• Title/Summary/Keyword: X2 Interface

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Spatial Pattern of Copper Phosphate Precipitation Involves in Copper Accumulation and Resistance of Unsaturated Pseudomonas putida CZ1 Biofilm

  • Chen, Guangcun;Lin, Huirong;Chen, Xincai
    • Journal of Microbiology and Biotechnology
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    • v.26 no.12
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    • pp.2116-2126
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    • 2016
  • Bacterial biofilms are spatially structured communities that contain bacterial cells with a wide range of physiological states. The spatial distribution and speciation of copper in unsaturated Pseudomonas putida CZ1 biofilms that accumulated 147.0 mg copper per g dry weight were determined by transmission electron microscopy coupled with energy dispersive X-ray analysis, and micro-X-ray fluorescence microscopy coupled with micro-X-ray absorption near edge structure (micro-XANES) analysis. It was found that copper was mainly precipitated in a $75{\mu}m$ thick layer as copper phosphate in the middle of the biofilm, while there were two living cell layers in the air-biofilm and biofilm-medium interfaces, respectively, distinguished from the copper precipitation layer by two interfaces. The X-ray absorption fine structure analysis of biofilm revealed that species resembling $Cu_3(PO_4)_2$ predominated in biofilm, followed by Cu-Citrate- and Cu-Glutathione-like species. Further analysis by micro-XANES revealed that 94.4% of copper were $Cu_3(PO_4)_2$-like species in the layer next to the air interface, whereas the copper species of the layer next to the medium interface were composed by 75.4% $Cu_3(PO_4)_2$, 10.9% Cu-Citrate-like species, and 11.2% Cu-Glutathione-like species. Thereby, it was suggested that copper was initially acquired by cells in the biofilm-air interface as a citrate complex, and then transported out and bound by out membranes of cells, released from the copper-bound membranes, and finally precipitated with phosphate in the extracellular matrix of the biofilm. These results revealed a clear spatial pattern of copper precipitation in unsaturated biofilm, which was responsible for the high copper tolerance and accumulation of the biofilm.

The Influence of Air Cavity on Interface Doses for Photon Beams (X선치료 조사야 내 공동의 존재에 따른 선량분포의 측정)

  • Chung Se Young;Kim Young Bum;Kwon Young Ho;Kim You Hyun
    • The Journal of Korean Society for Radiation Therapy
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    • v.10 no.1
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    • pp.69-77
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    • 1998
  • When a high energy photon beam is used to treat lesions located in the upper respiratory air passages or in maxillary sinus, the beams often must traverse an air cavity before it reaches the lesion. Because of this traversal of air, it is not clear that the surface layers of the lesion forming the air-tumor tissue interface will be in a state of near electronic equilibrium; if they are not, underdosing of these layers could result. Although dose corrections at large distances beyond an air cavity are accountable by attenuation differences, perturbations at air-tissue interfaces are complex to measure or calculate. This problem has been investigated for 4MV and 10MV X-ray beams which are becoming widely available for radiotherapy with linear accelerator. Markus chamber was used for measurement with variouse air cavity geometries in X-ray beams. Underdosing effects occur at both the distal and proximal air cavity interface. The magnitude depended on geometry, energy, field sizes and distance from the air-tissue interfaces. As the cavity thickness increased, the central axis dose at the distal interface decreased. Increasing field size remedied the underdosing, as did the introduction of lateral walls. Fellowing a $20{\times}2{\times}2\;cm^3$\;air\;cavity,\;4{\times}4\;cm\;field\;there\;was\;an\;11.5\%\;and\;13\%\;underdose\;at\;the\;distal\;interface,\;while\;a\;20{\times}20{\times}2\;cm^3\;air\;cavity\;yielded\;a\;24\%\;and\;29\%$ loss for the 4MV and 10MV beams, respectively. The losses were slightly larger for the 10MV beams. The measurements reported here can be used to guide the development of new calculation models under non-equilibrium conditions. This situation is of clinical concern when lesions such as larynx and maxillary carcinoma beyond air cavities are irradiated.

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Temperature dependence of Heteroeptaxial $Y_2O_3$ films grown on Si by ionized cluster beam deposition

  • Cho, M.-H.;Ko, D.-H.;Whangbo, S.W.;Kim, H.B.;Jeong, K.H.;Whang, C.N.;Choi, S.C.;Cho, S.J.
    • Journal of the Korean Vacuum Society
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    • v.7 no.s1
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    • pp.57-77
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    • 1998
  • Heteroepitaxial $Y_2O_3$ films were grown on a Si(111) substrate by ionized cluster beam deposition(ICBD) in ultra high vacuum, and its qualities such as crystllitnity, film stress, and morphological characteristics were investigated using the various measurement methods. The crystallinity was investigated by x-ray diffraction (XRD) and reflection high energy electron diffraction (RHEED). Interface crystallinity was also examined by Rutherford backscattering spectroscopy(RBS) channeling, transmission electron microscopy(TEM). The stress of the films was measured by RBS channeling and XRD. Surface and interface morphological characteristics were investigated by atomic force microscopy (AFM) and x-ray scattering method. Comparing the interface with the surface characteristics, we can conclude that many defects at the interface region were generated by interface reaction between the yttrium metal and SiO2 layer and by ion beam characteristic such as shallow implantation, so that they influenced the film qualities. The film quality was dominantly depended on the characteristic temperature range. In the temperature range from $500^{\circ}C$ to $600^{\circ}C$, the crystallinity was mainly improved and the surface roughness was drastically decreased. On the other hand, in the temperature range from $600^{\circ}C$ to $700^{\circ}C$, the compressive stress and film density were dominantly increased, and the island size was more decreased. Also the surface morphological shape was transformed from elliptical shape to triangular. The film stress existed dominantly at the interface region due to the defects generation.

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Technological Trends in Open 5G Fronthaul (개방형 5G 프론트홀 기술 동향)

  • Lee, J.S.;Park, J.W.;Lee, M.S.
    • Electronics and Telecommunications Trends
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    • v.37 no.3
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    • pp.1-10
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    • 2022
  • Traditional centralized radio access network architecture used for 4G is based on Option 8, a functional split between PHY and RF. This option is commonly used with a fronthaul interface based on common public radio interface (CPRI) specifications; however, the increased data rates in 5G make this option impractical because of the fronthaul interface's high bandwidth requirement. Since CPRI specifications have many vendor-specific options, achieving multi-vendor interoperability becomes challenging. Open RAN (O-RAN) Alliance is developing novel open fronthaul interface specifications based on the functional split Option 7-2x, one of the intra-PHY split options, to relax the bandwidth requirement of the fronthaul interface and achieve multi-vendor interoperability. This article provides a brief overview of the various functional split options for 5G fronthaul that have been reported so far and existing fronthaul technologies. Further, the technological trends in the 5G open fronthaul interface is discussed, focusing on the O-RAN Alliance specifications under standardization.

Fabrication of interface-controlled Josephson junctions using Sr$_2$AlTaO$_6$ insulating layers

  • Kim, Jun-Ho;Choi, Chi-Hong;Sung, Gun-Yong
    • 한국초전도학회:학술대회논문집
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    • v.10
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    • pp.165-168
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    • 2000
  • We fabricated ramp-edge Josephson junctions with barriers formed by interface treatments instead of epitaxially grown barrier layers. A low-dielectric Sr$_2$AlTaO$_6$(SAT) layer was used as an ion-milling mask as well as an insulating layer for the ramp-edge junctions. An ion-milled YBa$_2$Cu$_3$O$_{7-x}$ (YBCO)-edge surface was not exposed to solvent through all fabrication procedures. The barriers were produced by structural modification at the edge of the YBCO base electrode using high energy ion-beam treatment prior to deposition of the YBCO counter electrode. We investigated the effects of high energy ion-beam treatment, annealing, and counter electrode deposition temperature on the characteristics of the interface-controlled Josephson junctions. The junction parameters such as T$_c$, I$_c$c, R$_n$ were measured and discussed in relation to the barrier layer depending on the process parameters.

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A Study on the Adhesion Strength and Residual Stress Measurement of Plasma Sprayed Cr$_3$C$_2$-NiCr Coating (크롬탄화물 용사피막의 접착력 및 잔류응력측정에 관한 연구)

  • ;;Kim, E. H.;Kwun, S. I.
    • Journal of Welding and Joining
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    • v.14 no.4
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    • pp.43-52
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    • 1996
  • The plasma sprayed Cr$_{2}$C$_{2}$-NiCr coatings are widely used as wear-resistant and corrosion-resistant materials. The mechanical properties of the plasma sprayed Cr$_{2}$C$_{2}$-NiCr coatings were examined in this study. The distribution of the residual stress with the coating thickness was also examined by X-ray diffraction method. The pore in the coatings could be classified into two types ; one is the intrinsic pore originated from the spraying powder, the other is the extrinsic pore formed during spraying. During the tensile adhesion test, the fracture occurred at the interface of top coat and substrate or top coat and bond coat depending on the existence of bond coat. It was found that the compressive residual stress near the interface decreased with the increase of the top coat thickness. The tensile adhesion strength of the coating without bond coat was higher than that with bond coat, because the coating with bond coat has higher horizontal crack density near the interface between bond coat and top coat.

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Synthesis, interfacial property, and application of new hybrid anion surfactant containing fluorocarbon and hydrocarbon chains

  • Kang, Eun-kyung;Sohn, Eun-Ho;Jung, Ga Young;Jung, Seon Hwa;Ha, Jong-Wook;Lee, Soo-Bok;Park, In Jun;Lee, Byung Min
    • Journal of Industrial and Engineering Chemistry
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    • v.67
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    • pp.72-79
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    • 2018
  • Hybrid F2HX surfactants bearing a sulfate moiety and both hydrocarbon and fluorocarbon chains were prepared by the reaction of alkyl glycidyl ethers with fluoro-alcohol, and subsequent sulfation. The fluorocarbon number in F2HX was fixed at the shortest number possible (i.e., 2), while the hydrocarbon number (X) in the second chain was varied between 2, 4, 6, and 8. Their surface-active properties and emulsion stabilities were systematically estimated as a function of the X. Among them, F2H8 exhibited the optimal surfactant performance, which was comparable to previously reported surfactants and it was successfully applied in the emulsion polymerization of vinylidene fluoride.

Effect of Post-Metallization Anneal (PMA) on Interface Trap Density of Si-$SiO_2$ (금속후 어닐링 방법이 Si-$SiO_2$ 계면 전하 농도에 미치는 영향)

  • Jung, Jong-Wan
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.11a
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    • pp.157-158
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    • 2007
  • Effects of post-metallization anneal (PMA) on interface trap characteristics of Si-$SiO_2$ are studied. The conventional PMA method utilizes forming gas anneal, where 10% hydrogen in nitrogen atmosphere is used. A new PMA method utilizes hydrogen rich PECVD- silicon nitride $(SiN_x)$ film as a hydrogen diffusion source and a out-diffusion blocking layer. It can be shown through charge pumping current measurement that the new PMA is indeed effective to decrease Si-$SiO_2$ interface trap density.

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Interfacial Diffusion in Fe/Cr Magnetic Multilayers Studied by Synchrotron X-ray Techniques (방사광 x-선 기법에 의한 다층형 Fe/Cr 자성박막의 계면확산 연구)

  • 조태식
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.2
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    • pp.223-227
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    • 2004
  • We have studied the interfacial diffusion of Fe/Cr multilayers using synchrotron x-ray techniques, such as x-ray reflectivity, extended x-ray absorption fine structures (EXAFS), and high-resolution x-ray scattering. The results of x-ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers increased with the Cr-layer thickness. The Fourier transform (FT) of EXAFS data clearly showed that the Fe atoms dominantly diffused into the stable Cr layers at the Fe/Cr interface. The results of high-resolution x-ray scattering supported the interfacial diffusion of Fe atoms. Out study revealed that the dominantly interfacial diffusion of Fe atoms into the Cr layers effects the interfacial roughness of the Fe/Cr multilayers.

Reset-first Resistance Switching Mechanism of HfO2 Films Based on Redox Reaction with Oxygen Drift-Diffusion

  • Kim, Jong-Gi;Lee, Sung-Hoon;Lee, Kyu-Min;Na, Hee-Do;Kim, Young-Jae;Ko, Dae-Hong;Sohn, Hyun-Chul
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.286-287
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    • 2012
  • Reset-first resistive switching mechanism based on reduction reaction in HfO2-x with oxygen drift-diffusion was studied. we first report that the indirect evidence of local filamentary conductive path formation in bulk HfO2 film with local TiOx region at Ti top electrode formed during forming process and presence of anion-migration at interface between electrode and HfO2 during resistive switching through high resolution transmission electron microscopy (HRTEM), electron disperse x-ray (EDX), and electron energy loss spectroscopy (EELS) mapping. Based on forming process mechanism, we expected that redox reaction from Ti/HfO2 to TiOx/HfO2-x was responsible for an increase of initial current with increasing the post-annealing process. First-reset resistive switching in above $350^{\circ}C$ annealed Ti/HfO2 film was exhibited and the redox phenomenon from Ti/HfO2 to TiOx/HfO2-x was observed with high angle annular dark field (HAADF) - scanning transmission electron microscopy (STEM), EDX and x-ray photoelectron spectroscopy. Therefore, we demonstrated that the migration of oxygen ions at interface region under external electrical bias contributed to bipolar resistive switching behavior.

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