• 한국신뢰성학회:학술대회논문집
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• 한국신뢰성학회 2004년도 신뢰성해외전문가초청세미나
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• pp.29-37
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• 2004

Maintenance are actions (or activities) needed to (i) control equipment degradation and failures and (ii) to restore a failed equipment to operational state. The former is termed Preventive Maintenance (PM) and the latter as Corrective Maintenance (CM).(omitted)

• Structural Engineering and Mechanics
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• 제85권4호
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• pp.531-543
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• 2023

The existing concrete bridges are time-varying working systems, where the maintenance strategy should be planned according to the time-varying performance of the bridge. This work proposes a time-dependent residual capacity assessment procedure, which considers the non-stationary bridge load effects under growing traffic and non-stationary structural deterioration owing to material degradations. Lifetime bridge load effects under traffic growth are predicated by the non-stationary peaks-over-threshold (POT) method using time-dependent generalized Pareto distribution (GPD) models. The non-stationary structural resistance owing to material degradation is modeled by incorporating the Gamma deterioration process and field inspection data. A three-span continuous box-girder bridge is illustrated as an example to demonstrate the application of the proposed procedure, and the time-varying reliability indexes of the bridge girder are calculated. The accuracy of the proposed non-stationary POT method is verified through numerical examples, where the shape parameter of the time-varying GPD model is constant but the threshold and scale parameters are polynomial functions increasing with time. The case study illustrates that the residual flexural capacities show a degradation trend from a slow decrease to an accelerated decrease under traffic growth and material degradation. The reliability index for the mid-span cross-section reduces from 4.91 to 4.55 after being in service for 100 years, and the value is from 4.96 to 4.75 for the mid-support cross-section. The studied bridge shows no safety risk under traffic growth and structural deterioration owing to its high design safety reserve. However, applying the proposed numerical approach to analyze the degradation of residual bearing capacity for bridge structures with low safety reserves is of great significance for management and maintenance.

• 한국전기전자재료학회논문지
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• 제18권5호
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• pp.431-438
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• 2005

In this paper, we propose the built-in current testing circuit for improving reliability As the integrated CMOS circuits in a chip are increased, the testability on design and fabrication should be considered to reduce the cost of testing and to guarantee the reliability In addition, the high degree of integration makes more failures which are different from conventional static failures and introduced by the short between transistor nodes and the bridging fault. The proposed built-in current testing method is useful for detecting not only these failures but also low current level failures and faster than conventional method. In normal mode, the detecting circuit is turned off to eliminate the degradation of CUT(Circuits Under Testing). The differential input stage in detecting circuit prevents the degradation of CUT in test mode. It is expected that this circuit improves the quality of semiconductor products, the reliability and the testability.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.1
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• pp.13-16
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• 2004

The reliability of 1.550m-wavelength InGaAs mesa waveguide photodiodes(WGPDs), which developed for 40-Gbps optical receiver applications, fabricated by metal organic chemical vapor deposition is investigated. Reliability is examined by both high-temperature storage tests and the accelerated life tests by monitoring dark current and breakdown voltage. The median device lifetime and the activation energy of the degradation mechanism are computed for WGPD test structures. From the accelerated life test results, the activation energy of the degradation mechanism and median lifetime of these devices in room temperature are extracted from the log-normal failure model by using average lifetime and the standard deviation of that lifetime in each test temperature. It is found that the WGPD structure yields devices with the median lifetime of much longer than $10^6$ h at practical use conditions. Consequently, this WGPD structure has sufficient characteristics for practical 40-Gbps optical receiver modules.

• 한국정보통신학회논문지
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• 제11권1호
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• pp.83-88
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• 2007

MOSFET 트랜지스터의 전기적인 특성 변화에 따른 Class-E RF 전력 증폭기의 신뢰성 특성을 분석하였다. Class-E 전력 증폭기에서 MOSFET는 높은 효율을 얻기 위해 스위치로 동작하며, 이로 인해 MOSFET가 off 되었을 때 드레인 단자에 높은 전압 신호가 발생한다. 회로가 동작함에 따라 높은 전압의 스트레스로 인하여 MOSFET의 문턱 전압은 증가하고 전자의 이동도는 감소하여 MOSFET의 드레인 전류는 감소하게 된다. Class-E 전력 증폭기에서 MOSFET의 전류가 감소하면 전력 효율 및 출력 전력은 감소하게 된다. 그러나 class-E 전력증폭기에서 작은 부하 인덕터를 사용할 경우 큰 인덕터를 사용하는 경우에 비 해 신뢰성 특성을 향상시킬 수 있다. 1mH의 부하 인덕터를 사용한 경우 $10^{7}$초 후에 드레인 전류는 46.3%가 감소하였으며, 전력 효율은 58%에서 36%로 감소하였다. 그러나 1nH의 부하 인덕터를 사용한 경우 드레인 전류는 8.89%, 전력 효율 59%에서 55%로 감소하여 우수한 신뢰성 특성을 보여주었다.

• 한국신뢰성학회지:신뢰성응용연구
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• 제17권4호
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• pp.316-324
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• 2017

Purpose: The purpose of this study is to determine the replacement cycle applied age replacement policy by reliability analysis based on railway vehicle contactor's failure history data. Method: We performed reliability analysis based on railway vehicle contactor's failure history data. We found a suitable distribution by goodness of fit test and predicted the reliability through estimation of scale & shape parameter. Considering cost information we determined the replacement cycle that minimize the opportunity cost. Result: Suitable distribution was the Weibull and scale parameter & shape parameter are estimated by reliability analysis. The replacement cycle was predicted and MTTF, $B_6$ percentile life were suggested additionally. Conclusion: We confirmed that failure rate type of railway vehicle contactor is degradation model having a time dependent characteristic and examined the replacement cycle in our country's operating environment. We expect that this study result contribute to railway operation agency for maintenance policy decision.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2003년도 하계종합학술대회 논문집 II
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• pp.687-690
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• 2003

Experimental results are presented for gate oxide degradation and its effect on device parameters under negative and positive bias stress conditions using NMOSFET's with 3 nm gate oxide. The degradation mechanisms are highly dependent on stress conditions. For negative gate voltage, both hole- and electron-trapping are found to dominate the reliability of gate oxide. However, with changing gate voltage polarity, the degradation becomes dominated by electron trapping. Statistical parameter variations as well as the "OFF" leakage current depend on those charge trapping. Our results therefore show that Si or O bond breakage by electron can be another origin of the investigated gate oxide degradation.gradation.

• 한국조명전기설비학회:학술대회논문집
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• 한국조명전기설비학회 2005년도 학술대회 논문집
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• pp.161-165
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• 2005

In this paper, we observed degradation characteristics of luminous flux for new light source. Because degradation tests can be a useful tool for assessing the reliability when few or even no failures are expected in a life tests. And we use a simple random coefficient degradation model to induce most suitable equation of degradation. As a result, exponential distribution and equation is best suitable model for new light source.

• Archives of Metallurgy and Materials
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• 제64권3호
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• pp.913-916
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• 2019

For the reliable applications of silver nanowires, AgNW, which is used as a conductive transparent film in electronic devices, the isothermal degradation behaviors of AgNW films with and without overcoating were investigated. Accelerated isothermal degradation was performed as a function of temperature, time, and atmosphere. Electrical resistance and optical transmittance were measured and correlated with the microstructural damages, such as formation of oxide particles and fragmentations of AgNW, which were quantitatively determined from the scanning electron micrographs. The overcoating retarded the formation of oxide particles and subsequent fragmentations as well as resulting degradation in electrical resistance without affecting the optical transmittance.

• 한국의류학회지
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• 제34권6호
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• pp.1042-1052
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• 2010

The Degradation of amur cork tree extract is investigated by GC-MS after treating the dye with three thermal degradation systems of, room temperature (RT), $4^{\circ}C$ refrigeration (LT), $100^{\circ}C$ oven (OV), and $H_2O_2$/UV/$O_2$ (PER) degradation system for 0-24 days. It was found that PER degradation system represented the highest intensity of degradation treatment followed by OV treatment among the four degradation parameters. The possible fingerprint products of amur cork tree dye, that yielded 68% (or higher) reliability in the NIST spectral match, were isobenzofuran-1,3-dione,4,5-dimethoxy- (8.37 min, PER only), 1,3-dioxolo[4,5-g]isoquinolin-5(6H)-one,7,8-dihydro (9.41 min, PER only), canthine-6-one (10.24 min, RT, LT, OV only), and dihydroberberine (15.05 min, RT, LT, OV, PER) in the order of higher to lower possibility of detection. Unknown products 7 (13.43 min) and 8 (16.35 min) are two other possible fingerprint products of amur cork tree dye that require future identification.