltage, the devices showed degradation of reflectivity and memory effect due to irregular movement of overcharged particles. In addition, contrast ratio of the device varies with memory effect. Thus, we consider that device needs uniform q/m for improvement of electric and optical properties and memory effect.

• Nuclear Engineering and Technology
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• v.54 no.12
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• pp.4422-4430
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• 2022

Studying the effects of gamma radiation on the instrumentation and control (I&C) system of a nuclear power plant is critical to the successful and reliable operation of the plant. In the accidental scenario, the adverse environment of ionizing radiation affects the performance of the I&C system and it leads to inaccurate and incomprehensible results. This paper reports the effects of gamma radiation on the AT89C51RD2, a commercial-off-the-shelf 8-bit high-performance flash microcontroller. The microcontroller, selected for the device under test for this study is used in the remote terminal unit for a nuclear power plant. The custom circuits were made to test the microcontroller under different gamma doses using a ⁶⁰Co gamma source in both ex-situ and in-situ modes. The device was exposed to a maximum dose of 1.5 kGy. Under this hostile environment, the performance of the microcontroller was studied in terms of device current and voltage changes. It was observed that the microcontroller device can operate up to a total absorbed dose of approximately 0.6 kGy without any failure or degradation in its performance.

• Journal of the Korean Institute of Telematics and Electronics
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• v.24 no.3
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• pp.400-407
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• 1987

Thin film filter type 4-channel wavelength division multiplexing(WDM) device was designed and fabricated for the application in optical subscriber loop system. It has multi-mode fiber pigtails and four wavelength division consisting of 0.81, 0.89, 1.2 and 1.3 um. The evaluated performances are 1-2d B of insertion loss(connector loss excluded)and 30-35d B of crosstalk attenuation for all channels. The performance of the fabricated device was tested in the wideband optical transmission experiment, where the SNR degradation due to the crosstalk of the device was found to be within a measurement error.

• Journal of the Microelectronics and Packaging Society
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• v.17 no.4
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• pp.19-26
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• 2010

We found that saturated water vapor pressure is the most dominant stress factor for the degradation phenomenon in the package for high-power phosphor-converted white light emitting diode (high power LED). Also, we proved that saturated water vapor pressure is effective acceleration stress of LED package degradation from an acceleration life test. Test conditions were $121^{\circ}C$, 100% R.H., and max. 168 h storage with and without 350 mA. The accelerating tests in both conditions cause optical power loss, reduction of spectrum intensity, device leakage current, and thermal resistance in the package. Also, dark brown color and pore induced by hygro-mechanical stress partially contribute to the degradation of LED package. From these results, we have known that the saturated water vapor pressure stress is adequate as the acceleration stress for shortening life test time of LED packages.