• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2011년도 춘계학술대회 논문집
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• pp.619-620
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• 2011

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2010년도 추계학술대회 논문집
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• pp.387-388
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• 2010

• 한국재료학회:학술대회논문집
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• 한국재료학회 1998년도 IUMRS-ICEM ABSTRACT BOOK
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• pp.100.2-100
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• 1998

• 문화기술의 융합
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• 제4권3호
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• pp.209-212
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• 2018

이방성 도전필름(ACF)을 사용한 본딩은 납땜이 용이하지 않은 이질적인 소재 간 미세 접합을 형성하는데 널리 사용되어진다. 성공적인 ACF 본딩 구현을 위한 3가지 제한조건이 존재한다. 본딩 접촉점은 설정된 작업 시간동안 적절한 압력과 온도를 유지한 헤드에 의해서 압착되어야 한다. 본 논문에서는 머신 비전을 기반으로 한 ACF 본딩기법을 제안하고 실험을 통해 검증한다. 시스템은 본딩 작업대 상의 PCB 위치 및 방향을 계산하고 헤드가 압착되어야 하는 최적의 접촉점을 결정한다. 제안한 시스템이 접촉면 상의 헤드 평탄도를 보장함으로써 접착력을 향상시킬 수 있음을 실험결과를 통해 보여준다.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2008년도 추계학술대회A
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• pp.1277-1282
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• 2008

Recently LCD panels have becom very important components for portable electronics. In the high density interconnection material, ACF's are used to connect the outer lead of the tape automated bonding to the transparent indium tin oxide electrodes of the LCD panel. ACF consists of an adhesive polymer matrix and randomly dispersed conductive balls. In this study, we analyzed Failure Mode / Mechanism of ACF which is identified Conductive ball Corrsion, Delamination, Crack and Polymer Expansion / Swelling. In ALT(Accelerated Life Test), we select primary stress factors as temperature and humidity. As time passes by, an increase of connection resistance was observed. In conclusion, we have found that high temperature / humidity affects the adhesion.

• 한국정밀공학회지
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• 제31권9호
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• pp.831-838
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• 2014

Chip on glass (COG) bonding using anisotropic conductive film (ACF) is a key technology to assemble a driver IC onto a LCD glass panel. In this paper, an experimental investigation was conducted to investigate the correlation between contact resistance and characteristics of image taken by machine vision based inspection system. The results show that the contact resistance was strongly influenced by the contrast ratio of conductive particle rather than the number of conductive particles. Also, number of conductive particles whose contrast ratio is below 0.75 is crucial for determining the quality of the assembled samples. On the other hand, in the result of high temperature high humidity storage test, the contrast ratio of samples was increased. However, in the case of open-circuit samples after temperature humidity storage test, the number of conductive particles whose contrast ratio is above 0.75 was more than that of the closed-circuit samples.

• 대한용접접합학회:학술대회논문집
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• 대한용접접합학회 2006년도 춘계 학술대회 개요집
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• pp.16-17
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• 2006

We researched by the characteristic of a anisotropic etching of Si wafer and the Si career concerning the flip chip solder bump. Connectors and Anisotropic Conductive Film (ACF) method was already applied to board-to-board interconnection. In place of them, we have focused on board to board interconnection with solder bump by Si carrier, which has been used as Flip chip bonding technology. A major advantage of this technology is that the Flexible Printed Circuit (FPC) is connected in the same solder reflow process with other surface mount devices. This technology can be applied to semiconductors and electronic devices for higher functionality, integration and reliability.

• 마이크로전자및패키징학회지
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• 제15권2호
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• pp.7-15
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• 2008

본 논문에서는 ACF를 이용한 CCM용 COF 어셈블리의 실장 기술을 연구하고 COF 어셈블리의 신뢰성 분석을 수행하였다. 열팽창계수, 모듈러스, 유리전이온도 등 경화 후 ACF의 열-기계적 물성들을 분석하였으며, ACF의 경화거동 결과를 바탕으로 COF 접합공정 온도 및 시간을 최적화하였으며, 도전입자의 변형 관찰 및 전기적 접촉 저항 측정을 통해 본딩 압력에 대한 최적화를 수행하였다. 또한 ACF 물질 특성이 COF어셈블리의 신뢰성에 미치는 영향을 알아보기 위해 열-싸이클 시험, 고온 유지 시험, 고온고습 시험을 수행하였다. 신뢰성 시험 수행 후 ACF를 이용한 COF 어셈블리의 신뢰성에 가장문제가 되고 있는 점은 열-싸이클 신뢰성 시험에서 나타난 ACF joint의 접촉 저항 증가 문제였고, 이는 ACF 자체의 열-기계적 물성과 밀접한 관계가 있음을 확인하였다.

• 마이크로전자및패키징학회지
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• 제6권2호
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• pp.13-21
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• 1999

Flip chip assembly directly on organic boards offers miniaturization of package size as well as reduction in interconnection distances resulting in a high performance and cost-competitive Packaging method. This paper describes the investigation of alternative low cost flip-chip mounting processes using electroless Ni/Au bump and anisotropic conductive adhesives/films as an interconnection material on organic boards such as FR-4. As bumps for flip chip, electroless Ni/Au plating was performed and characterized in mechanical and metallurgical point of view. Effect of annealing on Ni bump characteristics informed that the formation of crystalline nickel with $Ni_3$P precipitation above $300^{\circ}C$ causes an increase of hardness and an increase of the intrinsic stress resulting in a reliability limitation. As an interconnection material, modified ACFs composed of nickel conductive fillers for electrical conductor and non-conductive inorganic fillers for modification of film properties such as coefficient of thermal expansion(CTE) and tensile strength were formulated for improved electrical and mechanical properties of ACF interconnection. The thermal fatigue life of ACA/F flip chip on organic board limited by the thermal expansion mismatch between the chip and the board could be increased by a modified ACA/F. Three ACF materials with different CTE values were prepared and bonded between Si chip and FR-4 board for the thermal strain measurement using moire interferometry. The thermal strain of ACF interconnection layer induced by temperature excursion of $80^{\circ}C$ was decreased with decreasing CTEs of ACF materials.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2010년도 춘계학술대회 논문집
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• pp.613-614
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• 2010