• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.29 no.2
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• pp.120-124
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• 2016

In this study, we fabricate transparent and bendable a-IGZO (amorphous indium gallium zinc oxide) TFTs (thin-film transistors) with a-IZO (amorphous indium zinc oxide) transparent electrodes on plastic substrates and investigate their electrical characteristics under bending states. Our a-IGZO TFTs show a high transmittance of 82% at a wavelength of 550 nm. And these TFTs have an $I_{on}/I_{off}$ ratio of $1.8{\times}10^8$, a field effect mobility of $15.4cm^2/V{\cdot}s$, and a subthreshold swing of 186 mV/dec. The good electrical characteristics are retained even after bending with a curvature radius of 18 mm corresponding to a strain of 0.5% owing to mechanical durability of the transparent electrodes used in this study.

• Transactions on Electrical and Electronic Materials
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• v.17 no.1
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• pp.46-49
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• 2016

A thin film transistor (TFT) has been fabricated using the amorphous 0.5 wt% Si doped zinc-tin-oxide (a-0.5 SZTO) with different electrodes made of either aluminium (Al) or titanium/aluminium(Ti/Al). Contact resistance and total channel resistance of a-0.5SZTO TFTs have been investigated and compared using the transmission line method (TLM). We measured the total resistance of 1.0×10² Ω/cm using Ti/Al electrodes. This result is due to Ti, which is a material known for its adhesion layer. We found that the Ti/Al electrode showed better contact characteristics between the channel and electrodes compared with that made of Al only. The former showed a less contact and total resistance. We achieved high performance of the TFTs characteristic, such as Vth of 2.6 V, field effect mobility of 20.1 cm² V⁻¹s⁻¹, S.S of 0.9 Vdecade⁻¹, and on/off current ratio of 9.7×10⁶ A. It was demonstrated that the Ti/Al electrodes improved performance of TFTs due to enhanced contact resistance.

• 한국정보디스플레이학회:학술대회논문집
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• 2008.10a
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• pp.831-833
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• 2008

150 nm thick Ga-doped ZnO thin film, which was deposited by a sputtering process, was wet-chemically etched by using various organic acids such as oxalic, citric and formic acid. Wet etch parameters including etchant concentration and temperature are investigated for each etchant, and their effects on the etch rate and the feature of edge line are compared.

• 한국정보디스플레이학회:학술대회논문집
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• 2009.10a
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• pp.543-545
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• 2009

With injection-type source delivery system of atomic layer deposition (ALD), bottom-contact and bottom-gate thin-film transistors (TFTs) were fabricated with a poly-4-vinyphenol polymeric dielectric for the first time. The properties of the ZnO TFT were greatly influenced by the device structure and the process conditions. The zinc oxide TFTs exhibited a channel mobility of 0.43 $cm^2$/Vs, a threshold voltage of 0.85 V, a subthreshold slope of 3.30 V/dec, and an on-to-off current ratio of above $10^6$ with solid saturation.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2016.11a
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• pp.188-188
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• 2016

GZO 박막은 상업적으로 사용되는 ITO를 경제적으로 대체할 수 있는 유망한 투명 전도 물질이며, 인체에 무해하고, 공급이 쉬우며, 화학적으로 안정하다. 특히, CIGS와 같은 광전변환 소자 전극에서는 부식 저항이 매우 중요한데, 습한 환경에서 견뎌낼 수 있다는 장점이 있다. GZO는 3가 갈륨이 2가 아연에 도핑된 n타입의 반도체 물질이다. 그리고 육각형의 황화아연 물질의 전기 전도도는 산소 결핍에 매우 의존한다. GZO의 수소는 산소 결핍 집중에 영향을 끼친다. 따라서 이 연구에서는 RF 마그네트론 스퍼터링 실험 동안 수소 함유량을 다양화 시키고, 면 저항, 광 투과도, 부식저항의 효과를 조사한다. 수소량이 증가할수록, 면 저항은 향상되어지고, 특정 지점을 넘으면 감소한다. 분극 실험에 의해 측정되어진 부식 저항은 박막의 미세조직과 결정립계의 특성에 더 의존되어진다. 훨씬 더 많은 수소를 함량한 비정질이 부식 저항성에 있어서 유효한 차이를 나타내지 못하는 동안 결정 내에서 많은 수소를 지닌 작은 결정의 결정립계는 낮은 분극저항, 즉 낮은 부식 저항성의 결과를 도출한다.

• Proceedings of the Materials Research Society of Korea Conference
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• 2011.10a
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• pp.43.1-43.1
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• 2011

Hydrogenated amorphous Si (a-Si:H), low temperature poly Si (LTPS) 등 기존 thin film transistors (TFTs)에 사용되던 채널 물질을 대체할 재료로써 다양한 연구가 진행되고 있는 amorphous indium-gallium-zinc-oxide (a-IGZO)는 TFT에 적용하였을 때 뛰어난 전기적 특성과 재연성을 나타낼 뿐만 아니라 넓은 밴드갭을 가져 투명소자로도 응용이 가능하다. 본 연구에서는 a-IGZO의 열처리에 따른 소자의 전기적 특성과 조성 분포의 관계를 확인하기 위해 다음과 같이 실험을 진행하였다. Si/SiO2 기판 위에 DC sputter를 이용하여 IGZO를 증착하고 $350^{\circ}C$에서 열처리를 한 후 evaporator로 Al 전극을 형성시켰다. 이 때 전기적 특성의 변화를 비교하기 위해 열처리 한 샘플과 열처리 하지 않은 샘플에 대해 I-V 특성을 측정하였고, 채널 내부의 조성 분포 변화를 transmission electron microscopy (TEM)의 energy dispersive spectrometer (EDS)를 이용하여 관찰하였다. 그 결과 열처리 된 a-IGZO 채널 층의 산소 비율이 감소하였으며 전체적인 조성이 고르게 분포 되었고 전기적 특성은 향상되었다.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.18 no.2
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• pp.72-75
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• 2008

Zinc oxide (ZnO) thin films were prepared by a sol-gel method. The structural and electrical properties were investigated by varying drying and annealing temperatures. The thin films were coated (250 nm) by spin-coating method on glass substrates. The optimum drying temperature of ZnO thin films was 300$^{\circ}C$ where the resistivity was the lowest and the preferred c-axis orientation was the highest. The annealing was carried out in air and inert atmospheric conditions. The degree of the preferred c-axis orientation was estimated. The highest preferred c-axis orientation was recorded at 600$^{\circ}C$. The preferred c-axis orientation and grain growth resulted in the mobility enhancement of the ZnO thin films, and the lowest resistivity was 0.62${\Omega}{\cdot}cm$ at 600$^{\circ}C$.

• 한국정보디스플레이학회:학술대회논문집
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• 2005.07b
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• pp.1526-1529
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• 2005

Zinc oxide films have been actively investigated as transparent electrode materials for display. We report the effect of the working pressures on electro-optical properties of Al-doped ZnO thin films deposited by d.c. magnetron sputtering. The resistivity of the ZnO thin films was depended on atomic bombardment effect by working pressure.

• Proceedings of the KIEE Conference
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• 2015.07a
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• pp.1151-1152
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• 2015

Silicon zinc oxide (SZO) thin films were deposited via co-sputtering. Two kinds of post-treatment, furnace annealing and hot pressing, were carried out on the deposited SZO films. The effects of the post-treatment on the chemical bond and surface roughness of the deposited SZO films were analyzed as functions of the post-treatment conditions that were used. It was observed from the X-ray photoelectron spectroscopy (XPS) results that the amount of Si-O bonds in the SZO film drastically increased after the low-temperature furnace annealing. The experiment results showed that the hot pressing method would be favorable as it could improve the electrical characteristics of the SZO-TFTs.

• 한국정보디스플레이학회:학술대회논문집
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• 2009.10a
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• pp.1408-1411
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• 2009

This paper describes organic acid-based wet chemical etching behaviors of amorphous Ga-doped zinc oxide (GZO) thin film sputter-deposited at low temperature (room temperature). Wet etch parameters such as etching time, temperature, and etchant concentration are investigated for formic and citric acid etchants, and their effects on the etch rate, etch residue and the feature of edge line are compared.