• 한국마이크로전자및패키징학회:학술대회논문집
• /
• 한국마이크로전자및패키징학회 2001년도 The IMAPS-Korea Workshop 2001 Emerging Technology on packaging
• /
• pp.127-133
• /
• 2001

솔더볼의 피로강도에 대한 솔더 조성의 영향을 조사하기 위하여 패키지 신뢰성 시험을 실시하였다. 공정조성 솔더, S $n_{62}$P $b_{36}$A $g_2$, S $n_{63}$P $b_{34.5}$A $g_2$S $b_{0.5}$ 솔더를 사용해 제조된 시편을 MRT Lv 2a 조건에서 전처리 후 TC 시험을 수행하였다. 제조 직후, 전처리 후, TC 후 각각에 대하여 전단강도를 측정하였으며, 미세 조직 사진을 얻었다. 또한, SEM과 EDX를 이용하여 파괴 기구에 대한 분석을 실시하였으며, 신뢰성 시험 후 전단강도의 저하에 대하여 논의하였다.다.

• 한국생산제조학회지
• /
• 제23권3호
• /
• pp.237-242
• /
• 2014

Recently much research are has been done into the compositions of lead-free solders. As a result, there has been a rapid increase in the number of new compositions. In the past, the properties of these new compositions were determined and verified through drop-impact tests. However, these drop tests were expensive and it took a long time to obtain a result. The main goal of this study was to establish an analytical method capable of predicting the impact life-time of a new solder composition for board-level flip chips though the application of drop simulations using LS-DYNA. Based on the reaction load obtain with LS-DYNA, the drop-impact fracture cycles were predicted. The study was performed using a Sn-3.0Ag-0.5Cu solder (305 composition). To verify the reliability of the proposed analytical method, the results of the drop-impact tests and life-time analysis were compared, and were found to be in good agreement. Thus, the new analytical method was shown to be very useful and effective.

• 제어로봇시스템학회논문지
• /
• 제15권9호
• /
• pp.916-921
• /
• 2009

The technology to inspect and measure an inner structure of micro parts has become an important tool in the semi-conductor industrial field with the development of automation and precision manufacturing. Especially, the inspection skill on the inside of highly integrated electronic device becomes a key role in detecting defects of a completely assembled product. X-ray inspection technology has been focused as a main method to inspect the inside structure. However, there has been insufficient research done on the customized inspection technology for the flip-chip assembly due to the interior connecting part of flip chip which connects the die and PCB electrically through balls positioned on the die. In this study, therefore, it is implemented to detect shape error of flip chip bonding without damaging chips using an x-ray inspection system. At this time, it is able to monitor the solder bump shape by introducing an edge-extracting algorithm (exponential approximation function) according to the attenuating characteristic and detect shape error compared with CAD data. Additionally, the bonding error of solder bumps is automatically detectable by acquiring numerical size information at the extracted solder bump edges.

• 마이크로전자및패키징학회지
• /
• 제8권1호
• /
• pp.5-11
• /
• 2001

SMT(Surface Mount Technology)패키징 공정에서 발생하는 솔더 페이스트의 용융거동과 브릿지 현상을 관찰하였다. 이를 위하여 Cu 패드위에 Sn-37%Pb 조성의 솔더 페이스트를 인쇄하였으며, 인쇄된 PCB기판을 솔더의 융점($183^{\circ}C$)이상으로 가열하였다. 이 때에 페이스트의 용융거동을 조사하기 위하여 CCD카메라를 이용하여 근접촬영하였다. 솔더링시 솔더 페이스트가 용융.응집되는 과정을 규명하기 위하여 동일한 조성의 0.76 mm직경을 갖는 두 개의 솔더 볼을 사용하여 모델링 하였다. 솔더 페이스트의 용융거동을 관찰한 결과 페이스트는 인쇄된 부분의 가장자리에서 안쪽으로 녹아들어가는 모습을 보였다. 또한, 페이스트의 높이는 가열 초기 270 $\mu\textrm{m}$에서 가열후 약 35초 경과시 200 $\mu\textrm{m}$로 줄어들었다가 최종적으로 250 $\mu\textrm{m}$로 다시 증가하였으며, 이 때 용융된 페이스트 내에서 기포가 방출되었다. 솔더볼의 용융모델에서 용융온도가 $280^{\circ}C$인 경우에 솔더볼의 접촉면적과 솔더링 시간 사이에는 $\chi^2/t=4r \; \gamma/\eta=7.56 m^2$/s의 관계식이 성립됨을 알 수 있었다.

• 마이크로전자및패키징학회지
• /
• 제17권3호
• /
• pp.17-26
• /
• 2010

반도체 패키지에 사용되고 있는 유연 솔더는 환경 보호 필요성 대문에 무연 솔더로 빠르게 대체되고 있다. 이와 같은 무연 솔더에 대한 여구는 주로 재료의 발견과 공정 적응성의 관점에서 이루어졌을 뿐, 기계적인 성질이나 신뢰성의 관점에서의 연구는 많이 이루어지지 않았다. 본 논문에서는 무아레 간섭계를 이용하여 유연 솔더와 무연 솔더 실장 WB-PBGA 패키지 결합체의 온도변화에 대한 열-기게적 거동을 해석하였다. 실시간 무아레 간섭계를 이용하여 각 온도 단계에서 변위 분포를 나타내는 간섭무늬를 얻고, 그로부터 유연과 무연의 솔더 조인트를 갖는 WB-PBGA 패키지의 굽힘 변형 거동 및 솔더 볼의 변형률을 비교 분석하였다. 분석결과를 보면 유연 솔더 실장 패키지 결합체의 솔더 볼은 칩경계 부근인 #3 솔더 볼에서 발생하는 전단변형률이 파손에 큰 영향을 미치며, 무연 솔더가 실장된 패키지 결합체의 솔더 볼은 가장 바깥 부근인 #7 솔더 볼에서 발행하는 수직 변형률이 파손에 큰 영향을 미칠 것으로 예측된다, 또한 무연 솔더 실장 패키지 결합체는 같은 온도 조건에서 유연 솔더 실장된 패키지에 비해 굽힘 변형이 휠씬 크게 발생될 뿐 아니라 솔더 볼의 유효변형률도 10% 정도 크게 발생하는 것으로 나타나서 열변형에 의한 파손에 취약할 것으로 예측된다.

• 반도체디스플레이기술학회지
• /
• 제5권1호
• /
• pp.1-4
• /
• 2006

Recently, Ball Grid Arrays(BGAs) are getting used more frequently for a package type. The connectors on a BGA consist of a large number of small solder balls in a grid shape on its bottom side. However, since balls of BGAs mounted on PCBs are not visible, inspection before mounting them is indispensable. High speed non-contact 3D measurement technologies are necessary far real-time measurement of ball height, the most important inspection item. In this paper, an accurate 3D data acquisition system for BGAs is proposed that can acquire 3D profile at high speed using a 3D smart camera and laser slit ray projection. Some clipping and morphological filtering operations are employed to remove spiky error data, which occur due to reflections from some ball area to camera direction.

• 한국생산제조학회지
• /
• 제18권4호
• /
• pp.362-368
• /
• 2009

In general, circuit board assemblies experience various mechanical loadings during assembly and in actual use. The repeated cyclic bending can cause electrical failures due to circuit board cracks, solder interconnects cracks, and the component cracks. In this paper, we report on the failure characteristics of semiconductor chips under the repeated cyclic bending. We first describe a new 4-point bending tester, which is developed according to JEDEC standard No. 22B113. The performance of the tester is then estimated through actual experiments. Test results reveal that the cracks first occur on the outer balls around 20,000 cycles and gradually propagate to the inner balls where cracks are found around 70,000 cycles.

• 대한금속재료학회지
• /
• 제47권9호
• /
• pp.580-585
• /
• 2009

The effects of shear speed and tip height on the high speed shear test of Sn-3.0wt.%Ag-0.5wt.%Cu ball joints were investigated. Solder balls of $450{\mu}m$ in diameter were reflowed at $245^{\circ}C$ on a FR4 PCB (Printed Circuit Board) in order to obtain a sample for the high-speed shear test. The UBM was comprised of Cu/Ni/Au, and the shear speed and tip height varied from 0.5 to 3.0 m/s, and from 10 to $135{\mu}m$, respectively. According to the experimental results, faster shear speed enhanced the shear strength of the solder joints, regardless of the tip height. The fraction of ductile (solder) fracture decreased when the shearing speed was raised from 0.5 to 3.0 m/s. With an increasing tip height from 10 to 50 and $135{\mu}m$, the fracture mode changed from pad lift to mixed (ductile and brittle) and ductile fracture, respectively, while the shearing energy also increased in the same order. The shear energy had a proportional relationship with the fraction of the solder fracture.

• 마이크로전자및패키징학회지
• /
• 제17권4호
• /
• pp.67-72
• /
• 2010

In this paper, a design optimization of ball grid array packaging geometry is studied based on the Taguchi method, which allowed robust design by considering the variance of the input parameters during the optimization process. Molding compound and substrate were modeled as viscoelastic, and finite element analyses were performed to calculate the strain energy densities of the eutectic solder balls. Six quality factors of the dimensions of the packaging geometry were chosen as control factors. After performing noise experiments to determine the dominant factors, main experiments were conducted to find the optimum packaging geometry. Then the strain energy densities between the original and optimized geometries were compared. It was found that the effects of the packaging geometry on the solder ball reliability were significant, and more than 40% of the strain energy density was reduced by the geometry optimization.

• 한국소음진동공학회:학술대회논문집
• /
• 한국소음진동공학회 2010년도 춘계학술대회 논문집
• /
• pp.572-573
• /
• 2010

Vibration analysis of Fine-pitch Ball Grid Array (FBGA) packages mounted on a Printed Circuit Board (PCB) subjected to harmonic excitation is performed by using finite element method (FEM). A finite element model of a memory module is composed of three main parts, packages, simplified solder balls and bare PCB. At first, natural frequencies and mode shapes of the developed model were confirmed experimentally. Secondly, the harmonic excitation experiment for the module was carried out at the first natural frequency of the memory module, and it was verified with the simulation by using mode superposition method at a constant acceleration.