Browse > Article
http://dx.doi.org/10.3938/jkps.73.1834

A Monochromatic Soft X-ray Generation from Femtosecond Laser-produced Plasma with Aluminum  

Son, Joon-Gon (Department of Physics and Photon Science, Gwangju Institute of Science and Technology)
Hwang, Byung-Jun (Department of Physics and Photon Science, Gwangju Institute of Science and Technology)
Seo, Okkyun (Synchrotron X-ray Station at SPring-8, Research Network and Facility Services Division, National Institute for Materials Science (NIMS))
Kim, Jae Myung (Synchrotron X-ray Station at SPring-8, Research Network and Facility Services Division, National Institute for Materials Science (NIMS))
Noh, Do Young (Department of Physics and Photon Science, Gwangju Institute of Science and Technology)
Ko, Do-Kyeong (Department of Physics and Photon Science, Gwangju Institute of Science and Technology)
Abstract
A tabletop ultrafast soft x-ray has been generated from the laser-produce plasma with a femtosecond pulsed Ti:Sapphire laser. The estimated total flux of Al $K{\alpha}$ is of $2.2{\times}10^9photons/sec$ in $4{\pi}$ radian and the parameters related to the optical performance were obtained. The tungsten/silicon multilayer, flat quartz and bent thallium acid phthalate (TLAP) crystal were used for monochromatization of soft x-ray to refine the aluminum $K{\alpha}$ radiation and compared the respective value of $E/{\Delta}E$. To estimate the size of the x-ray source beam generated by a fs laser, the approximation using the FWHM obtained from the x-ray beam scan near the focal point was discussed, and the size of the diameter was about $9.76{\mu}m$.
Keywords
Soft x-ray; XRD; Femtosecond laser; Monochromatic; Aluminum;
Citations & Related Records
연도 인용수 순위
  • Reference
1 M. M. Murnane, H. C. Kapteyn, M. D. Rosen and R. W. Falcone, Science 251, 531 (1991).   DOI
2 D. Salzmann, Ch. Reich, I. Uschmann, E. Forster and P. Gibbon, Phys. Rev. E 65, 036402 (2002).   DOI
3 I. Choi, H. Kim, N. Hafz, T. Yu, J. Sung et al., J. Korean Phys. Soc. 55, 517 (2009).   DOI
4 I. Nam, M. Kim, S. Lee, D. Jang and H. Suk, J. Korean Phys. Soc. 69, 957 (2016).   DOI
5 J. Kim, Y. H. Hwangbo, S-Y. Lee, J. Korean Phys. Soc. 71, 256 (2017).   DOI
6 K. Sokolowski-Tinten, C. Blome, C. Dietrich, A. Tarase- vitch, M. Horn von Hoegen, D. von der Linde, A. Cav- alleri, J. Squier and M. Kammler, Phys. Rev. Lett. 87, 225701 (2001).   DOI
7 J. Feng, K. Engelhorn, B. I. Cho, H. J. Lee, M. Greaves, C. P. Weber, R. W. Falcone, H. A. Padmore and P. A. Heimann, Appl. Phys. Lett. 96, 134102 (2010).   DOI
8 V. Arora, P. A. Naik, J. A. Chakera, S. Bagchi, M. Tayyab and P. D. Gupta, AIP Advances 4, 047106 (2014).   DOI
9 S. Lee, I. W. Choi, I-B. Sohn, K. Lee, G. I. Shim et al., J. Korean Phys. Soc. 67, 800 (2015).   DOI
10 M. Iqbal, M. Ijaz, D. Y. Noh, J. Korean Phys. Soc. 70, 905 (2017).   DOI
11 C. J. Milne, T. J. Penfold and M. Chergui, Coord. Chem. Rev. 44, 277 (2014).
12 J. Gustafson, M. Shipilin, C. Zhang, A. Stierle, U. Hejral et al., Science 10, 1126 (2014).
13 D. Laurencin, A. Wong, W. Chrzanowski, J. C. Knowles, D. Qiu et al., Phys. Chem. Chem. Phys. 12, 1081 (2010).   DOI
14 M. G. Kim, H. J. Shin, J-H. Kim, S-H. Park and Y-K. Sun, J. Electrochem. Soc. 152, A1320 (2005).   DOI
15 K. Gilmore, Y. U. Idzerda and M. D. Stiles, Phys. Rev. Lett. 99, 027204 (2007).   DOI
16 M Yuste, R Escobar Galindo, I Caretti, R Torres and O Sanchez, J. Phys. D: Appl. Phys. 45, 025303, (2012).   DOI
17 F. L. Pedrotti, S. J., Leno S. Pedrotti and L. M. Pedrotti, Introduction to optics, 3rd (2006), Ch. 3.
18 H. Nakano, Y. Goto, P. Lu, T. Nishikawa and N. Uesugi, Appl. Phys. Lett. 75, 18 (1999).
19 M. Le, M. Ren, Z. Zhang, P. T. Sprunger, R. L. Kurtz and J. C. Flakea, J. Electrochem. Soc. 158, 45 (2011).
20 P. Gibbon and E. Forster, Plasma Phys. Control. Fusion 38, 769 (1996).   DOI
21 A. C. Thompson, D. T. Attwood, E. M. Gullikson, M. R. Howells, J. B. Kortright et al., X-ray data booklet, LBNL/PUB-490 (2001), Rev. 2, Table 1 - 3.
22 E. Kleymenov, J. A. van Bokhoven, C. David, P. Glatzel, M. Janousch et al., Rev. Sci. Instrum. 82, 065107 (2011).   DOI