• 제목/요약/키워드: V-Zn oxide materials

검색결과 151건 처리시간 0.042초

Synthesis of functional ZnO nanoparticles and their photocatalytic properties

  • Nam, Sang-Hun;Kim, Myoung-Hwa;Lee, Sang-Duck;Kim, Min-Hee;Boo, Jin-Hyo
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2009년도 제38회 동계학술대회 초록집
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    • pp.54-54
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    • 2010
  • Zinc oxide is metal oxide semiconductor with the 3.37 eV bandgap energy. Zinc oxide is very attractive materials for many application fields. Zinc Oxide has many advantages such as high conductivity and good transmittance in visible region. Also it is cheaper than other semiconductor materials such as indium tin oxide (ITO). Therefore, ZnO is alternative material for ITO. ZnO is attracting attention for its application to transparent conductive oxide (TCO) films, surface acoustic wave (SAW), films bulk acoustic resonator (FBAR), piezoelectric materials, gas-sensing, solar cells and photocatalyst. In this study, we synthesized ZnO nanoparticles and defined their physical and chemical properties. Also we studied about the application of ZnO nanoparticles as a photocatalyst and try to find a enhancement photocatalytic activity of ZnO nanorticles.. We synthesized ZnO nanoparticles using spray-pyrolysis method and defined the physical and optical properties of ZnO nanoparticles in experiment I. When the ZnO are exposed to UV light, reduction and oxidation(REDOX) reaction will occur on the ZnO surface and generate ${O_2}^-$ and OH radicals. These powerful oxidizing agents are proven to be effective in decomposition of the harmful organic materials and convert them into $CO_2$ and $H_2O$. Therefore, we investigated that the photocatalytic activity was increased through the surface modification of synthesized ZnO nanoparticles. In experiment II, we studied on the stability of ZnO nanoparticles in water. It is well known that ZnO is unstable in water in comparison with $TiO_2$. $Zn(OH)_2$ was formed at the ZnO surface and ZnO become inactive as a photocatalyst when ZnO is present in the solution. Therefore, we prepared synthesized ZnO nanoparticles that were immersed in the water and dried in the oven. After that, we measured photocatalytic activities of prepared samples and find the cause of their photocatalytic activity changes.

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전이금속 도핑이 ZnO 나노분말의 특성 및 메틸렌블루 광촉매 분해 특성에 미치는 영향 (Effects of transition metal-doping on the properties of ZnO nanoparticles and the photocatalytic degradation of methylene blue)

  • 장한권;오경준;장희동;조국;김동진;최진훈
    • 한국입자에어로졸학회지
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    • 제6권1호
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    • pp.29-35
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    • 2010
  • Transition metals such as V, Fe, and Ni were used to synthesize doped zinc oxide nanoparticles from mixed liquid precursors by using the flame spray pyrolysis (FSP). The effects of dopants on the powder properties such as morphology, specific surface area, crystal structure, and light adsorption were analyzed by TEM, BET, XRD, and UV-Vis diffuse reflection spectrum (DRS), respectively. The results showed that hexagonal wurtzite structured ZnO:M (M = V, Fe, Ni) nanoparticles were successfully synthesized by the FSP. The transition metal-doping resulted in the decrease in its particle size and crystallite size. The UV-vis absorption spectra of ZnO:M nanoparticles were also red-shifted. ZnO:V showed the highest MB degradation of 99.4% under the UV irradiation after 3 hrs.

수소 도핑효과에 의한 ZnO 맴트랜지스터 소자특성 (Resistive Switching Characteristic of ZnO Memtransistor Device by a Proton Doping Effect)

  • 손기훈;강경문;박형호;이홍섭
    • 마이크로전자및패키징학회지
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    • 제27권1호
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    • pp.31-35
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    • 2020
  • 원자층 증착법(ALD: atomic layer deposition)으로 성장된 ZnO n-type 산화물반도체를 이용하여 three terminal memristor (memtransistor) 소자를 제작하여 습도에 따른 그 특성을 관찰하였다. 40 nm 두께의 ZnO 박막을 이용하여 channel width 70 ㎛, length 5 ㎛, back gate 구조의 memtransistor 소자를 제작하여 습도에 (40%, 50%, 60%, 70%) 따른 gate tunable memristive 특성변화를 관찰하였다. 습도가 높아질수록 electron mobility와 gate controllability가 감소하여 수소도핑효과에 의한 carrier 농도가 증가하는 거동의 output curve가 관찰되었다. 60%, 70%의 습도에서 memristive 거동이 관찰되었으며 습도가 높아질수록 on/off ratio는 증가하는 반면 gate controllability가 감소하였다. 60% 습도에서 가장 우수한 특성의 gate tunable memristive 특성을 얻을 수 있었다.

Thermal resistance effect of graphene doped zinc oxide nanocomposite in fire retardant epoxy coatings

  • Rao, Tentu Nageswara;Hussain, Imad;Riyazuddin, Riyazuddin;Koo, Bon Heun
    • Journal of Ceramic Processing Research
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    • 제20권4호
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    • pp.411-417
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    • 2019
  • Graphene doped zinc oxide nanoparticles (G-ZnO) were prepared using modified hummer's technique together with the ultrasonic method and characterized by field emission scanning electron microscopy (FESEM), X-ray powder diffraction (XRD), fourier-transform infrared spectroscopy (FTIR) and high-resolution transmission electron microscopy (HRTEM). Different samples of epoxy resin nanocomposites reinforced with G-ZnO nanoparticles were prepared and were marked as F1 (without adding nanoparticles), F2 (1% w/w G-ZnO), and F3 (2% w/w G-ZnO) in combination of ≈ 56:18:18:8w/w% with epoxy resin/hardener, ammonium polyphosphate, boric acid, and Chitosan. The peak heat release rate (PHRR) of the epoxy nanocomposites was observed to decrease dramatically with the increasing G-ZnO nanoparticles. However, the LOI values increased significantly with the increase in wt % of G-ZnO nanoparticles. From the UL-94V data, it was confirmed that the F2 and F3 samples passed the flame test and were rated as V-0. The results obtained in the present work clearly revealed that the synthesized samples can be used as efficient materials in fire-retardant coating technology.

투명전도성 ZnO 박막의 특성에 미치는 In2O3 첨가에 따른 영향 (Effect of In2O3 Doping on the Properties of ZnO Films as a Transparent Conducting Oxide)

  • 이춘호;김선일
    • 한국세라믹학회지
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    • 제41권1호
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    • pp.57-61
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    • 2004
  • Zinc Oxide (ZnO)은 wurtzite 결정구조를 가지고 있으며, 밴드갭 에너지가 약 3.3eV로 반도성 산화물이다. $In_2O_3$이 첨가된 ZnO 박막을 점자빔증착법을 이용하여 1737F 유리기판에 제조하였다. $400^{\circ}C$의 증착온도에서 $In_2O_3$의 첨가량에 따른 ZnO 박막의 결정성, 미세구조를 비롯한 전기.광학적 특성을 조사하였다. 첨가되는 $In_2O_3$의 양에 따라 투명전도성 산화막으로써의 ZnO 박막의 특성이 변화되었다. $In_2O_3$의 첨가량이 감소할수록 비정질상에서 결정성의 ZnO 막을 얻을 수 있었다. 0.2at%의 $In_2O_3$가 첨가된 출발물질에서 제조된 $In_2O_3$-doped ZnO막은 약 $6.0 {\times} 10^{-3} {\Omega}cm$ 정도의 비저항값과 가시광선 영역에서 85% 이상의 광투과도를 나타내었다.

Nano-Floating Gate Memory Devices with Metal-Oxide Nanoparticles in Polyimide Dielectrics

  • Kim, Eun-Kyu;Lee, Dong-Uk;Kim, Seon-Pil;Lee, Tae-Hee;Koo, Hyun-Mo;Shin, Jin-Wook;Cho, Won-Ju;Kim, Young-Ho
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제8권1호
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    • pp.21-26
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    • 2008
  • We fabricated nano-particles of ZnO, $In_2O_3$ and $SnO_2$ by using the chemical reaction between metal thin films and polyamic acid. The average size and density of these ZnO, $In_2O_3$ and $SnO_2$ nano-particles was approximately 10, 7, and 15 nm, and $2{\times}10^{11},\;6{\times}10^{11},\;2.4{\times}10^{11}cm^{-2}$, respectively. Then, we fabricated nano-floating gate memory (NFGM) devices with ZnO and $In_2O_3$ nano-particles embedded in the devices' polyimide dielectrics and silicon dioxide layers as control and tunnel oxides, respectively. We measured the current-voltage characteristics, endurance properties and retention times of the memory devices using a semiconductor parameter analyzer. In the $In_2O_3$ NFGM, the threshold voltage shift (${\Delta}V_T$) was approximately 5 V at the initial state of programming and erasing operations. However, the memory window rapidly decreased after 1000 s from 5 to 1.5 V. The ${\Delta}V_T$ of the NFGM containing ZnO was approximately 2 V at the initial state, but the memory window decreased after 1000 s from 2 to 0.4 V. These results mean that metal-oxide nano-particles have feasibility to apply NFGM devices.

버퍼막 두께에 따른 ZnO/ZnO/p-Si(111) 이종접합 다이오드 특성 평가 (Dependence of the Heterojunction Diode Characteristics of ZnO/ZnO/p-Si(111) on the Buffer Layer Thickness)

  • 허주회;류혁현;이종훈
    • 한국재료학회지
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    • 제21권1호
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    • pp.34-38
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    • 2011
  • In this study, the effects of an annealed buffer layer with different thickness on heterojunction diodes based on the ZnO/ZnO/p-Si(111) systems were reported. The effects of an annealed buffer layer with different thickness on the structural, optical, and electrical properties of zinc oxide (ZnO) films on p-Si(111) were also studied. Before zinc oxide (ZnO) deposition, different thicknesses of ZnO buffer layer, 10 nm, 30 nm, 50 nm and 70 nm, were grown on p-Si(111) substrates using a radio-frequency sputtering system; samples were subsequently annealed at $700^{\circ}C$ for 10 minutes in $N_2$ in a horizontal thermal furnace. Zinc oxide (ZnO) films with a width of 280nm were also deposited using a radio-frequency sputtering system on the annealed ZnO/p-Si (111) substrates at room temperature; samples were subsequently annealed at $700^{\circ}C$ for 30 minutes in $N_2$. In this experiment, the structural and optical properties of ZnO thin films were studied by XRD (X-ray diffraction), and room temperature PL (photoluminescence) measurements, respectively. Current-voltage (I-V) characteristics were measured with a semiconductor parameter analyzer. The thermal tensile stress was found to decrease with increasing buffer layer thickness. Among the ZnO/ZnO/p-Si(111) diodes fabricated in this study, the sample that was formed with the condition of a 50 nm thick ZnO buffer layer showed a strong c-axis preferred orientation and I-V characteristics suitable for a heterojunction diode.

Electrical and Optical Properties of Zinc Oxide Thin Films Deposited Using Atomic Layer Deposition

  • Kim, Jeong-Eun;Bae, Seung-Muk;Yang, Hee-Sun;Hwang, Jin-Ha
    • 한국세라믹학회지
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    • 제47권4호
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    • pp.353-356
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    • 2010
  • Zinc oxide (ZnO) thin films were deposited using atomic layer deposition. The electrical and optical properties were characterized using Hall measurements, spectroscopic ellipsometry and UV-visible spectrophotometry. The electronic concentration and the mobility were found to be critically dependent on the deposition temperature, exhibiting increased resistivity and reduced electronic mobility at low temperature. The corresponding optical properties were measured as a function of photon energy ranging from 1.5 to 5.0 eV. The simulated extinction coefficients allowed the determination of optical band gaps, i.e., ranging from 3.36 to 3.41 eV. The electronic carrier concentration appears to be related to the reduction in the corresponding band gap in ZnO thin films.

Fabrication of Solution Processed Thin Film Transistor Using Zinc Oxide Nanoparticles

  • Lee, Sul;Jeong, Sun-Ho;Kim, Dong-Jo;Park, Bong-Kyun;Moon, Joo-Ho
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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    • pp.703-706
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    • 2006
  • Zinc oxide nanocrystals are attractive candidates for a solution-processable semiconductor for high performance thin film field effect transistors. We have studied ZnO thin film transistor fabricated by solution process and have improved $V_{th}$ by controlling the ZnO ink additives. Synthesized ZnO nanoparticles of 30nm were dispersed in solvent to make the ZnO ink. ZnO ink was spin coated on silicon wafer and after heat treatment electrodes were patterned.

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Effects of multi-layered active layers on solution-processed InZnO TFTs

  • Choi, Won Seok;Jung, Byung Jun;Kwon, Myoung Seok
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2015년도 제49회 하계 정기학술대회 초록집
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    • pp.204.1-204.1
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    • 2015
  • We studied the electrical properties and gate bias stress (GBS) stability of thin film transistors (TFTs) with multi-stacked InZnO layers. The InZnO TFTs were fabricated via solution process and the In:Zn molar ratio was 1:1. As the number of InZnO layers was increased, the mobility and the subthreshold swing (S.S) were improved, and the threshold voltage of TFT was reduced. The TFT with three-layered InZnO showed high mobility of $21.2cm^2/Vs$ and S.S of 0.54 V/decade compared the single-layered InZnO TFT with $4.6cm^2/Vs$ and 0.71 V/decade. The three-layered InZnO TFTs were relatively unstable under negative bias stress (NBS), but showed good stability under positive bias stress (PBS).

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