Application of the modified fast fourier transformation weighted with refractive index dispersion far an accurate determination of film thickness |
김상준
(아주대학교 분자과학기술학과)
김상열 (아주대학교 분자과학기술학과) |
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Thickness measurement of dielectric films by wavelength scanning method
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DOI ScienceOn |
2 |
FTIR phase-modulated ellipsometry measurements of microcrystalline silicon films deposited by hot-wire CVD
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DOI ScienceOn |
3 |
White-light spectral interferometry with the uncompensated Michelson interferometer and the group refractive index dispersion in fused silica
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DOI ScienceOn |
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Measure-ment and prediction of angle-dependent optical properties of coated glass products: results of an inter-laboratory comparison of spectral transmittance and reflectance
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DOI ScienceOn |