• Title/Summary/Keyword: Semiconductor detector

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A Digital DLL with 4-Cycle Lock Time and 1/4 NAND-Delay Accuracy

  • Kim, Sung-Yong;Jin, Xuefan;Chun, Jung-Hoon;Kwon, Kee-Won
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.16 no.4
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    • pp.387-394
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    • 2016
  • This paper presents a fully digital delay locked loop (DLL) that can acquire lock in four clock cycles with a resolution of a 1/4 NAND-delay. The proposed DLL with a multi-dither-free phase detector acquires the initial lock in four clock cycles with 1/2 NAND-delay. Then, it utilizes a multi-dither-free phase detector, a region accumulator, and phase blenders, to improve the resolution to a 1/4 NAND-delay. The region accumulator which continuously steers the control registers and the phase blender, adaptively controls the tracking bandwidth depending on the amount of jitter, and effectively suppresses the dithering jitter. Fabricated in a 65 nm CMOS process, the proposed DLL occupies $0.0432mm^2$, and consumes 3.7 mW from a 1.2-V supply at 2 GHz.

A 500 MHz-to-1.2 GHz Reset Free Delay Locked Loop for Memory Controller with Hysteresis Coarse Lock Detector

  • Chi, Han-Kyu;Hwang, Moon-Sang;Yoo, Byoung-Joo;Choe, Won-Jun;Kim, Tae-Ho;Moon, Yong-Sam;Jeong, Deog-Kyoon
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.11 no.2
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    • pp.73-79
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    • 2011
  • This paper describes a reset-free delay-locked loop (DLL) for a memory controller application, with the aid of a hysteresis coarse lock detector. The coarse lock loop in the proposed DLL adjusts the delay between input and output clock within the pull-in range of the main loop phase detector. In addition, it monitors the main loop's lock status by dividing the input clock and counting its multiphase edges. Moreover, by using hysteresis, it controls the coarse lock range, thus reduces jitter. The proposed DLL neither suffers from harmonic lock and stuck problems nor needs an external reset or start-up signal. In a 0.13-${\mu}m$ CMOS process, post-layout simulation demonstrates that, even with a switching supply noise, the peak-to-peak jitter is less than 30 ps over the operating range of 500-1200 MHz. It occupies 0.04 $mm^2$ and dissipates 16.6 mW at 1.2 GHz.

Design of Temperature-Compensated Power-Up Detector (온도 변화에 무관한 출력 특성을 갖는 파워-업 검출기의 설계)

  • Ko, Tai-Young;Jun, Young-Hyun;Kong, Bai-Sun
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.10
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    • pp.1-8
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    • 2009
  • In this paper, a temperature variation-insensitive power-up detector for use in analog and digital integrated systems has been proposed. To provide temperature-insensitive characteristic, nMOS and pMOS voltage dividers in the proposed power-up detector are made to have zero temperature coefficient by exploiting the fact that the effective gate-source voltage of a MOS transistor can result in mutual compensation of mobility and threshold voltage for temperature independency. Comparison results using a 68-nm CMOS process indicate that the proposed power-up detector achieves as small as 4 mV voltage variation at 1.0 V power-up voltage over a temperature range of $-30^{\circ}C$ to $90^{\circ}C$, resulting in 92.6% reduction on power-up voltage variations over conventional power-up detectors.

SENSITIVITY ANALYSIS TO EVALUATE THE TRANSPORT PROPERTIES OF CdZnTe DETECTORS USING ALPHA PARTICLES AND LOW-ENERGY GAMMA-RAYS

  • Kim, Kyung-O;Ahn, Woo-Sang;Kwon, Tae-Je;Kim, Soon-Young;Kim, Jong-Kyung;Ha, Jang-Ho
    • Nuclear Engineering and Technology
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    • v.43 no.6
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    • pp.567-572
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    • 2011
  • A sensitivity analysis of the methods used to evaluate the transport properties of a CdZnTe detector was performed using two different radiations (${\alpha}$ particle and gamma-ray) emitted from an $^{241}Am$ source. The mobility-lifetime products of the electron-hole pair in a planar CZT detector ($5{\times}5{\times}2\;mm^3$) were determined by fitting the peak position as a function of biased voltage data to the Hecht equation. To verify the accuracy of these products derived from ${\alpha}$ particles and low-energy gamma-rays, an energy spectrum considering the transport property of the CZT detector was simulated through a combination of the deposited energy and the charge collection efficiency at a specific position. It was found that the shaping time of the amplifier module significantly affects the determination of the (${\mu}{\tau}$) products; the ${\alpha}$ particle method was stabilized with an increase in the shaping time and was less sensitive to this change compared to when the gamma-ray method was used. In the case of the simulated energy spectrum with transport properties evaluated by the ${\alpha}$ particle method, the peak position and tail were slightly different from the measured result, whereas the energy spectrum derived from the low-energy gamma-ray was in good agreement with the experimental results. From these results, it was confirmed that low-energy gamma-rays are more useful when seeking to obtain the transport properties of carriers than ${\alpha}$ particles because the methods that use gamma-rays are less influenced by the surface condition of the CZT detector. Furthermore, the analysis system employed in this study, which was configured by a combination of Monte Carlo simulation and the Hecht model, is expected to be highly applicable to the study of the characteristics of CZT detectors.

Implementation of the 60W DC Characteristic Measurement System for Semiconductor Devices (60W 출력을 가지는 반도체 소자의 직류 특성 측정시스템의 구현)

  • Choi, In-Kyu; Choi, Chang;Han, Hye-Jin;Park, Jong-Sik
    • Proceedings of the KIEE Conference
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    • 2001.11c
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    • pp.34-37
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    • 2001
  • In this paper, we designed and implemented the 60W DC characteristic measurement system for semiconductor devices. The proposed system is composed of 2 SMU(Source and Measure Unit)s, 2 HPU(High power Unit)s, 2VSU(Voltage Source Unit)s, and 2 VMU(Voltage Measurement Unit)s. HPU can source/measure voltage from -200V to 200V and source/measure current from -3A to 3A within 60W. Experimental results show that the implemented system can measure the power devices such as power BJT, regulator IC, and voltage detector.

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A Novel Thermal Shut Down circuit (새로운 고온 보호회로)

  • Park Young-Bae;Koo Gwan-Bon
    • Proceedings of the KIPE Conference
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    • 2006.06a
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    • pp.254-256
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    • 2006
  • A Novel way to support typical Thermal Shut Down(TSD) circuit is proposed. In power ICs, on-time or on-duration is the key factor to anticipate an abrupt increase of internal temperature. Such an abrupt raise of the temperature can cause TSD circuit cannot protect on proper time due to the temperature detection delay come from the physical distance or the imperfect coupling between heat sources and detector. The proposed circuit checks the duty ratio touched their maximum or not in every cycle. Once duty ratio touches the maximum duty, new circuit generates the warning signal to the TSD circuit and lowers pre-determined temperature for shut down to compensate the detection delay. The novel circuit will be analyzed to the transistor level and checked the validity by simulation.

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A Study on Development of Security Detection System for Infant, the Old and the Weak by using TRIZ (TRIZ를 활용한 유아 및 노약자를 위한 안전감지시스템 개발에 관한 연구)

  • Lee, Kook-Hwan;Lee, Kyeong-Won
    • Journal of the Semiconductor & Display Technology
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    • v.7 no.1
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    • pp.59-65
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    • 2008
  • There are no products, systems to manage health and detect security for infant, the old and the weak in Korea. Recently, the concerns of parents are increasing more about all of children(baby, infant, etc) because rate of birth is decreasing gradually. Also, the average span of human life is on an increasing trend according to well-being and evolution of medical treatment. Therefore, this treatise analyzed problems in managing and following-up infant, the old and the weak at present. By using TRIZ to solve problems, we devised new conceptional ideas, detail designs to manage health, detect security, cope with correspondences for them and developed the prototype and tested it. Excellent performances are proved through various field test.

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Fabrication of Optical Sheet for LED Lighting with Integrated Environment Monitoring Sensors (환경모니터링 센서가 집적된 LED 조명용 광학시트 제작)

  • Choi, Yong Joon;Lee, Young Tae
    • Journal of the Semiconductor & Display Technology
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    • v.12 no.3
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    • pp.35-39
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    • 2013
  • In this paper, we developed an optical sheet for LED lighting with integrated $CO_2$ gas and temperature sensor which can monitor at the indoor environment. The optical sheet for LED lighting is fabricated through PMMA(Polymethyl methacrylate) injection process using mold. This research enables to fabricate the reflective sheet, light-guide plate and the prism sheet in a optical sheet. The fabricated sheet demonstrates higher intensity of optical efficiency compared with single-sided sheets. The $CO_2$ sensor was fabricated using NDIR(NON-Dispersive Infrared) method and it has $0.0235mV/V{\cdot}PPM$ sensitivity. The temperature sensor was fabricated using RTD(Resistance temperature detector) method and it has $0.563{\Omega}/^{\circ}C $sensitivity.

Stability of a QD-blended Organic Photodiode for X-ray Imaging (X-선 영상 취득을 위한 양자점 혼합 유기재료 광다이오드의 안정성에 관한 연구)

  • Lee, Jehoon;Kang, Jungwon
    • Journal of the Semiconductor & Display Technology
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    • v.16 no.2
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    • pp.15-18
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    • 2017
  • In this study, we have studied the characteristics of the organic photodiode varying due to the blending conditions of the quantum dots (QDs). The active layer of the photodiode was formed with poly (3-hexylthiophene) and phenyl-C61-butyric acid methyl ester, and CdSe QDs with and without ZnS shell were blended in the active layer. The photodiode with CdSe/ZnS QDs showed the highest power conversion efficiency (PCE) and short-circuit current (Jsc). The performance change of the organic photodiode by X-ray irradiation was also measured. Regardless of X-ray irradiation conditions, the photodiode with CdSe/ZnS QDs showed better stability than other cases.

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RF Impedance Matching Algorithm Using Phase Detector (임피던스 정합장치 내 위상센서를 이용한 RF정합 알고리즘 연구)

  • Kim, Hwanggyu;Yang, Jinwoo;Kang, Sukho;Choi, Daeho;Hong, Sang Jeen
    • Journal of the Semiconductor & Display Technology
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    • v.21 no.2
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    • pp.32-37
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    • 2022
  • As semiconductors become finer, equipment must perform precise and accurate processes to achieve the desired wafer fabrication requirement. Radio frequency power delivery system in plasma system plays a critical role to generate the plasma, and the role of impedance matching unit is critical to terminate the reflected radio frequency power by modifying the impedance of the matching network in the plasma equipment. Impedance matching unit contains one fixed inductor and two variable vacuum capacitors whose positions are controlled two step motors. Controlling the amount of vacuum variable capacitor should be made as soon as possible when the mismatched impedance is detected. In this paper, we present the impedance matching algorithm using the phase sensor.