• Title/Summary/Keyword: Slurries

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Characterization of PTFE Electrode Made by Bar-Coating Method Using Alcohol-Based Catalyst Slurry (알코올계 촉매 슬러리를 활용한 바 코팅으로 제조된 PTFE 전극의 형성 및 특성 조사)

  • JUNG, HYEON SEUNG;KIM, DO-HYUNG;PAK, CHANHO
    • Transactions of the Korean hydrogen and new energy society
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    • v.31 no.3
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    • pp.276-283
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    • 2020
  • Alcohol-based solvents including ethanol (EtOH) and tert-butyl alcohol (TBA) are investigated instead of isopropanol (IPA), which is a common solvent for polytetrafluoroethylene (PTFE), as an alternative solvent for preparing the catalyst slurry with PTFE binder. As a result, the performance at 0.2 A/㎠ from the single cells from using catalyst slurries based on EtOH and TBA showed very similar value to that from the slurry using IPA, which implies the EtOH and TBA can be used as a solvent for the catalyst slurry. It is also confirmed by the very close values of the total resistance of the membrane electrode assemblies from the slurries using different solvents. In the energy dispersive spectrometry (EDS) image, the shape of crack and dispersion of PTFE are changed according to the vapor pressure of the solvent.

Statistical patterns of lipase activities on the release of short-chain fatty acids in Cheddar cheese slurries

  • Kwak, Hae-Soo
    • Journal of Dairy Science and Biotechnology
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    • v.7 no.1
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    • pp.6-19
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    • 1989
  • Twenty-five commercial food grade and alalytical grade lipases were used to study the patterns of release of short-chain free fatty acids (FFA) from milk fat in cheese slurries. Principal component Analysis showed that there were four distinctive groups by the FFA ratios and five groups by the FFA concentrations. However, Average Linkage Cluster Analysis showed that the patterns of FFA released were dependent upon distance defined between groups of lipases. All the lipases tested with both statistical analysis had distinctive specificities in hydrolyzing short-chain FFA from milk fat. Lipases from ruminant-animal origins produced an extremely high ratio (>40%) of butyric acid and a low ratio (<26%) of capric acid to total short chain FFA. Lipases from porcinepancreas and some microbial origins showed balanced production in both bytyric and capric acid. However, most lipases from microbial origins released a high ratio of capric acid but similar ratios to other origin enzymes for short-chain free fatty acids. Ruminant-animal origin lipases produced short-chain FFA much higher in concentration than other lipases. Lipases from porcine pancreas as well as microbial origins showed different concentrations of the fatty acids. Ratios of short-chain FFA in each sample were not significantly changed during incubation periods (4 wk), whereas concentrations of the FFA increased considerably.

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Effect of Solidification Condition of Sublimable Vehicles on the Pore Characteristics in Freeze Drying Process (동결건조 공정에서 동결제의 응고조건이 기공특성에 미치는 영향)

  • Suk, Myung-Jin;Kim, Ji Soon;Oh, Sung-Tag
    • Journal of Powder Materials
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    • v.21 no.5
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    • pp.366-370
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    • 2014
  • The present study demonstrates the effect of solidification condition on the pore structure in freeze drying process using the slurries of CuO/sublimable vehicles. Camphene and Camphor-45 wt% naphthalene based slurries with 14 vol% CuO powder were frozen into a mold at $-25^{\circ}C$, followed by sublimation at room temperature. The green bodies were hydrogen-reduced and sintered at $500^{\circ}C$ for 1 h. The porous Cu specimen, frozen the CuO/camphene slurry into the heated mold of the upper part, showed large pores with unidirectional pore channels and small pores in their internal wall. Also, it was observed that the size of large pores was decreasing near the bottom part of specimen. The change of pore structure depending on the freezing condition was explained by the nucleation behavior of camphene crystals and rearrangement of solid powders during solidification. In case of porous Cu prepared from CuO/Camphor-naphthalene system, the pore structure exhibited plate shape as a replica of the original structure of crystallized vehicles with hypereutectic composition.

Polishing Properties by Change of Slurry Temperature in Oxide CMP (산화막 CMP 공정에서 슬러리 온도 변화에 따른 연마 특성)

  • Ko, Pil-Ju;Park, Sung-Woo;Kim, Nam-Hoon;Seo, Yong-Jin;Lee, Woo-Sun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.3
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    • pp.219-225
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    • 2005
  • To investigate the effects of slurry temperature on the chemical mechanical polishing(CMP) performance of oxide film with silica and ceria slurries, we have studied slurry properties as a function of different slurry temperature. Also, the effects of each input parameter of slurry on the oxide CMP characteristics were investigated. The pH showed a slight tendency of decrease, the conductivity in slurries showed an increased tendency, the mean particle size in slurry decreased, and the zeta potential of slurry decreased with temperature. The removal rates significantly increased and maintained at the specific levels over 4$0^{\circ}C$. The better surface morphology of oxide films could be obtained at 40 $^{\circ}C$ of silica slurry and at 90 $^{\circ}C$ of ceria slurry. It is found that the CMP performance of oxide film could be significantly improved or controlled by change of slurry temperature.

Improvement of Defect Density by Slurry Fitter Installation in the CMP Process (CMP 공정에서 슬러리 필터설치에 따른 결함 밀도 개선)

  • Kim, Chul-Bok;Seo, Yong-Jin;Seo, Sang-Yong;Lee, Woo-Sun;Kim, Chang-Il;Chang, Eui-Goo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.05b
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    • pp.30-33
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    • 2001
  • Chemical mechanical polishing(CMP) process has been widely used to planarize dielectrics, which can apply to employed in integrated circuits for sub-micron technology. Despite the increased use of CMP process, it is difficult to accomplish the global planarization of free-defects in inter-level dielectrics (ILD). Especially, defects like micro-scratch lead to severe circuit failure, and affects yield. CMP slurries can contain particles exceeding $1{\mu}m$ size, which could cause micro-scratch on the wafer surface. The large particles in these slurries may be caused by particle agglomeration in slurry supply line. To reduce these defects, slurry filtration method has been recommended in oxide CMP. In this work, we have studied the effects of filtration and the defect trend as a function of polished wafer count using various filters in inter-metal dielectric(IMD)-CMP. The filter installation in CMP polisher could reduce defect after IMD-CMP. As a result of micro-scratches formation, it shows that slurry filter plays an important role in determining consumable pad lifetime.

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Fluid dynamical characteristics of microencapsulated phase change material slurries (미립잠열슬러리의 유체역학적 특성연구)

  • 이효진;이승우;이재구
    • Korean Journal of Air-Conditioning and Refrigeration Engineering
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    • v.11 no.4
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    • pp.549-559
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    • 1999
  • An experimental study was peformed to measure the viscosity of microencapsulated PCM slurries as the functions of its concentration and temperature, and also influence to its fluid dynamics. For the viscosity measurement, a rotary type viscometer, which was equipped with temperature control system, was adopted. The slurry was mixed with water and Sodium Lauryl Sulphate as a surfactant by which its suspended particles were dispersed well without the segregation of particles during the experiment. The viscosity was increased as the concentration of MicroPCM particle added. The surfactant increased 5% of the viscosity over the working fluid without particles. Experiments were proceeded by changing parameters such as PCM particles'concentration as well as the temperature of working fluid. As a result, a model to the functions of temperature for the working fluid and its particle concentration is proposed. The proposed model, for which its standard deviation shows 0.8068, is agreed well with the reference's data. The pressure drop was measured by U-tube manometer, and then the friction factor was obtained. It was noted that the pressure drop was not influenced by the state of PCM phase, that is solid or liquid in its core materials at their same concentration. On the other hand, it was described that the pressure drop of the slurry was much increased over the working fluid without particles. A friction factor was placed on a straight line in all working fluids of the laminar flow regardless of existing particles as we expected.

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Performance Characteristics of Liquid-Cooling Heat Exchangers with MPCM Slurry Designed for Telecommunication Equipment (MPCM을 적용한 액냉형 냉각기의 성능 특성에 관한 연구)

  • Jeon, Jong-Ug;Kim, Yong-Chan;Choi, Jong-Min;Hyun, Dong-Soo;Yun, Rin
    • Korean Journal of Air-Conditioning and Refrigeration Engineering
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    • v.19 no.10
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    • pp.710-717
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    • 2007
  • Electric and telecommunication industries are constantly striving towards miniaturization of electronic devices. Miniaturization of chips creates extra space on PCBs that can be populated with additional components, which decreases the heat transfer surface area and generates very high heat flux. Even though an air-cooling technology for telecommunication equipment has been developed in accordance with rapid growth in electrical industry, it is confronted with the limitation of cooling capacity due to the rapid increase of heat density. In this study, liquid-cooling heat exchangers with MPCM slurries were designed and tested by varying geometry and operating conditions. The liquid-cooling heat exchangers with 4-paths showed higher cooling performance than the others. The cooling performance of liquid cooling heat exchanger with MPCM slurries was more enhanced than that of the air cooling system. It's performance was also slightly superior to that of the water cooling system at the inlet temperature of $19^{\circ}C$.

Freeze Casting of Aqueous Alumina/Silicon Carbide Slurries and Fabrication of Layered Composites: (I) Dispersion and Rheology of Slurries (수성 알루미나/탄화규소 슬러리의 동결주조와 층상복합체의 제조: (I) 슬러리의 분산과 유동성)

  • Yang, Tae-Young;Cho, Yong-Ki;Kim, Young-Woo;Yoon, Seog-Young;Park, Hong-Chae
    • Journal of the Korean Ceramic Society
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    • v.45 no.2
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    • pp.99-104
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    • 2008
  • Zeta potential, sedimentation bulk density and rheology in the dispersion system have been studied in terms of solid loading (40-55 vol%), and types of additives. Ammonium polymethacrylate, glycerol, ethoxylated acetylenic diol, and polyvinyl alcohol have been used as the dispersant, cryo-protectant, surfactant, and binder, respectively. Sedimentation density greatly increased upon adding dispersant; the effect was more pronounced with ionic alumina suspension compared with covalent silicon carbide. With further addition of cryo-protectant and surfactant to dispersant, the sedimentation density increased somewhat. The suspension viscosity generally behaviored in an opposite manner to the sedimentation density, i.e., high sedimentation gave low high-shear viscosity, indicative of low order structure formation in the suspended particles. Shear rate rheology in shear rate of $2-300\;sec^{-1}$ showed a shear thinning and its onset began at similar shear rate (${\sim}100\;sce^{-1}$), regardless of solid loading.

A Study on CMP Properties of SnO2 Thin Film for Application of Gas Sensor (가스센서 적용을 위한 SnO2 박막의 CMP 특성 연구)

  • Lee, Woo-Sun;Choi, Gwon-Woo;Kim, Nam-Hoon;Park, Jin-Seong;Seo, Yong-Jin
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.12
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    • pp.1296-1300
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    • 2004
  • SnO$_2$ is one of the most suitable gas sensor materials. The microstructure and surface morphology of films must be controlled because the electrical and optical properties of SnO$_2$ films depend on these characteristics. The effects of chemical mechanical polishing(CMP) on the variation of morphology of SnO$_2$ films prepared by RF sputtering system were investigated. The commercially developed ceria-based oxide slurry, silica-based oxide slurry, and alumina-based tungsten slurry were used as CMP slurry. Non-uniformities of all slurries met stability standards of less than 5 %. Silica slurry had the highest removal rate among three different slurries, sufficient thin film topographies and suitable root mean square(RMS) values.

Characteristics of Slurry Filter for Reduction of CMP Slurry-induced Micro-scratch (CMP 공정에서 마이크로 스크래치 감소를 위한 슬러리 필터의 특성)

  • 김철복;김상용;서용진
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.14 no.7
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    • pp.557-561
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    • 2001
  • Chemical mechanical polishing (CMP) process has been widely used to planarize dielectric layers, which can be applied to the integraded circuits for sub-micron technology. Despite the increased use of CMP process, it is difficult to accomplish the global planarization of in the defect-free inter-level dielectrics (ILD). Especially, defects such as micro-scratch lead to severe circuit failure which affect yield. CMP slurries can contain particles exceeding 1㎛ in size, which could cause micro-scratch on the wafer surface. The large particles in these slurries may be caused by particles agglomeration in slurry supply line. To reduce these defects, slurry filtration method has been recommended in oxide CMP. In this work, we have studied the effects of filtration and the defect trend as a function of polished wafer count using various filters in inter-metal dielectrics(IMD)-CMP process. The filter installation in CMP polisher could reduce defects after IMD-CMP process. As a result of micro-scratch formation, it is shown that slurry filter plays an important role in determining consumable pad lifetime. The filter lifetime is dominated by the defects. We have concluded that slurry filter lifetime is fixed by the degree of generating defects.

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