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Changes in plant hydraulic conductivity in response to water deficit

  • Kim, Yangmin X.;Sung, Jwakyung;Lee, Yejin;Lee, Seulbi;Lee, Deogbae
    • Proceedings of the Korean Society of Crop Science Conference
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    • 2017.06a
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    • pp.35-35
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    • 2017
  • How do plants take up water from soils especially when water is scarce in soils? Plants have a strategy to respond to water deficit to manage water necessary for their survival and growth. Plants regulate water transport inside them. Water flows inside the plant via (i) apoplastic pathway including xylem vessel and cell wall and (ii) cell-to-cell pathway including water channels sitting in cell membrane (aquaporins). Water transport across the root and leaf is explained by a composite transport model including those pathways. Modification of the components in those pathways to change their hydraulic conductivity can regulate water uptake and management. Apoplastic barrier is modified by producing Casparian band and suberin lamellae. These structures contain suberin known to be hydrophobic. Barley roots with more suberin content from the apoplast showed lower root hydraulic conductivity. Root hydraulic conductivity was measured by a root pressure probe. Plant root builds apoplastic barrier to prevent water loss into dry soil. Water transport in plant is also regulated in the cell-to-cell pathway via aquaporin, which has received a great attention after its discovery in early 1990s. Aquaporins in plants are known to open or close to regulate water transport in response to biotic and/or abiotic stresses including water deficit. Aquaporins in a corn leaf were opened by illumination in the beginning, however, closed in response to the following leaf water potential decrease. The evidence was provided by cell hydraulic conductivity measurement using a cell pressure probe. Changing the hydraulic conductivity of plant organ such as root and leaf has an impact not only on the speed of water transport across the plant but also on the water potential inside the plant, which means plant water uptake pattern from soil could be differentiated. This was demonstrated by a computer simulation with 3-D root structure having root hydraulic conductivity information and soil. The model study indicated that the root hydraulic conductivity plays an important role to determine the water uptake from soil with suboptimal water, although soil hydraulic conductivity also interplayed.

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Study on Point Defect for $AgGaS_2$ Single Crystal Thin film Obtained by Photoluminescience Measurement Method (광발광 측정법에 의한 $AgGaS_2$ 단결정 박막의 점결함 연구)

  • Hong, Kwang-Joon;Kim, Koung-Suk
    • Journal of the Korean Society for Nondestructive Testing
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    • v.25 no.2
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    • pp.117-126
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    • 2005
  • A stoichiometric mixture of evaporating materials for $AgGaS_2$ single crystal thin films was prepared from horizontal electric furnace. To obtain the single crystal thin films, $AgGaS_2$ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the hot wall epitaxy (HWE) system. The source and substrate temperatures were $590^{\circ}C\;and\;440^{\circ}C$, respectively The temperature dependence of the energy band gap of the $AgGaS_2$ obtained from the absorption spectra was well described by the Varshni's relation, $E_g(T)=2.7284 eV-(8.695{\times}10^{-4}eV/K)T^2/T(T+332K)$. After the as-grown $AgGaS_2$, single crystal thin films was annealed in Ag-, S-, and Ga-atmospheres, the origin of point defects of $AgGaS_2$ single crystal thin films has been investigated by the photoluminescence(PL) at 10K. The native defects of $V_{Ag},\;V_s,\;Ag_{int},\;and\;S_{int}$, obtained by PL measurements were classified as a donors or acceptors type. And we concluded that the heat-treatment in the Ag-atmosphere converted $AgGaS_2$ single crystal thin films to an optical n-type. Also, we confirmed that Ga in $AgGaS_2$ crystal thin films did not form the native defects because Ga in $AgGaS_2$ single crystal thin films existed in the form of stable bonds.

Ship Detection Based on KOMPSAT-5 SLC Image and AIS Data (KOMPSAT-5 SLC 영상과 AIS 데이터에 기반한 선박탐지)

  • Kim, Donghan;Lee, Yoon-Kyung;Kim, Sang-Wan
    • Korean Journal of Remote Sensing
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    • v.36 no.2_2
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    • pp.365-377
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    • 2020
  • Continuous monitoring and immediate response is essential to protect the national maritime territory and maritime resources from the activities of illegal ships. Synthetic Aperture Radar (SAR) images with a wide range of images are effective for maritime surveillance asthe weather and day-night conditions rarely affect to image acquisition. However, an effective ship detection is not easy due to the huge data size of SAR images and various characteristics such as the speckle noise. In this study, the Human Visual Attention System (HVAS) algorithm was applied to KOMPSAT-5 to extract the initial targets, and the SAR-Split algorithm depending on the imaging modes was used to remove false alarms. The detected targets were finally selected by the Constant False Alarm Rate (CFAR) algorithm and matched with the ship's Automatic Identification System (AIS) information. Overall, the detected targets were well matched with AIS data, but some false alarms by ship wakes were observed. The detection rate was about 80% in ES mode and about 64% in ST mode. It is expected that the developed ship detection algorithm will contribute to the construction of a wide area maritime surveillance network.

Influence of the thermal preheating for the GaAs(100) substrate exerted on ZnTe epilayer (GaAs(100) 기판에 대한 열에칭이 ZnTe 에피층에 미치는 영향)

  • 남성운;유영문;오병성;이기선;최용대;정호용
    • Journal of the Korean Vacuum Society
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    • v.7 no.4
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    • pp.348-354
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    • 1998
  • To investigate an influence of the thermal preheating for the substrates exerted on the heteroepilayers, the ZnTe epilayers are grown on the GaAs (100) at the substrate temperature of 450~$630^{\circ}C$ by hot wall epitaxy (HWE). For this purpose, double crystal rocking curve (DCRC) and photoluminescence (PL) are measured. The full width at half maximum of DCRC are the smallest in the ZnTe epilayers grown on the GaAs thermally etched at around both $510^{\circ}C$ and $590^{\circ}C$. However, at around $550^{\circ}C$ they increase due to the reconstruction of the atoms in the surface. And they increase due to the oxide layer at below $490^{\circ}C$ and due to the surface defects at above $610^{\circ}C$. From PL analysis, the full width at half maximum of the light hole exciton $X_{1s,th}$ and of the second-order Raman line increase at around $550^{\circ}C$. With the increasing preheating temperature, the intensities of Y-bands and of the oxygen bound exciton (OBE) peak related to an oxide layer on the GaAs surface generally decrease. From these experimental results, it's confirmed that the GaAs substrate thermally etched influences the ZnTe pilayers.

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Study on chemical mechanical polishing characteristics of CdTe thin film absorption-layer for heterojunction thin film solar cell (이종접합 박막태양전지 흡광층 CdTe 박막의 화학적기계적연마 특성 연구)

  • Park, Ju-Sun;Lim, Chae-Hyun;Ryu, Seung-Han;Kim, Nam-Hoon;Lee, Woo-Sun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.04b
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    • pp.49-49
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    • 2009
  • 최근 범세계적인 그린에너지 정책에 관련해 화석연료를 대체할 수 있는 수소, 풍력, 태양광 등의 대체 에너지에 대한 관심이 고조되고 있다. 이러한 여러 대체에너지 중에서도 태양광을 전기에너지로 변환하는 태양전지에 관한 연구가 집중되고 있다. 태양전지는 구조적으로 단순하고 제조 공정도 비교적 간단하지만, 보다 널리 보급되기 위해서는 경제성 향상이라는 문제점을 해결해야 한다. 이를 위해서는 기존의 실리콘 태양전지를 대체할 수 있는 신물질에 대한 연구가 필요하며, 그 중에서도 반도체 기술을 이용한 박막형 태양전지는 기존의 실리콘 태양 전지가 가지고 있는 고비용이라는 문제점을 극복할 수 있을 것으로 기대를 모으고 있다. 박막형 태양전지의 박막 재료로는 CIGS, CdTe 등이 연구되어지고 있지만, 아직까지는 기존의 실리콘 태양전지에 비해 에너지변환효율이 낮은 이유로 인해 실용화가 많이 이루어지지 못하고 있는 것이 사실이다. 이러한 박막형 태양전지의 재료들 중에서도 CdTe는 이종접합 박막형 태양전지에 흡광층으로 사용되는 것으로 상온에서 1.45eV 정도의 밴드갭(band gap) 에너지를 갖는 II-VI족 화합물반도체로써 태양광 스펙트럼과 잘 맞는 이상적인 밴드랩 에너지와 높은 광흡수도 때문에 박막형 태양전지로 가장 주목을 받고 있다. CdTe 박막의 제조 방법으로는 진공증착법(vacuum evaporation), 전착법(electrodeposition), 스퍼터링법(sputtering) 등이 있지만 본 연구에서는 스퍼터링법을 이용하여 박막을 증착하였다. 이상과 같이 증착된 CdTe 박막을 화학적기계적연마(CMP, chemical mechanical polishing) 공정을 적용시킴으로써, 태양전지의 에너지변환효율에 직접적인 영향을 끼칠 수 있는 CdTe 박막의 물리적, 전기적 특성들의 변화를 연구하기 위한 선행 연구를 진행하였다. 특히 본 연구에서는 CdTe 박막의 화학적 기계적 연마 특성을 분석하여 정규화를 통한 모델링을 수행하였다. 또한 화학적기계적연마 공정 전과 후의 표면 특성을 관찰하기 위해 SEM(scanning electron microscopy)과 AFM(atomic forced microscope)를 이용하였으며, 구조적 특성 관찰을 XRD(X-ray diffraction)를 사용하여 실험을 수행하였다.

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Analysis of Spatio-Temporal Patterns of Nighttime Light Brightness of Seoul Metropolitan Area using VIIRS-DNB Data (VIIRS-DNB 데이터를 이용한 수도권 야간 빛 강도의 시·공간 패턴 분석)

  • Zhu, Lei;Cho, Daeheon;Lee, Soyoung
    • Journal of Cadastre & Land InformatiX
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    • v.47 no.2
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    • pp.19-37
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    • 2017
  • Visible Infrared Imaging Radiometer Suite Day-Night Band (VIIRS-DNB) data provides a much higher capability for observing and quantifying nighttime light (NTL) brightness in comparison with Defense Meteorological Satellite-Operational Linescan System (DMSP-OLS) data. In South Korea, there is little research on the detection of NTL brightness change using VIIRS-DNB data. This study analyzed the spatial distribution and change of NTL brightness between 2013 and 2016 using VIIRS-DNB data, and detected its spatial relation with possible influencing factors using regression models. The intra-year seasonality of NTL brightness in 2016 was also studied by analyzing the deviation and change clusters, as well as the influencing factors. Results are as follows: 1) The higher value of NTL brightness in 2013 and 2016 is concentrated in Seoul and its surrounding cities, which positively correlated with population density and residential areas, economic land use, and other factors; 2) There is a decreasing trend of NTL brightness from 2013 to 2016, which is obvious in Seoul, with the change of population density and area of industrial buildings as the main influencing factors; 3) Areas in Seoul, and some surrounding areas have high deviation of the intra-year NTL brightness, and 71% of the total areas have their highest NTL brightness in January, February, October, November and December; and 4) Change of NTL brightness between summer and winter demonstrated a significantly positive relation with snow cover area change, and a slightly and significantly negative relation with albedo change.

Quantitative analysis of formation of oxide phases between SiO2 and InSb

  • Lee, Jae-Yel;Park, Se-Hun;Kim, Jung-Sub;Yang, Chang-Jae;Kim, Su-Jin;Seok, Chul-Kyun;Park, Jin-Sub;Yoon, Eui-Joon
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.162-162
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    • 2010
  • InSb has received great attentions as a promising candidate for the active layer of infrared photodetectors due to the well matched band gap for the detection of $3{\sim}5\;{\mu}m$ infrared (IR) wavelength and high electron mobility (106 cm2/Vs at 77 K). In the fabrication of InSb photodetectors, passivation step to suppress dark currents is the key process and intensive studies were conducted to deposit the high quality passivation layers on InSb. Silicon dioxide (SiO2), silicon nitride (Si3N4) and anodic oxide have been investigated as passivation layers and SiO2 is generally used in recent InSb detector fabrication technology due to its better interface properties than other candidates. However, even in SiO2, indium oxide and antimony oxide formation at SiO2/InSb interface has been a critical problem and these oxides prevent the further improvement of interface properties. Also, the mechanisms for the formation of interface phases are still not fully understood. In this study, we report the quantitative analysis of indium and antimony oxide formation at SiO2/InSb interface during plasma enhanced chemical vapor deposition at various growth temperatures and subsequent heat treatments. 30 nm-thick SiO2 layers were deposited on InSb at 120, 160, 200, 240 and $300^{\circ}C$, and analyzed by X-ray photoelectron spectroscopy (XPS). With increasing deposition temperature, contents of indium and antimony oxides were also increased due to the enhanced diffusion. In addition, the sample deposited at $120^{\circ}C$ was annealed at $300^{\circ}C$ for 10 and 30 min and the contents of interfacial oxides were analyzed. Compared to as-grown samples, annealed sample showed lower contents of antimony oxide. This result implies that reduction process of antimony oxide to elemental antimony occurred at the interface more actively than as-grown samples.

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Structural and Electrical Properties of Fluorine-doped Zinc Tin Oxide Thin Films Prepared by Radio-Frequency Magnetron Sputtering

  • Pandey, Rina;Cho, Se Hee;Hwang, Do Kyung;Choi, Won Kook
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.335-335
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    • 2014
  • Over the past several years, transparent conducting oxides have been extensively studied in order to replace indium tin oxide (ITO). Here we report on fluorine doped zinc tin oxide (FZTO) films deposited on glass substrates by radio-frequency (RF) magnetron sputtering using a 30 wt% ZnO with 70 wt% SnO2 ceramic targets. The F-doping was carried out by introducing a mixed gas of pure Ar, CF4, and O2 forming gas into the sputtering chamber while sputtering ZTO target. Annealing temperature affects the structural, electrical and optical properties of FZTO thin films. All the as-deposited FZTO films grown at room temperature are found to be amorphous because of the immiscibility of SnO2 and ZnO. Even after the as-deposited FZTO films were annealed from $300{\sim}500^{\circ}C$, there were no significant changes. However, when the sample is annealed temperature up to $600^{\circ}C$, two distinct diffraction peaks appear in XRD spectra at $2{\Theta}=34.0^{\circ}$ and $52.02^{\circ}$, respectively, which correspond to the (101) and (211) planes of rutile phase SnO2. FZTO thin film annealed at $600^{\circ}C$ resulted in decrease of resistivity $5.47{\times}10^{-3}{\Omega}cm$, carrier concentration ~1019 cm-3, mobility~20 cm2 V-1s-1 and increase of optical band gap from 3.41 to 3.60 eV with increasing the annealing temperatures and well explained by Burstein-Moss effect. Change of work function with the annealing temperature was obtained by ultraviolet photoemission spectroscopy. The increase of annealing temperature leads to increase of work function from ${\phi}=3.80eV$ (as-deposited FZTO) to ${\phi}=4.10eV$ ($600^{\circ}C$ annealed FZTO) which are quite smaller than 4.62 eV for Al-ZnO and 4.74 eV for SnO2. Through X-ray photoelectron spectroscopy, incorporation of F atoms was found at around the binding energy of 684.28 eV in the as-deposited and annealed FZTO up to 400oC, but can't be observed in the annealed FZTO at 500oC. This result indicates that F atoms in FZTO films are loosely bound or probably located in the interstitial sites instead of substitutional sites and thus easily diffused into the vacuum from the films by thermal annealing. The optical transmittance of FZTO films was higher than 80% in all specimens and 2-3% higher than ZTO films. FZTO is a possible potential transparent conducting oxide (TCO) alternative for application in optoelectronics.

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Effects of Growth Conditions on Properties of ZnO Nanostructures Grown by Hydrothermal Method (수열합성법으로 성장된 ZnO 나노구조의 성장조건에 따른 특성)

  • Cho, Min-Young;Kim, Min-Su;Kim, Ghun-Sik;Choi, Hyun-Young;Jeon, Su-Min;Yim, Kwang-Gug;Lee, Dong-Yul;Kim, Jin-Soo;Kim, Jong-Su;Lee, Joo-In;Leem, Jae-Young
    • Korean Journal of Materials Research
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    • v.20 no.5
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    • pp.262-266
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    • 2010
  • ZnO nanostructures were grown on an Au seed layer by a hydrothermal method. The Au seed layer was deposited by ion sputter on a Si (100) substrate, and then the ZnO nanostructures were grown with different precursor concentrations ranging from 0.01 M to 0.3M at $150^{\circ}C$ and different growth temperatures ranging from $100^{\circ}C$ to $250^{\circ}C$ with 0.3 M of precursor concentration. FE-SEM (field-emission scanning electron microscopy), XRD (X-ray diffraction), and PL (photoluminescence) were carried out to investigate the structural and optical properties of the ZnO nanostructures. The different morphologies are shown with different growth conditions by FE-SEM images. The density of the ZnO nanostructures changed significantly as the growth conditions changed. The density increased as the precursor concentration increased. The ZnO nanostructures are barely grown at $100^{\circ}C$ and the ZnO nanostructure grown at $150^{\circ}C$ has the highest density. The XRD pattern shows the ZnO (100), ZnO (002), ZnO (101) peaks, which indicated the ZnO structure has a wurtzite structure. The higher intensity and lower FWHM (full width at half maximum) of the ZnO peaks were observed at a growth temperature of $150^{\circ}C$, which indicated higher crystal quality. A near band edge emission (NBE) and a deep level emission (DLE) were observed at the PL spectra and the intensity of the DLE increased as the density of the ZnO nanostructures increased.

Calcium Aluminate Phosphor Supported $TiO_2$ Nanoparticles (산화(酸化)티탄 나노입자(粒子)가 담지(擔持)된 칼슘 알루미늄 형광체(螢光體))

  • Thube, Dilip R.;Kim, Jin-Hwan;Kang, Suk-Min;Ryu, Ho-Jin
    • Resources Recycling
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    • v.18 no.4
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    • pp.24-30
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    • 2009
  • Rare earth based calcium aluminate phosphor ($CaAl_2O_4:Eu^{2+}$, $Nd^{3+}$) supported $TiO_2$ nanoparticles are synthesized by using sol-gel method, which are further characterized using powder X-ray diffraction (XRD), fourier transform infrared (FT-IR), diffuse reflectance UV-Visible spectroscopy (DRS UV-Vis) and transmission electron microscopy (TEM). The XRD pattern of as-prepared and sintered phosphor supported $TiO_2$ does not show the tendency to change the crystal structure from anatase to rutile phase up to $600^{\circ}C$. This indicates that the phosphor support might inhibit the densification and crystallite growth by providing dissimilar boundaries. The diffuse reflectance spectral (DRS) measurements showed shift towards longer wavelength indicating reduction in the band-gap energy as compared to free $TiO_2$. The FT-IR spectra of phosphor supported $TiO_2$ nanoparticles show shift in the peak positions to lower wavelengths. This indicates that the $TiO_2$ nanoparticles are not free, but covalently bonded to the phosphor support. TEM micrographs show presence of crystalline and spherical $TiO_2$ nanoparticles (8 - 15 nm diameter) dispersed uniformly on the surface of phosphor.