• Title/Summary/Keyword: Source mobility

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Improving TCP Performance Over Mobile ad hoc Networks by Exploiting Cluster-Label-based Routing for Backbone Networks

  • Li, Vitaly;Ha, Jae-Yeol;Oh, Hoon;Park, Hong-Seong
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.33 no.8B
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    • pp.689-698
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    • 2008
  • The performance of a TCP protocol on MANETs has been studied in a numerous researches. One of the significant reasons of TCP performance degradation on MANETs is inability to distinguish between packet losses due to congestion from those caused by nodes mobility and as consequence broken routes. This paper presents the Cluster-Label-based Routing (CLR) protocol that is an attempt to compensate source of TCP problems on MANETs - multi-hop mobile environment. By utilizing Cluster-Label-based mechanism for Backbone, the CLR is able to concentrate on detection and compensation of movement of a destination node. The proposed protocol provides better goodput and delay performance than standardized protocols especially in cases of large network size and/or high mobility rate.

Electrical properties for $ZnIn_2S_4$ epilayers grown by Hot Wall Epitaxy (Hot Wall Epitaxy (HWE)법에 의해 성장된 $ZnIn_2S_4$ 에피레이어의 전기적 특성)

  • Lee, Sang-Youl;Hong, Kwang-Joon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.143-144
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    • 2008
  • Single crystal $ZnIn_2S_4$ layers were grown on a thoroughly etched semi-insulating GaAs(100) substrate at $450^{\circ}C$ with the hot wall epitaxy (HWE) system by evaporating the polycrystal source of $ZnIn_2S_4$ at $610^{\circ}C$ prepared from horizontal electric furnace. The crystalline structure of the single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). The carrier density and mobility of single crystal $ZnIn_2S_4$ thin films measured with Hall effect by van der Pauw method are $8.51\times10^{17}$ electron/$cm^{-3}$, 291 $cm^2$/v-s at 293 K, respectively.

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Growth and electrical properties for $AgGaSe_2$ epilayers by hot wall epitaxy (Hot Wall Epitaxy(HWE)법에 의한 $AgGaSe_2$ 단결정 박막 성장과 전기적 특성)

  • Park, Chang-Sun;Hong, Kwang-Joon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.96-97
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    • 2008
  • Single crystal $AgGaSe_2$ layers were grown on thoroughly etched semi-insulating GaAs(100) substrate at 420 $^{\circ}C$ with hot wall epitaxy (HWE) system by evaporating $AgGaSe_2$ source at 630 $^{\circ}C$. The crystalline structure of the single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). The carrier density and mobility of single crystal $AgGaSe_2$ thin films measured with Hall effect by van def Pauw method are $9.24\times10^{16}cm^{-3}$ and 295 $cm^2/V{\cdot}s$ at 293 K, respectively.

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Improvement of Carrier Mobility on Silicon-Germanium on Insulator MOSFET Devices with a Strained-Si Layer

  • Cho, Won-Ju;Koo, Hyun-Mo;Lee, Woo-Hyun;Koo, Sang-Mo;Chung, Hong-Bay
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.20 no.5
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    • pp.399-402
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    • 2007
  • The effects of heat treatment on the electrical properties of strained-Si/SiGe-on-insulator (SGOI) devices were examined. We proposed the optimized heat treatment processes for improving the back interfacial electrical properties in SGOI-MOSFET. By applying the additional pre-RTA (rapid thermal annealing) before gate oxidation step and the post-RTA after source/drain dopant activation step, the electrical properties of strained-Si channel on $Si_{1-x}Ge_x$ layer were greatly improved, which resulting the improvement of the driving current, transconductance, and leakage current of SGOI-MOSFET.

Soft Lithographic Approach to Fabricate Sub-50 nm Nanowire Field-effect Transistors

  • Lee, Jeong-Eun;Lee, Hyeon-Ju;Go, U-Ri;Lee, Seong-Gyu;Qi, Ai;Lee, Min-Hyeong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.410.1-410.1
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    • 2014
  • A soft-lithographic top-down approach is combined with an epitaxial layer transfer process to fabricate high quality III-V compound semiconductor nanowires (NWs) and integrate them on Si/SiO2 substrates, using MBE-grown ultrathin InAs as a source wafer. The channel width of the InAs nanowires is controlled by using solvent-assisted nanoscale embossing (SANE), descumming, and etching processes. By optimizing these processes, the NW width is scaled to less than 50 nm, and the InAs NWFETs has ${\sim}1,600cm^2/Vs$ peak electron mobility, which indicates no mobility degradation due to the size.

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Low temperature electron mobility property in Si/$Si_{1-x}Ge_{x}$ modulation doped quantum well structure with thermally grown oxide

  • Kim, Jin-Young
    • Journal of Korean Vacuum Science & Technology
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    • v.4 no.1
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    • pp.11-17
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    • 2000
  • The low temperature electron mobilities were investigated in Si/$Si_{1-x}Ge_{x}$ modulation Doped (MOD) quantum well structure with thermally grown oxide. N-type Si/$Si_{1-x}Ge_{x}$ structures were fabricated by a gas source MBE. Thermal oxidation was carried out in a dry $O_2$ atmosphere at $700^{\circ}C$ for 7 hours. Electron mobilities were measured by a Hall effect and a magnetoresistant effect at low temperatures down to 0.4 K. Pronounced Shubnikov-de Haas (SdH) oscillations were observed at a low temperature showing two dimensional electron gases (2 DEG) in a tensile strained Si quantum well. The electron sheet density ($n_{s}$) of 1.5${\times}$$10^{12}$[$cm^{-2}$] and corresponding electron mobility of 14200 [$cm^2$$V^{-1}$$s^{-1}$] were obtained at low temperature of 0.4 K from Si/$Si_{1-x}Ge_{x}$ MOD quantum well structure with thermally grown oxide.

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Fabrication of Pentacene Thin Film Transistors and Their Electrical Characteristics (Pentacene 박막트랜지스터의 제조와 전기적 특성)

  • 김대엽;최종선;강도열;신동명;김영환
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.11a
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    • pp.598-601
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    • 1999
  • There is currently considerable interest in the applications of conjugated polymers, oligomers and small molecules for thin-film electronic devices. Organic materials have potential advantages to be utilized as semiconductors in field effect transistor and light emitting didoes. In this study, Pentacene thin film transistors(TFTs) were fabricated on glass substrate. Aluminum and Gold wei\ulcorner used fur the gate and source/drain electrodes. Silicon dioxde was deposited as a gate insulator by PECVD and patterned by R.I.E. The semiconductor layer of pentacene was thermally evaporated in vaccum at a pressure of about 10$^{-8}$ Torr and a deposition rate 0.3$\AA$/sec. The fabricated devices exhibited the field-effect mobility as large as 0.07cm$^2$/Vs and on/off current ratio larger than 10$^{7}$

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Geochemical Study on the Mobility of Dissolved Elements by Rocks-$CO_2$-rich waters Interaction in the Kangwon Province (강원도 지역 탄산수와 암석간의 반응에 의한 용존 원소들의 유동성에 관한 지구화학적 연구)

  • 최현수;고용권;윤성택;김천수
    • Economic and Environmental Geology
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    • v.35 no.6
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    • pp.533-544
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    • 2002
  • In order to investigate the relative mobility (RM) of dissolved elements during processes controlling major and trace element content, the concentrations of major, minor and trace elements were reviewed from the previous data of $CO_2$-rich waters and granites from Kangwon Province. The relative mobility of elements dissolved in $CO_2$-rich waters is calculated from $CO_2$-rich water/granite ratio with normalizing by sodium. The results show that gaseous input of magmatic volatile metals into the aquifer is negligible in this study area, being limited by cooling of the rising fluids. Granite leaching by weakly acidic, $CO_2$-charged water is the overwhelming source of metals. Poorly mobile element (Al) is preferentially retained in the solid residue of weathering, while alkalis, alkaline earth and oxo-hydroxo anion forming elements (especially As and U) are mobile and released to the aqueous system. Transition metals display an intermediate behavior and are strongly dependent on either the redox conditions (Fe and Mn) or solid surface-related processes (adsorption or precipitation) (V, Zn and Cu).

Design of smart mobility status notification system (스마트 모빌리티 상태 알림 시스템 설계)

  • Park, Se-il;Jang, Jong-wook
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.21 no.11
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    • pp.2128-2132
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    • 2017
  • Smart mobility is rapidly emerging as a next-generation eco-friendly transportation system, and the market is booming every year. However, due to the characteristics of the devices that use electricity as the power source, the motor and the battery are different from the performance and actual performance indicated by the manufacturer depending on the user's weight and driving environment. Therefore, The frequency of the overload is increased and the failure and damage of the device are increasing. In this paper, we propose an application that provides personalized recommended driving guidance and overloaded driving situation notification at the actual driving separately from the recommended driving provided by the manufacturer after measuring the driving environment of the user, so as to prevent malfunction and damage of the smart mobility device, To ensure safety.

Improved Contact property in low temperature process via Ultrathin Al2O3 layer (Al2O3 층을 이용한 저온공정에서의 산화물 기반 트랜지스터 컨택 특성 향상)

  • Jeong, Seong-Hyeon;Sin, Dae-Yeong;Jo, Hyeong-Gyun
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2018.06a
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    • pp.55-55
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    • 2018
  • Recently, amorphous oxides such as InGaZnO (IGZO) and InZnO (IZO) as a channel layer of an oxide TFT have been attracted by advantages such as high mobility, good uniformity, and high transparency. In order to apply such an amorphous oxide TFTs to a display, the stability in various environments must be ensured. In the InGaZnO which has been studied in the past, Ga elements act as a suppressor of oxygen vacancy and result in a decreased mobility at the same time. Previous studies have been showed that the InZnO, which does not contain Ga, can achieve high mobility, but has relatively poor stability under various instability environments. In this study, the TFTs using $IZO/Al_2O_3$ double layer structure were studied. The introduction of an $Al_2O_3$ interlayer between source/drain and channel causes superior electrical characteristics and electrical stability as well as reduced contact resistance with optimally perfect ohmic contact. For the IZO and $Al_2O_3$ bilayer structures, the IZO 30nm IZO channels were prepared at $Ar:O_2=30:1$ by sputtering and the $Al_2O_3$ interlayer were depostied with various thickness by ALD at $150^{\circ}C$. The optimal sample exhibits considerably good TFT performance with $V_{th}$ of -3.3V and field effect mobility of $19.25cm^2/Vs$, and reduced $V_{th}$ shift under positive bias stress stability, compared to conventional IZO TFT. The enhanced TFT performances are closely related to the nice ohmic contact properties coming from the defect passivation of the IZO surface inducing charge traps, and we will provide the detail mechanism and model via electrical analysis and transmission line method.

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