• Journal of radiological science and technology
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• v.34 no.3
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• pp.189-193
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• 2011

Sitting position upper extremity X-ray examinations (SUEX) is the most widely used patient positioning method for upper extremity X-ray examinations. For this method, the radiation dose is considerable for relatively less interesting organs. We investigated whether patients need to wear the apron during the examination or not. We also studied the examination methods which can reduce the radiation dose. The results showed that radiation dose was reduced as the distance of source to patient becomes longer and the thickness of object grows higher.

• Journal of Radiation Protection and Research
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• v.43 no.4
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• pp.137-142
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• 2018

Background: Gamma-ray detectors having a thin window of a material with low atomic number can increase the true coincidence summing effects for radionuclides emitting X-rays or gamma-rays. This effect can make efficiency calibration or spectrum analysis more complicated. In this study, a Cu shield was tested as an X-ray filter to neglect the true coincidence summing effect by X-rays and gamma-rays in gamma-ray spectrometry, in order to simplify gamma-ray energy spectrum analysis. Materials and Methods: A Cu shield was designed and applied to an n-type high-purity germanium detector having an $X-{\gamma}$ summing effect during efficiency calibration. This was tested using a commercial, certified mixed gamma-ray source. The feasibility of a Cu shield was evaluated by comparing efficiency calibration results with and without the shield. Results and Discussion: In this study, the thickness of a Cu shield needed to avoid true coincidence summing effects due to $X-{\gamma}$ was tested and determined to be 1 mm, considering the detection efficiency desired for higher energy. As a result, the accuracy of the detection efficiency calibration was improved by more than 13% by reducing $X-{\gamma}$ summing. Conclusion: The $X-{\gamma}$ summing effect should be considered, along with ${\gamma}-{\gamma}$ summing, when a detection efficiency calibration is implemented and appropriate shielding material can be useful for simplifying analysis of the gamma-ray energy spectra.

• The Journal of the Petrological Society of Korea
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• v.3 no.1
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• pp.34-40
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• 1994

High pressure X-ray diffraction study was carried out on a graphite to investigate its compressibility as well as any possible phase transition to the hexagonal diamond structure at room temperature. Energy dispersive X-ray diffraction method was introduced using a Mao-Bell type diamond anvil cell with Synchrotron Radiation. Polycrystalline sodium chloride was compressed together with graphite for the high pressure determinations. Because of the poor resolution of the X-ray diffraction pattern of graphite, its compressibility was estimated to be almost same as that of NaCl by graphite (002) X-ray diffraction peak only. An observation of any new peak from a possible hexagonal diamond phase seems very unplausible for its definite identification based on the present data. Alternative approaches such as an Wiggler Radiation source as well as a Large Volume high pressure apparatus will be necessary for the detailed studies on a graphite in future.

• Korean Journal of Crystallography
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• v.12 no.4
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• pp.233-238
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• 2001

X-ray microdiffraction which uses x-ray beam focused down to a micron size from synchrotron radiation sources allow precision measurements of local orientation and strain variations in polycrystalline materials. Using x-ray microdiffraction setup at Pohang Light Source, we investigated the tex-ture of Cu interconnects with various widths on Si wafer by collecting Laue images and focused to about 2×3㎛ ² in size. Our results show that 1㎛ wide Cu interconnect had grains in rather ran- dom orientation. On the other hand the 20㎛ wide interconnects showed a 〈111〉fiber texture near the center. The grains were 2∼5㎛ long at the 1㎛ wide interconnect and 6∼8㎛ in size at the 20㎛ wide interconnect.

• KSCE Journal of Civil and Environmental Engineering Research
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• v.28 no.2D
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• pp.277-285
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• 2008

X-ray images are wildly used in medical applications, and these can be more efficiently find scoliosis which is appearing during the growth of human skeleton than others. This research is focused on the calibration of X-ray image and three-dimensional coordinate determination of objects. Three-dimensional coordinate of objects taken by X-ray are determined by two step procedure. Firstly, interior and exterior orientation parameters are determined by camera calibration using Primary Calibration Object (PCO) which has two sides with embedded radiopaque steel ball. Secondly, calibration cage coordinates which is composed of two acrylic sheets that are perpendicular to X-ray source are determined by the parameters. Three-dimensional coordinates of calibration cage determined by photogrammetric technique are compared with that of Coordinate Measuring Machine (CMM). Though the accuracy analysis, X direction which is parallel to X-ray source error values are relatively higher than those of Y and Z directions. But, the accuracies of Y and Z axis are approximately -3 mm to 3 mm. From the research results, it is considered that photogrammetric technique is applied to determine three-dimensional coordinates of patients or assist to make medical devices.

• Publications of The Korean Astronomical Society
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• v.30 no.2
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• pp.599-601
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• 2015

The short time scale X-ray variability associated with the accretion disk around compact objects is complex and is vaguely understood. The study of the cross correlation function gives an insight into the energy dependent behavior of the variations and hence connected processes. Using high resolution RXTE data, we investigate the dynamical cross correlation function of an observation of a black hole source XTE J1550-564 in the steep power law state. The cross correlation between soft and hard X- ray energy bands revealed both correlated and anti-correlated delays (${\leq}{\pm}15s$) on a correlation time scale of 50 s. It was noticed that the observed delays were similar to the delays between X-ray and optical/IR bands in other black hole and neutron star sources. We discuss the possible mechanisms/processes to explain the observed delays in the dynamical CCF.

• Nuclear Engineering and Technology
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• v.51 no.6
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• pp.1633-1637
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• 2019

While considering the photon attenuation coefficient (${\mu}$) and its related parameters for photons shielding, it is necessary to account for its transmitted and reflected photons energy spectra and dose contribution. Monte Carlo simulation was used to study the efficiency of clay ($1.99g\;cm^{-3}$) as a shielding material below 150 keV photon. Am-241 gamma source and an X-ray of 150 kVp were calculated. The calculated value of ${\mu}$ for Am-241 is higher within 5.61% compared to theoretical value for a single-energy photon. The calculated half-value layer (HVL) is 0.9335 cm, which is lower than that of ordinary concrete for X-ray of 150 kVp. A thickness of 2 cm clay was adequate to attenuate 90% and 85% of the incident photons from Am-241 and X-ray of 150 kVp, respectively. The same thickness of 2 cm could shield the gamma source dose rate of Am-241 (1 MBq) down to $0.0528{\mu}Sv/hr$. For X-ray of 150 kVp, photons below 60 keV were significantly decreased with 2 cm clay and a dose rate reduction by ~80%. The contribution of reflected photons and dose from the clay is negligible for both sources.

• Journal of the Korean Vacuum Society
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• v.8 no.1
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• pp.13-19
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• 1999

Total reflection X-ray fluorescence spectroscopy using synchrotron radiation source called as TRSFA was explored to achieve high sensitivities to impurity metals on Si wafer surface. It consists of monochromating part to select a specific wavelength, slit part to shield direct beam and to control monochromated beam, and main chamber to dectect fluorescent X-ray counts of impurities on si wafer. Monochromated X-ray of 10.90 KeV was selected and the optimum total reflection condition on silicon wafer was obtained through tuning the dead time and fluorescent X-ray count of Si and Fe. TRSFA system could increase the sensitivity as high as 50 times in comparision with TRXFA using normal X-ray source. But the trend was varied since the surface conditions of Si wafers and, therefore, the reflectivities were different. Furthemore, there seems to be a promising path to reaching a detection limit useful to the next generation metal impurities control, because Fe impurity below to the $5\times10^{9}\textrm{atomas/cm}^2$ can be detectable through the developed TRSFA system.

• Journal of the Korean Vacuum Society
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• v.8 no.2
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• pp.102-110
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• 1999

The LIGA X-ray exposure step was modelled into three inequalities, by assuming that the X-ray energy attenuated within a resist is deposited only in the localized range of the resist. From these inequalities, equations for the minimum and maximum exposure times required for a good quality microstructure were obtained. Also, an equation for the thickness of an X-ray mask absorber was obtained from the exposure requirement of threshold dose deposition. The calculation method of the synchrotron radiation power from a synchrotron radiation source was introduced and applied to an X-ray exposure step. A power from a synchrotron radiation source was introduced and applied to an X-ray exposure step/ A power function of photon energy, approximating the attenuation length of the representative LIGA resist, PMMA, and the mean photon energy of the XZ-rays incident upon an X-ray mask absorber were applied to the above mentioned equations. Consequently, the tendencies of the minimum and maximum exposure and with respect to mean photon energy and thick ness of PMMA was obtained. Additionally, the tendencies of the necessary thickness of PMMA and photon energy of the X-ray mask absorber with respect to thickness of PMMA and photon energy of the X-rays incident upon an X-ray mask absorber were examined. The minimum exposure time increases monotonically with increasing mean photon energy for the same total power density and is not a function of the thickness of resist. The minimum exposure time increases with increasing mean photon energy for the same total power density in the case of the general LIGA process, where the thickness of PMMA is thinner than the attenuation length of PMMA. Additionally, the minimum exposure time increases monotonically with increasing thickness of PMMA. The maximally exposable thickness of resist is proportional to the attenuation length of the resist at the mean photon energy with its proportional constant of ln $(Dd_m/D_{dv})$. The necessary thickness of a gold X-ray mask absorber due to absorption edges of gold, increases smoothly with increasing PMMA thickness ratio, and is independent of the total power density itself. The simplicity of the derived equations has made clearly understandable the X-ray exposure phenomenon and the correlation among the exposure times, the attenuation coefficient and the thickness of an X-ray mask absorber, the attenuation coefficient and the thickness of the resist, and the synchrotron radiation power density.

• Journal of the Korean Physical Society
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• v.73 no.12
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• pp.1834-1839
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• 2018

A tabletop ultrafast soft x-ray has been generated from the laser-produce plasma with a femtosecond pulsed Ti:Sapphire laser. The estimated total flux of Al $K{\alpha}$ is of $2.2{\times}10^9photons/sec$ in $4{\pi}$ radian and the parameters related to the optical performance were obtained. The tungsten/silicon multilayer, flat quartz and bent thallium acid phthalate (TLAP) crystal were used for monochromatization of soft x-ray to refine the aluminum $K{\alpha}$ radiation and compared the respective value of $E/{\Delta}E$. To estimate the size of the x-ray source beam generated by a fs laser, the approximation using the FWHM obtained from the x-ray beam scan near the focal point was discussed, and the size of the diameter was about $9.76{\mu}m$.