• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.12
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• pp.72-82
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• 2014

Recently, the size of semiconductor industry market is constantly growing, due to the increase in diffusion of smart-phone, tablet PC and SSD(Solid State Drive). Also, it is expected that the demand for TLC NAND-type flash memory would gradually increase, with the recent release of TLC NAND-type flash memory in the SSD market. There have been a lot of studies on SLC NAND flash memory, but no research on TLC NAND flash memory has been conducted, yet. Also, a test of NAND-type flash memory is depending on a high-priced external equipment. Therefore, this study aims to suggest a structure for an autonomous test with no high-priced external test device by modifying the existing SLC NAND flash memory and MLC NAND flash memory test algorithms and patterns and applying them to TLC NAND flash memory.

• Proceedings of the Korean Society of Computer Information Conference
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• 2018.07a
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• pp.357-359
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• 2018

최근 메모리 반도체 시장은 SD(Secure Digital) 메모리 카드, SSD(Solid State Drive)등의 보급률 증가로 메모리 반도체의 시장이 대규모로 증가하고 있다. 메모리 반도체는 개인용 컴퓨터 뿐만 아니라 스마프폰, 테플릿 PC, 교육용 임베디드 보드 등 다양한 산업에서 이용 되고 있다. 또한 메모리 반도체 생산 업체가 대규모로 메모리 반도체 산업에 투자하면서 메모리 반도체 시장은 대규모로 성장되었다. 플래시 메모리는 크게 NAND-Type과 NOR-Type으로 나뉘며 플로팅 게이트 셀의 전압의 따라 SLC(Single Level Cell)과 MLC(Multi Level Cell) 그리고 TLC(Triple Level Cell)로 구분 된다. SLC 및 MLC NAND-Type 플래시 메모리는 많은 연구가 진행되고 이용되고 있지만, TLC NAND-Tpye 플래시 메모리는 많은 연구가 진행되고 있지 않다. 본 논문에서는 기존에 제안된 SLC 및 MLC NAND-Type 플래시 메모리에서 제안된 큐브 패턴을 TLC NAND-Type 플래시 메모리에서 적용 가능한 큐브 패턴 및 알고리즘을 제안한다.

• Journal of the Institute of Electronics and Information Engineers
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• v.53 no.1
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• pp.36-42
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• 2016

In multi-level-cell based storage devices, TLC NAND has been employed solid state drive due to cost effectiveness. Since TLC has slow performance and low endurance compared with MLC, TLC based storage has adopted SLC buffer scheme to improve performance. To improve SLC buffer scheme, this paper proposes page overwriting method in SLC block. This method provides data updates without erase operation within a limited number. When SLC buffer area is filled up, FTL should execute copying valid pages and erasing it. The proposed method reduces erase counts by 50% or more compared with previous SLC buffer scheme. Simulation results show that the proposed SLC buffer overwrite method achieves 2 times write performance improvement.

• IEMEK Journal of Embedded Systems and Applications
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• v.18 no.1
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• pp.31-40
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• 2023

Recent advances in flash technologies, such as 3D processing and multileveling schemes, have successfully increased the flash capacity. Unfortunately, these technology advances significantly degrade flash's reliability due to a smaller cell geometry and a finer-grained cell state control. In this paper, we propose an asymmetric BER-aware reliability optimization technique (aBARO), new flash optimization that improves the flash reliability. To this end, we first reveal that bit errors of 3D NAND flash memory are highly skewed among flash cell states. The proposed aBARO exploits the unique per-state error model in flash cell states by selecting the most error-prone flash states and by forming narrow threshold voltage distributions (for the selected states only). Furthermore, aBARO is applied only when the program time (tPROG) gets shorter when a flash cell becomes aging, thereby keeping the program latency of storage systems unchanged. Our experimental results with real 3D MLC and TLC flash devices show that aBARO can effectively improve flash reliability by mitigating a significant number of bit errors. In addition, aBARO can also reduce the read latency by 40%, on average, by suppressing the read retries.

• Journal of the Institute of Electronics and Information Engineers
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• v.52 no.9
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• pp.54-62
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• 2015

Although NAND flash-based SSD (Solid-State Drive) provides superior performance in comparison to HDD (Hard Disk Drive), it has a major drawback in write endurance. As a result, the lifetime of SSD is determined by the workload and thus it becomes a big challenge in current technology trend of such as the shifting from SLC (Single Level Cell) to MLC (Multi Level cell) and even TLC (Triple Level Cell). Most previous studies have dealt with wear-leveling or improving SSD lifetime regarding hardware architecture. In this paper, we propose the optimal configuration of host I/O stack focusing on file system, I/O scheduler, and link power management using JEDEC enterprise workloads in terms of WAF (Write Amplification Factor) which represents the efficiency perspective of SSD life time especially for host write processing into flash memory. Experimental analysis shows that the optimum configuration of I/O stack for the perspective of SSD lifetime is MinPower-Dead-XFS which prolongs the lifetime of SSD approximately 2.6 times in comparison with MaxPower-Cfq-Ext4, the best performance combination. Though the performance was reduced by 13%, this contributions demonstrates a considerable aspect of SSD lifetime in relation to I/O stack optimization.