• 한국정밀공학회지
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• 제20권1호
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• pp.85-90
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• 2003

Removal rate and Within Wafer Non-Uniformity (WIWNU), the most critical issues in Chemical Mechanical Polish (CMP) process, are related to the pressure distribution, wafer shape, slurry flow, mechanical property of pad and etc. Among them, wafer warp generated by other various manufacturing process of wafer may induce the deviation of pressure distribution on the backside of wafer. In the convex shaped wafer the pressure onto the backside of wafer is higher than that of perfectly flat shaped wafer. Besides, such an added pressure is in proportion to the curvature of wafer. That is, the bigger the curvature of wafer becomes the higher the removal rate goes. And the WIWNU is known to be directly related to the pressure distribution on the wafer as well. In other words, the deviation of pressure distribution is in proportion to the WIWNU. In this paper, it is found that the wafer shape may be modified through heating the backside of it and thus properly changed pressure onto the backside of it may improve the WIWNU.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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• pp.341-344
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• 2006

LED chips are produced by cutting the sapphire on which GaN is evaporated. To cut the sapphire wafer into each LED chip, at first the wafer is scribed by diamond tool. To get the sharp groove shape for the nice cutting plane it is important the diamond tool shape, load, etc when the wafer is scribed. Here we tried to simulate the scribing process and get the scribing condition to reduce the wear rate of diamond tool for the sharp groove shape.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2005년도 춘계학술대회 논문집
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• pp.1-5
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• 2005

The grinding process is replacing lapping and etching process because significant cost savings and performance improvemnets is possible. This paper presents the experimental results of wafer grinding. A three-variable two-level full factorial design was employed to reveal the main effects as well as the interaction effects of three process parameters such as wheel rotational speed, chuck table rotational speed and feed rate on TTV and STIR of wafers. The chuck table rotaional speed was a significant factor and the interaction effects was significant. The ground wafer shape was affected by surface shape of chuck table.

• 전기학회논문지
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• 제60권7호
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• pp.1434-1437
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• 2011

Precision measurement of silicon wafer resistivity has been using single-configuration Four-Point Probe(FPP) method. This FPP method have to applying sample size, shape and thickness correction factor for a probe pin spacing to precision measurement of silicon wafer. The deference for resistivity measurement values applied correction factor and not applied correction factor was about 1.0 % deviation. The sample size, shape and thickness correction factor for a probe pin spacing have an effects on precision measurement for resistivity of silicon wafer.

• 반도체디스플레이기술학회지
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• 제9권1호
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• pp.23-28
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• 2010

In this paper, wafer drop from wafer guide mechanism, which is one of the serious problems in water transfer robot, is analyzed, and new wafer guide mechanisms are proposed to minimize this drop. Three types of new wafer guide mechanisms are proposed: roller type, gear type and L-shape rocker type. We choose one of the proposed mechanism, which is roller type, and verified this mechanism through real transfer experiment. Wafer picking up test is conducted with initial aligning error for simulating the wafer drop. Number of drop is compared between conventional mechanism and proposed mechanism. As a result, we can find the proposed mechanism can reduce the number of wafer drop dramatically.

• 한국멀티미디어학회논문지
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• 제14권5호
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• pp.632-641
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• 2011

본 논문에서는 반도체 생산 공정 중 클리닝 공정 설비에서, 웨이퍼의 장착 위치를 인식하는 영상 인식 시스템을 제안한다. 제안한 시스템은 웨이퍼의 위치 이탈에 따른 위치오차 발생 시 이를 클리닝 설비에 전달하여, 웨이퍼 클리닝 장비의 파손을 방지하여 시스템의 신뢰성과 경제성을 높이기 위한 것이다. 제안한 방법은 기존의 시스템에서 체스보드 형태의 캘리브레이터를 사용시 발생되는 오차를 줄이기 위하여 방사형 캘리브레이터를 디자인 및 제작하고 이의 매핑합수를 구하는데 있다. 제안한 시스템은 고 신뢰성과 고 정밀의 위치인식 알고리즘을 사용하여, 효율적으로 웨이퍼 인라인 공정에 설치함을 목표로 하며 실험결과 기존의 방법에 비해 충분한 허용 기준 내에서 오차를 검출해내는 좋은 성능을 보여준다.

• 반도체디스플레이기술학회지
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• 제15권3호
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• pp.6-11
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• 2016

Silicon wafer is one of main materials in solar cell. Micro-cracks in silicon wafer are one of reasons to decrease efficiency of energy transformation. They couldn't be observed by human eye. Also, their shape is not only various but also complicated. Accordingly, their shape classification is absolutely needed for manufacturing process quality and its feedback. The performance of typical classification techniques which is principal component analysis(PCA), neural network, fusion model to integrate PCA with neural network, and support vector machine(SVM), are evaluated using pattern features of micro-cracks. As a result, it has been confirmed that the SVM gives good results in micro-crack classification.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2010년도 추계학술대회 논문집
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• pp.113-114
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• 2010

• 한국산학기술학회논문지
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• 제15권11호
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• pp.6464-6471
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• 2014

웨이퍼 단위의 렌즈를 성형 시 일반적으로 UV경화 방식을 사용한다. 이 경우 발생될 수 있는 문제점은 크게. 경화후 이형과정에서 성형 렌즈의 금형 고착문제, 경화 공정 중 발생하는 소재의 수축 현상으로 렌즈간의 형상 오차 발생 및 웨이퍼 단위의 변형, 위치별 렌즈 형상 편차 발생, 웨이퍼 양면의 렌즈 형상 및 센터 정렬 오차 등이다. 이중 UV경화 과정에 직접적인 영향을 받는 것은 형상 오차 및 변형으로 그 요인은 UV 조사 균일성, UV 강도에 대한 경화도, UV 경화 소재의 수축 특성이다. 따라서 소재에 대한 경화 모델링 수립 및 경화 반응에 따른 수축율과 물성 변화에 대한 이론정립이 필요하다. 또한 이러한 모델링을 해석에 구현할 수 있는 해석 툴 개발이 필요하다. 본 연구에서는 Comsol을 이용하여 수립된 모델링을 반영하고 이를 통하여 웨이퍼 단위 렌즈의 성형 공정에 대한 해석 기법을 제안하였다. 이를 통해 7.2mm에 대한 누적 공차값을 실제 성형 공정 후 결과($0.149{\mu}m$)과 비교하여 제안한 해석 방법에 의한 결과($0.215{\mu}m$)을 비교, 검증을 수행하였으며 이를 통하여 UV경화 공정 후 변형에 대한 해석 가능성을 확인하였다.

• 한국전기전자재료학회논문지
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• 제18권9호
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• pp.798-802
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• 2005

The plating shape in the opening of photoresist becomes gradated shape in the fountain plating system, because bubbles from the wafer surface are difficult to escape from the deep openings, vias. In this paper, the bubble flow from the wafer surface during plating process was studied and we designed the tilted electrode ring to get uniform bump height on all over the wafer and evaluated the film uniformity by SEM and $\alpha-step$. In a-step measurement, film uniformities in the fountain plating system and the tilted electrode ring contact system were $\pm16.6\%,\;\pm4\%$ respectively.