• 한국진공학회지
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• 제19권5호
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• pp.385-390
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• 2010

원자층 증착법(Atomic Layer Deposition, ALD)을 이용하여 ZnO 나노막대에 ZnO:Al과 $Al_2O_3$를 코팅하여 coaxial 형태의 나노선 구조를 제작하여 광학적 특성을 분석하였다. 반도체인 ZnO:Al을 코팅하는 경우 Al이 ZnO층에 확산되어 ZnO에 도핑이 되는 효과를, $Al_2O_3$를 코팅하는 경우 반도체-절연체 계면 상태가 존재함을 광전이 특성을 이용하여 확인하였다.

• Bulletin of the Korean Chemical Society
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• 제34권4호
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• pp.1205-1211
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• 2013

The structural and optical properties of the ZnO, Al-doped ZnO, Ga-doped ZnO, and In-doped ZnO nanorods were investigated using field-emission scanning electron microscopy, X-ray diffraction, photoluminescence (PL) and ultraviolet-visible spectroscopy. All the nanorods grew with good alignment on the ZnO seed layers and the ZnO nanorod dimensions could be controlled by the addition of the various dopants. For instance, the diameter of the nanorods decreased with increasing atomic number of the dopants. The ratio between the near-band-edge emission (NBE) and the deep-level emission (DLE) intensities ($I_{NBE}/I_{DLE}$) obtained by PL gradually decreased because the DLE intensity from the nanorods gradually increased with increase in the atomic number of the dopants. We found that the dopants affected the structural and optical properties of the ZnO nanorods including their dimensions, lattice constants, residual stresses, bond lengths, PL properties, transmittance values, optical band gaps, and Urbach energies.

• 한국전기전자재료학회논문지
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• 제26권4호
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• pp.294-297
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• 2013

ZnO crystals with octahedral shape were synthesized by thermal evaporation technique. $ZnF_2$ powder was used as the source material. The thermal evaporation and oxidation of $ZnF_2$ powder was carried out for 1 hr at $1,000^{\circ}C$ in air under atmospheric pressure. SEM images showed that the ZnO crystals produced by oxidizing $ZnF_2$ vapor possessed a characteristic octahedral shape. XRD spectrum revealed that the ZnO octahedron had hexagonal wurtzite structure. In the room temperature photoluminescence spectrum, a strong green emission peak at around 510 nm was observed.

• 대한금속재료학회지
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• 제49권10호
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• pp.818-822
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• 2011

ZnO nanorods were grown on Au-coated Si substrates by vapor phase transport (VPT) at the growth temperature of $600^{\circ}C$ using a mixture of zinc oxide and graphite powders as source material. Au thin films with the thickness of 5 nm were deposited by ion sputtering. Temperature-dependent photoluminescence (PL) was carried out to investigate the optical properties of the ZnO nanorods. Five peaks at 3.363, 3.327, 3.296, 3.228, and 3.143 eV, corresponding to the free exciton (FX), neutral donor bound exciton ($D^{\circ}X$), first order longitudinal optical phonon replica of free exciton (FX-1LO), FX-2LO, and FX-3LO emissions, were obtained at low-temperature (10 K). The intensity of these peaks decreased and their position was red shifted with the increase in the temperature. The FX emission peak energy of the ZnO nanorods exhibited an anomalous behavior (red-blue-red shift) with the increase in temperature. This is also known as an "S-shaped" emission shift. The thermal activation energy for the exciton with increasing temperature in the ZnO nanorods is found to be about 26.6 meV; the values of Varshni's empirical equation fitting parameters are = $5{\times}10^{-4}eV/K$, ${\beta}=350K$, and $E_g(0)=3.364eV$.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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• pp.421.2-421.2
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• 2014

We report on the growth of ZnO nanorods (NRs) grown on graphite and silicon substrates via an all-solution process and characteristics of their heterojunctions. Structural investigations indicated that morphological and crystalline properties were not significantly different for the ZnO NRs on both substrates. However, optical properties from photoluminescence spectra showed that the ZnO NRs on graphite substrate contained more point defects than that on Si substrate. The ZnO NRs on both substrates showed typical rectification properties exhibiting successful diode formation. The heterojunction between the ZnO NRs and the graphite substrate showed a Schottky diode characteristic and photoresponse under ultraviolet illumination at a small reverse bias of -0.1 V. The results showed that the graphite substrate could be a good candidate for a Schottky contact electrode as well as a conducting substrate for electronic and optoelectronic applications of ZnO NRs.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 추계학술대회 논문집 Vol.14 No.1
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• pp.108-111
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• 2001

ZnO thin films on (001) sapphire substrates have been deposited by pulsed laser deposition(PLD) technique for light emitting device applications. We have controlled the emission intensity of UV and visible light, depending on film thickness and various post-annealing time. UV emission became strong as the thickness of ZnO thin films increased. The intensity of visible light was strong as post-annealing temperature increased. The optical properties of the ZnO thin films were characterized by PL(photoluminescence) and the structural properties of the ZnO were characterized by XRD for the application of ZnO light emission device.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제54권3호
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• pp.103-108
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• 2005

ZnO thin films on (001) sapphire substrates have been deposited by pulsed laser deposition(PLD) technique using an Nd:YAG laser with a wavelength of 266nm. Before post-annealing treatment in the oxygen ambient, the experiment of the deposition of ZnO thin films has been performed for substrate temperatures in the range of $300\~450^{\circ}C$ and oxygen gas flow rate of $100\~700\;sccm$. In order to investigate the effect of post-annealing treatment of ZnO thin films, films have been annealed at various temperatures after deposition. After post-annealing treatment in the oxygen ambient, the structural properties of ZnO thin films were characterized by X-ray diffraction(XRD), scanning electron microscopy(SEM) and the optical properties of the ZnO were characterized by photoluminescence(PL).

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 추계학술대회 논문집
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• pp.108-111
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• 2001

ZnO thin films on (001) sapphire substrates knave been deposited by pulsed laser deposition(PLD) technique for light emitting device applications. We have controlled the emission intensity of UV and visible light, depending on film thickness and various post-annealing time. UV emission became strong as the thickness of ZnO thin films increased. The intensity of visible light was strong as post-annealing temperature increased. The optical properties of the ZnO thin films were characterized by PL(photoluminescence) and the structural properties of the ZnO were characterized by XRD for the application of ZnO light emission device.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.1
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• pp.200-202
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• 2004

ZnO thin films were grown at different plume-substrate angles by pulsed laser deposition(PLD). From the X-ray diffraction(XRD) result, all ZnO thin films were found to be well c-axis oriented and c-axis lattice constant approached the value of bulk ZnO as plume-substrate(P-S) angle decreased. The grain size of ZnO thin films measured by atomic force microscopy increased and the UV intensity of ZnO thin films investigated by photoluminescence increased as P-S angle decreased. It is found that the improvement of structural and optical properties mainly comes from the reduction of the flux of ablated species arriving on a substrate per a laser shot by tilting a substrate parallel to the plume propagation direction.

• 한국결정성장학회지
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• 제11권2호
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• pp.49-55
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• 2001

sol-gel방법에 의해서 p-형 Si(100)웨이퍼와 ITO glass, quartz glass기판 위 ZnO박막을 형성시켰으며 출발 물질은 zinc acetate dihydrate를 사용하였다. Zinc acetate dihydrate를 2-methoxyethanol-monoethanolamine(MEA)용액에 녹여 :균질하고 안정된 용액을 만들었다. ZnO박막은 2800rpm에서 25초 동안 spin-coating하고 $250^{\circ}C$의 hot plate에서 10분 동안 중간 열처리한 후 이를 반복하여 형성시켰고 결정화를 위한 열처리는 $400^{\circ}C$~$800^{\circ}C$공기 분위기에서 1시간 동안 시행하였다. X-ray diffraction(XRD), scanning electron microscopy(SEM), UV-vis 투과 스펙트럼, IR 투과 스펙트럼, photoluminescence(PL)스펙트럼 등의 측정 결과로부터 박막의 구조적 특성과 광학적 성질에 대해서 논의하였다. 제조된 ZnO막은 (002)면으로 정렬되어 있으며 380nm파장에서 예리한 흡수단이 있고 가시광선 영역에서 투명(투과율 70% 이상)하였는데 이 흡수단은 ZnO의 밴드 갭(3.2eV)과 잘 일치한다. 저온에서의 띠끝 PL스펙트럼은 속박된 엑시톤 복합체와 포논 복제에 의한 다중선 구조를 보인다.