• Title/Summary/Keyword: Zinc oxide film

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3-dimensional nanostructured ZnO gas sensor (3차원 ZnO 나노구조체 가스센서)

  • Park, Yong-Wook;Shin, Hyun-Yong;Yoon, Seok-Jin
    • Journal of Sensor Science and Technology
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    • v.19 no.5
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    • pp.356-360
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    • 2010
  • Due to the high surface-to-volume ratio, the 3-dimensional(3D) nanostructures of metal oxides are regarded as the best candidate materials for the chemical gas sensors. Here we have synthesised flower-like 3D zinc oxide nanostructures through a simple hydrothermal route. Specific surface area of the 3D zinc oxide nanostructures synthesised in different pH values from 9.0 to 12.0 were evaluated by using a BET analyzer and the results were compared with that of a zinc oxide thin film fabricated by rf sputtering. Using interdigitated electrodes, superior CO gas sensing properties of the 3D zinc oxide nanostructures on the ZnO thin film to those of the ZnO thin film were demonstrated.

Characteristics of indium zinc oxide thin films with input power and film thickness (투입전력 및 두께 변화 조건에 따른 Indium zinc oxide 박막의 특성)

  • Rim, You-Seung;Kim, Sang-Mo;Keum, Min-Jong;Son, In-Hwan;Jang, Kyung-Wook;Kim, Kyung-Hwan
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.11a
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    • pp.406-407
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    • 2007
  • We prepared indium zinc oxide (IZO) thin film for cathode electrode such as an application of flat panel display by using the facing targets sputtering (FTS) method at room temperature. The effects of input power and film thickness were investigated with respect to physical and optical properties of films such as deposition rate, electrical properties, microstructure and transmittance. We could obtain properties of IZO thin films of under $10^{-3}\;{\Omega}-cm$ in resistivity and the thin films of over 90% in transmittance. Also, we obtained IZO thin films which were an amorphous structure.

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Strain sensing skin-like film using zinc oxide nanostructures grown on PDMS and reduced graphene oxide

  • Satish, Tejus;Balakrishnan, Kaushik;Gullapalli, Hemtej;Nagarajaiah, Satish;Vajtai, Robert;Ajayan, Pulickel M.
    • Structural Monitoring and Maintenance
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    • v.4 no.2
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    • pp.107-113
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    • 2017
  • In this paper, we present a strain-sensitive composite skin-like film made up of piezoresistive zinc oxide (ZnO) nanorods embedded in a flexible poly(dimethylsiloxane) substrate, with added reduced graphene oxide (rGO) to facilitate connections between the nanorod clusters and increase strain sensitivity. Preparation of the composite is described in detail. Cyclic strain sensing tests are conducted. Experiments indicate that the resulting ZnO-PDMS/rGO composite film is strain-sensitive and thus capable of sensing cycling strain accurately. As such, it has the potential to be molded on to a structure (civil, mechanical, aerospace, or biological) in order to provide a strain sensing skin.

Nd:YVO4 Laser Patterning of Various Transparent Conductive Oxide Thin Films on Glass Substrate at a Wavelength of 1,064 nm

  • Wang, Jian-Xun;Kwon, Sang Jik;Cho, Eou Sik
    • Transactions on Electrical and Electronic Materials
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    • v.14 no.2
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    • pp.59-62
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    • 2013
  • At an infra-red (IR) wavelength of 1,064 nm, a diode-pumped Q-switched $Nd:YVO_4$ laser was used for the direct patterning of various transparent conductive oxide (TCO) thin films on glass substrate. With various laser beam conditions, the laser ablation results showed that the indium tin oxide (ITO) film was removed completely. In contrast, zinc oxide (ZnO) film was not etched for any laser beam conditions and indium gallium zinc oxide (IGZO) was only ablated with a low scanning speed. The difference in laser ablation is thought to be due to the crystal structures and the coefficient of thermal expansion (CTE) of ITO, IGZO, and ZnO. The width of the laser-patterned grooves was dependent on the film materials, the repetition rate, and the scanning speed of the laser beam.

Effects of an Aluminum Contact on the Carrier Mobility and Threshold Voltage of Zinc Tin Oxide Transparent Thin Film Transistors

  • Ma, Tae-Young
    • Journal of Electrical Engineering and Technology
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    • v.9 no.2
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    • pp.609-614
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    • 2014
  • We fabricated amorphous zinc tin oxide (ZTO) transparent thin-film transistors (TTFTs). The effects of Al electrode on the mobility and threshold voltage of the ZTO TTFTs were investigated. It was found that the aluminum (Al)-ZTO contact decreased the mobility and increased the threshold voltage. Traps, originating from $AlO_x$, were assumed to be the cause of degradation. An indium tin oxide film was inserted between Al and ZTO as a buffer layer, forming an ohmic contact, which was revealed to improve the performance of ZTO TTFTs.

Zinc Oxide Nanostructured Thin Film as an Efficient Photoanode for Photoelectrochemical Water Oxidation

  • Park, Jong-Hyun;Kim, Hyojin
    • Korean Journal of Materials Research
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    • v.30 no.9
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    • pp.441-446
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    • 2020
  • Synthesizing nanostructured thin films of oxide semiconductors is a promising approach to fabricate highly efficient photoelectrodes for hydrogen production via photoelectrochemical (PEC) water splitting. In this work, we investigate the feasibility as an efficient photoanode for PEC water oxidation of zinc oxide (ZnO) nanostructured thin films synthesized via a simple method combined with sputtering Zn metallic films on a fluorine-doped tin oxide (FTO) coated glass substrate and subsequent thermal oxidation of the sputtered Zn metallic films in dry air. Characterization of the structural, optical, and PEC properties of the ZnO nanostructured thin film synthesized at varying Zn sputtering powers reveals that we can obtain an optimum ZnO nanostructured thin film as PEC photoanode at a sputtering power of 40 W. The photocurrent density and optimal photocurrent conversion efficiency for the optimum ZnO nanostructured thin film photoanode are found to be 0.1 mA/㎠ and 0.51 %, respectively, at a potential of 0.72 V vs. RHE. Our results illustrate that the ZnO nanostructured thin film has promising potential as an efficient photoanode for PEC water splitting.

Morphological and Structural Characterization of ZnO Films Deposited by Multiple Sol-Gel Methods (다중 졸-겔 방법에 의해 증착된 ZnO 막의 형태적 및 구조적 특성평가)

  • Muhammad Saqib;Woo Young Kim
    • Journal of the Korean Applied Science and Technology
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    • v.40 no.5
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    • pp.1116-1125
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    • 2023
  • Zinc oxide film is a transparent conductive material and is used in optoelectronic devices in various fields. Therefore, characterization of the zinc oxide film will play a very important role in improving the performance of optoelectronic devices. Here, we will evaluate the morphological and structural characteristics of such a zinc oxide film based on the solution process. Specifically, the sol-gel method will be repeatedly performed to observe the change in material properties of the zinc oxide film according to the number of times of spin-coating. It was confirmed that crystallization proceeded as a result of performing the sol-gel method repetitively 5 times under constant solution conditions. At 7 times or more, the element composition and crystallinity tended to converge to a specific value. The average crystal size of the final zinc oxide film was calculated to be about 10.7 nm. In this study, the number of processes showing optimal crystallization was 7 times. The results and methodology of this study can be applied while varying various solution process variables and are expected to contribute to establishing optimal process conditions.

Characterization of a Solution-processed YHfZnO Gate Insulator for Thin-Film Transistors

  • Kim, Si-Joon;Kim, Dong-Lim;Kim, Doo-Na;Kim, Hyun-Jae
    • Journal of Information Display
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    • v.11 no.4
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    • pp.165-168
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    • 2010
  • A solution-processed multicomponent oxide, yttrium hafnium zinc oxide (YHZO), was synthesized and deposited as a gate insulator. The YHZO film annealed at $600^{\circ}C$ contained an amorphous phase based on the results of thermogravimetry, differential thermal analysis, and X-ray diffraction. The electrical characteristics of the YHZO film were analyzed by measuring the leakage current. The high dielectric constant (16.4) and high breakdown voltage (71.6 V) of the YHZO films resulted from the characteristics of $HfO_2$ and $Y_2O_3$, respectively. To examine if YHZO can be applied to thin-film transistors (TFTs), indium gallium zinc oxide TFTs with a YHZO gate insulator were also fabricated. The desirable characteristics of the YHZO films when used as a gate insulator show that the limitations of the general binary-oxide-based materials and of the conventional vacuum processes can be overcome.

Effects of Oxygen on the Properties of Mg-doped Zinc Tin Oxide Films Prepared by rf Magnetron Sputtering (rf 마그네트론 스퍼터링으로 증착한 Mg-doped Zinc Tin Oxide막의 특성에 미치는 산소의 영향)

  • Park, Ki Cheol;Ma, Tae Young
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.26 no.5
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    • pp.373-379
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    • 2013
  • Mg-doped zinc tin oxide (ZTO:Mg) thin films were prepared on glasses by rf magnetron sputtering. $O_2$ was introduced into the chamber during the sputtering. The optical properties of the films as a function of oxygen flow rate were studied. The crystal structure, elementary properties, and depth profiles of the films were investigated by X-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS), and secondary ion mass spectrometry (SIMS), respectively. Bottom-gate transparent thin film transistors were fabricated on $N^+$ Si wafers, and the variation of mobility, threshold voltage etc. with the oxygen flow rate were observed.