• Journal of the Korean Society of Industry Convergence
• /
• v.5 no.1
• /
• pp.39-43
• /
• 2002

In present much CMOS devices used in VLSI circuit and Logic circuit. With increasing a number of device in VLSI, the confidence becomes more serious. This paper describe the mechanism of breakdown on CMOS, especially n-MOS, based on Hydro Dynamic model with device self-heating. Additionally, illustrate the CMOS latch-up characteristics on simplified device structure on this paper.

• Journal of the Korean Institute of Telematics and Electronics B
• /
• v.30B no.11
• /
• pp.66-73
• /
• 1993

This paper presents an analog circuit implementation and experimental resuls of the Hopfield type neural network. The proposed architecture enables the reconfiguration betwewn feedback and feedforward networks and employs new circuit designs for the weight supply and storage, analog multilier, nd current-voltage converter, in order to achieve area efficiency as well as function al versatility. The layout design of the eight-neuron neural network is tested as an associative memory to verify its applicability to real world.

• JSTS:Journal of Semiconductor Technology and Science
• /
• v.7 no.4
• /
• pp.215-220
• /
• 2007

Leakage current of CMOS circuits has become a major factor in VLSI design these days. Although many circuit-level techniques have been developed, most of them require significant amount of designers' effort and are not aligned well with traditional VLSI design process. In this paper, we focus on technology mapping, which is one of the steps of logic synthesis when gates are selected from a particular library to implement a circuit. We take a radical approach to push the limit of technology mapping in its capability of suppressing leakage current: we use a probabilistic leakage (together with delay) as a cost function that drives the mapping; we consider pin reordering as one of options in the mapping; we increase the library size by employing gates with larger gate length; we employ a new flipflop that is specifically designed for low-leakage through selective increase of gate length. When all techniques are applied to several benchmark circuits, leakage saving of 46% on average is achieved with 45-nm predictive model, compared to the conventional technology mapping.

• Journal of the Korean Institute of Telematics and Electronics C
• /
• v.35C no.3
• /
• pp.16-23
• /
• 1998

In this paper, we present a fast and efficient Iterative Improvement Partitioning(IIP) technique for VLSI circuits and hybrid bucket structures on its implementation. The IIP algorithms are very widely used in VLSI circuit partition due to their time efficiency. As the performance of these algorithms depends on choices of moving cell, various methods have been proposed. Specially, Cluster-Removal algorithm by S. Dutt significantly improved partition quality. We indicate the weakness of previous algorithms wjere they used a uniform method for choice of cells during for choice of cells during the improvement. To solve the problem, we propose a new IIP technique that selects the method for choice of cells according to the improvement status and present hybrid bucket structures for easy implementation. The time complexity of proposed algorithm is the same with FM method and the experimental results on ACM/SIGDA benchmark circuits show improvment up to 33-44%, 45%-50% and 10-12% in cutsize over FM, LA-3 and CLIP respectively. Also with less CUP tiem, it outperforms Paraboli and MELO represented constructive-partition methods by about 12% and 24%, respectively.

• Journal of Korean Society of Industrial and Systems Engineering
• /
• v.23 no.60
• /
• pp.73-81
• /
• 2000

The testing processes for VLSI finished devices are considerably complex because they require different types of ATE to be linked together. Due to the interaction effect between two or more linked ATEs, it is difficult to trace down the cause of the unexpected longer ATE setup time and random yields, which frequently occur in the VLSI circuit-testing laboratory. The goal of this paper is to develop and demonstrate the methodology designed to eliminate the possible interaction factors that might affect the random yields and/or unexpected longer setup time as well as increase the productivity. The statistical method such as design of experiment or multivariate analysis cannot be applied to the final testing floor here directly due to the environmental constraints. Expanded product data information (PDI) is constructed by combining product data information and ATE control information. An architecture utilizing expanded PDI is designed, which enables the engineer to conduct statistical approach investigation and reduce the setup time, as well as increase yield.

• Journal of the Korean Institute of Telematics and Electronics
• /
• v.26 no.1
• /
• pp.104-112
• /
• 1989

A design automation method for sequential circuits implementation by mans of PLA is discussed, and an optimal state-code assignment algorithm to minimize the PLA area is proposed. In order to design sequential circuit automatically, DASL (Design Automation Support Language) [8] which is easy to describe and powerful to synthesize, is proposed and used to describe sequential circuit, An optimal statecode assignment algorithm which considers next states and outputs simultaneously is proposed, and by adopting this algorithm to various examples, the area of PLA is reduced by 10% comparing privious methods. This system is constructed to design microinstruction, FSM, VLSI control part synthesis.

• Journal of Broadcast Engineering
• /
• v.18 no.5
• /
• pp.669-679
• /
• 2013

This paper proposed a new VLSI (Very Large Scale Integrated Circuit) architecture for stereo matching in real time. We minimized the amount of calculation and the number of memory accesses through analyzing calculation of stereo matching. From this, we proposed a new stereo matching calculating cell and a new hardware architecture by expanding it in parallel, which concurrently calculates cost function for all pixels in a search range. After expanding it, we proposed a new hardware architecture to calculate cost function for 2-dimensional region. The implemented hardware can be operated with minimum 250Mhz clock frequence in FPGA (Field Programmable Gate Array) environment, and has the performance of 805fps in case of the search range of 64 pixels and the image size of $640{\times}480$.

• Journal of the Korean Institute of Telematics and Electronics B
• /
• v.31B no.9
• /
• pp.76-84
• /
• 1994

This paper presents a new high-performance VLSI architecture and VLSI implementation for full-search block matching algorithm. The proposed VLSI architecture has the feature of two directional parallel and pipeline processing, thereby reducing the PE idle time at which the direction of block matching operation within the search area is changed. Therfore, the proposed architecture is faster than the existing architectures under the same clock frequency. Based on HSPICE circuit simulation, it is verified that the implemented procesing element is operated successfully within 13 ns for 75 MHz operation.

• Proceedings of the KSR Conference
• /
• 1998.05a
• /
• pp.408-418
• /
• 1998

This paper presents the implementation of comparator which is self-testing with respect to the faults caused by any single physical defect likely to occur in NMOS and CMOS integrated circuit. The goal is to use it for the fault-tolerant system. First, a new fault model for PLA(Programmable Logic Array) is presented. This model reflects several physical defects in VLSI circuits. It focuses on the designs based on PLA because VLSI chips are far too complex to allow detailed analysis of all the possible physical defects that can occur and of the effects on the operation of the circuit. Second, this paper shows that these design, which has been implemented with 2 level AND-ORor NOR-NOR circuit, are optimal in term of size. And it also presents a formal proof that a comparator implemented using NOR-NOR PLA, based on these design, is sol f-testing with respect to most single faults in the presented fault model. Finally, it discusses the application of the self-testing comparator as a building block for the implementation of the fault-tolerant system.

• Journal of the Korean Institute of Telematics and Electronics B
• /
• v.32B no.11
• /
• pp.1434-1444
• /
• 1995

Current test has recently been known to be a promising testing method in CMOS VLSI because conventional voltage test can not make sure of the complete detection of bridging, gate-oxide shorts, stuck-open faults and etc. This paper presents a new BIC(built-in current sensor) for the internal current test in CMOS logic circuit. A single phase clock is used in the BIC to reduce the control circuitry of it and to perform a self- testing for a faulty current. The BIC is designed to detect the faulty current at the end of the clock period, so that it can test the CUT(circuit under test) with much longer critical propagation delay time and larger area than conventional BICs. The circuit is composed of 18 devices and verified by using the SPICE simulator.