• 품질경영학회지
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• 제24권2호
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• pp.172-178
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• 1996

In this study, we developed a software for statistical process control. This software presents $\bar{x}$, R, CUSUM, EWMA control chart and process capability index. In this system, statistical process control methods are integrated into the automated method on a real time base. It is available in process control of specified type and can be performed on personal computer with network system.

• 기술사
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• 제20권3호
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• pp.15-25
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• 1987

Statistical control charts are useful tools to monitor and control the manufacturing processes and are widely used in most Korean industries. Many Korean companies, however, do not always obtain desired results from the traditional control charts by Shewhart such as the X-chart, X-chart, X-chart, etc. This is partly because the quality charterstics of the process are not distributed normally but are skewed due to the intermittent production, small lot size, etc. In Shewhart X-chart, which is the most widely used one in Korea, such skewed distributions make the plots to be inclined below or above the central line or outside the control limits although no assignable causes can be found. To overcome such shortcomings in nonnormally distributed processes, a distribution-free type of confidence interval can be used, which should be based on order statistics. This thesis is concerned with the design of control chart based on a sample median which is easy to use in practical situation and therefore properties for nonnormal distributions may be easily analyzed. Control limits and central lines are given for tile more famous nonnormal distributions, such as Gamma, Beta, Lognormal, Weibull, Pareto, Truncated-normal distributions. Robustness of the proposed median control chart is compared with that of the X-chart, the former tends to be superior to the latter as the probability distribution of the process becomes more skewed. The average run length to detect the assignable cause is also compared when the process has a Normal or a Gamma distribution for which the properties of X are easy to verify, the proposed chart is slightly worse than the X-chart for the normally distributed product but much better for Gamma-distributed products. Average Run Lengths of the other distributions are also computed. To use the proposed control chart, the probability distribution of the process should be known or estimated. If it is not possible, the results of comparison of the robustness force us to use the proposed median control chart based on a normal distribution. To estimate the distribution of the process, Sturge's formula is used to graph the histogram and the method of probability plotting, $X^2$-goodness of fit test and Kolmogorov-Smirnov test, are discussed with real case examples. A comparison of the propose4 median chart and the X chart was also performed with these examples and the median chart turned out to be superior to the X-chart.

• 산업경영시스템학회지
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• 제10권16호
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• pp.101-106
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• 1987

Statistical control charts are useful tools to monitor and control the manufacturing processes and are widely used in most Korean industries. Many Korean companies, however, do not always obtain desired results from the traditional control charts by Shewhart such as the $\bar{X}$-chart, $\bar{X}$-chart, $\bar{X}$-chart, etc. This is partly because the quality charterstics of the process are not distributed normally but are skewed due to the intermittent production, small lot size, etc. In Shewhart $\bar{X}$-chart. which is the most widely used one in Kora, such skewed distributions make the plots to be inclined below or above the central line or outside the control limits although no assignable causes can be found. To overcome such shortcomings in nonnormally distributed processes, a distribution-free type of confidence interval can be used, which should be based on order statistics. This thesis is concerned with the design of control chart based on a sample median which is easy to use in practical situation and therefore properties for nonnormal distributions may be easily analyzed. Control limits and central lines are given for the more famous nonnormal distributions, such as Gamma, Beta, Lognormal, Weibull, Pareto, Truncated-normal distributions. Robustness of the proposed median control chart is compared with that of the $\bar{X}$-chart; the former tends to be superior to the latter as the probability distribution of the process becomes more skewed. The average run length to detect the assignable cause is also compared when the process has a Normal or a Gamma distribution for which the properties of X are easy to verify, the proposed chart is slightly worse than the $\bar{X}$-chart for the normally distributed product but much better for Gamma-distributed products. Average Run Lengths of the other distributions are also computed. To use the proposed control chart, the probability distribution of the process should be known or estimated. If it is not possible, the results of comparison of the robustness force us to use the proposed median control chart based oh a normal distribution. To estimate the distribution of the process, Sturge's formula is used to graph the histogram and the method of probability plotting, $\chi$$^2$-goodness of fit test and Kolmogorov-Smirnov test, are discussed with real case examples. A comparison of the proposed median chart and the $\bar{X}$ chart was also performed with these examples and the median chart turned out to be superior to the $\bar{X}$-chart.

• 대한안전경영과학회:학술대회논문집
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• 대한안전경영과학회 2011년도 추계학술대회
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• pp.535-549
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• 2011

Control chart is most widely used in SPC(Statistical Process Control), Recently it is a critical issue that the standard control chart is not suitable to non-normal process with very small percent defective. Especially, this problem causes serious errors in the reliability procurement, such as semiconductor, high-precision machining and chemical process etc. Procuring process control technique for non-normal process with very small percent defective and perturbation is becoming urgent. Control chart technique in non-normal distribution become very important issue. In this paper, we investigate on research trend of control charts under non-normal distribution with very small percent defective and perturbation, and propose some variable-transformation methods applicable to CUSUM control charts in non-normal process.

• 산업경영시스템학회지
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• 제26권1호
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• pp.7-16
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• 2003

At present, company has to produce a product that consumer like with a competitive price, a good quality, and a fitting time to supply. Process control and quality control are very important to supply with a product uniformly and inexpensively. Process control is given much weight in the quality control in manufacturing system. Statistical process controls(SPC) that are used in process generally have major impact on manufacturing, product design activities, and process development potentially. Control charts in statistical process control method can be interpreted the data from quality characteristics in production process and discriminated between chance variation and assignable variation in process. In addition, control chart can be used to monitor the process output and detect when changes in the inputs are required to bring the process back to an in-control state. The models that relate the influential inputs to process outputs help determine the nature and magnitude of the adjustments required. In this paper, the characteristic of product quality is monitored by control chart during the machining process and construction of quality control cycle is considered to divide into two types in this case that different assignable causes lead to shifts having different magnitudes. Then we are intended to find a process shift magnitude which has economical quality cost policy and are considered to quality cost functions to find a process shift magnitude. Those costs are categorized into the well-known categories of prevention, appraisal, and internal failure and external failure. This paper ends with numerical examples that demonstrate the usefulness of the model.

• 대한안전경영과학회:학술대회논문집
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• 대한안전경영과학회 2013년 춘계학술대회
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• pp.547-556
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• 2013

Control chart is most widely used in SPC(Statistical Process Control), Recently it is a critical issue that the standard control chart is not suitable to non-normal process with very small percent defective. Especially, this problem causes serious errors in the reliability procurement, such as semiconductor, high-precision machining and chemical process etc. Procuring process control technique for non-normal process with very small percent defective and perturbation is becoming urgent. Control chart technique in non-normal distribution become very important issue. In this paper, we investigate on research trend of control charts under non-normal distribution.

• 품질경영학회지
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• 제38권2호
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• pp.190-201
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• 2010

This research proposes a method for designing VSI (Variable Sampling Interval) control charts with supplementary run rules. The basic idea is to apply various run rules and the VSI scheme to a control chart in order to increase the sensitivity. The sampling process of the VSI run rules chart is constructed by Markov chain approach. A procedure for designing the VSI run rules chart is proposed based on Lorenzen and Vance's model. Sensitivity study shows that the VSI run rules charts outperform the FSI (Fixed Sampling Interval) run rules charts for wide range of process mean shifts. A major advantage of the VSI run rules chart over other charts such as CUSUM, EWMA, and adaptive charts is it's simplicity in implementation. Some useful guidelines are proposed based on the sensitivity study.

• Communications for Statistical Applications and Methods
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• 제14권2호
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• pp.365-376
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• 2007

This research considers to propose the control charts using median for the location parameter. In order to decide the control limits, we apply several bootstrap methods through the approach obtaining the confidence interval except the standard bootstrap method. Then we illustrate our procedure using an example and compare the performance among the various bootstrap methods by obtaining the length between control limits through the simulation study. The standard bootstrap may be apt to yield shortest length while the bootstrap-t method, the longest one. Finally we comment briefly about some specific features as concluding remarks.

• 산업경영시스템학회지
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• 제24권63호
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• pp.45-54
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• 2001

The process capability indices have been widely used in manufacturing industries to provide numerical measures of process potential and performance. This study is concerned with process controls and adjustments by incapability index $C_{pp}$ and its sub-indices. A monitoring for $\^{C}_{pp}$ would provide a convenient way to monitor changes on process capability after statistical control is established, since $C_{pp}$ simultaneously measures process variability and centering. Further, we can separate charting of process location and variability by sub-indices of $C_{pp}$, ($C_{ia}$, $C_{ip}$), without returning to $\={x}$-R chart, even though an out-of-control signals on $\^{C}_{pp}$ control chart is found.

• 품질경영학회지
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• 제28권3호
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• pp.44-52
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• 2000

In this paper we apply VSS X chart to the case when two assignable causes effect the process mean shift. We compare the case when two compound assignable causes effect the process mean with another one which effects individually. For the practical use of VSS $\bar{X}$ chart we propose the sample size which minimizes the average number of samples until the signal is given in out-of-control state.