한국산업융합학회 논문집 (Journal of the Korean Society of Industry Convergence)
- 제5권1호
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- Pages.39-43
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- 2002
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- 1226-833X(pISSN)
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- 2765-5415(eISSN)
Hydro Dynamic Model을 이용한 CMOS의 파괴특성의 Transient Simulation해석
Transient Simulation of CMOS Breakdown characteristics based on Hydro Dynamic Model
- 최원철 (하이닉스반도체 System IC 소자기술팀)
- Choi, Won-Cheol (Device Engineering Team Hynix Semiconductor)
- 투고 : 2001.11.05
- 심사 : 2002.02.20
- 발행 : 2002.02.28
초록
In present much CMOS devices used in VLSI circuit and Logic circuit. With increasing a number of device in VLSI, the confidence becomes more serious. This paper describe the mechanism of breakdown on CMOS, especially n-MOS, based on Hydro Dynamic model with device self-heating. Additionally, illustrate the CMOS latch-up characteristics on simplified device structure on this paper.
키워드