• 전력전자학회논문지
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• 제22권2호
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• pp.181-184
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• 2017

This study analyzes the turn-on and turn-off transients of a metal-oxide-semiconductor field-effect transistor (MOSFET) with high-switching frequency systems. In these systems, the voltage distortion becomes serious at the output terminal of a Vienna rectifier by the turn-off delay of the MOSFET. The current has low-order harmonics through this voltage distortion. This paper describes the transient of the turn-off that causes the voltage distortion. The algorithm for reducing the sixth harmonic using a proportional-resonance controller is proposed to improve the current distortion without complex calculation for compensation. The reduction of the current distortion by high-switching frequency is verified by experiment with the 2.5-kW prototype Vienna rectifier.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1995년도 하계학술대회 논문집 C
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• pp.1205-1208
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• 1995

The optically-gated p-i-n diode switches have been fabricated with gold-compensated silicon. The turn-on and turn-off delay times and the rise and fall times were measured as a function of optical power level, bias, and pulse width. The turn-on characteristics shows a strong dependence an optical pulse power and a delay time(${\delta}{\iota}$) between two pulses, but a weak dependence on the width of optical pulse. Actually there is no turn-off delay in gold-doped p-i-n switches and the fall time is negligible.

• 한국광학회지
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• 제21권2호
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• pp.69-73
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• 2010

본 논문에서는 광학적으로 비등방성인 폴리머를 이용하여 $90^{\circ}$ TN(Twisted Nematic) 액정셀의 응답시간을 향상시키는 방법을 제안하였다. 액정과 비등방성 폴리머를 일정 비율로 혼합하여 TN 액정셀에 주입한 뒤 UV를 조사하여 폴리머 네트워크를 형성시킴으로써 투과율에 영향을 주지 않고 응답시간을 향상시킬 수 있다. 폴리머 네트워크가 형성되지 않은 TN 액정셀의 turn-off 시간이 16 ms인데 반해 제안된 방법에서는 액정과 비등방성 폴리머의 혼합 비율이 3, 5, 10 wt%로 증가할 때 12, 11, 9 ms로 고속 turn-off가 구현될 수 있다. 또한, turn-off 동작 시 TN 액정셀에서 발생하였던 delay time과 backflow가 폴리머 네트워크의 형성에 의해 크게 개선됨을 확인하였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2006년도 하계학술대회 논문집 Vol.7
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• pp.22-23
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• 2006

Proton irradiation technology was used for improvement of switching characteristics of the PT-IGBT. Proton irradiation was carried out at 5.56 MeV energy with $1{\times}10^{12}/cm^2$ doze from the back side of the wafer. Characterization of the device was performed by I-V, breakdown voltage, threshold voltage, and turn-off delay time measurement. For irradiated device by 5.56 MeV energy, the breakdown voltage and the threshold voltage were 730 V and 6.5~6.6 V, respectively. The turn-off time has been reduced to 170 ns, which was original $6\;{\mu}s$ for the un-irradiated device.

• Nuclear Engineering and Technology
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• 제55권9호
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• pp.3334-3341
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• 2023

We studied the irradiation effects of fast neutron generated by a 30 MeV cyclotron on the electrical and switching characteristics of NPT-IGBT devices. Fast neutron fluence ranges from 2.7 × 10⁹ to 1.82 × 10¹³ n/cm². Electrical characteristics of the IGBT device such as I-V, forward voltage drop and additionally switching characteristics of turn-on and -off were measured. As the neutron fluence increased, the device's threshold voltage decreased, the forward voltage drop increased significantly, and the turn-on and turn-off time became faster. In particular, the delay time of turn-on switching was improved by about 35% to a maximum of about 39.68 ns, and that of turn-off switching was also reduced by about 40%-84.89 ns, showing a faster switching.

• 한국전기전자재료학회논문지
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• 제19권12호
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• pp.1073-1077
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• 2006

Proton irradiation technology was used for improvement of switching characteristics of the PT-IGBT. Proton irradiation was carried out at 5.56 MeV energy with $1{\times}10^{12}/cm^2$ doze from the back side of the wafer. The I-V, breakdown voltage, and turn-off delay time of the device were analyzed and compared with those of un-irradiated device and e-beam irradiated device which was conventional method for minority carrier lifetime reduction. For proton irradiated device, the breakdown voltage and the on-state voltage were 733 V and 1.85 V which were originally 749 V and 1.25 V, respectively. The turn-off time has been reduced to 170 ns, which was originally $6{\mu}s$ for the un-irradiated device. The proton irradiated device was superior to e-beam irradiated device for the breakdown voltage and the on-state voltage which were 698 V and 1.95 V, respectively, nevertheless turn-off time of proton irradiated device was reduced to about 60 % compared to that of the e-beam irradiated device.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1996년도 하계학술대회 논문집 C
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• pp.1547-1549
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• 1996

The electrical and optical switching characteristics of gold-doped silicon p-i-n diodes have been investigated. The device shows a dark switching voltage of about 500 V. The switching voltage decreases rapidly when the illumination level is increased. The differential sensitivity of optical gating over linear region is $d(V_{Th}/V_{Tho})/dP_{Ph}$=0.25/uW. The turn-on delay time and the turn-on rise time decrease with increasing optical pulse power. The turn-off delay and the fall time are negligible.

• 전력전자학회논문지
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• 제3권3호
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• pp.222-230
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• 1998

본 논문에서는 스너버 회로를 사용하지 않고 턴-온시 역회복 전류의 영향과 턴-오프 시 구동되는 IGBT에 발생하는 과전압을 제한할 수 있는 새로운 IGBT 게이트 구동회로를 제안한다. 제안하는 턴-온 게이트 구동기법은 턴-온 지연 시간을 증가시키지 않고 게이트-에이터 전압이 문턱전압 이상이 되면 IGBT의 입력 커패시턴스를 증가시킴으로써 게이트-에이터 전압의 증가율을 감소시키는 특징을 갖는다. 제안하는 턴-오프 게이트 구동기법은 전류의 크기에 따라 과전압을 제한하여 단락사고와 같은 대전류가 흐르는 경우 더욱 효과적으로 과전압을 제한하는 특징을 가진다. 또한, 여러 가지 조건에서 실험을 수행하여 제안한 IGBT 게이트 구동회로의 타당성을 검증한다.

• 대한전기학회논문지
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• 제36권10호
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• pp.713-718
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• 1987

A new method for the modeling of non-ideal dc-dc converters whose switching times are finite is proposed. The effects of finite turn-on, turn-off times, delay time, storage time, reverse recovery process on the system stability, dc transfer function and efficiency are investigated. It is verified how system poles are changed and how dc transfer function and efficiency are decreased by non-ideal switching.

• 전력전자학회:학술대회논문집
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• 전력전자학회 2011년도 추계학술대회
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• pp.257-258
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• 2011

This paper describes a new method for the seamless operation mode transfer of a PCS with minimized voltage disturbance. The proposed method provides reduced STS turn off time after line fault and smooth mode change between current and voltage control of the PCS. The usefulness of the method is verified through simulations with the consideration of the time delay in detecting a line fault and SCR turn-off time.