• Communications of the Korean Mathematical Society
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• v.10 no.3
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• pp.653-659
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• 1995

We prove that two essentially normal elements of a type $II_{\infty}$ factor von Neumann algebra are unitarily equivalent up to the compact ideal if and only if they have the identical essential spectrum and the same index data. Also we calculate the spectrum and essential spectrum of a non-unitary isometry of von Neumann algebra.

• Journal of Korea Water Resources Association
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• v.38 no.6 s.155
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• pp.439-448
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• 2005

This paper introduces the wavelet transform that was improved by the fourier transform to assess periodicities and trends, we assessed propriety with examples of two monthly precipitation data, annual precipitation, SOI index and SST index. The wavelet transform can effectively assess the power spectrum corresponding to frequency as maintaining chronological characteristics. The results of the analysis using the wavelet transform showed that the monthly precipitation have the strongest power spectrum near that of 1 year, and the annual precipitation represent the dominated spectrum in the band of 2-8 years. Also, the SOI index and SST index indicate the strongest power spectrum in the band of 2-8 years.

• Korean Journal of Optics and Photonics
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• v.7 no.4
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• pp.357-362
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• 1996

The thickness and the spectrum of the complex refractive index in the region 1.5~4.5 eV, of an MNA/PMMA thin film fabricated by spin casting are determined. The film thickness and the refractive index in its transparent region is calculated by modeling the spectroscopic ellipsometry data. The extinction coefficient spectrum is obtained from the absorption spectrum in its non-transparent region. The best fit oscillator parameters of the classical Lorentz oscillator and a quantum mechanical oscillator are found. The complex refractive index spectrum by these oscillators are compared. The present technique can be applied to get the thickness and the complex refractive index of unknown polymer films and thus it will be useful in optical characterization of those films.

• Proceedings of the Optical Society of Korea Conference
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• 1991.06a
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• pp.203-208
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• 1991

We present an analytic equation for the reflectivity spectrum of a Bragg reflector in terms of the front mirror reflectivity, due to the refractive index difference between the refractive index of outside medium and the average refractive index of Bragg reflector structures, and the reflectivity of a Bragg reflector calculated by the coupled wave method. We show that even Fresnel reflection causes the reflectivity spectrum of a bragg reflector to be very different from that of Bragg reflectors calculated by the coupled wave method. The reflectivity spectrum of a Bragg reflector is dramatically changed because the interference effect between the reflected wave from the front facet and that from the Bragg reflector is changed due to the difference of a phase change from a Bragg reflector when the sequence of layers in a Bragg reflector is changed.

• Journal of Communications and Networks
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• v.11 no.2
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• pp.134-147
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• 2009

Tracking and exploiting instantaneous spectrum opportunities are fundamental challenges in opportunistic spectrum access (OSA) in presence of the bursty traffic of primary users and the limited spectrum sensing capability of secondary users. In order to take advantage of the history of spectrum sensing and access decisions, a sequential decision framework is widely used to design optimal policies. However, many existing schemes, based on a partially observed Markov decision process (POMDP) framework, reveal that optimal policies are non-stationary in nature which renders them difficult to calculate and implement. Therefore, this work pursues stationary OSA policies, which are thereby efficient yet low-complexity, while still incorporating many practical factors, such as spectrum sensing errors and a priori unknown statistical spectrum knowledge. First, with an approximation on channel evolution, OSA is formulated in a multi-armed bandit (MAB) framework. As a result, the optimal policy is specified by the wellknown Gittins index rule, where the channel with the largest Gittins index is always selected. Then, closed-form formulas are derived for the Gittins indices with tunable approximation, and the design of a reinforcement learning algorithm is presented for calculating the Gittins indices, depending on whether the Markovian channel parameters are available a priori or not. Finally, the superiority of the scheme is presented via extensive experiments compared to other existing schemes in terms of the quality of policies and optimality.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.58 no.6
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• pp.1078-1086
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• 2009

This paper presents a Fourier based algorithm for estimating the parameters of the low frequency oscillating modes. The proposed methods estimates various parameters(frequency, damping factor, mode magnitude, phase) by fitting Fourier spectrum and phase with a damped exponential cosine function. Dominant frequency is selected by taking frequency corresponding to the peak spectrum, and damping factor is estimated using the left/right spectra of Fourier spectrum. In addition, mode magnitude is calculated by the normalized peak spectrum, and phase is estimated from spectrum phase. Also, we introduce an accuracy index in order to determine the accuracy of the estimated parameters, and the index is calculated using the deviations of the peak spectrum and the left/right spectra. The parameter estimation methods proposed in this paper include very simple arithmetical processes, so the algorithms are simple and the calculation speed is very fast. The proposed methods are applied to test functions with two dominant modes. The results show that the proposed methods are highly applicable to low frequency parameter estimation.

• Journal of The Korean Astronomical Society
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• v.37 no.5
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• pp.315-322
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• 2004

Several arguments have been presented in the literature to support the connection between radio halos and cluster mergers. The spectral index distributions of the halos in A665 and A2163 provide a new strong confirmation of this connection, i.e. of the fact that the cluster merger plays an important role in the energy supply to the radio halos. Features of the spectral index (flattening and patches) are indication of a complex shape of the radiating electron spectrum, and are therefore in support of electron reacceleration models. Regions of flatter spectrum are found to be related to the recent merger. In the undisturbed cluster regions, instead, the spectrum steepens with the distance from the cluster center. The plot of the integrated spectral index of a sample of halos versus the cluster temperature indicates that clusters at higher temperature tend to host halos with flatter spectra. This correlation provides further evidence of the connection between radio emission and cluster mergers.

• Journal of Biomedical Engineering Research
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• v.28 no.6
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• pp.750-755
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• 2007

The linear SEF (Spectral Edge Frequency) parameter and spectrum analysis method can not reflect the non-linear of EEG. This method can not contribute to acquire real time analysis and obtain a high confidence in the clinic due to low discrimination. To solve the problems, the development of a new index is carried out using the bispectrum analyzing the EEG including the non-linear characteristic. At the bispectrum analysis of the 2 dimension, the most significant's power spectrum density peaks appeared much at the specific area in awake and anesthesia state. Because many peaks are showed at the specific area in the frequency coordinate, these points are used to create the new index. Range of the index is 0-100. At the anesthesia, the index is 20-50 and at the awake, the index is 90-60. New index can discriminate the awake and anesthesia state.

• Korean Journal of Optics and Photonics
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• v.14 no.3
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• pp.266-271
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• 2003

The reflectance spectrum of optical films thicker than a few microns shows an intensity oscillation due to interference. Since the spectral period of the oscillation is inversely related to film thickness, the thickness of an optical film can be determined from the spectral frequency of the oscillation. For rapid data processing, the spectral frequency is obtained by use of a Fast Fourier Transformation technique. The conventional method of applying a Fast Fourier Transformation to the reflectance spectrum versus photon energy is modified so as to clear the ambiguity in choosing the proper effective refractive index value and to prevent the broadening of the Fourier transformed peak due to the refractive index dispersion. This technique of modified Fast Fourier Transformation is suggested by the authors for the first time to their knowledge. From the analysis of the calculated reflectance spectrum of a 30-${\mu}{\textrm}{m}$-thick dielectric film. it is shown to improve the accuracy in determining film thickness by a great amount. The improved accuracy of the modified Fast Fourier Transformation is also confirmed from the analysis of the reflectance spectra of a sample with 80-${\mu}{\textrm}{m}$-thick cover layer and 13-${\mu}{\textrm}{m}$-thick spacer layer on a PC substrate.

• Applied Microscopy
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• v.46 no.1
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• pp.27-31
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• 2016

It has been investigated what kind of characteristic X-ray in electron probe micro-analyzer (EPMA) is effective for the determination of compounds of Si series materials. After comparing the characteristic X-rays among the primary and secondary lines in $K_{\alpha}$ and $K_{\beta}$ obtained from the Si series standard samples, it was found that the secondary line of $K_{\alpha}$ exhibited the most informative spectrum although the intensity was considerably weak. As a result of analyzing the spectrum shapes of the Si series standard samples, the spectrum shape of the secondary line of $K_{\alpha}$ for SiC was different from those for other Si compounds. To grasp the characteristics of the shape, a line was perpendicularly drawn from the peak top to base line in order to divide a spectrum into two areas. The area ratio of right to left was defined to call as the asymmetry index here. As a result, the asymmetry index value of the SiC was greater than one, while those of other Si compounds were less than one. It was found from the EPMA analysis that identification of SiC became successful to distinguish from other Si compounds and this method was applicable for micro-sized compounds in a practical composite material.