• Journal of Korea Multimedia Society
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• v.13 no.12
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• pp.1814-1819
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• 2010

Since 1987, when statistical analyzing guide for thermal life test of Accelerated Life Test(ALT) was proposed as ANSI/IEEE Std 101, this guide has been used widely for many experiment data. Shim(2004) had done Monte Carlo simulation to compare life of two different systems or materials, based on statistic values obtained from ANSI/IEEE Std 101 data. In this study, a profile analysis is proposed for comparing life of two different systems or materials, and some examples using pre-existing data are given.

• Proceedings of the Korean Reliability Society Conference
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• 2005.06a
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• pp.327-337
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• 2005

Accelerated life test models and procedure are developed to assess the reliability of Door switch. The main function of door switch is to operate bulb lamp and fan motor. The accelerated life test method and test equipments are developed using the relationship between stresses and life characteristics of the products. Using the developed accelerated life test method, the parameters of the ALT model and life time distribution are estimated and the reliability of the Door S/W at use condition if assessed. The proposed accelerated life test method and procedure may be extended and applied to testing similar kinds of products to reduce test time and costs of the tests remarkably.

• Proceedings of the KSME Conference
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• 2008.11a
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• pp.1391-1393
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• 2008

In this paper, the long-term reliability for 1.25G transceiver in use of high speed optical access network is investigated. High temperature storage tests and accelerated life tests are used to long-term reliability. Accelerated aging test have been during 3,000 hour of the three accelerated aging conditions by caused high temperature stress. Mean life is assumed to follow the Arrhenius relationship and analysis from the failure data obtained in the accelerated aging conditions.

• Journal of Korean Institute of Industrial Engineers
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• v.20 no.1
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• pp.39-51
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• 1994

Almost all accelerated life tests assume that no basic failure mechanism changes within the test stresses. But accelerated life test, considering failure mechanism changes, is needed since failure mechanism changes when accelerating beyond the used stress. This paper studies the analysis when the failure mechanism changes within the test stresses. The piecewise linear regression, which the join point of two lines is estimated, is applied In particular, two accelerated life tests, with and without a change in failure mechanism are examined.

• Journal of Applied Reliability
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• v.14 no.2
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• pp.93-96
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• 2014

RFID (Radio Frequency IDentification) system is recognition technology which can maintain various object's information. Reliability of RFID tags is the most important factor in RFID system. In this paper, we proposed ALT (Accelerated Life Test) method for UHF RFID tags. Temperature and humidity were adopted as stress factors and the accelerated life tests were conducted in three different conditions. We performed failure analysis for identifying failure mechanism and statistical analysis of test data. In the statistical analysis, we employed Inverse Power law for relationship between tag's life and stress. Through the statistical analysis, we proposed acceleration factor for several levels of temperature-humidity. The reliability qualification test plans were also designed for the tag's target reliability.

• Journal of Applied Reliability
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• v.5 no.2
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• pp.273-287
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• 2005

Accelerated life test models and procedure are developed to assess the reliability of Refrigerator door switch. The main function of door switch is to operate bulb lamp and fan motor in the refrigerating room. The accelerated life test method and test equipments are developed using the relationship between stresses and life characteristics of the products. Using the developed accelerated life test method, the parameters of the ALT model and life time distribution are estimated and the reliability of the Door S/W at use condition if assessed. The proposed accelerated life test method and procedure may be extended and applied to testing similar kinds of products to reduce test time and costs of the tests remarkably.

• International Journal of Reliability and Applications
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• v.10 no.2
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• pp.101-107
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• 2009

In the accelerated tests, the importance of correct failure analysis must be strongly emphasized. Understanding the failure mechanisms is requisite for designing and conducting successful accelerated life test. Under this presumption, a rational method must be identified to relate the results of accelerated tests quantitatively to the reliability or failure rates in use conditions, using a scientific acceleration transform. Most widely used models for relating the results of accelerated tests quantitatively to the reliability or failure rates in use conditions are an accelerated failure time model and a proportional hazards model. The purpose of this research is to compare the usability of the accelerated failure time model and proportional hazards model in the accelerated life tests.

• Proceedings of the Korean Reliability Society Conference
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• 2004.07a
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• pp.129-137
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• 2004

This paper presents an accelerated life test for burnout of tungsten filament of incandescent lamp. From failure analyses of field samples, it is shown that their root causes are local heating or hot sports in the filament caused by tungsten evaporation and wire sag. Finite element analysis is performed to evaluate the effect of vibration and impact for burnout, but any points of stress concentration or structural weakness are not found in the sample. To estimate the burnout life of lamp, an accelerated life test is planned by using quality function deployment and fractional factorial design, where voltage, vibration, and temperature are selected as accelerating variables. We assumed that Weibull lifetime distribution and a generalized linear model of life-stress relationship hold through goodness of fit test and test for common shape parameter of the distribution. Using accelerated life testing software, we estimated the common shape parameter of Weibull distribution, life-stress relationship, and accelerating factor.

• Journal of Applied Reliability
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• v.11 no.3
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• pp.281-291
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• 2011

This paper presents an accelerated life test of booster pump for home water purifier. The failure analysis shows that decreased flux due to the plastic deformation of bypass spring adjusting pressure is the predominant failure mechanism. An accelerated life test is designed and implemented to estimate the lifetime of the booster pump. Temperature, water pressure and voltage are selected as accelerating variables through the technical review about failure mechanism. It is assumed that the lifetimes of booster pumps follow lognormal distribution and the combination model of temperature and non-thermal stresses holds. The life-stress relationship, acceleration factor, and $B_{10}$ life at design condition are estimated by analyzing the accelerated life test data.

• Proceedings of the KSME Conference
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• 2004.11a
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• pp.136-141
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• 2004

The gear in various mechanical components easily occurs at damages by the external torque. The main failure modes of the gear are surface pitting with the tooth surface and breakage with tooth root by caused fatigue. Therefore, the gear is very important role in the reliability research since it may cause fatal damage of entire system such as the gear box in automobile transmission. In this study, the failure mode of the gear was analyzed and accelerated durability analysis was employed for the life estimation of spur gears. In the case of assumed load spectrums, the reliability of spur gears was evaluated by inverse power law-Weibull accelerated life test model with cumulative damage exposure.