• 대한용접접합학회:학술대회논문집
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• 대한용접접합학회 2005년도 추계학술발표대회 개요집
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• pp.219-221
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• 2005

Sn-9Zn solder balls were bonded to Cu, ENIG (Electroless Nickel/Immersion Gold) and electrolytic Au/Ni pads, and the effect of aging on their joint reliability was investigated. The interfacial products were different from the general reaction layer formed in a Sn-base solder. The intermetallic compounds formed in the solder/Cu joint were $Cu_{5}Zn_{8}$ and $Cu_{6}Sn_{5}$. After aging treatment, voids formed irregularly at the bottom side of the solder because of Sn diffusion into the $Cu_{5}Zn_{8}$ IMC. In the case of the solder/ENIG joint, $AuZn_{3}$ IMCs were formed at the interface. In the case of the Au/Ni/Cu substrate, an $AuZn_{3}$ IMC layer formed at the interface due to the fast reaction between Au and Zn. In addition, the $AuZn_{3}$ IMC layer became detached from the interface after reflow. When the aging time was extended to 100 h, $Ni_{5}Zn_{21}$ IMC was observed on the Ni substrate.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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• pp.442-446
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• 1999

Melting behavior and bridge phenomenon of solder paste, which is essential for surface mount technology in packaging, were investigated. solder paste of Sn-37%Pb was printed on Sn-coated Cu-pattern of PCB, and heated over melting point. Melting behavior of the paste was observed using CCD-camera. In order to modelize the melting and agglomeration phenomena of the paste, two solder balls of 0.76mm diameter were used. As experimental results, the paste start to melt from the margin of the printed shape. The hight of the melted paste decreased from 270 $\mu$m to 200 $\mu$m firstly, and finally recovered to 250 $\mu$m. During the melting procedure, pores were evolved from the molten paste. Bridge Phenomenon of the molten Paste depends upon the pitch of the pattern.

• 제어로봇시스템학회논문지
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• 제19권11호
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• pp.960-967
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• 2013

Shape recognition of solder ball bumps in a BGA (Ball Grid Array) is an important issue in flip chip bonding technology. In particular, the semiconductor industry has required faster and more accurate inspection of micron-size solder bumps in flip chip bonding as the density of balls has increased dramatically. The difficulty of this issue comes from specular reflection on the metal ball. Shape recognition of a metal ball is a very realproblem for computer vision systems. Specular reflection of the metal ball appears, disappears, or changes its image abruptly due to tiny movementson behalf of the viewer. This paper presents a practical shape recognition method for three dimensional (3-D) inspection of a BGA using a 5-step ring illumination device. When the ring light illuminates the balls, distinctive specularity images of the balls, which are referred to as "iso-slope contours" in this paper, are shown. By using a mathematical reflectance model, we can drive the 3-D shape information of the ball in aquantitative manner. The experimental results show the usefulness of the method for industrial application in terms of time and accuracy.

• 대한용접접합학회:학술대회논문집
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• 대한용접접합학회 2006년도 춘계 학술대회 개요집
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• pp.36-38
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• 2006

We investigated that the metallurgical, mechanical and electrical properties of the Sn-3.SAg/Cu ball grid array (BGA) solder joints at a reflow temperature of $255^{\circ}C$ for different reflow times of 10, 60, 300 and 1800 s. Two different intermetallic compound (IMC) layers, consisting of scallop-shaped $Cu_6Sn_5$ and very thin $Cu_3Sn$, formed at the solder/substrate interface, and their thicknesses increased with increasing reflow time. The shear force peaked after reflow for 60 s, and then significantly decreased with increasing reflow time. The fracture occurred along the solder ball in the initial reflow, but the fraction of the brittle fracture increased with increasing reflow time. The IMC growth and the volume of Cu dissolved in the solder balls affected the electrical property.

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2002년도 추계기술심포지움논문집
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• pp.55-58
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• 2002

The possibility of SnCuX Solder as alternative for Pb-free Solder have been investigated in this study. SnCuX Solder balls(500${\mu}{\textrm}{m}$) were placed on Si-wafer which is Al/Ni/Cu(500nm/$4{\mu}{\textrm}{m}$/$4{\mu}{\textrm}{m}$)UBM layer. After reflow soldering at $250^{\circ}C$, shear strength and microstructure were analyzed. The results showed that the shear strength(500gf) of SnCuX was higher than that of SnCuX at $230^{\circ}C$ and $Cu_6Sn_5$ intermetallic compounds were formed between Cu and SnCuX Solder layers

• 전자공학회논문지SC
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• 제47권6호
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• pp.80-85
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• 2010

현재 BGA 409 chip의 외관검사는 대부분 현미경을 이용한 육안검사로 이루어지고 있다. 그러나 인간의 시력에 의존하여 검사하는 현재의 외관검사 방법은 검사자의 육체적, 정신적 부분에 의하여 검사 결과가 변화하기 때문에 안정적인 결과를 기대하기 어렵다. 따라서 육안검사 시 발생하는 문제점을 개선하기 위해 BGA 솔더볼 외관검사의 비전 시스템이 개발 되었고, 이는 기존의 검사 방법에 비해 BGA 409 chip의 솔더볼의 외관검사의 신뢰성과 효율성을 증가시켰다. 하지만 BGA 솔더볼의 크기가 미세하고 그 특징의 구분이 힘들어 검사의 정확도가 떨어지고 오리엔테이션 오류가 발생하였다. 이에 본 논문에서는 BGA 솔더볼 외관검사의 정확도를 향상시키기 위해 에지 검출 알고리즘의 보완과 특징들만을 비교하는 패턴매칭 기법을 제안하였으며, 또한 특징 공간 설정의 기준이 되는 기준 영역의 개선을 통해 오리엔테이션 오류의 개선을 제안하였다. 즉, 본 논문에서는 기존의 비전 시스템의 정확도와 오리엔테이션 오류를 개선하는 방법을 제안함으로써 BGA 솔더볼 외관검사의 정확도를 향상시켜 결과적으로 BGA 솔더볼 외관검사의 에러율을 줄이고 검사 속도의 향상 등 기존의 외관검사 방법에 비해 향상된 검사 결과를 획득하였다.

• 한국전기전자재료학회논문지
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• 제17권6호
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• pp.575-579
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• 2004

Package reliability test was conducted to investigate the effect of solder paste composition at BGA Package. It was found that the shape and size of the phase form are affected by the processing parameters. The material have used to fill in the via was Sn/36Pb/2Ag and Sn/0.75Cu type solder paste. Sn/36Pb/2Ag and Sn/0.75Cu paste were fabricated on Tape-BGA substrates by screen printing process, and via ball mount data were characterized with variations of dwell time of 85 seconds at reflow peak temperature at 22$0^{\circ}C$ or 24$0^{\circ}C$. The test condition was MRT 30 $^{\circ}C$/60 %RH/96 HR. Failures formed of a ball-off in solder paste process were observed by using a Optical Microscope and SEM(Scanning Electron Microscope). It was concluded that intermetallic layer growth played important roles in increasing solder fatigue strength for addition of Ag composition. The degradation of shear strength of solder composition is discussed.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2009년도 추계학술대회 논문집
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• pp.207-208
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• 2009

• 대한기계학회:학술대회논문집
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• 대한기계학회 2000년도 춘계학술대회논문집A
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• pp.873-878
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• 2000

Semiconductor packaging technology is changed rapidly according to the trends of the micro miniaturization of multimedia and information equipment. For I/O limitation and fine pitch limitation, DIP and SOP/QFP are replaced by BGA/CSP. This is one of the surface mount technology(SMT). Solder ball is bumped n the die pad and connected onto mounting board. In ball bump formation, vacuum suction type ball alignment process is widely used, However this type has some problems such as ionization, static electricity and difficulty of fifo(first-input first-out) of solder balls. Seesaw type is reducing these problems and has a structural simplicity and economic efficiency. Ball cartridge velocity and ball aligned plate angle are Important variables to improve the ball alignment Process. In this paper, seesaw-type CSP solder ball loader is developed and the optimal velocity and plate angle are proposed.

• 마이크로전자및패키징학회지
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• 제17권2호
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• pp.21-28
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• 2010

본 논문에서는 온도 사이클이 진행되는 동안 비선형 거동과 크립 거동을 보이는 FC-PBGA 패키지 솔더볼의 변형거동을 알아보기 위하여 시간에 종속하는 거동을 적용 시킬 수 있는 점소성 모델과 크립 모델에 대하여 유한요소해석을 수행하였다. 유한요소해석 결과의 신뢰성을 평가하기 위하여 무아레 간섭계를 이용하여 온도변화에 따른 열변형 실험을 수행하였다. 전체적인 굽힘변위는 Anand 모델과 변형률 분리 모델 모두 실험결과와 잘 일치하였으나 솔더볼의 변형률은 Anand 모델의 경우 큰 차이를 보이고 변형률 분리 모델의 경우 상당히 일치하는 계산결과를 얻었다. 따라서 본 논문에서는 변형률 분리 모델을 이용하여 시간에 종속하는 FC-PBGA 패키지 솔더볼의 크립 거동을 검토하였다. 솔더를 포함한 패키지에 온도변화가 생길 때 고온에서는 시간이 지남에 따라 크립 거동에 의해 솔더의 응력이 점차 완화되는 현상을 나타내고 있음을 알 수 있었다.