• 제목/요약/키워드: Si(111)

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메틸클로로실란류의 열분해를 이용한 탄화규소의 화학증착 (Chemical Vapor Deposition of Silicon Carbide by the Pyrolysis of Methylchlorosilanes)

  • 최병진;박동원;조미자;김대룡
    • 한국세라믹학회지
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    • 제32권4호
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    • pp.489-497
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    • 1995
  • The DDS((CH3)2SiCl2)+H2 gas mixture, where C atoms exist in excess in the molecules, was used for chemical vapor deposition of SiC in order to prevent codeposition of free Si in MTS(Ch3SiCl3)+H2 system. The deposition rate was more rapid than MTS, however differ from that of MTS, it decreased after shwoing a maximum at 140$0^{\circ}C$. The stoichiometry was highly improved by using the DDS as a precursor, although there exist a little pyrolytic C at 150$0^{\circ}C$. The preferred orientation was (220) in MTS, however, it changed to (111) in DDS. The microstructure of the layer deposited at lower temperature were dense, however it grew coarse with the increase in the temperature.

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Metal induced crystallization of amorphous silicon using metal solution

  • Yoon, Soo-Young;Oh, Jae-Young;Kim, Chae-Ok;Jang, Jin
    • 한국진공학회지
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    • 제7권s1호
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    • pp.123-133
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    • 1998
  • Amorphous silicon (a-Si) was crystallized by metal induced crystallization using metal solution. The a-Si films spin coated with a 50,000 ppm Ni solution were crystallized at as low as $500^{\circ}C$. Needlelike morphology, developed as a result of the migration of $NiSi_2$, precipitates, appears in the MIC poly-Si. The growth of the needlelike crystallites proceeds to a direction parallel to (111). The crystallization temperature can be lowered to $450^{\circ}C$ by Au addition. The enhancement of crystallization results from the decrease of interfacial energy at the NiSi2/Si interface by Au addition.

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Chemical Vapor Deposition of Silicon Carbide Thin Films Using the Single Precursor 1,3-Disilabutane

  • Lee, Kyung-Won;Boo, Jin-Hyo;Yu, Kyu-Sang;Kim, Yunsoo
    • The Korean Journal of Ceramics
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    • 제3권3호
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    • pp.177-181
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    • 1997
  • Epitaxial films of cubic silicon carbide (3C-SiC, $\beta$-SiC) have been grown on Si(001) and Si(111) substrates by high vacuum chemical vapor deposition using the single precursor 1,3-disilabutane, $H_3SiCH_2SiH_2CH_3$, at temperatures 900~$100^{\circ}C$. The advantage of using the single precursor over the covnentional chemical vapor deposition is evident in that the source chemical is safe to handle, carbonization of the substrates is not necessary, accurate stoichiometry of the silicon carbide films is easily achieved, and the deposition temperature is much lowered. The films were characterized by XPS, XRD, SEM, RHEED, RBS, AES, and TED.

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탄화규소/7091알루미늄 복합재료의 부식거동 (Corrosion Behavior of Silicon Carbide/7091 Aluminum Matrix Composites)

  • 강우승
    • Corrosion Science and Technology
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    • 제11권4호
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    • pp.108-111
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    • 2012
  • The effects of volume fraction (15-30%) of SiC particulate reinforcements on the corrosion behavior of SiCp/7091 Al composites in the 3.5% NaCl solution were studied by electrochemical techniques and scanning electron microscopy. The results showed that the amount of SiC particulate reinforcements did not cause much difference in the corrosion behavior of SiCp/7091 Al composites but the corrosion rate was proportional to the amount of SiCp reinforcement. And numerous pits and severe dissolution of the matrix was observed probably due to the discontinuities and galvanic effects between Al matrix and SiC reinforcements.

일방향 응고법에 의한 단결정 Si의 결정성장에 관한 연구 (Crystal Growth of Polycrystalline Silicon by Directional Solidification)

  • 김계수;이창원;홍준표
    • 한국결정성장학회지
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    • 제3권2호
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    • pp.149-156
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    • 1993
  • Si과 흑연 주형사이에 release layer로서 $CaCl_2$를 사용하여 vold와 crack이 없는 건전한 다결정 Si ingot를 제조하였다. 원소재로서 merallurgical-grade Si를 사용하였으며, 결정성장속도와 응고분율에 따른 불순물농도변화, X-선 회절분석, 비저항측정등을 행하였다. X-선 회절분석 결과 R=0.5mm/min으로 성장된 다결정 Si의 우선성장방향은 (220)면이고, R=0.2mm/min의 경우 우선성장방향은 (111)면임을 확인하였다. 또한 결정성장속도 및 응고분율의 증가에 따라 비저항값은 감소하는 경향을 나타내었다.

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Epitaxial Growth of $Y_2O_3$ films by Ion Beam Assisted Deposition

  • Whang, C.N.
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2000년도 제18회 학술발표회 논문개요집
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    • pp.26-26
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    • 2000
  • High quality epitaxial Y2O3 thin films were prepared on Si(111) and (001) substaretes by using ion beam assisted deposition. As a substrate, clean and chemically oxidized Si wafers were used and the effects of surface state on the film crystallinity were investigated. The crystalline quality of the films were estimated by x-ray scattering, rutherford backscattering spectroscopy/channeling, and high-resolution transmission electron microscopy (HRTEM). The interaction between Y and Si atoms interfere the nucleation of Y2O3 at the initial growth stage, it could be suppressed by the interface SiO2 layer. Therefore, SiO2 layer of the 4-6 layers, which have been known for hindering the crystal growth, could rather enhance the nucleation of the Y2O3 , and the high quality epitaxial film could be grown successfully. Electrical properties of Y2O3 films on Si(001) were measured by C-V and I-V, which revealed that the oxide trap charge density of the film was 1.8$\times$10-8C/$\textrm{cm}^2$ and the breakdown field strength was about 10MV/cm.

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Mobility Enhancement in Polycrystalline Silicon Thin Film Transistors due to the Dehydrogenation Mechanism

  • Lee, Seok Ryoul;Sung, Sang-Yun;Lee, Kyong Taik;Cho, Seong Gook;Lee, Ho Seong
    • Journal of the Korean Physical Society
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    • 제73권9호
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    • pp.1329-1333
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    • 2018
  • We investigated the mechanism of mobility enhancement after the dehydrogenation process in polycrystalline silicon (poly-Si) thin films. The dehydrogenation process was performed by using an in-situ CVD chamber in a $N_2$ ambient or an ex-situ furnace in air ambient. We observed that the dehydrogenated poly-Si in a $N_2$ ambient had a lower oxygen concentration than the dehydrogenated poly-Si annealed in an air ambient. The in-situ dehydrogenation increased the (111) preferred orientation of poly-Si and reduced the oxygen concentration in poly-Si thin films, leading to a reduction of the trap density near the valence band. This phenomenon gave rise to an increase of the field-effect mobility of the poly-Si thin film transistor.

열 화학기상증착법을 이용한 탄화규소 나노선의 합성 및 특성연구 (Characterization of SiC nanowire Synthesized by Thermal CVD)

  • 정민욱;김민국;송우석;정대성;최원철;박종윤
    • 한국진공학회지
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    • 제19권4호
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    • pp.307-313
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    • 2010
  • 본 연구에서는 열 화학기상증착법(thermal chemical vapor deposition)을 이용하여 분말 형태의 규소(Si)와 염화니켈 수화물 $(NiCl_2{\cdot}6H_2O)$을 혼합한 후 탄소공급원인 $CH_4$ 가스를 주입하여 탄화규소 나노선(SiC nanowire)을 합성하였다. 합성 온도와 $CH_4$ 가스 유량 변화에 따른 탄화규소 나노선의 구조적 특성을 분석한 결과, 합성온도가 $1,400^{\circ}C$, $CH_4$ 가스의 유량이 300 sccm인 경우가 탄화규소 나노선의 합성에 최적화된 조건임을 라만 분광법(Raman spectroscopy)과 X-선 회절(X-ray diffraction), 주사전자현미경(scanning electron microscopy), 그리고 투과전자현미경(transmission electron microscopy) 분석을 통해 확인하였다. 합성된 탄화규소 나노선의 직경은 약 50~150 nm이며, 곧은 방향성과 높은 결정성을 가지는 입방구조(cubic structure)를 지니고 있었다.

5182 알루미늄 합금판재의 재결정 집합조짓에 대한 I/d 파라메타의 영향 (Effect of I/d Parameter on Recrystallization Textures of AA5182 Alloy Sheets)

  • 김기주;원시태
    • 한국정밀공학회지
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    • 제28권9호
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    • pp.1086-1093
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    • 2011
  • To fabricate the aluminum alloys with good drawability, the textures evolution of the AA5182 sheets due to the change of lid parameter after rolling and subsequent annealing was studied. The measurement of the deformation textures was carried out for the sheets with high reduction ratio and the change of the recrystallization texture was investigated after heat-treatments of the rolled sheets in various I/d parameters. Rolling without lubrication and subsequent annealing led to the formation of favorable rot-$C_{ND}$ {001}<110> and ${\gamma}$-fiber ND//<111> textures in AA5182 sheets. From the results, the ${\gamma}$-fiber ND//<111> component well evolved during rolling at high lid parameter of 6.77. The initial shear deformation texture, especially, ${\gamma}$-fiber ND//<111> was not rotated during heat treatment in holding time of 180~7,200 seconds on AA5182 with I/d parameter of 6.77. Therefore, the AA5182 sheets were fabricated by controlling I/d parameter having well evolved ${\gamma}$-fiber ND//<111> which was advantageous in good drawability of the sheets.