• Journal of Welding and Joining
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• 제32권3호
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• pp.74-80
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• 2014

Due to environmental regulations (RoHS, WEEE and ELV) of the European Union, electronics and automotive electronics have to eliminate toxic substance from their devices and system. Especially, reliability issue of lead-free solder joint is increasing in car electronics due to ELV (End-of-Life Vehicle) banning from 2016. We have prepared engine control unit (ECU) modules soldered with Sn-40Pb and Sn-3.0Ag-0.5Cu (SAC305) solders, respectively. Degradation characteristics of solder joint strength were compared with various conditions of automobile environment such as cabin and engine room. Thermal cycle test (TC, $-40^{\circ}C$ ~ ($85^{\circ}C$ and $125^{\circ}C$), 1500 cycles) were conducted with automotive company standard. To compare shear strength degradation rate with eutectic and Pb-free solder alloy, we measured shear strength of chip components and its size from cabin and engine ECU modules. Based on the TC test results, finally, we have known the difference of degradation level with solder alloys and use environmental conditions. Solder joints degradation rate of engine room ECU is superior to cabin ECU due to large CTE (coefficient of thermal expansion) mismatch in field condition. Degradation rate of engine room ECU is 50~60% larger than cabin room electronics.

• 품질경영학회지
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• 제38권4호
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• pp.504-511
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• 2010

A fuze detonator comprising star shells is an important device so that its failure usually leads to failure of the shells. In this paper, accelerated degradation tests of RD1333 (lead azide) using temperature stress were performed, and then degradation data of explosive power for the detonator were analyzed to predict the storage lifetime of detonator. Degradation data analysis to estimate the storage lifetime is based on a distribution-based degradation process. Statistical distribution parameters of explosive power degradation measures at each time were estimated for each temperature level, and then reliability of the detonator for each accelerated temperature level was estimated using both time-varying distribution parameters and critical level of explosive power. Arrhenius model was applied to estimate storage lifetime of the detonator under the field temperature condition. Accelerated distribution-based degradation analysis to estimate storage lifetime is explained in detail, and estimation results are compared to field data of storage lifetime in this paper.

• 한국전기전자재료학회논문지
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• 제18권11호
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• pp.996-1000
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• 2005

Experimental results are presented for the degradation of 3 nm-thick gate oxide $(SiO_2)$ under both Negative-bias Temperature Instability (NBTI) and Hot-carrier-induced (HCI) stresses using P and NMOSFETS, The devices are annealed with hydrogen or deuterium gas at high-pressure $(1\~5\;atm.)$ to introduce higher concentration in the gate oxide. Both interface trap and oxide bulk trap are found to dominate the reliability of gate oxide during electrical stress. The degradation mechanism depends on the condition of electrical stress that could change the location of damage area in the gate oxide. It was found the trap generation in the gate oxide film is mainly related to the breakage of Si-H bonds in the interface or the bulk area. We suggest that deuterium bonds in $SiO_2$ film are effective in suppressing the generation of traps related to the energetic hot carriers.

• Elastomers and Composites
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• 제56권3호
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• pp.124-135
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• 2021

Evaluating service lives of rubber materials at certain temperatures requires a destructive method (typically using elongation at break). In this study, a non-destructive method based on hardness change rate was proposed for evaluating the service life of chloroprene rubber (CR). Compared to the destructive method, this non-destructive method ensures homogeneity of CR specimens and requires a small number of samples. Thermal accelerated degradation test was conducted on the CR specimens at 55, 70, 85, 100, and 125℃, and the tensile strength, elongation at break, and hardness were measured. The results of the experiment were compared to those of the accelerated life evaluation method proposed in this study. Comparing the analyzed lives in the high temperature region (70, 85, 100, and 125℃), the difference between the service lives for the destructive method (using the elongation at break) and non-destructive method (using the hardness) was approximately 0.1 year. Therefore, it was confirmed that the proposed non-destructive evaluation method based on hardness changes can evaluate the actual life of CR under thermally accelerated degradation conditions.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2002년도 하계학술대회 논문집 Vol.3 No.2
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• pp.1022-1025
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• 2002

This paper presents the reliability of planar InP/InGaAs avalanche photodiodes (APD's) with recess etching, which is very crucial for the commercial 10-Gb/s optical receiver application. A versatile design for the planar InP/InGaAs APD's and bias-temperature tests to evaluate long-term reliability at temperature from 200 to $250^{\circ}C$. The reliability is examined by accelerated life tests by monitoring dark current and breakdown voltage. The lifetime of the APD's is estimated by a degradation activation energy. Based on the test results, it is concluded that the planar InP/InGaAs APD's with recess etching shows the sufficient reliability for practical 10-Gb/s optical receivers.

• 한국세라믹학회지
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• 제31권1호
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• pp.74-78
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• 1994

Degradation of thin oxide by doped poly-Si and its improvement were studied. The gate oxide can be degraded by phosphorous in poly-Si doped POCl3. The degradation is increased with the decrement of sheet resistance and poly-Si thickness. Oxide failures of amorphous-Si are higher than those of poly-Si. In-situ double deposition of amorphous-Si, 54$0^{\circ}C$/30 nm, and poly-Si, 6$25^{\circ}C$/220 nm, forms the mismatch structure of grain boundary between amorphous-Si and poly-Si, and suppresses the excess phosphorous on oxide surface by the mismatch structure. The control of phosphorous through grain boundary improves the oxide reliability.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1999년도 하계학술대회 논문집 A
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• pp.449-451
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• 1999

When the traction motor for urban transit E.M.U is driven with VVVF controlled inverter, the insulation degradation factors on the 200 Class insulation system of VPI process are analyzed with considering dielectric, mechanical properties, thermal stability, chemical resistivity and compatibility. A new test method of complex accelerating degradation is proposed to evaluate the insulation reliability and the long-term life including harmonic loss and transient surge stress due to PWM inverter drive.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2000년도 하계학술대회 논문집 B
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• pp.1374-1376
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• 2000

In this paper, sample coils for stator form-wound winding of traction motor were tested by the accelerative thermal degradation, which composed of heat, vibration, moisture and overvoltage applying. Reliability and expected life were evaluated on the insulation system for 200 class traction motor. After aging of 10 cycles, insulation resistance and PI properties were investigated as diagnosis tests in the range of $20{\sim}160^{\circ}C$. Analysis of polarization properties was performed on the base of do current-time change.

• 한국신뢰성학회지:신뢰성응용연구
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• 제16권1호
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• pp.41-47
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• 2016

Purpose: The purpose of this study was to evaluate electrical and structural degradation of flexible CIGS sollar cell exposed to high temperature and humid atmosphere. Method: Accelerated degradation was performed for various time under $85^{\circ}C/85%RH$ and then electrical and structural properties were analyzed by 4-point probe method, scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), and X-ray diffraction (XRD). Results: Sheet resistance of the top ITO layer increased with exposure time to the high temperature and humid atmosphere. Blunting of the protrusion morphology of ITO layer was observed for the degraded specimen, while no phase change was detected by XRD. Oxygen was detected at the edge area after 300 hours of exposure. Conclusion: Increase in electrical resistance of the degraded CIGS solar cell under high temperature and humid environment was attribute to the oxygen or water absorption.

• 품질경영학회지
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• 제40권3호
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• pp.270-277
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• 2012

Purpose: In this paper, storage lifetime of delay system in the fuse of 81MM illuminating projectile is estimated. Methods: Accelerated degradation testings of tungsten delay system using both temperature and humidity stresses were performed, and then delay time increase of the systems were analyzed as degradation data based on distribution-based degradation processes. Results: The estimated storage lifetime of detonator is between 11.8 years and 17.6 years with each stress-life relationship. Conclusion: Comparing with field data, storage lifetime of 90% reliability is about 12 years.