• Journal of Korean Society for Quality Management
• /
• v.15 no.2
• /
• pp.10-19
• /
• 1987

Statistical control charts are useful tools to monitor and control the manufacturing processes and are widely used in most Korean industries. Many Korean companies, however, do not always obtain desired results from the traditional control charts by Shewhart such as the $\overline{X}$-chart, X-chart, $\widetilde{X}$-chart, etc. This is partly because the quality charterstics of the process are not distributed normally but are skewed due to the intermittent production, small lot size, etc. In the Shewhart $\overline{X}$-chart, which is the most widely used one in Korea, such skewed distributions make the plots to be inclined below or above the central line or outside the control limits although no assignable causes can be found. To overcome such shortcomings in nonnormally distributed processes, a distribution-free type of confidence interval can be used, which should be based on order statistics. This thesis is concerned with the design of control chart based on a sample median which is easy to use in practical situation and therefore properties for nonnormal distributions may be easily analyzed. Control limits and central lines are given for the more famous nonnormal distributions, such as Gamma, Beta, Lognormal, Weibull, Pareto, and Truncated-normal distributions.

• Journal of Korean Society of Industrial and Systems Engineering
• /
• v.23 no.57
• /
• pp.123-129
• /
• 2000

The Bootstrap method proposed by Efron is non-parametric method which doesn't depend on the estimation of prior distribution refer to population. A typical statistical process control chart which is generally used is developed under the assumption that observations follow mutually independent and identically distributed within a sample and between samples. However, autocorrelation greatly affect the developed control chart under the assumption that observations are mutually independent. Many researchers showed that the result which was analyzed by using a typical control chart for the observations which has the correlation violated to the independence assumption can not be true. Therefore, we compared the standard method with bootstrap method and then evaluated them for x control chart and EWMA control chart by using bootstrap method which was proposed by Efron in the AR(1) model when the observations have correlation.

• Journal of Korean Society for Quality Management
• /
• v.40 no.2
• /
• pp.176-185
• /
• 2012

After a work of Derman and Ross(1997) that considered simple main runs rules and derived ARL (Average Run Length) using Markov chain modeling, $\bar{X}$ control chart based on diverse alternative main and supplementary runs rules that is the most popular control chart for monitoring the mean of a process are proposed. This paper reviews and discusses the-state-of-art researches for these runs rules and classifies according to several properties of runs rules. ARL derivation for a proposed runs rule is also illustrated.

• The Journal of Engineering Geology
• /
• v.25 no.1
• /
• pp.9-20
• /
• 2015

A strainmeter goes through a period of instability immediately after installation. To determine the stability of strainmeters installed around the Andong fault zone, South Korea, an x-MR control chart analysis and a T² control chart analysis were conducted. The x-MR control chart analysis used an empirically determined 3σ control limit line to identify abnormal data in recently installed strain gauges. In the T² control chart analysis, the control limit line was set at a confidence of 95%. A comparison of the early stage of measurement with the terminal stage of measurement for three months after installation indicates that stabilization depends on the location and direction of each strain gauge in x-MR control chart analysis. In the T² control chart analysis, the number of values exceeding the control limit line decreased as the terminal stage was approached. Based on these results, it is suggested that the 3σ control limit line of an x-MR control chart can be used as a standard for single gauge stability, and that the 95% confidence limit of a T² control chart analysis could be used as the standard for the stability of multi-gauge strainmeters.

• Journal of Korean Society for Quality Management
• /
• v.32 no.4
• /
• pp.252-264
• /
• 2004

Variable sampling Interval (VSI) control charts vary the sampling interval according to value of the control statistic while the sample size is fixed. It is known that control charts with 2-state VSI scheme, which uses only two sampling intervals, give good statistical properties. Variable sample size (VSS) control charts vary the sample size according to value of the control statistic while the sampling interval is fixed. In the VSS scheme no optimal results are known for the number of sample sizes. It is also known that the variable sampling rate (VSR) $\bar{X}$ control chart with 2-state VSS and 2-state VSI scheme leads to large improvements In performance over the fixed sampling rate (FSR) $\bar{X}$ chart, but the optimal number of states for sample size Is not known. In this paper, the VSR Χ charts with multi-state VSS and 2-state VSI scheme are designed and compared to 2-state VSS and 2-state VSI scheme. The multi-state VSS scheme is considered to, achieve an additional improvement by switching from the 2-state VSS scheme. On the other hand, the multi-state VSI scheme is not considered because the 2-state scheme is known to be optimal. The 3-state VSS scheme improves substantially the sensitivity of the $\bar{X}$ chart especially for small and moderate mean shifts.

• Journal of Korean Society of Industrial and Systems Engineering
• /
• v.39 no.1
• /
• pp.116-122
• /
• 2016

Recently, the production cycle in manufacturing process has been getting shorter and different types of product have been produced in the same process line. In this case, the control chart using coefficient of variation would be applicable to the process. The theory that random variables are located in the three times distance of the deviation from mean value is applicable to the control chart that monitor the process in the manufacturing line, when the data of process are changed by the type of normal distribution. It is possible to apply to the control chart of coefficient of variation too. ${\bar{x}}$, s estimates that taken in the coefficient of variation have just used all of the data, but the upper control limit, center line and lower control limit have been settled by the effect of abnormal values, so this control chart could be in trouble of detection ability of the assignable value. The purpose of this study was to present the robust control chart than coefficient of variation control chart in the normal process. To perform this research, the location parameter, ${\bar{x_{\alpha}}}$, $s_{\alpha}$ were used. The robust control chart was named Tim-CV control chart. The result of simulation were summarized as follows; First, P values, the probability to get away from control limit, in Trim-CV control chart were larger than CV control chart in the normal process. Second, ARL values, average run length, in Trim-CV control chart were smaller than CV control chart in the normal process. Particularly, the difference of performance of two control charts was so sure when the change of the process was getting to bigger. Therefore, the Trim-CV control chart proposed in this paper would be more efficient tool than CV control chart in small quantity batch production.

• Proceedings of the Korean Society for Quality Management Conference
• /
• 2004.04a
• /
• pp.507-512
• /
• 2004

This research investigates economic-statistical characteristics of variable sampling size & interval(VSSI) X charts under two assignable causes. We propose the procedure for designing VSSI X charts, based on Lorenzen and Vance model. Computational experiments show that the VSSI X chart Is superior to the Shewhart X chart in the economic-statistical sense, even under two assignable causes

• Journal of the Korean Geosynthetics Society
• /
• v.17 no.2
• /
• pp.9-18
• /
• 2018

In this study, a field model experiment was performed to analyze the bahavior of slope during failure. It was analyzed through x-MR control chart method with inverse displacement and K-value. As a result, the portent was confirmed at 4 minutes before slope failure in Case 1. The change of the control limit line according to moving range was analyzed and it was effective to apply K = 3. Use of the inverse displacement and x-MR control chart method will be useful for the prediction of abnormal behavior through quick and objective judgment. Prediction of slope failure using control chart method can be used as basic data of slope measurement management standard, and it can contribute in reduction of life and property damage caused by slope disaster.

• Journal of Korean Society of Industrial and Systems Engineering
• /
• v.24 no.66
• /
• pp.19-26
• /
• 2001

I propose the control chart pattern to provide a more comprehensive scheme for detecting process X and R shifts using individual observations in start-up process. It is important to automate the identification of special disturbances to facilitate real-time manufacturing. This papers formulates X-R charts for interpretation by artificial neural networks. In this papers, which uses the backpropagation algorithm, two samples are fed into the trained neural network to provide outputs ranging from 0 to 1. Simulation results sow that the performance of the proposed control chart using the neural network(NNCC) is quite promising. Using these NN charts, guidelines are given for detecting and classifying process X and R shifts.

• Journal of Korean Society of Industrial and Systems Engineering
• /
• v.18 no.33
• /
• pp.143-151
• /
• 1995

In this design the sampling interval that each sampling time changes according to the valuse of the previous to sample statistics, sample mean and ranges. The VSI scheme uses large sample if the sample statistics appear near in side the control limits and smaller sample otherwise. The efficiency of the VSI scheme is compare to the FSI. It is shown that VSI control chart improves the confidence of the procedure and performens better than FSI control chart.