• Title/Summary/Keyword: TLM

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A Design Of Physical Layer For OpenCable Copy Protection Module Using SystemC (SystemC를 이용한 OpenCableTM Copy Protection Module의 Physical Layer 설계)

  • Lee, Jung-Ho;Lee, Suk-Yun;Cho, Jun-Dong
    • Proceedings of the Korea Information Processing Society Conference
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    • 2004.05a
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    • pp.157-160
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    • 2004
  • 본 논문은 미국 차세대 디지털 케이블 방송 표준 규격인 오픈케이블($OpenCable^{TM}$)의 수신제한 모듈인 CableCard의 Physical Layer를 SystemC의 TLM(Transaction Level Modeling)과 RTL(Register-Transfer Level) 모델링 기법으로 설계하였다. 본 논문에서 설계한 CableCard의 Physical Layer는 PCMCIA Interface, Command Inteface 그리고 MPEG-2 TS Interface 로 구성된다. CableCard가 전원이 인가될 때, 카드 초기화를 위하여 동작하는 PCMCIA 인터페이스는 16 비트 PC 카드 SRAM 타입으로 2MByte Memory와 100ns access time으로 동작할 수 있게 설계하였다. PCMCIA 카드 초기화 동작이 완료된 후, CableCard의 기능을 수행하기 위하여 두 개의 논리적 인터페이스가 정의되는데 하나는 MPEG-2 TS 인터페이스이고, 다른 하나는 호스트(셋톱박스)와 모듈 사이의 명령어들을 전달하는 명령어 인터페이스(Command Interface)이다. 명령어 인터페이스(Command Interface)는 셋톱박스의 CPU와 통신하기 위한 1KByte의 Data Channel과 OOB(Out-Of-Band) 통신을 위한 4KByte의 Extended Channel 로 구성되고, 최대 20Mbits/s까지 동작한다. 그리고 MPEG-2 TS는 100Mbits/s까지 동작을 수행할 수 있게 설계하였다. 설계한 코드를 실행한 후, Cadence사의 SimVision을 통해서 타이밍 시뮬레이션을 검증하였다.

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Formation of Copper Electroplated Electrode Patterning Using Screen Printing for Silicon Solar Cell Transparent Electrode (실리콘 태양전지 투명전극용 스크린 프린팅을 이용한 구리 도금 전극 패터닝 형성)

  • Kim, Gyeong Min;Cho, Young Joon;Chang, Hyo Sik
    • Korean Journal of Materials Research
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    • v.29 no.4
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    • pp.228-232
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    • 2019
  • Copper electroplating and electrode patterning using a screen printer are applied instead of lithography for heterostructure with intrinsic thin layer(HIT) silicon solar cells. Samples are patterned on an indium tin oxide(ITO) layer using polymer resist printing. After polymer resist patterning, a Ni seed layer is deposited by sputtering. A Cu electrode is electroplated in a Cu bath consisting of $Cu_2SO_4$ and $H_2SO_4$ at a current density of $10mA/cm^2$. Copper electroplating electrodes using a screen printer are successfully implemented to a line width of about $80{\mu}m$. The contact resistance of the copper electrode is $0.89m{\Omega}{\cdot}cm^2$, measured using the transmission line method(TLM), and the sheet resistance of the copper electrode and ITO are $1{\Omega}/{\square}$ and $40{\Omega}/{\square}$, respectively. In this paper, a screen printer is used to form a solar cell electrode pattern, and a copper electrode is formed by electroplating instead of using a silver electrode to fabricate an efficient solar cell electrode at low cost.

Electrical and Optical Properties for TCO/Si Junction of EWT Solar Cells (TCO/Si 접합 EWT 태양전지에 관한 전기적 및 광학적 특성)

  • Song, Jinseob;Yang, Jungyup;Lee, Junseok;Hong, Jinpyo;Cho, Younghyun
    • 한국신재생에너지학회:학술대회논문집
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    • 2010.11a
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    • pp.39.2-39.2
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    • 2010
  • In this work we have investigated electrical and optical properties of interface for ITO/Si with shallow doped emitter. The ITO is prepared by DC magnetron sputter on p-type monocrystalline silicon substrate. As an experimental result, The transmittance at 640nm spectra is obtained an average transmittance over 85% in the visible range of the optical spectrum. The energy bandgap of ITO at oxygen flow from 0% to 4% obtained between 3.57eV and 3.68eV (ITO : 3.75eV). The energy bandgap of ITO is depending on the thickness, sturcture and doping concentration. Because the bandgap and position of absorption edge for degenerated semiconductor oxide are determined by two competing mechanism; i) bandgap narrowing due to electron-electron and electron-impurity effects on the valance and conduction bands (> 3.38eV), ii) bandgap widening by the Burstein-Moss effect, a blocking of the lowest states of the conduction band by excess electrons( < 4.15eV). The resistivity of ITO layer obtained about $6{\times}10^{-4}{\Omega}cm$ at 4% of oxygen flow. In case of decrease resistivity of ITO, the carrier concentration and carrier mobility of ITO film will be increased. The contact resistance of ITO/Si with shallow doped emitter was measured by the transmission line method(TLM). As an experimental result, the contact resistance was obtained $0.0705{\Omega}cm^2$ at 2% oxygen flow. It is formed ohmic-contact of interface ITO/Si substrate. The emitter series resistance of ITO/Si with shallow doped emitter was obtained $0.1821{\Omega}cm^2$. Therefore, As an PC1D simulation result, the fill factor of EWT solar cell obtained above 80%. The details will be presented in conference.

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Histopathological changes in fish gills by potassium permanganate and influence of water quality (과망간산칼리에 의한 어류 아가미의 병리조직학적 변화와 수질에 따른 영향)

  • Shin, Mee-Young;Choi, Dong-Lim;Chung, Joon-Ki;Chun, Seh-Kyu
    • Journal of fish pathology
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    • v.6 no.1
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    • pp.21-55
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    • 1993
  • Histopathological changes in gills by potassium permanganate were investigated in four fish species. flounder(Pararychthys olivaceus) and rockfish(Sebastes schlegeli) in marine fish, and carp(Cyprinus carpio) and eel(Anguilla japonica) in freshwater fish. Marine fishies were more sensitive to $KMnO_4$ than freshwater fishies and have shown histological changes even in low concentration of 1ppm. Eels were less affected than carp in high concentration of $KMnO_4$. Especially in eels, hyperplasia and hypertropy of mucus cells were observed. Compared to in underground water. the effect of KMnO₄ were reduced very much in pond water. That this differences were due to the concentration of organic substances were certained by experiment with various feed concentrations. The potency of $KMnO_4$ were influenced by dissolved oxygen.

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Sorption of $UO^{2+}_2$ onto Goethite and Kaolinite: Mechanistic Modeling Approach

  • Jinho Jung;Lee, Jae-Kwang;Cho, Young-Hwan;Keum, Dong-Kwon;Hahn, Pil-Soo
    • Nuclear Engineering and Technology
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    • v.31 no.2
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    • pp.182-191
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    • 1999
  • The sorption of UO$_{2}$$^{2+}$ onto goethite and kaolinite under various experimental conditions was successfully interpreted using surface complexation modeling (SCM). The SCM approach used in this work is the triple-layer model (TLM) in which weakly bonded ions are modeled as outer-sphere (ion-pair) complexes and strongly bonded ions as inner-sphere (surface coordination) complexes. The change of ionic strength did not affect the U(VI) sorption onto goethite, thus the formation of inner-sphere surface complexes, (FeO)$_2$UO$_2$ and (FeO)$_2$(UO$_2$)$_3$OH$_{5}$ was assumed to simulate the effects of ionic strength and goethite concentration. On the other hand, the U(VI) sorption onto kaolinite showed ionic strength dependence, thus the formation of AlO-UO$_{2}$$^{2+}$(outer-sphere complex) and SiO(UO$_2$)$_3$OH$_{5}$ (inner-sphere complex) was assumed to simulate the experimental data. In the presence of carbonates, the sorption of U(VI) onto kaolinite decreased in the weakly alkaline pH range. This was well simulated assuming the formation of a outer-sphere surface complex, A1OH$^{2+}$- (UO$_2$)$_2$CO$_3$OH$_3$. Since SCM approach uses thermodynamic data such as surface complexation constants, it is more predictive than empirical modeling approach in which conditional values such as partition coefficient are used. used.

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Investigation of Effective Contact Resistance of ZTO-Based Thin Film Transistors

  • Gang, Yu-Jin;Han, Dong-Seok;Park, Jae-Hyeong;Mun, Dae-Yong;Sin, So-Ra;Park, Jong-Wan
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.543-543
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    • 2013
  • Thin-film transistors (TFTs) based on oxide semiconductors have been regarded as promising alternatives for conventional amorphous and polycrystalline silicon TFTs. Oxide TFTs have several advantages, such as low temperature processing, transparency and high field-effect mobility. Lots of oxide semiconductors for example ZnO, SnO2, In2O3, InZnO, ZnSnO, and InGaZnO etc. have been researched. Particularly, zinc-tin oxide (ZTO) is suitable for channel layer of oxide TFTs having a high mobility that Sn in ZTO can improve the carrier transport by overlapping orbital. However, some issues related to the ZTO TFT electrical performance still remain to be resolved, such as obtaining good electrical contact between source/drain (S/D) electrodes and active channel layer. In this study, the bottom-gate type ZTO TFTs with staggered structure were prepared. Thin films of ZTO (40 nm thick) were deposited by DC magnetron sputtering and performed at room temperature in an Ar atmosphere with an oxygen partial pressure of 10%. After annealing the thin films of ZTO at $400^{\circ}C$ or an hour, Cu, Mo, ITO and Ti electrodes were used for the S/D electrodes. Cu, Mo, ITO and Ti (200 nm thick) were also deposited by DC magnetron sputtering at room temperature. The channel layer and S/D electrodes were defined using a lift-off process which resulted in a fixed width W of 100 ${\mu}m$ and channel length L varied from 10 to 50 ${\mu}m$. The TFT source/drain series resistance, the intrinsic mobility (${\mu}i$), and intrinsic threshold voltage (Vi) were extracted by transmission line method (TLM) using a series of TFTs with different channel lengths. And the performances of ZTO TFTs were measured by using HP 4145B semiconductor analyzer. The results showed that the Cu S/D electrodes had a high intrinsic field effect mobility and a low effective contact resistance compared to other electrodes such as Mo, ITO and Ti.

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Formation of Plasma Damage-Free ITO Thin Flims on the InGaN/GaN based LEDs by Using Advanced Sputtering

  • Park, Min Joo;Son, Kwang Jeong;Kwak, Joon Seop
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.312-312
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    • 2013
  • GaN based light emitting diodes (LEDs) are important devices that are being used extensively in our daily life. For example, these devices are used in traffic light lamps, outdoor full-color displays and backlight of liquid crystal display panels. To realize high-brightness GaN based LEDs for solid-state lighting applications, the development of p-type ohmic electrodes that have low contact resistivity, high optical transmittance and high refractive index is essential. To this effect, indiumtin oxide (ITO) have been investigated for LEDs. Among the transparent electrodes for LEDs, ITO has been one of the promising electrodes on p-GaN layers owing to its excellent properties in optical, electrical conductivity, substrate adhesion, hardness, and chemical inertness. Sputtering and e-beam evaporation techniques are the most commonly used deposition methods. Commonly, ITO films on p-GaN by sputtering have better transmittance and resistivity than ITO films on p-GaN by e-bam evaporation. However, ITO films on p-GaN by sputtering have higher specific contact resistance, it has been demonstrated that this is due to possible plasma damage on the p-GaN in the sputtering process. In this paper, we have investigated the advanced sputtering using plasma damage-free p-electrode. Prepared the ITO films on the GaN based LEDs by e-beam evaporation, normal sputtering and advanced sputtering. The ITO films on GaN based LEDs by sputtering showed better transmittance and sheets resistance than ITO films on the GaN based LEDs by e-beam evaporation. Finally, fabricated of GaN based LEDs by using advanced sputtering. And compared the electrical properties (measurement by using C-TLM) and structural properties (HR-TEM and FE-SEM) of ITO films on GaN based LEDs produced by e-beam evaporation, normal sputtering and advanced sputtering. As a result, It is expected to form plasma damage free-electrode, and better light output power and break down voltage than LEDs by e-beam evaporation and normal sputter.

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Sol-gel Derived Nano-glass for Silicon Solar Cell Metallization (솔-젤법에 의해 제조된 실리콘 태양전지 전극형성용 나노 글래스)

  • Kang, Seong Gu;Lee, Chang Wan;Chung, Yoon Jang;Kim, Chang-Gyoun;Kim, Seongtak;Kim, Donghwan;Lee, Young Kuk
    • Current Photovoltaic Research
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    • v.2 no.4
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    • pp.173-176
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    • 2014
  • We have investigated the seed layer formation of front side contact using the inkjet printing process. Conductive silver ink was printed on textured Si wafers with 80 nm thick $SiN_x$ anti reflection coating (ARC) layers and thickened by light induced plating (LIP). The inkjet printable sliver inks were specifically formulated for inkjet printing on these substrates. Also, a novel method to prepare nano-sized glass frits by the sol-gel process with particle sizes around 5 nm is presented. Furthermore, dispersion stability of the formulated ink was measured using a Turbiscan. By implementing these glass frits, it was found that a continuous and uniform seed layer with a line width of $40{\mu}m$ could be formed by a inkjet printing process. We also investigated the contact resistance between the front contact and emitter using the transfer length model (TLM). On an emitter with the sheet resistance of $60{\Omega}/sq$, a specific contact resistance (${\rho}_c$) below $10m{\Omega}{\cdot}cm^2$ could be achieved at a peak firing temperature around $700^{\circ}C$. In addition, the correlation between the contact resistance and interface microstructures were studied using scanning electron microscopy (SEM). We found that the added glass particles act as a very effective fire through agent, and Ag crystallites are formed along the interface glass layer.

Characteristics of p-InGaN/GaN Superlattice structure of the p-GaN according to annealing conditions (p-InGaN/GaN 초격자구조에서 열처리 조건에 따른 오믹전극의 특성)

  • Jang, Seon-Ho;Kim, Sei-Min;Lee, Young-Woong;Lee, Young-Seok;Lee, Jong-Seon;Park, Min-Jung;Park, Il-Kyu;Jang, Ja-Soon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.160-160
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    • 2010
  • In this work, we investigate ohmic contacts to p-type GaN using a Pt/Cu/Au metallization scheme in order to achieve low resistance and thermally stable ohmic contact on p-GaN. An ohmic contact formed by a metal electrode deposited on a highly doped InGaN/GaN superlattice sturucture on p-GaN layer. The specific contact resistance is $1.56{\times}10^{-6}{\Omega}cm^2$ for the as-deposited sample, $1.35{\times}10^{-4}{\Omega}cm^2$ for the sample annealed at $250^{\circ}C$ and $6.88{\times}10^{-3}{\Omega}cm^2$ for the sample annealed at $300^{\circ}C$.

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Implementation of an Instruction Buffer to process Variable-Length Instructions (가변 길이 명령어 처리를 위한 명령어 버퍼 구현)

  • 박주현;김영민
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.35C no.12
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    • pp.66-76
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    • 1998
  • In this paper, we implement a buffer capable of handling short loops references to statistically lower the miss rate of variable-length instructions stored in the instruction buffer. MAU(Mark Appending Unit) takes the instructions as they are fetched from external memory, performs some initial decode operations and stores the results of the decode in the buffer for reducing multiple decodes when instructions are executed repeatedly such as in a loop. It includes a decision block of whether hit or not for effectively processing branch instructions Each module of the proposed architecture of processing variable-length instruction is described in VHDL structurally and behaviorally and whether it is working well or not is checked on V-System simulator of Model Technology Inc. We synthesized and simulated the architecture using an ASIC Synthesizer tool with 0.6$\mu\textrm{m}$ 5-Volt CMOS COMPASS library. Operation speed is up to 140MHz. The architecture includes about 17,000 gates.

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