• Title/Summary/Keyword: Two-stage circuit

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Parallel Architecture Design of H.264/AVC CAVLC for UD Video Realtime Processing (UD(Ultra Definition) 동영상 실시간 처리를 위한 H.264/AVC CAVLC 병렬 아키텍처 설계)

  • Ko, Byung Soo;Kong, Jin-Hyeung
    • Journal of the Institute of Electronics and Information Engineers
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    • v.50 no.5
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    • pp.112-120
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    • 2013
  • In this paper, we propose high-performance H.264/AVC CAVLC encoder for UD video real time processing. Statistical values are obtained in one cycle through the parallel arithmetic and logical operations, using non-zero bit stream which represents zero coefficient or non-zero coefficient. To encode codeword per one cycle, we remove recursive operation in level encoding through parallel comparison for coefficient and escape value. In oder to implement high-speed circuit, proposed CAVLC encoder is designed in two-stage {statical scan, codeword encoding} pipeline. Reducing the encoding table, the arithmetic unit is used to encode non-coefficient and to calculate the codeword. The proposed architecture was simulated in 0.13um standard cell library. The gate count is 33.4Kgates. The architecture can support Ultra Definition Video ($3840{\times}2160$) at 100 frames per second by running at 100MHz.

A 10b 100 MSample/s $1.4\;mm^2$ 56 mW 0.18 urn CMOS A/D Converter for Low-Power Multimedia Applications (저전력 멀티미디어 응용을 위한 10b 100 MSample/s $1.4\;mm^2$ 56 mW 0.18 um CMOS A/D 변환기)

  • Min Byoung-Han;Park Hee-Won;Chae Hee-Sung;Sa Doo-Hwan;Lee Seung-Hoon
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.42 no.12
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    • pp.53-60
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    • 2005
  • This work proposes a 10b 100 MS/s $1.4\;mm^2$ CMOS ADC for low-power multimedia applications. The proposed two-step pipeline ADC minimizes chip area and power dissipation at the target resolution and sampling rate. The wide-band SHA employs a gate-bootstrapping circuit to handle both single-ended and differential inputs with 1.2 Vp-p at 10b accuracy while the second-stage flash ADC employs open-loop offset sampling techniques to achieve 6b resolution. A 3-D fully symmetrical layout reduces the capacitor and device mismatch of the first-stage MDAC. The low-noise references are integrated on chip with optional off-chip voltage references. The prototype 10b ADC implemented in a 0.18 um CMOS shows the maximum measured DNL and INL of 0.59 LSB and 0.77 LSB, respectively. The ADC demonstrates the SNDR of 54 dB, the SFDR of 62 dB, and the power dissipation of 56 mW at 100 MS/s.

Signal Level Analysis of a Camera System for Satellite Application

  • Kong, Jong-Pil;Kim, Bo-Gwan
    • Proceedings of the KSRS Conference
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    • 2008.10a
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    • pp.220-223
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    • 2008
  • A camera system for the satellite application performs the mission of observation by measuring radiated light energy from the target on the earth. As a development stage of the system, the signal level analysis by estimating the number of electron collected in a pixel of an applied CCD is a basic tool for the performance analysis like SNR as well as the data path design of focal plane electronic. In this paper, two methods are presented for the calculation of the number of electrons for signal level analysis. One method is a quantitative assessment based on the CCD characteristics and design parameters of optical module of the system itself in which optical module works for concentrating the light energy onto the focal plane where CCD is located to convert light energy into electrical signal. The other method compares the design\ parameters of the system such as quantum efficiency, focal length and the aperture size of the optics in comparison with existing camera system in orbit. By this way, relative count of electrons to the existing camera system is estimated. The number of electrons, as signal level of the camera system, calculated by described methods is used to design input circuits of AD converter for interfacing the image signal coming from the CCD module in the focal plane electronics. This number is also used for the analysis of the signal level of the CCD output which is critical parameter to design data path between CCD and A/D converter. The FPE(Focal Plane Electronics) designer should decide whether the dividing-circuit is necessary or not between them from the analysis. If it is necessary, the optimized dividing factor of the level should be implemented. This paper describes the analysis of the electron count of a camera system for a satellite application and then of the signal level for the interface design between CCD and A/D converter using two methods. One is a quantitative assessment based on the design parameters of the camera system, the other method compares the design parameters in comparison with those of the existing camera system in orbit for relative counting of the electrons and the signal level estimation. Chapter 2 describes the radiometry of the camera system of a satellite application to show equations for electron counting, Chapter 3 describes a camera system briefly to explain the data flow of imagery information from CCD and Chapter 4 explains the two methods for the analysis of the number of electrons and the signal level. Then conclusion is made in chapter 5.

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Wire Recognition on the Chip Photo based on Histogram (칩 사진 상의 와이어 인식 방법)

  • Jhang, Kyoungson
    • Journal of the Institute of Electronics and Information Engineers
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    • v.53 no.5
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    • pp.111-120
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    • 2016
  • Wire recognition is one of the important tasks in chip reverse engineering since connectivity comes from wires. Recognized wires are used to recover logical or functional representation of the corresponding circuit. Though manual recognition provides accurate results, it becomes impossible, as the number of wires is more than hundreds of thousands. Wires on a chip usually have specific intensity or color characteristics since they are made of specific materials. This paper proposes two stage wire recognition scheme; image binarization and then the process of determining whether regions in binary image are wires or not. We employ existing techniques for two processes. Since the second process requires the characteristics of wires, the users needs to select the typical wire region in the given image. The histogram characteristic of the selected region is used in calculating histogram similarity between the typical wire region and the other regions. The first experiment is to select the most appropriate binarization scheme for the second process. The second experiment on the second process compares three proposed methods employing histogram similarity of grayscale or HSV color since there have not been proposed any wire recognition method comparable by experiment. The best method shows more than 98% of true positive rate for 25 test examples.

Corrosion Monitoring of Reinforcing Bars in Cement Mortar Exposed to Seawater Immersion-and-dry Cycles (해수침지-건조 환경에 노출된 모르타르속 철근의 부식속도 평가)

  • Kim, Je-kyoung;Kee, Seong-Hoon;Yee, Jurng-Jae
    • Journal of the Korea institute for structural maintenance and inspection
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    • v.22 no.4
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    • pp.10-18
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    • 2018
  • The primary purposes of this study are to understand a fundamental aspect of current uniformity around a reinforcing bar (rebar) in cement mortar, and to develop an accurate monitoring method in a wet-dry cycling process with the alternative current (AC) impedance method. Three cement mortar specimens with two embedded rebars were prepared in the laboratory. As a main variable, the distance between two rebars was designed to be 10, 20 and 30 mm with the same thickness of 20 mm. To simulate the corrosion of rebars in concrete structures in a marine environment, three cement mortar specimens were exposed to 15 wet-drying cycles (24-hour-immersion in seawater and 48-hour-drying in a room temperature) in the laboratory. It was observed that the potential level shifted to a noble value during corrosion potential monitoring, which is attributed to acceleration of dissolved oxygen diffusion at the drying process. AC impedance was measured in a frequency range from 100 kHz to 1 mHz on a wet-drying process. A theoretical model was proposed to explain the interface condition between the rebars and cement mortar by using the equivalent circuit consisting of a solution resistance, a charge transfer resistance and a CPE (constant phase element). It was observed that the diffusion impedance appeared in a low frequency range as corrosion of rebars progresses. At the drying stage of the wet-drying cycles, the currents line for monitoring tended to be non-uniform at the interface of rebar/mortar, being phase shift, ${\theta}$, close to $-45^{\circ}$.

A Radio-Frequency PLL Using a High-Speed VCO with an Improved Negative Skewed Delay Scheme (향상된 부 스큐 고속 VCO를 이용한 초고주파 PLL)

  • Kim, Sung-Ha;Kim, Sam-Dong;Hwang, In-Seok
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.42 no.6
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    • pp.23-36
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    • 2005
  • PLLs have been widely used for many applications including communication systems. This paper presents a VCO with an improved negative skewed delay scheme and a PLL using this VCO. The proposed VCO and PLL are intended for replacing traditional LC oscillators and PLLs used in communication systems and other applications. The circuit designs of the VCO and PLL are based on 0.18um CMOS technology with 1.8V supply voltage. The proposed VCO employs subfeedback loops using pass-transistors and needs two opposite control voltages for the pass transistors. The subfeedback loops speed up oscillation depending on the control voltages and thus provide a high oscillation frequency. The two voltage controls have opposite frequency gain characteristics and result in low phase-noise. The 7-stage VCO in 0.18um CMOS technology operates from $3.2GHz\~6.3GHz$ with phase noise of about -128.8 dBc/Hz at 1MHz frequency onset. For 1.8V supply voltage, the current consumption is about 3.8mA. The proposed PLL has dual loop-filters for the proposed VCO. The PLL is operated at 5GHz with 1.8V supply voltage. These results indicate that the proposed VCO can be used for radio frequency operations replacing LC oscillators. The circuits have been designed and simulated using 0.18um TSMC library.

Simulation Study of a Large Area CMOS Image Sensor for X-ray DR Detector with Separate ROICs (센서-회로 분리형 엑스선 DR 검출기를 위한 대면적 CMOS 영상센서 모사 연구)

  • Kim, Myung Soo;Kim, Hyoungtak;Kang, Dong-uk;Yoo, Hyun Jun;Cho, Minsik;Lee, Dae Hee;Bae, Jun Hyung;Kim, Jongyul;Kim, Hyunduk;Cho, Gyuseong
    • Journal of Radiation Industry
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    • v.6 no.1
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    • pp.31-40
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    • 2012
  • There are two methods to fabricate the readout electronic to a large-area CMOS image sensor (LACIS). One is to design and manufacture the sensor part and signal processing electronics in a single chip and the other is to integrate both parts with bump bonding or wire bonding after manufacturing both parts separately. The latter method has an advantage of the high yield because the optimized and specialized fabrication process can be chosen in designing and manufacturing each part. In this paper, LACIS chip, that is optimized design for the latter method of fabrication, is presented. The LACIS chip consists of a 3-TR pixel photodiode array, row driver (or called as a gate driver) circuit, and bonding pads to the external readout ICs. Among 4 types of the photodiode structure available in a standard CMOS process, $N_{photo}/P_{epi}$ type photodiode showed the highest quantum efficiency in the simulation study, though it requires one additional mask to control the doping concentration of $N_{photo}$ layer. The optimized channel widths and lengths of 3 pixel transistors are also determined by simulation. The select transistor is not significantly affected by channel length and width. But source follower transistor is strongly influenced by length and width. In row driver, to reduce signal time delay by high capacitance at output node, three stage inverter drivers are used. And channel width of the inverter driver increases gradually in each step. The sensor has very long metal wire that is about 170 mm. The repeater consisted of inverters is applied proper amount of pixel rows. It can help to reduce the long metal-line delay.

A 1.1V 12b 100MS/s 0.43㎟ ADC based on a low-voltage gain-boosting amplifier in a 45nm CMOS technology (45nm CMOS 공정기술에 최적화된 저전압용 이득-부스팅 증폭기 기반의 1.1V 12b 100MS/s 0.43㎟ ADC)

  • An, Tai-Ji;Park, Jun-Sang;Roh, Ji-Hyun;Lee, Mun-Kyo;Nah, Sun-Phil;Lee, Seung-Hoon
    • Journal of the Institute of Electronics and Information Engineers
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    • v.50 no.7
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    • pp.122-130
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    • 2013
  • This work proposes a 12b 100MS/s 45nm CMOS four-step pipeline ADC for high-speed digital communication systems requiring high resolution, low power, and small size. The input SHA employs a gate-bootstrapping circuit to sample wide-band input signals with an accuracy of 12 bits or more. The input SHA and MDACs adopt two-stage op-amps with a gain-boosting technique to achieve the required DC gain and high signal swing range. In addition, cascode and Miller frequency-compensation techniques are selectively used for wide bandwidth and stable signal settling. The cascode current mirror minimizes current mismatch by channel length modulation and supply variation. The finger width of current mirrors and amplifiers is laid out in the same size to reduce device mismatch. The proposed supply- and temperature-insensitive current and voltage references are implemented on chip with optional off-chip reference voltages for various system applications. The prototype ADC in a 45nm CMOS demonstrates the measured DNL and INL within 0.88LSB and 1.46LSB, respectively. The ADC shows a maximum SNDR of 61.0dB and a maximum SFDR of 74.9dB at 100MS/s, respectively. The ADC with an active die area of $0.43mm^2$ consumes 29.8mW at 100MS/s and a 1.1V supply.