• Title/Summary/Keyword: Vacuum ultraviolet

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Surface Reconstruction on Hydrogen Covered W(011) (수소가 흡착된 W(011) 표면의 재구성)

  • 김희봉;최원국;홍사용;황정남;정광호
    • Journal of the Korean Vacuum Society
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    • v.1 no.1
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    • pp.83-87
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    • 1992
  • Rencently, angle-resolved ultraviolet photoemission measurements of the Fermi surface contours for Mo(011) and W(011) are reported. The electron contour of W(011) is expanded upon hydrogen adsorption, which implies that the surface states consisting of electron pockets are shifted to higher binding energy. This phenomena can be explained by the band flattening. We explained here the reconstruction of W(011) surface induced by adsorption of hydrogen in terms of band flattening of surface states with a combination of S. E. Trullinger long range dipole-dipole interaction force and Kohn anomaly.

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Extreme Ultraviolet Plasma and its Emission Characteristics Generated from the Plasma Focus in Accordance with Gas Pressure for Biological Applications

  • Kim, Jin Han;Lee, Jin Young;Kim, Sung Hee;Choi, Eun Ha
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.178.2-178.2
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    • 2013
  • Conventional ultraviolets A,B,C are known to be very important factor of killing, changing surface properties of biological cells and materials. It is of great importance to investigate the influence of extreme ultraviolet (EUV) exposure on the biological cell. Here we have studied high density EUV plasma and its emission characteristics, which have been generated by plasma focus device with hypercycloidal pinch (HCP) electrode under various Ar gas pressures ranged from 30~500 mTorr in this experiment. We have also measured the plasma characteristics generated from the HCP plasma focus device such as electron temperature by the Boltzman plot, plasma density by the Stark broading method, discharge images by open-shuttered pin hole camera, and EUV emission signals by using the photodiode AXUV-100 Zr/C.

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Nano-patterning technology using an UV-NIL method (UV-NIL(Ultraviolet-Nano-Imprinting-Lithography) 방법을 이용한 나노 패터닝기술)

  • 심영석;정준호;손현기;신영재;이응숙;최성욱;김재호
    • Journal of the Korean Vacuum Society
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    • v.13 no.1
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    • pp.39-45
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    • 2004
  • Ultraviolet-nanoimprint lithography (UV-NIL) is a promising method for cost-effectively defining nanoscale structures at room temperature and low pressure. A 5${\times}$5${\times}$0.09 in. quartz stamp is fabricated using the etch process in which a Cr film was employed as a hard mask for transferring nanostructures onto the quartz plate. FAS(Fluoroalkanesilane) is used as a material for anti-adhesion surface treatment on the stamp and a thin organic film to improve adhesion on a wafer is formed by spin-coating. The low viscosity resin droplets with a nanometer scale volume are dispensed on the whole area of the coated wafer. The UV-NIL experiments have been performed using the EVG620-NIL. 370 nm - 1 m features on the stamp have been transferred to the thin resin layer on the wafer using the multi-dispensing method and UV-NIL process. We have measured the imprinted patterns and residual layer using SEM and AFM to evaluate the potential of the process.

Study of the Energy Level Alignment of Organic Materials' Planar Junction Prepared by Electrospray Vacuum Deposition

  • Kim, Ji-Hun;Hong, Jong-Am;Seo, Jae-Won;Gwon, Dae-Gyeon;Maeng, Min-Jae;Park, Yong-Seop
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.08a
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    • pp.235-235
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    • 2012
  • We investigated the energy levels of valence region at the planar junction of poly (3-hexylthiophene) (P3HT) and C61-butyric acid methylester (PCBM) using ultraviolet photoemission spectroscopy (UPS) with ultra high vacuum. These are the most widely used materials for bulk heterojunction (BHJ) organic solar cells due to their high efficiency. In order to make the planar junction, we carried out the electrospray vacuum deposition (EVD) of PCBM onto spin-coated P3HT in high vacuum conditions (${\sim}10^{-5}-10^{-6}$). The planar junction interface exhibited 0.71 eV for the offset between P3HT HOMO and PCBM LUMO, which is different from the gap (0.85 eV) of individual values and is closer to the open circuit voltage of solar cells fabricated with the same material combination.

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Vacuum Ultraviolet Emission Characteristics on High Xenon Mole Fraction at Low Pressure in AC-PDP (AC-PDP에서 저압의 높은 Xe함량 방전기체의 진공자외선 발광특성)

  • Son, C.G.;Kim, S.H.;Jung, S.H.;Han, Y.G.;Uhm, H.S.;Choi, E. H.
    • Journal of the Korean Vacuum Society
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    • v.18 no.2
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    • pp.92-96
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    • 2009
  • Nowadays, many research groups try to achieve the high Xe mole fraction discharge gas for high efficiency in AC-PDPs. However, the high Xe mole fraction discharge gas causes the high discharge voltage, which is a serious problem in AC-PDP's for high efficiency. In this study, the discharge gas with high Xe mole fraction and the low pressures has been applied and it's discharge voltage and vacuum ultraviolet emission characteristics have also been measured. It is shown that the discharge voltage is 354V and 389V at Ne+Xe (15%) with 400 Torr and Ne+Xe (30%) with 200 Torr, respectively. Their vacuum ultraviolet emission characteristics have similar characteristics to each other, in which their wavelengths are ranged from 140 nm to 200 nm. It is found in this experiment that the luminous efficiency for the discharge gas of Ne+Xe (30%) with 200 Torr is drastically increased by about 30%.

Gas dischage Simulation for Color Plasma Display Panel and Measurement of VUV (Vacuum UltraViolet) (칼라 플라즈마 디스플레이 패널용 혼합 가스 최적화 시뮬레이션 및 진공 자외선 측정)

  • Park, Hun-Gun;Lee, Seok-Hyun
    • Proceedings of the KIEE Conference
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    • 1997.07e
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    • pp.1666-1668
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    • 1997
  • This paper reports the optimal gas mixing ratio for color plasma display panel to improve luminous efficiency using gas dischage simulation which contains energy equation. We verified a simulation by measuring vacuum ultraviolet. The luminous efficiency has improved considerably(about 30%) by adding Ar (0.5%), compared with Ne-Xe(4%) mixing gas.

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Optical properties of epitaxial $Gd_2$O_3:EU^{3+}$luminescent thin films depending on crystallinity ($Gd_2$O_3:EU^{3+}$ 형광체 박막의 결정성에 따른 발광특성 연구)

  • 장문형;최윤기;정권범;황보상우;장홍규;노명근;조만호;손기선;김창해
    • Journal of the Korean Vacuum Society
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    • v.12 no.4
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    • pp.275-280
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    • 2003
  • Epitaxial Gd$_2O_3:Eu^{3+}$luminescent thin films have been grout on Si(III) substrates using ionized Cluster Beam Deposition (ICBD). After the film growing, they were implanted and post annealed to change the crystal structure. The initial growth stage was monitored by using in-situ Reflection High Energy Electron Diffraction (RHEED). The formed crystal structure was identified with X-ray diffraction (XRD) technique and Fourier transform infrared (FT-R) spectroscopy. The electronic states variations were investigated by Near Edge X-ray Absorption Fine Structure (NEXAFS). Photoluminescence (PL), Cathodoluminescence (CL). and Vacuum ultraviolet (VUV) spectrum were used for examining the optical properties. We report the optical property changes depending on crystal structure and the electronic states.