• Title/Summary/Keyword: cantilevers

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Design and Fabrication of a Micro PZT Cantilever Array Actuator for Applications in Fluidic Systems

  • Kim Hyonse;In Chihyun;Yoon Gilho;Kim Jongwon
    • Journal of Mechanical Science and Technology
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    • v.19 no.8
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    • pp.1544-1553
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    • 2005
  • In this article, a micro cantilever array actuated by PZT films is designed and fabricated for micro fluidic systems. The design features for maximizing tip deflections and minimizing fluid leakage are described. The governing equation of the composite PZT cantilever is derived and the actuating behavior predicted. The calculated value of the tip deflection was 15 ${\mu}m$ at 5 V. The fabrication process from SIMOX (Separation by oxygen ion implantation) wafer is presented in detail with the PZT film deposition process. The PZT films are characterized by investigating the ferroelectric properties, dielectric constant, and dielectric loss. Tip deflections of 12 ${\mu}m$ at 5 V are measured, which agreed well with the predicted value. The 18 ${\mu}l/s$ leakage rate of air was observed at a pressure difference of 1000 Pa. Micro cooler is introduced, and its possible application to micro compressor is discussed.

Thermo-Piezoelectric Read/Write Mechanisms for Probe-Based Data Storage

  • Nam, Hyo-Jin;Kim, Young-Sik;Lee, Sun-Yong;Jin, Won-Hyeog;Jang, Seong-Soo;Cho, Il-Joo;Bu, Jong-Uk
    • Transactions of the Society of Information Storage Systems
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    • v.3 no.1
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    • pp.47-53
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    • 2007
  • In this paper, a thermo-piezoelectric mechanism with integrated heaters and piezoelectric sensors has been studied for low power probe-based data storage. Silicon nitride cantilever integrated with silicon heater and piezoelectric sensor has been developed to improve the uniformity of cantilevers. Data bits of 40 nm in diameter were recorded on PMMA film. The sensitivity of the piezoelectric sensor was 0.615 fC/nm after poling the PZT layer. And, the $34\times34$ probe array integrated with CMOS circuits has been successfully developed by simple one-step bonding process. The process can simplify the process step and reduce tip wear using silicon nitride tip.

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Sustainable Vibration Energy Harvesting Based on Zr-Doped PMN-PT Piezoelectric Single Crystal Cantilevers

  • Moon, Seung-Eon;Lee, Sung-Q;Lee, Sang-Kyun;Lee, Young-Gi;Yang, Yil-Suk;Park, Kang-Ho;Kim, Jong-Dae
    • ETRI Journal
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    • v.31 no.6
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    • pp.688-694
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    • 2009
  • In this paper, we present the results of a preliminary study on the piezoelectric energy harvesting performance of a Zr-doped $PbMg_{1/3}Nb_{2/3}O_3-PbTiO_3$ (PMN-PZT) single crystal beam. A novel piezoelectric beam cantilever structure is used to demonstrate the feasibility of generating AC voltage during a state of vibration. The energy-harvesting capability of a PMN-PZT beam is calculated and tested. The frequency response of the cantilever device shows that the first mode resonance frequency of the excitation model exists in the neighborhood of several hundreds of hertz, which is similar to the calculated value. These tests show that several significantly open AC voltages and sub-mW power are achieved. To test the possibility of a small scale power source for a ubiquitous sensor network service, energy conversion and the testing of storage experiment are also carried out.

Thermal Design and Batch Fabrication of Full SiO2 SThM Probes for Sensitivity Improvement (주사탐침열현미경의 감도향상을 위한 전체 실리콘 산화막 열전탐침의 열적설계 및 일괄제작)

  • Jaung, Seung-Pil;Kim, Kyeong-Tae;Won, Jong-Bo;Kwon, Oh-Myoung;Park, Seung-Ho;Choi, Young-Ki;Lee, Joon-Sik
    • Transactions of the Korean Society of Mechanical Engineers B
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    • v.32 no.10
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    • pp.800-809
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    • 2008
  • Scanning Thermal Microscope (SThM) is the tool that can map out temperature or the thermal property distribution with the highest spatial resolution. Since the local temperature or the thermal property of samples is measured from the extremely small heat transferred through the nanoscale tip-sample contact, improving the sensitivity of SThM probe has always been the key issue. In this study, we develop a new design and fabrication process of SThM probe to improve the sensitivity. The fabrication process is optimized so that cantilevers and tips are made of thermally grown silicon dioxide, which has the lowest thermal conductivity among the materials used in MEMS. The new design allows much higher tip so that heat transfer through the air gap between the sample-probe is reduced further. The position of a reflector is located as far away as possible to minimize the thermal perturbation due to the laser. These full $SiO_2$ SThM probes have much higher sensitivity than that of previous ones.

Free vibration analysis of tall buildings with outrigger-belt truss system

  • Malekinejad, Mohsen;Rahgozar, Reza
    • Earthquakes and Structures
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    • v.2 no.1
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    • pp.89-107
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    • 2011
  • In this paper a simple mathematical model is presented for estimating the natural frequencies and corresponding mode shapes of a tall building with outrigger-belt truss system. For this purposes an equivalent continuum system is analyzed in which a tall building structure is replaced by an idealized cantilever continuum beam representing the structural characteristics. The equivalent system is comprised of a cantilever shear beam in parallel to a cantilever flexural beam that is constrained by a rotational spring at outrigger-belt truss location. The mathematical modeling and the derivation of the equation of motion are given for the cantilevers with identically paralleled and rotational spring. The equation of motion and the associated boundary conditions are analytically obtained by using Hamilton's variational principle. After obtaining non-trivial solution of the eigensystem, the resulting is used to determine the natural frequencies and associated mode shapes of free vibration analysis. A numerical example for a 40 story tall building has been solved with proposed method and finite element method. The results of the proposed mathematical model have good adaptation with those obtained from finite element analysis. Proposed model is practically suitable for quick evaluations during the preliminary design stages.

Effects of Drive-in Process Parameters on the Residual Stress Profile of the p+ Silicon Film (후확산 공정 변수가 p+ 실리콘 박막의 잔류 응력 분포에 미치는 영향)

  • Jeong, Ok-Chan;Yang, Sang-Sik
    • Proceedings of the KIEE Conference
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    • 2002.11a
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    • pp.245-247
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    • 2002
  • The paper represents the effects of the drive-in process parameters on the residual stress profile of the p+ silicon film. For the quantitative determination of the residual stress profiles, the test samples are doped via the fixed boron diffusion process and four types of the thermal oxidation processes and consecutively etched by the improved process. The residual stress measurement structures with the different thickness are simultaneously fabricated on the same silicon wafer. Since the residual stress profile is not uniform along the direction normal to the surface, the residual stress is assumed to be a polynomial function of the depth. All of the coefficients of the polynomial are determined from the deflections of cantilevers and the displacement of a rotating beam structure. As the drive-in temperature or the drive-in time increases, the boron concentration decreases and the magnitude of the average residual tensile stress decreases. Also, near the surface of the p+ film the residual tensile stress is transformed into the residual compressive stress and its magnitude increases.

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Measurement of Normal Spring Constant of Colloidal Probes for Atomic Force Microscope (원자 현미경용 콜로이드 탐침 수직 스프링 상수 측정)

  • Kim, Dae-Hyun;Kim, Min-Seok;Hahn, Junhee;Ahn, Hyo-Sok
    • Tribology and Lubricants
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    • v.28 no.5
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    • pp.212-217
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    • 2012
  • A modified thermal noise method was proposed to measure the normal spring constants of the colloidal probes for an atomic force microscope. We used commercial tipless cantilevers (length 150, width 30, nominal k 7.4 N/m) and borosilicate spheres with a diameter of 20 to fabricate colloidal probes. The inverse optical lever sensitivity of both the tipless cantilever and colloidal probes were used to measure the normal spring constant of the colloidal probes. We confirmed the accuracy and usefulness of our method by comparing the measurement results with those obtained using the nanoforce calibrator (NFC), which reportedly has an uncertainty of 1.00%. The modified thermal method showed a good agreement (~10% difference) with the NFC, allowing us to conclude that the modified thermal method could be employed for the effective measurement of the normal spring constants of colloidal probes.

Atomic Force Microscopy Study on Correlation between Electrical Transport and Nanomechanical properties of Graphene Layer

  • Kwon, Sang-Ku;Choi, Sung-Hyun;Chung, H.J.;Seo, S.;Park, Jeong-Young
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.85-85
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    • 2010
  • Graphene, the building block of graphite, is one of the most promising materials due to their fascinating electronic transport properties. The pseudo-two-dimensional sp2 bonding in graphene layers yields one of the most effective solid lubricants. In this poster, we present the correlation between electrical and nanomechanical properties of graphene layer grown on Cu/Ni substrate with CVD (Chemical Vapor Deposition) method. The electrical (current and conductance) and nanomechanical (adhesion and friction) properties have been investigated by the combined apparatus of friction force microscopy/conductive probe atomic force microscopy (AFM). The experiment was carried out in a RHK AFM operating in ultrahigh vacuum using cantilevers with a conductive TiN coating. The current was measured as a function of the applied load between the AFM tip and the graphene layer. The contact area has been obtained with the continuum mechanical models. We will discuss the influence of mechanical deformation on the electrical transport mechanism on graphene layers.

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Does matching relation exist between the length and the tilting angle of terminal implants in the all-on-four protocol? stress distributions by 3D finite element analysis

  • Li, Xiaomei;Cao, Zhizhong;Qiu, Xiaoqian;Tang, Zhen;Gong, Lulu;Wang, Dalin
    • The Journal of Advanced Prosthodontics
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    • v.7 no.3
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    • pp.240-248
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    • 2015
  • PURPOSE. To explore whether there is matching relation between the length and the tilting angle of terminal implants in the All-on-Four protocol by studying the effects of different implant configurations on stress distributions of implant, bone, and framework. MATERIALS AND METHODS. Four implants were employed to support a full-arch fixed prosthesis and five three-dimensional finite element models were established with CT images, based on the length (S and L) and distal tilt angle ($0^{\circ}$, $30^{\circ}$ and $45^{\circ}$) of terminal implants for an edentulous mandible, which named: Tilt0-S, Tilt30-S, Tilt30-L, Tilt45-S and Tilt45-L. An oblique 240 N was loaded at second molar. The von Mises Stresses were analyzed. The implants were consecutively named #1 to #4 from the loading point. RESULTS. 1) Tilt0-S had the greatest stress on the implants, with the other groups exhibiting variable reductions; the four implants of Tilt45-L demonstrated the greatest reduction in stress. 2) Tilt0-S had the greatest stress at bone around #1 implant neck, and Tilt45-L exhibited the least stress, which was a 36.3% reduction compared to Tilt0-S. 3) The greatest stress in the framework was found on the cantilevers distal to #1 implant. Tilt45-S exhibited the least stress. CONCLUSION. Matching different length and tilting angle of the terminal implants led to variable stress reductions on implants, bone and the superstructure. By optimizing implant configuration, the reduction of stress on implants and surrounding bone could be maximized. Under the present condition, Tilt45-L was the preferred configuration. Further clinical testings are required.

Stress characteristics of multilayer polysilicon for the fabrication of micro resonators (마이크로 공진 구조체 제작을 위한 다층 폴리실리콘의 스트레스 특성)

  • Choi, C.A.;Lee, C.S.;Jang, W.I.;Hong, Y.S.;Lee, J.H.;Sohn, B.K.
    • Journal of Sensor Science and Technology
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    • v.8 no.1
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    • pp.53-62
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    • 1999
  • Micro polysilicon actuators, which are widely used in the field of MEMS (Microelectromechanical System) technology, were fabricated using polysilicon thin layers. Polysilicon deposition were carried out to have symmetrical layer structures with a LPCVD (Low Pressure Chemical Vapor Deposition) system, and we have measured physical characteristics by micro test patterns, such as bridges and cantilevers to verify minimal mechanical stress and stress gradient in the polysilicon layers according to the methods of mutilayer deposition, doping, and thermal treatment, also, analyzed the properties of each specimen, which have a different process condition, by XRD, and SIMS etc.. Finally, the fabricated planar polysilicon resonator, symmetrically stacked to $6.5{\mu}m$ thickness, showed Q of 1270 and oscillation ampitude of $5{\mu}m$ under DC 15V, AC 0.05V, and 1000 mtorr pressure. The developed micro polysilicon resonator can be utilized to micro gyroscope and accelerometer sensor.

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