• Journal of Applied Reliability
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• v.9 no.1
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• pp.59-69
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• 2009

LEDs have rapidly replaced old light devices such as incandescent or fluorescent lamps, and have been widely applied in general lighting, signals, automobile, signs and others. Since LEDs are for both indoor and outdoor use, temperature and humidity inevitably affect its reliability. We explain the result of the degradation life test on LEDs, and guide to reliability analysis procedure. Analysis on reliability measures are performed by Weibull++6 program, and a common shape parameter of Weibull distribution on the LED is suggested. Also, we make a description of reliability analysis procedures for the degradation data using collected test data from degradation tests. Reliability analysis procedures are consisted of estimating degradation models and failure time, verifying of distribution and parameters of the distribution, and estimating of reliability measures. Finally, this paper suggests reliability analysis method for light characteristics on LEDs.

• Journal of Applied Reliability
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• v.5 no.4
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• pp.413-425
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• 2005

As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article presents an accelerated degradation testing for vacuum fluorescent displays (VFDs). The accelerated degradation model is based on Arrhenius-lifetime relationship for cathode temperatures. We compare the results between accelerated degradation test and test at normal use condition. Accelerated degradation test for display devices is observed as an efficient method to warrantee product reliability to customers, as well as a tool to save time and costs.

• Journal of Applied Reliability
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• v.18 no.2
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• pp.122-129
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• 2018

Purpose: This article develops an optimal reliability acceptance sampling plan for the case where the degradation quantity of the performance characteristic follows Weibull distribution. Method: For developing reliability acceptance sampling plans, the sample size and the acceptance constant are determined based on the accelerated characteristic of the test condition and the product. Results: The sample size and the acceptance constant are provided such that the constraints of the producer and the consumer risks are satisfied. Conclusion: Reliability acceptance sampling plans based on the accelerated degradation test method can be used for the quality control within a resonable amount of cost and time. In this article. an optimal reliability sampling plans are newly developed for this purpose.

• Journal of Applied Reliability
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• v.13 no.2
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• pp.87-98
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• 2013

Accelerated degradation tests (ADTs) measuring failure-related degradation characteristic at the accelerated condition are widely used to assess the reliability of highly reliable products. Often, however, little degradation could be observed even in single-stress ADTs due to the high reliability of test unit, and as a result poor estimate of the reliability may be obtained. ADTs with multiple stress variables can be employed to overcome such difficulties. In this paper, optimal ADT plans with two stress variables are developed assuming that the degradation characteristic follows Weibull distribution by determining the stress levels, the proportion of test units allocated to each stress level such that the asymptotic variance of the maximum likelihood estimator of the q-th quantile of the lifetime distribution at the use condition is minimized.

• Journal of Applied Reliability
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• v.3 no.2
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• pp.103-116
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• 2003

We carry out reliability tests and investigate the failure mechanisms. of the wafer level vacuum packaged MEMS gyroscope sensor using an accelerated degradation test. The accelerated degradation test (ADT) is used to evaluate reliability (and/or life) of the MEMS vacuum package and to select the accelerated test conditions, which reduce the reliability testing time. Using the failure distribution model and stress-life model, we are able to estimate the average life time of the vacuum package, which is well agreed with the measured data. After improving several package reliability issues such as prevention of gas diffusion through package, we carry out another set of accelerated tests at the chosen acceleration level. The results show that reliability of the vacuum packaged gyroscope has been greatly improved and can survive without degradation of performance, which is the Q-factor in gyroscope sensor, during environmental stress reliability tests.

• Journal of Applied Reliability
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• v.3 no.2
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• pp.93-101
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• 2003

Life time data analysis requires some time-to-failure data to an extent. Some life tests result in few or no failure. In such cases, it is difficult to access reliability with traditional life tests that record only time to failure. Furthermore, with short product development time, reliability tests must be conducted with severe time constraints. For some devices, it is possible to obtain degradation measurements over time, and these measurements may contain useful information about product reliability. This article describes degradation reliability analysis methods to do inferences and predictions about a failure-time distribution by using software. In addition, the possibility of extension to CBM (Condition Based Maintenance) is suggested as an example of applied degradation data analysis.

• Proceedings of the Korean Reliability Society Conference
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• 2000.04a
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• pp.177-183
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• 2000

As monitoring, testing, and measuring techniques develop, predictive control of components and complete systems have become more practical and affordable. In this paper we develop a statistics-based approach assuming nonlinear degradation paths and time-dependent standard deviation. This approach can be extended to provide reliability estimates and limit value determination in the censoring case fur predictive maintenance policy.

• Journal of Applied Reliability
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• v.17 no.2
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• pp.103-111
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• 2017

Purpose: Accelerated degradation tests can speed time to market and reduce the test time and costs associated with long term reliability tests to verify the required service life of a product or material. This paper proposes a service life prediction method for components or materials using an accelerated degradation tests based on the relationships between temperature and the rate of failure-causing chemical reaction. Methods: The relationship between performance degradation and the rate of a failure-causing chemical reaction is assumed and least square estimation is used to estimate model parameters from the degradation model. Results: Methods of obtaining acceleration factors and predicting service life using the degradation model are presented and a numerical example is provided. Conclusion: Service life prediction of a component or material is possible at an early stage of the degradation test by using the proposed method.

• Journal of Applied Reliability
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• v.9 no.4
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• pp.291-302
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• 2009

Accelerated and field degradation tests are performed for reliability assessment of an anticorrosive paint for steel structures. Test data were analyzed to obtain the degradation model and the life time distributions of the paint. A power law degradation model and lognormal performance distribution were used to predict the lifetime of the anticorrosive paint and the method of finding an acceleration factor is provided.

• Proceedings of the Korean Reliability Society Conference
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• 2006.05a
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• pp.181-191
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• 2006

As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article proposes a new model to describe the nonlinear degradation paths caused by nano-contamination for plasma display panels (PDPs) : a bi-exponential model with random coefficients. A sequential likelihood ratio test was executed to select random effects in the nonlinear model. Analysis results indicate that the reliability estimation can be improved substantially by using the nonlinear random-coefficients model to incorporate both inherent degradation characteristics and contamination effects of impurities for PDP degradation paths.