• Journal of Information Technology Services
• /
• v.10 no.2
• /
• pp.189-202
• /
• 2011

It is important issue how to evaluate the economic feasibility of computing factors in the real world when we build ubiquitous spaces. In this paper, we propose a simple model that can evaluate the economic feasibility of mobile RFID-based ubiquitous computing system which enables seamless communication between offline and online via embedded computing factors in the real world. To achieve this, we explore the meaning of mobile RFID system, the difference between our research and extant researches concerning the evaluation of economic feasibility in RFID system, and propose the so-called 'Tag-based Evaluation Model' (TEM) which is an evaluation model to access the economic feasibility of mobile RFID systems. We also analyze the TEM via simulation cases based on proposed model and discuss the future of TEM.

• Journal of the Korean Institute of Telematics and Electronics
• /
• v.27 no.5
• /
• pp.716-723
• /
• 1990

Transmission electron microscopy (TEM) and anger electron microscopy(AES) studies of GaAs/AlxGa1-xAs(x=0.58) quantum wells grown by low pressure metalorganic chemical vapor deposition(LP-MOCVD) are carried out. Isolated quantum well structure having the well width as small as 15 \ulcornerand multiquantum well structure, which consisted of 51 alternating layers with each thickness of 10\ulcorner were suscessfully grown. TEM analyses have shown that their interfaces were almost completely coherent without any structural disorder, alloy clustering and crystal defect. AES depth resolution have shown the compositional periodicity of superlattice structure.

• The Journal of Korean Institute of Communications and Information Sciences
• /
• v.25 no.1B
• /
• pp.48-55
• /
• 2000

The design techniques of an asymmetric TEM (ATEM) cell for calibrating E/H filed probes are presented in this paper. The authors describe the techniques to obtain not only the arbitrary frequency and second resonant frequency, but also the test space with $\pm$2dB filed uniformity. We could design an ATEM cell that the measured data, electric filed distribution inside the cell, impedance matching and resonant frequencies, agree with the calculated results.

• Applied Microscopy
• /
• v.31 no.4
• /
• pp.315-323
• /
• 2001

In situ TEM heating experiments utilizing kaolinite powder samples result in the following facts. (1) The water recirculation system adopted in the Gatan's heating holder is required to prevent specimen drift above $500^{\circ}C$. (2) Since the degree of phase changes depends on the thickness of powders below $600^{\circ}C$, examinations of both thin and thick specimens are required. (3) Sample preparation using Mo-grids is required for TEM heating experiments above $900^{\circ}C$. At these temperature ranges the effect of heating rate and holding time on the phase transition process increases drastically, so that a programmed temperature control is required. (4) TEM heating experiments of the embedded powders by epoxy for the cross-sectional view was limited due to the severe epoxy movement during heating above $300^{\circ}C$. Better methods of sample preparation are required to overcome this problem.

• Applied Microscopy
• /
• v.29 no.1
• /
• pp.67-73
• /
• 1999

It is practically hard to prepare good TEM specimens from powders which are embedded in epoxy materials for ion milling, because the milling rate difference between powders and epoxy is quite large. In order to overcome this problem, we tried to find methods to increase the density of powders in the embedding epoxy without loosing the adhesive strength between them. Powder density was considerably increased by employing a centrifuge for embedding, compared to the result by a conventional vacuum embedding. In addition, mixing powders of different sizes after sieving also enhanced the final density by allowing smaller particles filling in the gaps of larger particles. Ion milling of powders embedded by these methods resulted in thin specimens good enough for normal TEM works. TEM specimens from spherical, platy and fibrous powders of submicron size were successfully prepared by this centrifuging method.

• The Optical Journal
• /
• v.14 no.4 s.80
• /
• pp.74-75
• /
• 2002

• Polymer Science and Technology
• /
• v.7 no.4
• /
• pp.437-444
• /
• 1996

• Polymer Science and Technology
• /
• v.7 no.6
• /
• pp.765-772
• /
• 1996

• Applied Microscopy
• /
• v.50
• /
• pp.21.1-21.3
• /
• 2020

Sample preparation is significantly important to the high-resolution transmission electron microscopy (HRTEM) characterization of nanomaterials. However, many general organic solvents can dissolve the necessary organic polymer support layer in TEM grid, which causes it difficult to obtain high-quality samples of oil-soluble nanomaterials. In this study, a new sample preparation method for oil-soluble nanomaterials has been developed by using the sublimable material as a transition layer. Experiments also show that there is no damage to TEM grids and high-quality HRTEM images can be obtained via this method. This approach paves the way to applicable HRTEM sample preparation of oil-soluble nanomaterials.

• Applied Microscopy
• /
• v.41 no.3
• /
• pp.215-222
• /
• 2011

We discuss the experimental procedure for extracting reliable phase information from a defocus series of transmission electron microscopy (TEM) dark-field images using the transport of intensity equation (TIE). Taking InGaN/GaN multi-quantum well light-emitting diode as a model system, various factors affecting the final result of reconstructed phase such as TEM sample preparation, TEM imaging condition, image alignment, the correction of defocus values and the use of high frequency pass filter are evaluated. The obtained phase of wave function was converted to the geometric phase of the corresponding lattice planes, which was then used for the two-dimensional mapping of lattice strain following the dark-field inline holography (DIH) routine. The strain map obtained by DIH after optimized image processing is compared with that obtained by the geometric phase analysis of high resolution TEM (HRTEM) image, manifesting that DIH yields more accurate and reliable strain information than HRTEM-based GPA.